JP2021115694A - ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 - Google Patents
ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 Download PDFInfo
- Publication number
- JP2021115694A JP2021115694A JP2021003047A JP2021003047A JP2021115694A JP 2021115694 A JP2021115694 A JP 2021115694A JP 2021003047 A JP2021003047 A JP 2021003047A JP 2021003047 A JP2021003047 A JP 2021003047A JP 2021115694 A JP2021115694 A JP 2021115694A
- Authority
- JP
- Japan
- Prior art keywords
- double
- rotor disk
- workpiece
- processing machine
- sided processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000012530 fluid Substances 0.000 claims description 34
- 239000011248 coating agent Substances 0.000 claims description 18
- 238000000576 coating method Methods 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 17
- 238000003754 machining Methods 0.000 claims description 15
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910052799 carbon Inorganic materials 0.000 claims description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 12
- 239000010935 stainless steel Substances 0.000 description 12
- 238000005498 polishing Methods 0.000 description 11
- 235000012431 wafers Nutrition 0.000 description 8
- 238000007788 roughening Methods 0.000 description 7
- 239000002002 slurry Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 3
- 239000007769 metal material Substances 0.000 description 3
- 238000000265 homogenisation Methods 0.000 description 2
- 230000005660 hydrophilic surface Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 206010013642 Drooling Diseases 0.000 description 1
- 208000008630 Sialorrhea Diseases 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005661 hydrophobic surface Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/28—Work carriers for double side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
- B24B29/02—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents designed for particular workpieces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Inorganic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
Abstract
Description
12 下側キャリアディスク
14 上側作業ディスク
16 下側作業ディスク
18 駆動シャフト
20 駆動シャフト
22 作業ギャップ
24 ロータディスク
26 軸線
28 ワークピース
30 流体供給部
124 ロータディスク
132 ワークピース開口部
134 外歯
224 ロータディスク
232 ワークピース開口部
234 外歯
236 補助開口部
Claims (7)
- 両面加工機においてワークピース(28)を案内するためのロータディスクであって、前記両面加工機において両面に対して材料除去方式で加工される少なくとも1つのワークピース(28)を受容するための少なくとも1つのワークピース開口部(132、232)を備える、ロータディスクにおいて、前記ロータディスク(24、124、224)の表面が、少なくとも60°の水滴の接触角を有することを特徴とする、ロータディスク。
- 前記ロータディスク(24、124、224)の表面が、90°以下、好ましくは75°以下の水滴の接触角を有することを特徴とする、請求項1に記載のロータディスク。
- 前記ロータディスク(24、124、224)の表面が粗面化されていることを特徴とする、請求項1又は2に記載のロータディスク。
- 前記ロータディスク(24、124、224)の表面がコーティングされていることを特徴とする、請求項1から請求項3のいずれか一項に記載のロータディスク。
- 前記コーティングがダイヤモンドライクカーボン(DLC)コーティングであることを特徴とする、請求項4に記載のロータディスク。
- 第1の作業面を有する第1の作業ディスク(14)と、第2の作業面を有する第2の作業ディスク(16)とを備える両面加工機であって、前記作業面は前記作業面の間に作業ギャップ(22)を画定し、前記両面加工機の前記作業ディスク(14,16)の少なくとも1つは回転駆動されることが可能であり、前記両面加工機は、加工流体を前記作業ギャップ(22)に供給するための流体供給部(30)をさらに備え、また前記両面加工機は、請求項1から請求項5のいずれか一項に記載の少なくとも1つのロータディスク(24,124,224)を備え、前記少なくとも1つのロータディスク(24,124,224)により、少なくとも1つのワークピース(28)が、両面の材料除去加工のために前記作業ギャップ(22)内において案内され得る、両面加工機。
