JP2021530682A - X線を用いた電池測定装置 - Google Patents
X線を用いた電池測定装置 Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/4285—Testing apparatus
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Secondary Cells (AREA)
Abstract
Description
Claims (9)
- 電池の一側面を第1電池面とし、前記第1電池面と対面する前記電池の他側面を第2電池面とする時、
前記第1電池面に接して、前記電池を加圧する第1プレートと、
前記第2電池面に接して、前記電池を支持する第2プレートと、
前記第1プレートを前記第2プレート側に押す加圧部と、を含み、
前記第1プレートには、X線が通過する第1ホールが形成され、
前記第2プレートには、前記X線が通過する第2ホールが形成され、
前記第1ホールと前記第2ホールは、互いに対面する位置に形成されるX線を用いた電池測定装置。 - 前記第1プレート及び前記第2プレートの素材は、Al、SUSのうち1つ以上を含み、
前記第1プレート及び前記第2プレートの厚さは、5〜15mmであり、
前記第1ホール及び前記第2ホールの縦幅は、15〜30mmであり、横幅は、5〜25mmである請求項1に記載のX線を用いた電池測定装置。 - 前記電池と接する前記第1プレートの一側面を第2面とし、
前記第2面と対面する前記第1プレートの他側面を第1面とし、
前記電池と接する前記第2プレートの一側面を第3面とし、
前記第3面と対面する前記第2プレートの他側面を第4面とする時、
前記加圧部は、
前記第1プレートの前記第1面を加圧して、前記第1プレートの前記第2面が前記電池を加圧させる加圧手段と、
前記第1プレートの第1面側に位置し、前記加圧手段が挿入されてガイドされるガイドホールが設けられるガイドプレートと、
一端部は、前記第2プレートに結合され、他端部は、前記ガイドプレートと結合されて、前記第2プレートと前記ガイドプレートとを離隔した状態で互いに平行に固定する固定プレートと、を含む請求項1または2に記載のX線を用いた電池測定装置。 - 前記第2プレートと前記ガイドプレートとの隔離距離は、10〜30mmである請求項3に記載のX線を用いた電池測定装置。
- 前記第1プレートの一端部のエッジが前記固定プレートの面に接するように、前記第1プレートは、前記ガイドプレートと前記第2プレートとの間に配置される請求項3または4に記載のX線を用いた電池測定装置。
- 前記加圧部と異なる位置で前記第1プレートと前記第2プレートとを前記電池に密着されるように加圧する補助加圧部をさらに含む請求項3に記載のX線を用いた電池測定装置。
- 前記補助加圧部は、
前記第2プレートの前記第4面に接して、前記第2プレートを支持する第2補助プレートと、
前記第1プレートの前記第1面側で前記第1面と対面する第1補助プレートと、
前記第1補助プレートに設けられた補助ガイドホールに挿入されて、前記第1プレートを前記電池側に加圧する補助加圧手段と、
前記第1補助プレートに一端部が結合され、前記第2補助プレートに他端部が結合されて、前記第1補助プレートと前記第2補助プレートとを離隔した状態で互いに平行に固定する柱部と、を含む請求項6に記載のX線を用いた電池測定装置。 - 前記第1補助プレートと前記第2補助プレートとの隔離距離は、15〜45mmである請求項7に記載のX線を用いた電池測定装置。
- 前記加圧手段と前記補助加圧手段との一端部は、前記第1プレートに接触して加圧し、
前記加圧手段が前記第1プレートに接触する地点と前記補助加圧手段が前記第1プレートに接触する地点とを連結する仮想の直線は、前記第1ホールを経由する請求項7または8に記載のX線を用いた電池測定装置。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2019-0050425 | 2019-04-30 | ||
KR20190050425 | 2019-04-30 | ||
KR10-2019-0172991 | 2019-12-23 | ||
KR1020190172991A KR102395889B1 (ko) | 2019-04-30 | 2019-12-23 | X 선 이용 전지 측정 장치 |
PCT/KR2020/002712 WO2020222413A1 (ko) | 2019-04-30 | 2020-02-26 | X 선 이용 전지 측정 장치 |
Publications (2)
Publication Number | Publication Date |
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JP2021530682A true JP2021530682A (ja) | 2021-11-11 |
JP7152071B2 JP7152071B2 (ja) | 2022-10-12 |
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Application Number | Title | Priority Date | Filing Date |
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JP2021500117A Active JP7152071B2 (ja) | 2019-04-30 | 2020-02-26 | X線を用いた電池測定装置 |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP3805743B1 (ja) |
JP (1) | JP7152071B2 (ja) |
KR (1) | KR102395889B1 (ja) |
CN (1) | CN112384791A (ja) |
ES (1) | ES2955813T3 (ja) |
HU (1) | HUE063295T2 (ja) |
PL (1) | PL3805743T3 (ja) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (ja) * | 2004-02-05 | 2005-08-18 | Rigaku Corp | X線分析用試料支持装置及びx線分析装置 |
JP2008064463A (ja) * | 2006-09-04 | 2008-03-21 | Nagoya Industrial Science Research Inst | ビーム照射による軟質材料の構造解析方法及びそれに用いる軟質材料保持装置 |
JP2012159311A (ja) * | 2011-01-29 | 2012-08-23 | Rigaku Corp | X線測定用電池構造体及びその支持装置 |
