JP2021522544A5 - - Google Patents
Info
- Publication number
- JP2021522544A5 JP2021522544A5 JP2020559478A JP2020559478A JP2021522544A5 JP 2021522544 A5 JP2021522544 A5 JP 2021522544A5 JP 2020559478 A JP2020559478 A JP 2020559478A JP 2020559478 A JP2020559478 A JP 2020559478A JP 2021522544 A5 JP2021522544 A5 JP 2021522544A5
- Authority
- JP
- Japan
- Prior art keywords
- actuator
- less
- support member
- increments
- common actuator
- Prior art date
Links
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP18169639.4 | 2018-04-26 | ||
| EP18169639.4A EP3385792A3 (en) | 2018-04-26 | 2018-04-26 | Stage apparatus for use in a lithographic apparatus |
| EP19150671.6 | 2019-01-08 | ||
| EP19150671 | 2019-01-08 | ||
| PCT/EP2019/057672 WO2019206548A1 (en) | 2018-04-26 | 2019-03-27 | Stage apparatus, lithographic apparatus, control unit and method |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2021522544A JP2021522544A (ja) | 2021-08-30 |
| JPWO2019206548A5 JPWO2019206548A5 (https=) | 2022-02-15 |
| JP2021522544A5 true JP2021522544A5 (https=) | 2022-02-15 |
| JP7079858B2 JP7079858B2 (ja) | 2022-06-02 |
Family
ID=65818534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020559478A Active JP7079858B2 (ja) | 2018-04-26 | 2019-03-27 | ステージ装置、リソグラフィ装置、コントロールユニット及び方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11243476B2 (https=) |
| JP (1) | JP7079858B2 (https=) |
| KR (1) | KR102493253B1 (https=) |
| CN (1) | CN112041750B (https=) |
| NL (1) | NL2022818A (https=) |
| WO (1) | WO2019206548A1 (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3764165A1 (en) | 2019-07-12 | 2021-01-13 | ASML Netherlands B.V. | Substrate shape measuring device |
| DE102019008104A1 (de) * | 2019-11-21 | 2021-05-27 | Vat Holding Ag | Verfahren zur Überwachung, Positionsbestimmung und Positionierung eines Stiffthubsystems |
| US20240345490A1 (en) * | 2021-08-24 | 2024-10-17 | Asml Netherlands B.V. | An object gripper, a method of holding an object and a lithographic apparatus |
| KR102883313B1 (ko) * | 2022-04-04 | 2025-11-06 | 세메스 주식회사 | 기판 지지 장치 및 이를 포함하는 기판 하면 세정 장치 |
| CN115709902B (zh) * | 2022-11-24 | 2025-05-16 | 镇江龙源铝业有限公司 | 一种铝合金板带辅助支撑装置及其控制方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL8300220A (nl) | 1983-01-21 | 1984-08-16 | Philips Nv | Inrichting voor het stralingslithografisch behandelen van een dun substraat. |
| JP3477777B2 (ja) * | 1993-01-22 | 2003-12-10 | 株式会社日立製作所 | 投影露光装置およびその方法 |
| JPH0758191A (ja) * | 1993-08-13 | 1995-03-03 | Toshiba Corp | ウェハステージ装置 |
| US5563684A (en) | 1994-11-30 | 1996-10-08 | Sgs-Thomson Microelectronics, Inc. | Adaptive wafer modulator for placing a selected pattern on a semiconductor wafer |
| JPH1154423A (ja) * | 1997-07-31 | 1999-02-26 | Horiba Ltd | 露光装置 |
