JP2020013997A - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
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- JP2020013997A JP2020013997A JP2019129363A JP2019129363A JP2020013997A JP 2020013997 A JP2020013997 A JP 2020013997A JP 2019129363 A JP2019129363 A JP 2019129363A JP 2019129363 A JP2019129363 A JP 2019129363A JP 2020013997 A JP2020013997 A JP 2020013997A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 72
- 239000000758 substrate Substances 0.000 claims abstract description 69
- 239000011810 insulating material Substances 0.000 claims abstract description 5
- 238000005530 etching Methods 0.000 claims description 59
- 238000002955 isolation Methods 0.000 claims description 33
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 28
- 229910052710 silicon Inorganic materials 0.000 claims description 28
- 239000010703 silicon Substances 0.000 claims description 28
- 125000006850 spacer group Chemical group 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 17
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 16
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 16
- 230000000149 penetrating effect Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 description 88
- 239000010410 layer Substances 0.000 description 46
- 238000004519 manufacturing process Methods 0.000 description 30
- 239000011229 interlayer Substances 0.000 description 29
- 229910052751 metal Inorganic materials 0.000 description 18
- 239000002184 metal Substances 0.000 description 18
- 230000004888 barrier function Effects 0.000 description 11
- 239000007789 gas Substances 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 238000000231 atomic layer deposition Methods 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 8
- 150000004767 nitrides Chemical class 0.000 description 8
- 229910052814 silicon oxide Inorganic materials 0.000 description 7
- 239000012535 impurity Substances 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 238000001312 dry etching Methods 0.000 description 5
- 238000005498 polishing Methods 0.000 description 5
- 229910021332 silicide Inorganic materials 0.000 description 5
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 5
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 238000004151 rapid thermal annealing Methods 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 3
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 3
- 239000012159 carrier gas Substances 0.000 description 3
- 230000003647 oxidation Effects 0.000 description 3
- 238000007254 oxidation reaction Methods 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- -1 GaP Chemical class 0.000 description 2
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- 230000015572 biosynthetic process Effects 0.000 description 2
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- 239000010941 cobalt Substances 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
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- 238000000059 patterning Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- 229910016909 AlxOy Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910005540 GaP Inorganic materials 0.000 description 1
- 229910005542 GaSb Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
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- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 229920000592 inorganic polymer Polymers 0.000 description 1
