JP2019075494A - Grinding method and grinding device of workpiece - Google Patents

Grinding method and grinding device of workpiece Download PDF

Info

Publication number
JP2019075494A
JP2019075494A JP2017201728A JP2017201728A JP2019075494A JP 2019075494 A JP2019075494 A JP 2019075494A JP 2017201728 A JP2017201728 A JP 2017201728A JP 2017201728 A JP2017201728 A JP 2017201728A JP 2019075494 A JP2019075494 A JP 2019075494A
Authority
JP
Japan
Prior art keywords
workpiece
grinding
thickness
chuck table
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2017201728A
Other languages
Japanese (ja)
Other versions
JP7015139B2 (en
Inventor
敬祐 山本
Keisuke Yamamoto
敬祐 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Disco Corp
Original Assignee
Disco Abrasive Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disco Abrasive Systems Ltd filed Critical Disco Abrasive Systems Ltd
Priority to JP2017201728A priority Critical patent/JP7015139B2/en
Priority to TW107136178A priority patent/TWI772535B/en
Publication of JP2019075494A publication Critical patent/JP2019075494A/en
Application granted granted Critical
Publication of JP7015139B2 publication Critical patent/JP7015139B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

To prevent unintended grinding of a surface protective member stuck to a surface side of a workpiece by a grind stone in a grinding device.SOLUTION: A grinding method for a workpiece includes a step of covering a workpiece surface with a protective member, a step of holding the workpiece on a holding surface of a chuck table 30, a thickness measurement step of bringing a thickness measuring instrument 382 into contact with the surface of the workpiece opposite to the workpiece holding surface and measuring a thickness, and then calculating a variation from measured first thickness data and second thickness data measured upon elapsing arbitrary time from the moment in time when the first thickness data is measured, and a step of grinding a reverse face of the workpiece. In the thickness measurement step, if the calculated variation is less than a previously registered threshold level, a determination is made that the surface of the workpiece in contact with the thickness measuring instrument 382 is the reverse face of the workpiece and grinding is started, and if the calculated variation exceeds the previously registered threshold level, a determination is made that the surface of the workpiece in contact with the thickness measuring instrument 382 is a surface protective member and grinding is not started.SELECTED DRAWING: Figure 5

Description

本発明は、半導体ウエーハ等の板状の被加工物を研削する方法及び該被加工物を研削する研削装置に関する。   The present invention relates to a method for grinding a plate-like workpiece such as a semiconductor wafer and a grinding apparatus for grinding the workpiece.

ICやLSI等のデバイスが複数表面に形成された被加工物は、その裏面が研削されて所定の厚さに薄化され、さらに、ダイシング装置等の分割装置によって個々のデバイスチップに分割されて各種電子機器に利用される。   The back surface of the workpiece with IC and LSI devices formed on multiple surfaces is ground and thinned to a predetermined thickness, and then divided into individual device chips by a dividing device such as a dicing device. Used in various electronic devices.

被加工物の裏面を研削する研削装置(例えば、特許文献1参照)は、表面保護部材が貼着された被加工物の表面側を保持するチャックテーブルと、チャックテーブルに保持された被加工物の裏面を研削する研削砥石を回転可能に支持する研削手段とを備えており、被加工物を効率よく研削することができる。   A grinding apparatus (see Patent Document 1, for example) for grinding the back surface of a workpiece comprises a chuck table for holding the surface side of the workpiece to which a surface protection member is attached, and the workpiece held by the chuck table And a grinding means for rotatably supporting a grinding wheel for grinding the back surface of the workpiece, and the workpiece can be ground efficiently.

特許第5025200号公報Patent No. 5025200 gazette

しかしながら、上記のような研削装置においては、被加工物をチャックテーブルで保持する際、誤って表面保護部材で覆われていない被加工物の裏面側をチャックテーブルの保持面で吸着してしまうことがある。被加工物の裏面側をチャックテーブルで吸着した場合、被加工物の表面側の表面保護部材を研削砥石が研削することになり、加工不良により研削砥石を回転させるモータの電流値が許容値を超えてしまい、研削装置のフルオート動作が停止される事態が生じ得る。このような場合、研削砥石をドレス(目立て)して正常な状態に戻す必要があり、研削装置のダウンタイムの増加にも繋がってしまう。   However, in the grinding apparatus as described above, when the workpiece is held by the chuck table, the back surface side of the workpiece which is not covered by the surface protection member is accidentally attracted by the holding surface of the chuck table. There is. When the back side of the workpiece is absorbed by the chuck table, the grinding wheel grinds the surface protection member on the front side of the workpiece, and the current value of the motor that rotates the grinding wheel due to processing defects It may happen that the full-automatic operation of the grinding device is stopped. In such a case, it is necessary to dress (set up) the grinding wheel to return to a normal state, which leads to an increase in the downtime of the grinding apparatus.

