JP2020534904A5 - - Google Patents

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JP2020534904A5
JP2020534904A5 JP2020516732A JP2020516732A JP2020534904A5 JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5 JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020516732 A JP2020516732 A JP 2020516732A JP 2020534904 A5 JP2020534904 A5 JP 2020534904A5
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Japan
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ray
imaging device
scan data
ray detector
respect
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JP2020516732A
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Japanese (ja)
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JP2020534904A (ja
JP6961077B2 (ja
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Priority claimed from EP17192846.8A external-priority patent/EP3459461A1/en
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JP2020516732A 2017-09-25 2018-09-21 X線撮像参照スキャン Active JP6961077B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17192846.8 2017-09-25
EP17192846.8A EP3459461A1 (en) 2017-09-25 2017-09-25 X-ray imaging reference scan
PCT/EP2018/075643 WO2019057915A1 (en) 2017-09-25 2018-09-21 X-RAY IMAGING REFERENCE SCAN

Publications (3)

Publication Number Publication Date
JP2020534904A JP2020534904A (ja) 2020-12-03
JP2020534904A5 true JP2020534904A5 (https=) 2021-04-22
JP6961077B2 JP6961077B2 (ja) 2021-11-05

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JP2020516732A Active JP6961077B2 (ja) 2017-09-25 2018-09-21 X線撮像参照スキャン

Country Status (5)

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US (1) US11231378B2 (https=)
EP (2) EP3459461A1 (https=)
JP (1) JP6961077B2 (https=)
CN (1) CN111107787B (https=)
WO (1) WO2019057915A1 (https=)

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DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するx線吸収分光法のためのシステム及び方法
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
WO2023177981A1 (en) 2022-03-15 2023-09-21 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
CN115861250B (zh) * 2022-12-14 2023-09-22 深圳技术大学 自适应数据集的半监督医学图像器官分割方法及系统
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