- 238000005224 laser annealing Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- RUFLMLWJRZAWLJ-UHFFFAOYSA-N nickel silicide Chemical compound [Ni]=[Si]=[Ni] RUFLMLWJRZAWLJ-UHFFFAOYSA-N 0.000 description 1
- 229910021334 nickel silicide Inorganic materials 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 229920003209 poly(hydridosilsesquioxane) Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229910021426 porous silicon Inorganic materials 0.000 description 1
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910021341 titanium silicide Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
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Abstract
Description
図1乃至図20は、本発明の実施例による半導体装置の製造方法のステップを説明するための平面図及び断面図である。具体的に、図1、4、7、10、及び13は平面図であり、図2−3、5−6、8−9、11−12、及び14−20は、断面図である。
120 素子分離パターン
140 ダミーゲート電極
200 ソース/ドレイン層
210 第1の層間絶縁膜
270 ゲート電極構造物
300 エッチング阻止膜
Claims (20)
- 第1及び第2の領域を含む基板の前記第1の領域上に形成されたゲート電極構造物と;
キャップ構造物であり、
前記ゲート電極構造物の上面を覆い、
キャップパターンと、
前記キャップパターンの底面及び側壁を覆う第1のエッチング阻止パターンと、
を備える、キャップ構造物と;
前記基板の第2の領域上に形成され、絶縁物質を含む、アラインキーと;
充填構造物であり、
前記基板の第2の領域上に形成され、前記アラインキーの側壁を覆い、
第1の充填パターンと、
前記第1の充填パターンの底面及び側壁を覆う第2の充填パターンと、
前記第2の充填パターンの底面及び側壁を覆う第2のエッチング阻止パターンと、
を備える、充填構造物と;
を含む、半導体装置。 - 前記キャップパターン及び前記第2の充填パターンは、互いに同一の物質を含み、
前記第1のエッチング阻止パターン及び前記第2のエッチング阻止パターンは、互いに同一の物質を含む、
請求項1に記載の半導体装置。 - 前記キャップパターン及び前記第2の充填パターンは、シリコン酸炭化物(SiOC)を含み、
前記第1のエッチング阻止パターン及び前記第2のエッチング阻止パターンは、シリコン窒化物(SiN)、シリコン酸窒化物(SiON)、又は、シリコン炭窒化物(SiCN)を含む、
請求項2に記載の半導体装置。 - 前記アラインキー及び前記第1の充填パターンは、酸化物を含む、
請求項1または2に記載の半導体装置。 - 前記充填構造物の幅は、前記キャップ構造物の幅よりも大きい、
請求項1または2に記載の半導体装置。 - 前記充填構造物の底面は、前記アラインキーの底面よりも低い、
請求項1または2に記載の半導体装置。 - 前記半導体装置は、更に、
前記ゲート電極構造物の側壁を覆うゲートスペーサを含み、
前記キャップ構造物は、前記ゲート電極構造物の上面、及び、前記ゲートスペーサの上面を覆う、
請求項1に記載の半導体装置。 - 前記半導体装置は、更に、
前記キャップ構造物を貫通して、前記ゲート電極構造物の上面に接触する第1のコンタクトプラグ、を含む、
請求項1に記載の半導体装置。 - 前記ゲート電極構造物は、前記基板の上面から突出したアクティブフィン上に形成され、更に、
前記ゲート電極構造物に隣接する前記アクティブフィン上に形成されたソース/ドレイン層と、
前記ソース/ドレイン層の上面に接触する第2のコンタクトプラグと、を含む、
請求項1に記載の半導体装置。 - 前記ゲート電極構造物は、前記アクティブフィンの上面に順次に積層されたインタフェースパターン、ゲート絶縁パターン、仕事関数調節パターン、及び、ゲート電極、を含む、
請求項9に記載の半導体装置。 - 第1及び第2の領域を含む基板の前記第1の領域上に形成された導電構造物と、
キャップ構造物であり、
前記導電構造物の上面を覆い、
シリコン酸炭化物(SiOC)を有するキャップパターンと、
前記キャップパターンの底面及び側壁を覆い、前記キャップパターンに対して、第1のエッチング選択比を有する物質を含む第1のエッチング阻止パターンと、
を備える、キャップ構造物と;
前記基板の第2の領域上に形成され、前記キャップパターンに対して、前記第1のエッチング選択比よりも低い第2のエッチング選択比を有する物質を備える、アラインキーと;
充填構造物であり、
前記基板の第2の領域上に形成され、前記アラインキーの側壁を覆い、
第1の充填パターンと、
前記第1の充填パターンの底面及び側壁を覆い、前記キャップパターンと同一の物質を有する、第2の充填パターンと、
前記第2の充填パターンの底面及び側壁を覆い、前記第1のエッチング阻止パターンと同一の物質を含む、第2のエッチング阻止パターンと、
を備える、充填構造物と;
を含む、半導体装置。 - 前記第1のエッチング阻止パターン及び前記第2のエッチング阻止パターンは、シリコン窒化物(SiN)、シリコン酸窒化物(SiON)、又は、シリコン炭窒化物(SiCN)を含む、
請求項11に記載の半導体装置。 - 前記アラインキー及び前記第1の充填パターンは、酸化物を含む、
請求項11または12に記載の半導体装置。 - 前記充填構造物の幅は、前記キャップ構造物の幅よりも大きい、
請求項11または12に記載の半導体装置。 - 前記充填構造物の底面は、前記アラインキーの底面よりも低い、
請求項11または12に記載の半導体装置。 - 基板上に形成された素子分離パターンにより、前記基板上で定義されるアクティブ領域と;
前記アクティブ領域及び前記素子分離パターン上に形成されたゲート電極構造物と;
キャップ構造物であり、
前記ゲート電極構造物の上面を覆い、
シリコン酸炭化物(SiOC)を含むキャップパターンと、
前記キャップパターンの底面及び側壁を覆い、シリコン窒化物(SiN)、シリコン酸窒化物(SiON)、又は、シリコン炭窒化物(SiCN)を含む、エッチング阻止パターンと、
を備える、キャップ構造物と;
前記ゲート電極構造物に隣接する前記アクティブ領域上に形成された、ソース/ドレイン層と;
を含む、半導体装置。 - 前記半導体装置は、更に、
前記ゲート電極構造物の側壁を覆うゲートスペーサを含み、
前記キャップ構造物は、前記ゲート電極構造物の上面、及び、前記ゲートスペーサの上面を覆う、
請求項16に記載の半導体装置。 - 前記半導体装置は、更に、
前記キャップ構造物を貫通して、前記ゲート電極構造物の上面に接触する、第1のコンタクトプラグと、
前記ソース/ドレイン層の上面に接触する、第2のコンタクトプラグと、を含む、
請求項16または17に記載の半導体装置。 - 前記アクティブ領域は、前記基板の上面から突出して、前記素子分離パターンの上面よりも高い上面を有する、アクティブフィンを含む、
請求項16に記載の半導体装置。 - 前記ゲート電極構造物は、前記アクティブフィンの上面に順次に積層されたインタフェースパターン、ゲート絶縁パターン、仕事関数調節パターン、及び、ゲート電極を含む、
請求項19に記載の半導体装置。
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