よって、研削装置においては、研削砥石で被加工物の表面側に貼着された表面保護部材を誤って研削してしまうことがないようにするという課題がある。   Therefore, in the grinding apparatus, there is a problem that the surface protection member stuck on the surface side of the workpiece by the grinding stone is not accidentally ground.

上記課題を解決するための本発明は、格子状に形成された複数の分割予定ラインにより区画された領域にデバイスが形成された表面を有する被加工物の裏面を研削砥石で研削する被加工物の研削方法であって、被加工物の表面を表面保護部材で覆う表面保護ステップと、該表面保護ステップを実施した後、該被加工物を軸方向が鉛直方向である回転軸で回転可能なチャックテーブルの保持面で保持する保持ステップと、該保持ステップを実施した後、該被加工物のチャックテーブルで保持された面と反対側の面に厚み測定器を接触させて被加工物の厚みを測定し、測定した第1の厚みデータと該第1の厚みデータを測定した時点から任意の時間経過後に測定した第2の厚みデータとからその変化量を算出する厚み測定ステップと、該厚み測定ステップを実施した後、該保持面と直交する回転軸で回転する研削砥石で研削水を供給しながら被加工物の裏面を研削する研削ステップと、を備え、該厚み測定ステップでは、算出した該変化量が予め登録したしきい値以下であれば、該厚み測定器が接触した被加工物の該面が該厚み測定器の沈み込みが発生し難い被加工物の裏面であると判断し該研削ステップを開始し、算出した該変化量が該予め登録したしきい値を越えていれば、該厚み測定器が接触した被加工物の該面が該厚み測定器の沈み込みが発生しやすい該表面保護部材であると判断し該研削ステップを開始しない研削方法である。   The present invention for solving the above problems is a workpiece that has a surface on which a device is formed in a region partitioned by a plurality of planned dividing lines formed in a grid, and the back surface of the workpiece is ground with a grinding stone And a surface protection step of covering the surface of the workpiece with a surface protection member, and after performing the surface protection step, the workpiece can be rotated on a rotation axis whose axial direction is the vertical direction. After carrying out the holding step held by the holding surface of the chuck table and the holding step, the thickness measuring device is brought into contact with the surface opposite to the surface held by the chuck table of the workpiece to make the thickness of the workpiece A thickness measurement step of calculating the amount of change from the first thickness data measured and the second thickness data measured after an arbitrary time from the time of measuring the first thickness data, and the thickness Measurement And performing a grinding step of grinding the back surface of the workpiece while supplying grinding water with a grinding wheel rotating on a rotation axis orthogonal to the holding surface, and calculating the thickness in the thickness measurement step. If the amount of change is equal to or less than a pre-registered threshold value, it is determined that the surface of the workpiece to which the thickness measuring device is in contact is the back surface of the workpiece where the thickness measuring device hardly sinks. The grinding step is started, and if the calculated amount of change exceeds the pre-registered threshold value, the surface of the workpiece to which the thickness measuring device is in contact tends to cause the thickness measuring device to sink. It is a grinding method which judges that it is the surface protection member and does not start the grinding step.

前記表面保護部材は、例えば、粘着テープであってもよい。   The surface protection member may be, for example, an adhesive tape.

