JP2020534687A - 劈開技法を用いて基板を除去する方法 - Google Patents
劈開技法を用いて基板を除去する方法 Download PDFInfo
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- JP2020534687A JP2020534687A JP2020515181A JP2020515181A JP2020534687A JP 2020534687 A JP2020534687 A JP 2020534687A JP 2020515181 A JP2020515181 A JP 2020515181A JP 2020515181 A JP2020515181 A JP 2020515181A JP 2020534687 A JP2020534687 A JP 2020534687A
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- group iii
- iii nitride
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/11—Separation of active layers from substrates
- H10P95/112—Separation of active layers from substrates leaving a reusable substrate, e.g. epitaxial lift off
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0217—Removal of the substrate
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/013—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
- H10H20/0137—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials the light-emitting regions comprising nitride materials
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/24—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using chemical vapour deposition [CVD]
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/27—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
- H10P14/276—Lateral overgrowth
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3414—Deposited materials, e.g. layers characterised by the chemical composition being group IIIA-VIA materials
- H10P14/3416—Nitrides
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3442—N-type
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3438—Doping during depositing
- H10P14/3441—Conductivity type
- H10P14/3444—P-type
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/11—Separation of active layers from substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/12—Pendeo epitaxial lateral overgrowth [ELOG], e.g. for growing GaN based blue laser diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
- H01S5/0202—Cleaving
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/817—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
- H10H20/821—Bodies characterised by their shape, e.g. curved or truncated substrates of the light-emitting regions, e.g. non-planar junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
- H10P14/2907—Materials being Group IIIA-VA materials
- H10P14/2908—Nitrides
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022163051A JP2022185100A (ja) | 2017-09-15 | 2022-10-11 | 劈開技法を用いて基板を除去する方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762559378P | 2017-09-15 | 2017-09-15 | |
| US62/559,378 | 2017-09-15 | ||
| PCT/US2018/051375 WO2019055936A1 (en) | 2017-09-15 | 2018-09-17 | METHOD OF REMOVING A SUBSTRATE USING A CLEAVAGE TECHNIQUE |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022163051A Division JP2022185100A (ja) | 2017-09-15 | 2022-10-11 | 劈開技法を用いて基板を除去する方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2020534687A true JP2020534687A (ja) | 2020-11-26 |
Family
ID=65723150
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020515181A Pending JP2020534687A (ja) | 2017-09-15 | 2018-09-17 | 劈開技法を用いて基板を除去する方法 |
| JP2022163051A Pending JP2022185100A (ja) | 2017-09-15 | 2022-10-11 | 劈開技法を用いて基板を除去する方法 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022163051A Pending JP2022185100A (ja) | 2017-09-15 | 2022-10-11 | 劈開技法を用いて基板を除去する方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US11508620B2 (https=) |
| EP (1) | EP3682465A4 (https=) |
| JP (2) | JP2020534687A (https=) |
| CN (1) | CN111095483B (https=) |
| WO (1) | WO2019055936A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022185100A (ja) * | 2017-09-15 | 2022-12-13 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 劈開技法を用いて基板を除去する方法 |
| JPWO2023153358A1 (https=) * | 2022-02-10 | 2023-08-17 | ||
| JP2024540892A (ja) * | 2021-10-22 | 2024-11-06 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 垂直共振器型面発光レーザを製作する方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110603651B (zh) | 2017-05-05 | 2023-07-18 | 加利福尼亚大学董事会 | 移除衬底的方法 |
| WO2019191760A1 (en) * | 2018-03-30 | 2019-10-03 | The Regents Of The University Of California | Method of fabricating non-polar and semi-polar devices using epitaxial lateral overgrowth |
| US12087577B2 (en) | 2018-05-17 | 2024-09-10 | The Regents Of The University Of California | Method for dividing a bar of one or more devices |
| CN112204754B (zh) * | 2018-05-30 | 2024-08-13 | 加利福尼亚大学董事会 | 从半导体衬底移除半导体层的方法 |
| CN111211477B (zh) * | 2018-11-21 | 2023-07-28 | 深圳市中光工业技术研究院 | 半导体激光器及其制备方法 |
| US12417913B2 (en) | 2019-03-01 | 2025-09-16 | The Regents Of The University Of California | Method for flattening a surface on an epitaxial lateral growth layer |
| JP2022523861A (ja) * | 2019-03-12 | 2022-04-26 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 支持板を使用して1つ以上の素子のバーを除去するための方法 |
