JP7216005B2 - 焦点可変レンズを用いた粒子特性評価装置 - Google Patents
焦点可変レンズを用いた粒子特性評価装置 Download PDFInfo
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- JP7216005B2 JP7216005B2 JP2019548925A JP2019548925A JP7216005B2 JP 7216005 B2 JP7216005 B2 JP 7216005B2 JP 2019548925 A JP2019548925 A JP 2019548925A JP 2019548925 A JP2019548925 A JP 2019548925A JP 7216005 B2 JP7216005 B2 JP 7216005B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/447—Systems using electrophoresis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/075—Investigating concentration of particle suspensions by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
- G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/03—Electro-optical investigation of a plurality of particles, the analyser being characterised by the optical arrangement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
- G01N2021/4728—Optical definition of scattering volume
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/416—Systems
- G01N27/447—Systems using electrophoresis
- G01N27/44704—Details; Accessories
- G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
- G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Molecular Biology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optics & Photonics (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB201606918 | 2016-04-21 | ||
| US15/454,814 US10365198B2 (en) | 2016-04-21 | 2017-03-09 | Particle characterization |
| US15/454,814 | 2017-03-09 | ||
| PCT/GB2017/053204 WO2018162869A1 (en) | 2016-04-21 | 2017-10-24 | Particle characterisation with a focus tuneable lens |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020510838A JP2020510838A (ja) | 2020-04-09 |
| JP2020510838A5 JP2020510838A5 (enExample) | 2020-12-03 |
| JP7216005B2 true JP7216005B2 (ja) | 2023-01-31 |
Family
ID=60088999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019548925A Active JP7216005B2 (ja) | 2016-04-21 | 2017-10-24 | 焦点可変レンズを用いた粒子特性評価装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US10365198B2 (enExample) |
| EP (2) | EP3593110B1 (enExample) |
| JP (1) | JP7216005B2 (enExample) |
| CN (2) | CN110402380B (enExample) |
| WO (1) | WO2018162869A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11002655B2 (en) | 2015-09-23 | 2021-05-11 | Malvern Panalytical Limited | Cuvette carrier |
| EP4215900A1 (en) | 2015-09-23 | 2023-07-26 | Malvern Panalytical Limited | Particle characterisation |
| GB201604460D0 (en) * | 2016-03-16 | 2016-04-27 | Malvern Instr Ltd | Dynamic light scattering |
| US10365198B2 (en) | 2016-04-21 | 2019-07-30 | Malvern Panalytical Limited | Particle characterization |
| US12420355B2 (en) * | 2016-11-25 | 2025-09-23 | Glowforge Inc. | Laser fabrication with beam detection |
| EP3379232A1 (en) | 2017-03-23 | 2018-09-26 | Malvern Panalytical Limited | Particle characterisation |
| WO2020011360A1 (de) * | 2018-07-12 | 2020-01-16 | Robert Bosch Gmbh | Partikelsensor |
| WO2020026704A1 (ja) * | 2018-08-01 | 2020-02-06 | 株式会社島津製作所 | 光散乱検出装置 |
| GB201816607D0 (en) * | 2018-10-11 | 2018-11-28 | Univ Court Univ St Andrews | Light-sheet imaging |
| CN109030298B (zh) * | 2018-11-01 | 2020-08-21 | 山东理工大学 | 一种利用后向散射纳米颗粒粒度测量装置实现的测量方法 |
| CN109030299B (zh) * | 2018-11-01 | 2020-08-21 | 山东理工大学 | 高浓度样品的后向散射纳米颗粒粒度测量装置的测量方法 |
| WO2020106036A1 (en) * | 2018-11-19 | 2020-05-28 | Samsung Electronics Co., Ltd. | Multimodal dust sensor |
| WO2021236726A1 (en) * | 2020-05-20 | 2021-11-25 | Ysi, Inc. | Swept frequency fluorometer |
| CN113029958B (zh) * | 2021-04-01 | 2023-07-25 | 温州大学 | 一种用于检测dna变性的动态光散射检测装置 |
| AT525224A1 (de) * | 2021-06-21 | 2023-01-15 | Engel Austria Gmbh | Verfahren, System und Computerprogrammprodukt zum Überwachen eines Formgebungsprozesses |
| KR102655295B1 (ko) * | 2021-12-30 | 2024-04-05 | (주)인프라칩 | 유체렌즈를 이용한 미세먼지센서 |
| US20250085191A1 (en) * | 2022-07-24 | 2025-03-13 | George Nehmetallah | 3D Refractive Index Estimation Based on Partially-Coherent Optical Diffraction Tomography (PC-ODT) and Deep Learning |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004069494A (ja) | 2002-08-06 | 2004-03-04 | Mitsubishi Heavy Ind Ltd | 噴流速度計測装置 |
| JP2006047064A (ja) | 2004-08-03 | 2006-02-16 | Sumitomo Chemical Co Ltd | 粒子径分布測定方法および粒子径分布測定装置 |
| WO2016034902A1 (en) | 2014-09-05 | 2016-03-10 | Malvern Instruments Limited | A particle characterization method and apparatus |
| DE202016006846U1 (de) | 2016-11-07 | 2016-12-23 | Particle Metrix Gmbh | Vorrichtung zum Messen der Konzentration und der Größe von Nanopartikeln in Flüssigkeiten im Streulichtmodus und im Fluoreszenzmodus |