また、上記課題を解決するための本発明は、被加工物を保持するチャックテーブルと、該チャックテーブルに保持された被加工物の厚みを測定する厚み測定手段と、該チャックテーブルに保持された該被加工物を研削する研削手段と、を備えた研削装置であって、該チャックテーブルは、鉛直方向を軸方向とする回転軸で回転可能であり保持面で表面保護部材が貼着された被加工物を保持し、該厚み測定手段は、被加工物の研削開始前に被加工物の該チャックテーブルで保持された面と反対側の面に厚み測定器を接触させて厚み測定を行い、該研削手段は、該チャックテーブルの保持面と直交する回転軸で回転する研削砥石で研削水を供給しながら被加工物の裏面を研削し、該厚み測定手段により測定された第1の厚みデータと第1の厚みデータが測定された時点から任意の時間経過後に測定された第2の厚みデータとからその変化量を算出する算出手段と、該算出手段が算出した該変化量が予め登録されたしきい値以下であれば研削を開始させ、該変化量が該予め登録されたしきい値を超えている場合にはエラーを表示し研削を開始させない制御手段と、を備えたことを特徴とする研削装置である。   Further, according to the present invention for solving the above problems, there are provided a chuck table for holding a workpiece, a thickness measuring means for measuring the thickness of the workpiece held by the chuck table, and the chuck table And a grinding device for grinding the workpiece, wherein the chuck table is rotatable about a rotation axis having an axis in the vertical direction, and a surface protection member is attached on the holding surface. The workpiece is held, and the thickness measuring means measures the thickness by bringing the thickness measuring device into contact with the surface of the workpiece opposite to the surface held by the chuck table before starting the grinding of the workpiece. The grinding means grinds the back surface of the workpiece while supplying grinding water with a grinding wheel rotating on a rotation axis orthogonal to the holding surface of the chuck table, and the first thickness measured by the thickness measuring means Data and first thickness Calculation means for calculating the amount of change from the second thickness data measured after an arbitrary time has elapsed since the time the data was measured, and the amount of change calculated by the calculation means is equal to or less than a threshold previously registered And a control means for starting grinding and displaying an error if the amount of change exceeds the pre-registered threshold value and not for starting grinding. is there.

前記厚み測定手段は、研削開始前の被加工物の厚み測定に用いられると共に、研削開始後の被加工物の厚み制御にも用いられると好ましい。   The thickness measuring means is preferably used to measure the thickness of the workpiece before the start of grinding and to control the thickness of the workpiece after the start of grinding.

厚み測定手段による被加工物の厚み測定において、測定面が柔軟性を備える表面保護部材である場合、厚み測定手段が備える厚み測定器の表面保護部材への沈み込みにより、被加工物の厚みの変化量は大きくなる。一方、測定面が被加工物の被研削面である硬い裏面の場合、厚み測定手段が備える厚み測定器の該裏面に対する沈み込みがほとんどないため、被加工物の厚みの変化量は小さくなる。そこで、本発明に係る研削方法は、被加工物の表面を表面保護部材で覆う表面保護ステップと、表面保護ステップを実施した後、被加工物を軸方向が鉛直方向である回転軸で回転可能なチャックテーブルの保持面で保持する保持ステップと、保持ステップを実施した後、被加工物のチャックテーブルで保持された面と反対側の面に厚み測定器を接触させて被加工物の厚みを測定し、測定した第1の厚みデータと第1の厚みデータを測定した時点から任意の時間経過後に測定した第2の厚みデータとからその変化量を算出する厚み測定ステップと、厚み測定ステップを実施した後、保持面と直交する回転軸で回転する研削砥石で研削水を供給しながら被加工物の裏面を研削する研削ステップと、を備え、厚み測定ステップでは、算出した変化量が予め登録したしきい値以下であれば、厚み測定器が接触した被加工物の面が厚み測定器の沈み込みが発生し難い被加工物の裏面であると判断し研削ステップを開始し、算出した変化量が予め登録したしきい値を越えていれば、厚み測定器が接触した被加工物の面が厚み測定器の沈み込みが発生しやすい表面保護部材であると判断し研削ステップを開始しないものとすることで、被加工物がチャックテーブルにより誤った状態で吸引保持されてしまった場合、即ち、被加工物の被研削面たる裏面がチャックテーブルによって吸着されてしまった場合に、そのまま研削ステップが実施されて表面保護部材が研削され研削不良を発生させてしまうということが無くなる。   In the thickness measurement of a workpiece by the thickness measurement means, when the measurement surface is a surface protection member having flexibility, the thickness of the workpiece is measured by the sinking of the thickness measurement device provided in the thickness measurement means into the surface protection member. The amount of change increases. On the other hand, when the measurement surface is a hard back surface which is the surface to be ground of the workpiece, the amount of change in thickness of the workpiece is small because the thickness measuring device provided in the thickness measuring means hardly sinks into the back surface. Therefore, in the grinding method according to the present invention, after performing the surface protection step of covering the surface of the workpiece with the surface protection member and the surface protection step, the workpiece can be rotated about the rotation axis whose axial direction is the vertical direction. After carrying out the holding step held by the holding surface of the chuck table and the holding step, the thickness measuring device is brought into contact with the surface opposite to the surface held by the chuck table of the workpiece to measure the thickness of the workpiece Measurement and thickness measurement steps of calculating the amount of change from the measured first thickness data and the second thickness data measured after the lapse of an arbitrary time from the time when the first thickness data was measured; And a grinding step of grinding the back surface of the workpiece while supplying grinding water with a grinding wheel rotating on a rotation axis orthogonal to the holding surface, and calculating the amount of change in the thickness measurement step. If it is equal to or less than the pre-registered threshold value, it is determined that the surface of the workpiece to which the thickness measuring device is in contact is the back surface of the workpiece with which the thickness measuring device hardly sinks and starts the grinding step If the amount of change exceeds the pre-registered threshold value, it is determined that the surface of the workpiece to which the thickness measuring device is in contact is a surface protection member that tends to cause the thickness measuring device to sink, and the grinding step is started. If the workpiece is sucked and held in the wrong state by the chuck table, that is, if the back surface, which is the surface to be ground of the workpiece, is adsorbed by the chuck table, the workpiece is not moved as it is. The grinding step is not performed, and the surface protection member is not ground to cause grinding defects.

