JP2020510838A5 - - Google Patents

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Publication number
JP2020510838A5
JP2020510838A5 JP2019548925A JP2019548925A JP2020510838A5 JP 2020510838 A5 JP2020510838 A5 JP 2020510838A5 JP 2019548925 A JP2019548925 A JP 2019548925A JP 2019548925 A JP2019548925 A JP 2019548925A JP 2020510838 A5 JP2020510838 A5 JP 2020510838A5
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Japan
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optical path
lens
irradiation
detection
light
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JP2019548925A
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Japanese (ja)
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JP2020510838A (ja
JP7216005B2 (ja
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Priority claimed from US15/454,814 external-priority patent/US10365198B2/en
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JP2019548925A 2016-04-21 2017-10-24 焦点可変レンズを用いた粒子特性評価装置 Active JP7216005B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB201606918 2016-04-21
US15/454,814 2017-03-09
US15/454,814 US10365198B2 (en) 2016-04-21 2017-03-09 Particle characterization
PCT/GB2017/053204 WO2018162869A1 (en) 2016-04-21 2017-10-24 Particle characterisation with a focus tuneable lens

Publications (3)

Publication Number Publication Date
JP2020510838A JP2020510838A (ja) 2020-04-09
JP2020510838A5 true JP2020510838A5 (enExample) 2020-12-03
JP7216005B2 JP7216005B2 (ja) 2023-01-31

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JP2019548925A Active JP7216005B2 (ja) 2016-04-21 2017-10-24 焦点可変レンズを用いた粒子特性評価装置

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US (2) US10365198B2 (enExample)
EP (2) EP3593110B1 (enExample)
JP (1) JP7216005B2 (enExample)
CN (2) CN110402380B (enExample)
WO (1) WO2018162869A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
EP3353527B1 (en) 2015-09-23 2022-12-28 Malvern Panalytical Limited Particle characterisation
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
US10365198B2 (en) 2016-04-21 2019-07-30 Malvern Panalytical Limited Particle characterization
US12420355B2 (en) * 2016-11-25 2025-09-23 Glowforge Inc. Laser fabrication with beam detection
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
WO2020011360A1 (de) * 2018-07-12 2020-01-16 Robert Bosch Gmbh Partikelsensor
JP7140193B2 (ja) * 2018-08-01 2022-09-21 株式会社島津製作所 光散乱検出装置
GB201816607D0 (en) * 2018-10-11 2018-11-28 Univ Court Univ St Andrews Light-sheet imaging
CN109030298B (zh) * 2018-11-01 2020-08-21 山东理工大学 一种利用后向散射纳米颗粒粒度测量装置实现的测量方法
CN109030299B (zh) * 2018-11-01 2020-08-21 山东理工大学 高浓度样品的后向散射纳米颗粒粒度测量装置的测量方法
WO2020106036A1 (en) * 2018-11-19 2020-05-28 Samsung Electronics Co., Ltd. Multimodal dust sensor
WO2021236720A1 (en) * 2020-05-20 2021-11-25 Ysi, Inc. Extended solid angle turbidity sensor
CN113029958B (zh) * 2021-04-01 2023-07-25 温州大学 一种用于检测dna变性的动态光散射检测装置
AT525224A1 (de) * 2021-06-21 2023-01-15 Engel Austria Gmbh Verfahren, System und Computerprogrammprodukt zum Überwachen eines Formgebungsprozesses
KR102655295B1 (ko) * 2021-12-30 2024-04-05 (주)인프라칩 유체렌즈를 이용한 미세먼지센서
US20250085191A1 (en) * 2022-07-24 2025-03-13 George Nehmetallah 3D Refractive Index Estimation Based on Partially-Coherent Optical Diffraction Tomography (PC-ODT) and Deep Learning