Family Cites Families (33)
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| US4273443A (en) * | 1979-11-21 | 1981-06-16 | Coulter Electronics, Inc. | Method and apparatus for measurement of reradiation in particle flow cell systems |
| FR2445962A1 (fr) * | 1979-01-02 | 1980-08-01 | Coulter Electronics | Procede et dispositif pour mesurer la reradiation d'une particule dans des systemes a chambre d'ecoulement |
| US4690561A (en) * | 1985-01-18 | 1987-09-01 | Canon Kabushiki Kaisha | Particle analyzing apparatus |
| CN87214585U (zh) * | 1987-10-20 | 1988-06-29 | 地质矿产部海洋地质综合研究大队 | 显微镜光度计 |
| JP4323571B2 (ja) * | 1997-01-31 | 2009-09-02 | エックスワイ, インコーポレイテッド | 光学装置 |
| DE19725211C1 (de) * | 1997-06-15 | 1998-06-04 | Alv Laser Vertriebsgesellschaf | Faserdetektor zur Detektion des Streulichtes oder des Fluoreszenzlichtes einer flüssigen Suspension |
| US6178346B1 (en) * | 1998-10-23 | 2001-01-23 | David C. Amundson | Infrared endoscopic imaging in a liquid with suspended particles: method and apparatus |
| WO2000037984A2 (de) * | 1998-12-21 | 2000-06-29 | Evotec Biosystems Ag | Positionierung des messvolumens in einem scanning-mikroskopischen verfahren |
| US6744566B2 (en) * | 2002-10-01 | 2004-06-01 | Eastman Kodak Company | Symmetric, bi-aspheric lens for use in transmissive and reflective optical fiber components |
| US20090075391A1 (en) * | 2003-01-17 | 2009-03-19 | Newton Laboratories, Inc. | Spectroscopic diagnostic method and system based on scattering of polarized light |
| US20140226158A1 (en) * | 2004-03-06 | 2014-08-14 | Michael Trainer | Methods and apparatus for determining particle characteristics |
| US9297737B2 (en) | 2004-03-06 | 2016-03-29 | Michael Trainer | Methods and apparatus for determining characteristics of particles |
| US20070242269A1 (en) * | 2004-03-06 | 2007-10-18 | Michael Trainer | Methods and apparatus for determining characteristics of particles |
| US10620105B2 (en) * | 2004-03-06 | 2020-04-14 | Michael Trainer | Methods and apparatus for determining characteristics of particles from scattered light |
| KR100817854B1 (ko) * | 2006-09-19 | 2008-03-31 | 재단법인서울대학교산학협력재단 | 라만 산란광 및 광산란의 동시 검출 장치 |
| CN101482572B (zh) * | 2008-01-11 | 2012-07-04 | 株式会社东芝 | 自动分析装置以及自动分析方法 |
| KR100968352B1 (ko) * | 2008-01-31 | 2010-07-08 | 정철우 | 수중 조명등 제어장치 |
| US7999936B1 (en) * | 2008-04-03 | 2011-08-16 | N&K Technology, Inc. | Combined transmittance and angle selective scattering measurement of fluid suspended particles for simultaneous determination of refractive index, extinction coefficient, particle size and particle density |
| CN102308196B (zh) * | 2008-12-18 | 2014-02-05 | 百维吉伦特系统有限公司 | 用于同时检测粒子的尺寸和荧光性的紧凑型检测器 |
| JP5615941B2 (ja) * | 2011-02-10 | 2014-10-29 | 株式会社日立ハイテクノロジーズ | 異物検出装置及び異物検出方法 |
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-
2017
- 2017-03-09 US US15/454,814 patent/US10365198B2/en active Active
- 2017-10-24 CN CN201780087992.8A patent/CN110402380B/zh active Active
- 2017-10-24 CN CN202210330431.9A patent/CN114778393B/zh active Active
- 2017-10-24 EP EP17794045.9A patent/EP3593110B1/en active Active
- 2017-10-24 JP JP2019548925A patent/JP7216005B2/ja active Active
- 2017-10-24 EP EP23201298.9A patent/EP4372361A1/en active Pending
- 2017-10-24 US US16/492,329 patent/US11054356B2/en active Active
- 2017-10-24 WO PCT/GB2017/053204 patent/WO2018162869A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004069494A (ja) | 2002-08-06 | 2004-03-04 | Mitsubishi Heavy Ind Ltd | 噴流速度計測装置 |
| JP2006047064A (ja) | 2004-08-03 | 2006-02-16 | Sumitomo Chemical Co Ltd | 粒子径分布測定方法および粒子径分布測定装置 |
| WO2016034902A1 (en) | 2014-09-05 | 2016-03-10 | Malvern Instruments Limited | A particle characterization method and apparatus |
| DE202016006846U1 (de) | 2016-11-07 | 2016-12-23 | Particle Metrix Gmbh | Vorrichtung zum Messen der Konzentration und der Größe von Nanopartikeln in Flüssigkeiten im Streulichtmodus und im Fluoreszenzmodus |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2018162869A1 (en) | 2018-09-13 |
| EP3593110A1 (en) | 2020-01-15 |
| JP2020510838A (ja) | 2020-04-09 |
| EP4372361A1 (en) | 2024-05-22 |
| US20170307495A1 (en) | 2017-10-26 |
| US10365198B2 (en) | 2019-07-30 |
| CN110402380B (zh) | 2022-06-10 |
| CN110402380A (zh) | 2019-11-01 |
| US20200166446A1 (en) | 2020-05-28 |
| EP3593110B1 (en) | 2023-10-04 |
| CN114778393A (zh) | 2022-07-22 |
| CN114778393B (zh) | 2025-12-05 |
| US11054356B2 (en) | 2021-07-06 |
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