本発明に係る研削装置は、厚み測定手段により測定された第1の厚みデータと第1の厚みデータが測定された時点から任意の時間経過後に測定された第2の厚みデータとからその変化量を算出する算出手段と、算出手段が算出した変化量が予め登録されたしきい値以下であれば研削を開始させ、変化量が予め登録されたしきい値を超えている場合にはエラーを表示し研削を開始させない制御手段と、を備えるものとすることで、被加工物がチャックテーブルにより誤った状態で吸引保持されてしまった場合、即ち、被加工物の被研削面たる裏面がチャックテーブルに吸着されてしまった場合に、そのまま研削手段で表面保護部材を研削して研削不良を発生させてしまうということが無くなる。   The grinding apparatus according to the present invention is the amount of change from the first thickness data measured by the thickness measuring means and the second thickness data measured after the lapse of an arbitrary time from the time when the first thickness data is measured. The grinding means is started if the amount of change calculated by the calculation means and the amount of change calculated by the calculation means is equal to or less than a threshold registered in advance, and an error is indicated if the amount of change exceeds the threshold registered in advance. By including control means for displaying and not starting grinding, the workpiece is sucked and held in an incorrect state by the chuck table, that is, the back surface of the workpiece to be ground is the chuck In the case where the surface protection member is absorbed by the table, the surface protection member is not ground as it is by the grinding means, and the grinding failure is not generated.

研削装置の厚み測定手段が、研削開始前の被加工物の厚み測定に用いられると共に、研削開始後の被加工物の厚み制御にも用いられることで、研削装置の小型化を図れ、また、研削装置の製造コストの増加を防ぐことができる。   The thickness measuring means of the grinding apparatus is used to measure the thickness of the workpiece before the start of grinding and is also used to control the thickness of the workpiece after the start of grinding, whereby the miniaturization of the grinding apparatus can be achieved, and It is possible to prevent an increase in the manufacturing cost of the grinding apparatus.

