JP2020095244A5 - - Google Patents
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- JP2020095244A5 JP2020095244A5 JP2019137785A JP2019137785A JP2020095244A5 JP 2020095244 A5 JP2020095244 A5 JP 2020095244A5 JP 2019137785 A JP2019137785 A JP 2019137785A JP 2019137785 A JP2019137785 A JP 2019137785A JP 2020095244 A5 JP2020095244 A5 JP 2020095244A5
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- 238000001459 lithography Methods 0.000 claims description 33
- 239000000758 substrate Substances 0.000 claims description 20
- 238000005259 measurement Methods 0.000 claims description 9
- 230000003287 optical effect Effects 0.000 claims 32
- 238000000034 method Methods 0.000 claims 29
- 238000004519 manufacturing process Methods 0.000 claims 3
- 238000003384 imaging method Methods 0.000 description 1
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW108138343A TWI821436B (zh) | 2018-11-30 | 2019-10-24 | 微影裝置、確定方法及製造物品的方法 |
| EP19209488.6A EP3667423B1 (en) | 2018-11-30 | 2019-11-15 | Lithography apparatus, determination method, and method of manufacturing an article |
| KR1020190148416A KR102605876B1 (ko) | 2018-11-30 | 2019-11-19 | 리소그래피 장치, 판정 방법, 및 물품 제조 방법 |
| US16/691,334 US11275319B2 (en) | 2018-11-30 | 2019-11-21 | Lithography apparatus, determination method, and method of manufacturing an article |
| CN201911169433.9A CN111258183B (zh) | 2018-11-30 | 2019-11-26 | 光刻设备、确定方法和制造物品的方法 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018225476 | 2018-11-30 | ||
| JP2018225476 | 2018-11-30 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2020095244A JP2020095244A (ja) | 2020-06-18 |
| JP2020095244A5 true JP2020095244A5 (enExample) | 2022-07-20 |
| JP7353846B2 JP7353846B2 (ja) | 2023-10-02 |
Family
ID=71084083
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019137785A Active JP7353846B2 (ja) | 2018-11-30 | 2019-07-26 | リソグラフィ装置、判定方法、および物品の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7353846B2 (enExample) |
| TW (1) | TWI821436B (enExample) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1027743A (ja) * | 1996-07-11 | 1998-01-27 | Canon Inc | 投影露光装置、デバイス製造方法及び収差補正光学系 |
| JP2003084189A (ja) | 2001-09-07 | 2003-03-19 | Canon Inc | オートフォーカス検出方法および投影露光装置 |
| TWI396225B (zh) * | 2004-07-23 | 2013-05-11 | 尼康股份有限公司 | 成像面測量方法、曝光方法、元件製造方法以及曝光裝置 |
| JP2014527312A (ja) | 2011-09-16 | 2014-10-09 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィパターニングデバイスを監視する装置 |
| JP6818501B2 (ja) * | 2016-10-19 | 2021-01-20 | キヤノン株式会社 | リソグラフィ装置、および物品製造方法 |
-
2019
- 2019-07-26 JP JP2019137785A patent/JP7353846B2/ja active Active
- 2019-10-24 TW TW108138343A patent/TWI821436B/zh active
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