| US6020964A (en) | 1997-12-02 | 2000-02-01 | Asm Lithography B.V. | Interferometer system and lithograph apparatus including an interferometer system |
| JP2002064132A (ja) * | 2000-08-22 | 2002-02-28 | Tokyo Electron Ltd | 被処理体の受け渡し方法、被処理体の載置機構及びプローブ装置 |
| SG135052A1 (en) | 2002-11-12 | 2007-09-28 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| JP2004228453A (ja) | 2003-01-27 | 2004-08-12 | Renesas Technology Corp | 半導体装置の製造方法 |
| US6805338B1 (en) | 2003-06-13 | 2004-10-19 | Lsi Logic Corporation | Semiconductor wafer chuck assembly for a semiconductor processing device |
| US7307697B2 (en) | 2004-05-28 | 2007-12-11 | Board Of Regents, The University Of Texas System | Adaptive shape substrate support system |
| DE102005043569A1 (de) | 2005-09-12 | 2007-03-22 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP2007189181A (ja) * | 2006-01-10 | 2007-07-26 | Horon:Kk | 露光ステージ装置 |
| KR20070119386A (ko) * | 2006-06-15 | 2007-12-20 | 세메스 주식회사 | 평판 디스플레이 제조용 장비 |
| JP5090079B2 (ja) | 2007-06-27 | 2012-12-05 | 大日本スクリーン製造株式会社 | 減圧乾燥装置 |
| JP5406475B2 (ja) | 2008-07-28 | 2014-02-05 | 大日本スクリーン製造株式会社 | 熱処理装置 |
| JP2010056217A (ja) | 2008-08-27 | 2010-03-11 | Dainippon Screen Mfg Co Ltd | 基板昇降装置および基板処理装置 |
| JP2011091070A (ja) | 2009-10-20 | 2011-05-06 | Nikon Corp | 保持部材、ステージ装置、反射部材、反射装置、測定装置、露光装置、デバイス製造方法、板状部材の表面の形状を変える方法、露光方法、反射面の形状を変える方法、測定方法 |
| JP5141707B2 (ja) * | 2010-03-24 | 2013-02-13 | 株式会社安川電機 | 被処理体の支持機構、支持方法およびそれを備えた搬送システム |
| KR101866719B1 (ko) | 2010-12-20 | 2018-06-11 | 에베 그룹 에. 탈너 게엠베하 | 웨이퍼의 장착을 위한 수용 수단 |
| JP2013161946A (ja) | 2012-02-06 | 2013-08-19 | Tokyo Electron Ltd | 基板処理装置及び基板処理方法 |
| JP5912654B2 (ja) | 2012-02-24 | 2016-04-27 | 株式会社東芝 | 基板保持装置及びパターン転写装置並びにパターン転写方法 |
| JP2014003259A (ja) | 2012-06-21 | 2014-01-09 | Nikon Corp | ロード方法、基板保持装置及び露光装置 |
| JP2015050418A (ja) | 2013-09-04 | 2015-03-16 | 東京エレクトロン株式会社 | 基板冷却装置、基板冷却方法及び基板処理装置 |
| KR102247936B1 (ko) * | 2013-10-30 | 2021-05-04 | 가부시키가이샤 니콘 | 기판 유지 장치, 노광 장치 및 디바이스 제조 방법 |
| WO2015169616A1 (en) | 2014-05-06 | 2015-11-12 | Asml Netherlands B.V. | Substrate support, method for loading a substrate on a substrate support location, lithographic apparatus and device manufacturing method |
| JP5865475B2 (ja) * | 2014-12-16 | 2016-02-17 | 株式会社東芝 | 基板保持装置及びパターン転写装置並びにパターン転写方法 |
| EP3385792A3 (en) | 2018-04-26 | 2018-12-26 | ASML Netherlands B.V. | Stage apparatus for use in a lithographic apparatus |
-
2019
- 2019-03-27 KR KR1020207030833A patent/KR102493253B1/ko active Active
- 2019-03-27 US US17/050,149 patent/US11243476B2/en active Active
- 2019-03-27 NL NL2022818A patent/NL2022818A/en unknown
- 2019-03-27 JP JP2020559478A patent/JP7079858B2/ja active Active
- 2019-03-27 WO PCT/EP2019/057672 patent/WO2019206548A1/en not_active Ceased
- 2019-03-27 CN CN201980028170.1A patent/CN112041750B/zh active Active
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