JP2016170093A (ja) * | 2015-03-13 | 2016-09-23 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
JP2018049002A (ja) * | 2016-09-16 | 2018-03-29 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
WO2019057484A1 (de) * | 2017-09-21 | 2019-03-28 | Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH | Vorrichtung zum einspannen und temperieren von flachen proben für die röntgendiffraktometrie |
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KR101334121B1 (ko) * | 2009-10-26 | 2013-11-29 | 에스케이이노베이션 주식회사 | 전지의 전극 검사장치 및 방법 |
CN102435625B (zh) * | 2011-12-27 | 2016-05-18 | 东莞新能源科技有限公司 | 一种x射线衍射原位测试方法及样品架 |
KR101274730B1 (ko) | 2012-10-11 | 2013-06-17 | 군산대학교산학협력단 | 엑스선 회절분석이 가능한 인시추 전지프레임 |
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JP6221723B2 (ja) * | 2013-12-17 | 2017-11-01 | 住友金属鉱山株式会社 | X線分析装置及びx線分析方法 |
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KR20170116539A (ko) * | 2016-04-11 | 2017-10-19 | 주식회사 엘지화학 | 리튬-황 전지용 수직저항 측정장치 및 이를 이용한 리튬-황 전지용 양극 평가 방법 |
JP6673165B2 (ja) * | 2016-11-29 | 2020-03-25 | 株式会社島津製作所 | 電池のx線検査装置 |
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CN207600984U (zh) * | 2018-02-28 | 2018-07-10 | 北京中研环科科技有限公司 | 二次电池x射线吸收荧光原位反应池 |
KR101959004B1 (ko) * | 2018-05-09 | 2019-03-15 | 한전원자력연료 주식회사 | 4발 동시 체결형 사용후 핵연료 취급 안전성 보완기구 |
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2019
- 2019-12-23 KR KR1020190172991A patent/KR102395889B1/ko active IP Right Grant
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2020
- 2020-02-26 JP JP2021500117A patent/JP7152071B2/ja active Active
- 2020-02-26 ES ES20799321T patent/ES2955813T3/es active Active
- 2020-02-26 HU HUE20799321A patent/HUE063295T2/hu unknown
- 2020-02-26 CN CN202080003954.1A patent/CN112384791A/zh active Pending
- 2020-02-26 PL PL20799321.3T patent/PL3805743T3/pl unknown
- 2020-02-26 EP EP20799321.3A patent/EP3805743B1/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005221363A (ja) * | 2004-02-05 | 2005-08-18 | Rigaku Corp | X線分析用試料支持装置及びx線分析装置 |
JP2008064463A (ja) * | 2006-09-04 | 2008-03-21 | Nagoya Industrial Science Research Inst | ビーム照射による軟質材料の構造解析方法及びそれに用いる軟質材料保持装置 |
JP2012159311A (ja) * | 2011-01-29 | 2012-08-23 | Rigaku Corp | X線測定用電池構造体及びその支持装置 |
JP2016170093A (ja) * | 2015-03-13 | 2016-09-23 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
JP2018049002A (ja) * | 2016-09-16 | 2018-03-29 | 住友金属鉱山株式会社 | 試料ホルダーおよびx線分析方法 |
WO2019057484A1 (de) * | 2017-09-21 | 2019-03-28 | Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH | Vorrichtung zum einspannen und temperieren von flachen proben für die röntgendiffraktometrie |
Also Published As
Publication number | Publication date |
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HUE063295T2 (hu) | 2024-01-28 |
CN112384791A (zh) | 2021-02-19 |
EP3805743B1 (en) | 2023-07-19 |
PL3805743T3 (pl) | 2023-12-11 |
EP3805743A4 (en) | 2021-09-22 |
EP3805743A1 (en) | 2021-04-14 |
KR20200126885A (ko) | 2020-11-09 |
JP7152071B2 (ja) | 2022-10-12 |
ES2955813T3 (es) | 2023-12-07 |
KR102395889B1 (ko) | 2022-05-09 |
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