DK1145066T3 - Positionering af målevolumen i en scanningsmikroskopisk fremgangsmåde - Google Patents

Positionering af målevolumen i en scanningsmikroskopisk fremgangsmåde

Info

Publication number
DK1145066T3
DK1145066T3 DK99967963T DK99967963T DK1145066T3 DK 1145066 T3 DK1145066 T3 DK 1145066T3 DK 99967963 T DK99967963 T DK 99967963T DK 99967963 T DK99967963 T DK 99967963T DK 1145066 T3 DK1145066 T3 DK 1145066T3
Authority
DK
Denmark
Prior art keywords
optic
positioning
radiation source
measurement volume
microscopic method
Prior art date
Application number
DK99967963T
Other languages
English (en)
Inventor
Juergen Rolf Dr Mueller
Karsten Dr Henco
Rodney Turner
Peter Axhausen
Rolf Dr Guenther
Original Assignee
Evotec Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE1998160549 external-priority patent/DE19860549A1/de
Application filed by Evotec Ag filed Critical Evotec Ag
Application granted granted Critical
Publication of DK1145066T3 publication Critical patent/DK1145066T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G01N2021/6439—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes" with indicators, stains, dyes, tags, labels, marks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6445—Measuring fluorescence polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
DK99967963T 1998-12-21 1999-12-21 Positionering af målevolumen i en scanningsmikroskopisk fremgangsmåde DK1145066T3 (da)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11347898P 1998-12-21 1998-12-21
DE1998160549 DE19860549A1 (de) 1998-12-21 1998-12-21 Scanning-mikroskopisches Verfahren mit hoher axialer Auflösung
EP98124314 1998-12-21
EP99967963A EP1145066B1 (de) 1998-12-21 1999-12-21 Positionierung des messvolumens in einem scanning-mikroskopischen verfahren

Publications (1)

Publication Number Publication Date
DK1145066T3 true DK1145066T3 (da) 2005-07-04

Family

ID=27218904

Family Applications (1)

Application Number Title Priority Date Filing Date
DK99967963T DK1145066T3 (da) 1998-12-21 1999-12-21 Positionering af målevolumen i en scanningsmikroskopisk fremgangsmåde

Country Status (7)

Country Link
US (1) US7202953B1 (da)
EP (1) EP1145066B1 (da)
JP (1) JP4945025B2 (da)
AT (1) ATE290229T1 (da)
DE (1) DE59911709D1 (da)
DK (1) DK1145066T3 (da)
WO (1) WO2000037984A2 (da)

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JP4914715B2 (ja) * 2004-06-21 2012-04-11 オリンパス株式会社 倒立顕微鏡システム
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JP6396774B2 (ja) * 2014-12-02 2018-09-26 浜松ホトニクス株式会社 画像取得装置及び画像取得方法
JP6535190B2 (ja) * 2015-03-23 2019-06-26 オルガノ株式会社 樹脂粒子に吸着した有機物の吸着状態判定方法及び水処理システムの管理方法
JP6550673B2 (ja) * 2015-04-03 2019-07-31 国立大学法人 東京大学 フォトルミネセンス寿命測定装置及び測定方法
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EP3287829A1 (en) * 2016-08-25 2018-02-28 Deutsches Krebsforschungszentrum Method of and microscope with installation for focus stabilization
EP3538941A4 (en) 2016-11-10 2020-06-17 The Trustees of Columbia University in the City of New York METHODS FOR FAST IMAGING OF HIGH RESOLUTION LARGE SAMPLES
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Also Published As

Publication number Publication date
US7202953B1 (en) 2007-04-10
ATE290229T1 (de) 2005-03-15
WO2000037984A2 (de) 2000-06-29
JP4945025B2 (ja) 2012-06-06
JP2002533686A (ja) 2002-10-08
WO2000037984A3 (de) 2001-10-18
EP1145066B1 (de) 2005-03-02
EP1145066A3 (de) 2002-09-11
DE59911709D1 (de) 2005-04-07
EP1145066A2 (de) 2001-10-17

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