| WO2021081308A1 (en) * | 2019-10-23 | 2021-04-29 | The Regents Of The University Of California | Method of fabricating a resonant cavity and distributed bragg reflector mirrors for a vertical cavity surface emitting laser on a wing of an epitaxial lateral overgrowth region |
| EP4053881B1 (en) * | 2019-10-29 | 2024-10-09 | Kyocera Corporation | Semiconductor element and method for producing semiconductor element |
| CN111048635B (zh) * | 2019-12-27 | 2021-06-18 | 广东省半导体产业技术研究院 | 一种芯片制备方法与待剥离芯片结构 |
| CN111129242B (zh) * | 2019-12-27 | 2021-06-18 | 广东省半导体产业技术研究院 | 一种led制备方法与待剥离led结构 |
| CN116057715A (zh) * | 2020-06-19 | 2023-05-02 | 加利福尼亚大学董事会 | 实现半导体器件的转移过程 |
| CN116325183A (zh) * | 2020-10-14 | 2023-06-23 | 苏州晶湛半导体有限公司 | 微型led结构的制作方法 |
| US20230411554A1 (en) * | 2020-10-23 | 2023-12-21 | The Regents Of The University Of California | Small size light emiting diodes fabricated via regrowth |
| CN116508137A (zh) * | 2020-10-28 | 2023-07-28 | 加利福尼亚大学董事会 | 将图案转移到发光器件的外延层的方法 |
| DE102021207298A1 (de) * | 2021-07-09 | 2023-01-12 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zur herstellung eines strahlungsemittierenden halbleiterchips und strahlungsemittierender halbleiterchip |
| CN115642211B (zh) * | 2022-10-31 | 2025-07-29 | 江苏第三代半导体研究院有限公司 | 一种Micro-LED芯片及其制作方法 |
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| JP2006005331A (ja) * | 2004-05-18 | 2006-01-05 | Sumitomo Electric Ind Ltd | Iii族窒化物半導体結晶およびその製造方法、iii族窒化物半導体デバイスおよびその製造方法ならびに発光機器 |
| JP2007096114A (ja) * | 2005-09-29 | 2007-04-12 | Sanyo Electric Co Ltd | 半導体発光素子及び半導体発光素子の製造方法 |
| WO2011021710A1 (ja) * | 2009-08-20 | 2011-02-24 | 株式会社パウデック | 半導体素子およびその製造方法 |
| JP2013251304A (ja) * | 2012-05-30 | 2013-12-12 | Furukawa Co Ltd | 積層体および積層体の製造方法 |
| JP2015504242A (ja) * | 2011-12-14 | 2015-02-05 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 半導体素子及びそれを製造する方法 |
| JP2015154074A (ja) * | 2014-02-10 | 2015-08-24 | ソラア レイザー ダイオード インク | 基板材料の使用を改良したガリウムおよび窒素を含有するレーザ装置を製造する方法 |
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| JP2010512301A (ja) * | 2006-12-12 | 2010-04-22 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 様々な基板上の(Al,In,Ga,B)NのM面および半極性面の結晶成長 |
| US8259769B1 (en) * | 2008-07-14 | 2012-09-04 | Soraa, Inc. | Integrated total internal reflectors for high-gain laser diodes with high quality cleaved facets on nonpolar/semipolar GaN substrates |
| US8284810B1 (en) * | 2008-08-04 | 2012-10-09 | Soraa, Inc. | Solid state laser device using a selected crystal orientation in non-polar or semi-polar GaN containing materials and methods |
| JP4971508B1 (ja) * | 2011-01-21 | 2012-07-11 | 住友電気工業株式会社 | Iii族窒化物半導体レーザ素子、及びiii族窒化物半導体レーザ素子を作製する方法 |
| JP2013201412A (ja) | 2011-08-05 | 2013-10-03 | Mitsubishi Chemicals Corp | 半導体構造、その製造方法、および六角棒状結晶の製造方法 |
| JP5561489B2 (ja) | 2011-09-02 | 2014-07-30 | 信越半導体株式会社 | GaN自立基板の製造方法 |
| US20140339566A1 (en) * | 2011-12-14 | 2014-11-20 | Seoul Viosys Co., Ltd. | Semiconductor device and method of fabricating the same |
| JP2013247362A (ja) * | 2012-05-29 | 2013-12-09 | Samsung Corning Precision Materials Co Ltd | 半導体素子用薄膜貼り合わせ基板の製造方法 |
| DE102012109594A1 (de) * | 2012-10-09 | 2014-04-10 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines optoelektronischen Halbleiterbauteils und optoelektronisches Halbleiterbauteil |
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| EP3682465A4 (en) | 2017-09-15 | 2021-06-02 | The Regents of The University of California | METHOD OF REMOVING A SUBSTRATE USING A SPREADING TECHNIQUE |
-
2018
- 2018-09-17 EP EP18857235.8A patent/EP3682465A4/en not_active Withdrawn
- 2018-09-17 CN CN201880060140.4A patent/CN111095483B/zh active Active
- 2018-09-17 US US16/642,298 patent/US11508620B2/en active Active
- 2018-09-17 WO PCT/US2018/051375 patent/WO2019055936A1/en not_active Ceased
- 2018-09-17 JP JP2020515181A patent/JP2020534687A/ja active Pending
-
2022
- 2022-09-15 US US17/945,717 patent/US12205847B2/en active Active
- 2022-10-11 JP JP2022163051A patent/JP2022185100A/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006005331A (ja) * | 2004-05-18 | 2006-01-05 | Sumitomo Electric Ind Ltd | Iii族窒化物半導体結晶およびその製造方法、iii族窒化物半導体デバイスおよびその製造方法ならびに発光機器 |
| JP2007096114A (ja) * | 2005-09-29 | 2007-04-12 | Sanyo Electric Co Ltd | 半導体発光素子及び半導体発光素子の製造方法 |
| WO2011021710A1 (ja) * | 2009-08-20 | 2011-02-24 | 株式会社パウデック | 半導体素子およびその製造方法 |
| JP2015504242A (ja) * | 2011-12-14 | 2015-02-05 | ソウル バイオシス カンパニー リミテッドSeoul Viosys Co.,Ltd. | 半導体素子及びそれを製造する方法 |
| JP2013251304A (ja) * | 2012-05-30 | 2013-12-12 | Furukawa Co Ltd | 積層体および積層体の製造方法 |
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Also Published As
| Publication number | Publication date |
|---|---|
| WO2019055936A1 (en) | 2019-03-21 |
| US20230005793A1 (en) | 2023-01-05 |
| US20200203228A1 (en) | 2020-06-25 |
| US12205847B2 (en) | 2025-01-21 |
| EP3682465A1 (en) | 2020-07-22 |
| CN111095483A (zh) | 2020-05-01 |
| JP2022185100A (ja) | 2022-12-13 |
| EP3682465A4 (en) | 2021-06-02 |
| CN111095483B (zh) | 2023-11-28 |
| US11508620B2 (en) | 2022-11-22 |
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