- 請求項9に記載の両面加工機において少なくとも1つのワークピース(28)を加工する方法であって、前記少なくとも1つのワークピース(28)は、前記少なくとも1つのロータディスク(24,124,224)の前記少なくとも1つのワークピース開口部(32,132,232)に受容され、前記両面加工機の前記作業ギャップ(22)での加工のために案内され、前記両面加工機の前記作業ディスク(14、16)の少なくとも1つは回転駆動され、前記加工中に前記作業ギャップ(22)には加工流体が供給される、方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2023096931A JP2023115061A (ja) | 2020-01-21 | 2023-06-13 | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102020101313.2 | 2020-01-21 | ||
DE102020101313.2A DE102020101313B3 (de) | 2020-01-21 | 2020-01-21 | Läuferscheibe, Doppelseitenbearbeitungsmaschine und Verfahren zum Bearbeiten mindestens eines Werkstücks in einer Doppelseitenbearbeitungsmaschine |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023096931A Division JP2023115061A (ja) | 2020-01-21 | 2023-06-13 | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2021115694A true JP2021115694A (ja) | 2021-08-10 |
Family
ID=74130127
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021003047A Pending JP2021115694A (ja) | 2020-01-21 | 2021-01-12 | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 |
JP2023096931A Pending JP2023115061A (ja) | 2020-01-21 | 2023-06-13 | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023096931A Pending JP2023115061A (ja) | 2020-01-21 | 2023-06-13 | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20210220963A1 (ja) |
EP (1) | EP3854525A1 (ja) |
JP (2) | JP2021115694A (ja) |
KR (1) | KR20210095052A (ja) |
CN (1) | CN113211304A (ja) |
DE (1) | DE102020101313B3 (ja) |
SG (1) | SG10202100104WA (ja) |
TW (1) | TW202134001A (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010030013A (ja) * | 2008-07-31 | 2010-02-12 | Tocalo Co Ltd | 被研磨物保持用キャリアおよびその製造方法 |
JP2013132744A (ja) * | 2011-12-27 | 2013-07-08 | Asahi Glass Co Ltd | 研磨キャリア、磁気記録媒体用ガラス基板の研磨方法、および、磁気記録媒体用ガラス基板の製造方法 |
WO2018105306A1 (ja) * | 2016-12-09 | 2018-06-14 | 信越半導体株式会社 | 両面研磨装置用キャリア及び両面研磨装置並びに両面研磨方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080166952A1 (en) * | 2005-02-25 | 2008-07-10 | Shin-Etsu Handotai Co., Ltd | Carrier For Double-Side Polishing Apparatus, Double-Side Polishing Apparatus And Double-Side Polishing Method Using The Same |
DE102009038942B4 (de) * | 2008-10-22 | 2022-06-23 | Peter Wolters Gmbh | Vorrichtung zur beidseitigen Bearbeitung von flachen Werkstücken sowie Verfahren zur gleichzeitigen beidseitigen Material abtragenden Bearbeitung mehrerer Halbleiterscheiben |
DE102011003008B4 (de) * | 2011-01-21 | 2018-07-12 | Siltronic Ag | Führungskäfig und Verfahren zur gleichzeitig beidseitigen Material abtragenden Bearbeitung von Halbleiterscheiben |
JP6083889B2 (ja) * | 2012-10-10 | 2017-02-22 | トーカロ株式会社 | アモルファスカーボン膜被覆部材 |
JP2015069671A (ja) | 2013-09-30 | 2015-04-13 | Hoya株式会社 | 磁気ディスク用ガラス基板の製造方法 |
JP6330628B2 (ja) | 2013-11-11 | 2018-05-30 | 旭硝子株式会社 | ガラス基板の製造方法 |
DE102017221931A1 (de) * | 2017-12-05 | 2019-06-06 | Siltronic Ag | Läuferscheibe zum Führen von Halbleiterscheiben und Verfahren zur beidseitigen Politur von Halbleiterscheiben |