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4273443A (en) * 1979-11-21 1981-06-16 Coulter Electronics, Inc. Method and apparatus for measurement of reradiation in particle flow cell systems
GB2041516B (en) * 1979-01-02 1983-04-13 Coulter Electronics Methods and apparatus for measurement of reradiation in particle flow cell systems
US4690561A (en) * 1985-01-18 1987-09-01 Canon Kabushiki Kaisha Particle analyzing apparatus
CN87214585U (zh) * 1987-10-20 1988-06-29 地质矿产部海洋地质综合研究大队 显微镜光度计
JP4323571B2 (ja) * 1997-01-31 2009-09-02 エックスワイ, インコーポレイテッド 光学装置
DE19725211C1 (de) * 1997-06-15 1998-06-04 Alv Laser Vertriebsgesellschaf Faserdetektor zur Detektion des Streulichtes oder des Fluoreszenzlichtes einer flüssigen Suspension
US6178346B1 (en) * 1998-10-23 2001-01-23 David C. Amundson Infrared endoscopic imaging in a liquid with suspended particles: method and apparatus
EP1145066B1 (de) * 1998-12-21 2005-03-02 Evotec OAI AG Positionierung des messvolumens in einem scanning-mikroskopischen verfahren
JP2004069494A (ja) 2002-08-06 2004-03-04 Mitsubishi Heavy Ind Ltd 噴流速度計測装置
US6744566B2 (en) * 2002-10-01 2004-06-01 Eastman Kodak Company Symmetric, bi-aspheric lens for use in transmissive and reflective optical fiber components
US20090075391A1 (en) * 2003-01-17 2009-03-19 Newton Laboratories, Inc. Spectroscopic diagnostic method and system based on scattering of polarized light
US9297737B2 (en) 2004-03-06 2016-03-29 Michael Trainer Methods and apparatus for determining characteristics of particles
US10620105B2 (en) * 2004-03-06 2020-04-14 Michael Trainer Methods and apparatus for determining characteristics of particles from scattered light
US20070242269A1 (en) * 2004-03-06 2007-10-18 Michael Trainer Methods and apparatus for determining characteristics of particles
US20140226158A1 (en) * 2004-03-06 2014-08-14 Michael Trainer Methods and apparatus for determining particle characteristics
JP2006047064A (ja) 2004-08-03 2006-02-16 Sumitomo Chemical Co Ltd 粒子径分布測定方法および粒子径分布測定装置
KR100817854B1 (ko) * 2006-09-19 2008-03-31 재단법인서울대학교산학협력재단 라만 산란광 및 광산란의 동시 검출 장치
CN101482572B (zh) * 2008-01-11 2012-07-04 株式会社东芝 自动分析装置以及自动分析方法
KR100968352B1 (ko) * 2008-01-31 2010-07-08 정철우 수중 조명등 제어장치
US7999936B1 (en) * 2008-04-03 2011-08-16 N&K Technology, Inc. Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density
US8427641B2 (en) * 2008-12-18 2013-04-23 Azbil BioVigilant, Inc. Compact detector for simultaneous particle size and fluorescence detection
KR101545419B1 (ko) * 2011-02-10 2015-08-18 가부시키가이샤 히다치 하이테크놀로지즈 이물 검출 장치 및 이물 검출 방법
CN105891304B (zh) 2011-06-15 2018-10-23 马尔文仪器有限公司 表面电荷测量
EP2741843B1 (en) * 2011-08-09 2020-02-12 TSI, Incorporated System and method for converting optical diameters of aerosol particles to mobility and aerodynamic diameters
JP6244308B2 (ja) * 2011-12-09 2017-12-06 ルーメンタム オペレーションズ エルエルシーLumentum Operations LLC レーザービームのビームパラメータ積を変動させること
US9746412B2 (en) 2012-05-30 2017-08-29 Iris International, Inc. Flow cytometer
CN102818759B (zh) * 2012-07-19 2015-04-15 华中科技大学 一种基于光散射的湿性颗粒形状参数在线测量系统及方法
CA2920132C (en) * 2012-10-24 2021-03-02 The Regents Of The University Of California System and method for deforming and analyzing particles
KR102101350B1 (ko) * 2013-03-15 2020-04-17 삼성전자주식회사 파티클 카운터 및 그를 구비한 임멀젼 노광 설비
EP2808669B1 (de) * 2013-05-31 2015-03-04 Durag GmbH Vorrichtung zur Messung von Streulicht aus einem Messvolumen unter Kompensation von Hintergrundsignalen
DE102013211885A1 (de) * 2013-06-24 2014-12-24 Siemens Aktiengesellschaft Partikeldetektor und Verfahren zur Detektion von Partikeln
GB201415783D0 (en) 2014-09-05 2014-10-22 Malvern Instr Ltd Particle characterisation
US9933351B2 (en) * 2015-03-06 2018-04-03 Scanit Technologies, Inc. Personal airborne particle monitor with quantum dots
FR3048240B1 (fr) * 2016-02-29 2018-04-13 Cordouan Tech Dispositif de caracterisation de particules dispersees dans un milieu liquide
US10365198B2 (en) 2016-04-21 2019-07-30 Malvern Panalytical Limited Particle characterization
CN106333650B (zh) * 2016-09-26 2019-05-07 华南师范大学 一种多尺度光声显微成像装置及其方法
DE202016006846U1 (de) 2016-11-07 2016-12-23 Particle Metrix Gmbh Vorrichtung zum Messen der Konzentration und der Größe von Nanopartikeln in Flüssigkeiten im Streulichtmodus und im Fluoreszenzmodus

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