-
2020
- 2020-01-21 DE DE102020101313.2A patent/DE102020101313B3/de active Active
- 2020-12-25 TW TW109146192A patent/TW202134001A/zh unknown
-
2021
- 2021-01-06 SG SG10202100104WA patent/SG10202100104WA/en unknown
- 2021-01-11 EP EP21150963.3A patent/EP3854525A1/de active Pending
- 2021-01-12 JP JP2021003047A patent/JP2021115694A/ja active Pending
- 2021-01-14 KR KR1020210005055A patent/KR20210095052A/ko not_active Application Discontinuation
- 2021-01-21 US US17/154,424 patent/US20210220963A1/en active Pending
- 2021-01-21 CN CN202110079972.4A patent/CN113211304A/zh active Pending
-
2023
- 2023-06-13 JP JP2023096931A patent/JP2023115061A/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010030013A (ja) * | 2008-07-31 | 2010-02-12 | Tocalo Co Ltd | 被研磨物保持用キャリアおよびその製造方法 |
JP2013132744A (ja) * | 2011-12-27 | 2013-07-08 | Asahi Glass Co Ltd | 研磨キャリア、磁気記録媒体用ガラス基板の研磨方法、および、磁気記録媒体用ガラス基板の製造方法 |
WO2018105306A1 (ja) * | 2016-12-09 | 2018-06-14 | 信越半導体株式会社 | 両面研磨装置用キャリア及び両面研磨装置並びに両面研磨方法 |
Also Published As
Publication number | Publication date |
---|---|
DE102020101313B3 (de) | 2021-07-01 |
CN113211304A (zh) | 2021-08-06 |
JP2023115061A (ja) | 2023-08-18 |
KR20210095052A (ko) | 2021-07-30 |
US20210220963A1 (en) | 2021-07-22 |
SG10202100104WA (en) | 2021-08-30 |
EP3854525A1 (de) | 2021-07-28 |
TW202134001A (zh) | 2021-09-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4904960B2 (ja) | 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法 | |
JP5476432B2 (ja) | 平坦なワークピースを両面加工する装置、ならびに複数の半導体ウェハを両面で同時に材料切削加工する方法 | |
KR100457718B1 (ko) | 실리콘웨이퍼의제조방법과그장치 | |
US8480456B1 (en) | Ultra-flat, high throughput wafer lapping process | |
JP2007210074A (ja) | 研削装置および研磨装置、並びに研削方法および研磨方法 | |
JP2006303136A (ja) | 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法 | |
US11453098B2 (en) | Carrier for double-side polishing apparatus, double-side polishing apparatus, and double-side polishing method | |
JP2021115694A (ja) | ロータディスク、両面加工機、及び両面加工機において少なくとも1つのワークピースを加工する方法 | |
JPS63174877A (ja) | 電鋳薄刃砥石 | |
JP5507799B2 (ja) | 半導体ウェーハ研磨装置および研磨方法 | |
JP2000094303A (ja) | 研磨方法およびその装置 | |
JPH09262747A (ja) | 高脆性材の両面研削装置 | |
JP2008254082A (ja) | 球体の研磨装置 | |
KR200414569Y1 (ko) | 자동연마장치 | |
JP2002184730A (ja) | 半導体デバイス加工用硬質発泡樹脂溝付パッド及びそのパッド旋削溝加工用工具 | |
JP4781654B2 (ja) | 研磨クロス及びウェーハ研磨装置 | |
TW466150B (en) | Non-abrasive conditioning for polishing pads | |
KR100899637B1 (ko) | 웨이퍼 연마장치 | |
JP6593318B2 (ja) | キャリアプレートの厚み調整方法 | |
KR100321551B1 (ko) | 반도체 기판의 표면 요철을 제거하기 위한 반도체 웨이퍼 연마 장치 | |
KR100680880B1 (ko) | 리테이너 링 및 이를 포함하는 화학적 기계적 연마 장치 | |
JP6888753B2 (ja) | 研磨装置、及び、研磨パッドのドレッシング方法 | |
KR101285923B1 (ko) | 연마장치 및 연마장치의 드레싱기어 | |
KR20140133497A (ko) | 연마 패드 및 연마 장치 | |
WO2020203557A1 (ja) | 切削インサートおよび加工方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20210903 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20220629 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20220719 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20221019 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20230214 |