研削装置の一例を示す斜視図である。It is a perspective view showing an example of a grinding device. 被加工物の表面を表面保護部材で覆っている状態を示す斜視図である。It is a perspective view which shows the state which has covered the surface of a to-be-processed object by the surface protection member. 被加工物のチャックテーブルで保持された表面保護部材が貼着された表面と反対側の裏面に第2の厚み測定器を接触させて被加工物の厚み測定を行っている状態を示す断面図である。A cross-sectional view showing a state in which the second thickness measuring device is brought into contact with the back surface opposite to the front surface to which the surface protection member held by the chuck table of the workpiece is attached. It is. 被加工物のチャックテーブルで保持された裏面と反対側の表面に貼着された表面保護部材に第2の厚み測定器を接触させて被加工物の厚み測定を行っている状態を示す断面図である。Sectional drawing which shows the state which is making the 2nd thickness measuring device contact the surface protection member stuck on the surface on the opposite side to the back side held by the chuck table of the workpiece, and to measure the thickness of the workpiece It is. 裏面に第2の厚み測定器を接触させて被加工物の厚み測定を行った場合の被加工物の厚みの推移を示すグラフ、及び表面保護部材に第2の厚み測定器を接触させて被加工物の厚み測定を行った場合の被加工物の厚みの推移を示すグラフである。A graph showing transition of the thickness of the workpiece when the thickness of the workpiece is measured by bringing the second thickness gauge into contact with the back surface, and contacting the second thickness gauge with the surface protection member It is a graph which shows transition of the thickness of a workpiece at the time of measuring thickness of a workpiece. 被加工物が厚みの制御がされつつ粗研削手段によって粗研削されている状態を示す断面図である。It is sectional drawing which shows the state which is rough-grind by rough grinding means, while control of thickness is carried out of a to-be-processed object.

図1に示す本発明に係る研削装置3は、チャックテーブル30によって吸引保持された被加工物Wに研削加工を施す装置である。
図1に示す被加工物Wは、例えば、シリコンを母材とする外形が円形板状の半導体ウエーハであり、図1においては下側を向いている表面Waには、直交差する複数の分割予定ラインSが形成されており、分割予定ラインSによって格子状に区画された各領域にはIC等のデバイスDがそれぞれ形成されている。被加工物Wの表面Waと反対側の裏面Wbは、研削加工が施される被研削面なる。なお、被加工物Wはシリコン以外にガリウムヒ素、サファイア、窒化ガリウム又はシリコンカーバイド等で構成されていてもよいし、その外形も円形状ではなく、例えば、矩形状に形成されていてもよい。
A grinding apparatus 3 according to the present invention shown in FIG. 1 is an apparatus for performing grinding on a workpiece W suctioned and held by a chuck table 30.
The workpiece W shown in FIG. 1 is, for example, a semiconductor wafer having a circular plate shape whose outer shape has silicon as a base material, and in FIG. A planned line S is formed, and devices D such as ICs are respectively formed in respective areas divided in a grid shape by the planned dividing line S. The back surface Wb opposite to the surface Wa of the workpiece W is a surface to be ground to be ground. The workpiece W may be made of gallium arsenide, sapphire, gallium nitride, silicon carbide or the like in addition to silicon, and its outer shape may not be circular but may be rectangular, for example.

研削装置3のベース3A上の前方(−Y方向側)は、被加工物Wを搬送可能なロボット330によってチャックテーブル30に対して被加工物Wの着脱が行われる領域となっており、ベース3A上の後方(+Y方向側)は、被加工物Wに対して粗研削を施す粗研削手段31又は被加工物Wに対して仕上げ研削を施す仕上げ研削手段32によってチャックテーブル30上に保持された被加工物Wの研削が行われる領域となっている。   The front (−Y direction side) on the base 3A of the grinding apparatus 3 is an area where the workpiece W can be attached to and detached from the chuck table 30 by the robot 330 capable of transporting the workpiece W. The rear side (+ Y direction side) on 3A is held on the chuck table 30 by a rough grinding means 31 that performs rough grinding on the workpiece W or a finish grinding means 32 that performs finish grinding on the workpiece W It is an area where grinding of the workpiece W is performed.

ベース3A上の前方側には、研削前の被加工物Wを収容する第一のカセット331及び研削済みの被加工物Wを収容する第二のカセット332が配設されている。第一のカセット331及び第二のカセット332の近傍には、第一のカセット331から研削前の被加工物Wを搬出すると共に、研削済みの被加工物Wを第二のカセット332に搬入する機能を有するロボット330が配設されている。   On the front side of the base 3A, a first cassette 331 for housing the workpiece W before grinding and a second cassette 332 for housing the ground workpiece W are disposed. In the vicinity of the first cassette 331 and the second cassette 332, the workpiece W before grinding is unloaded from the first cassette 331, and the ground workpiece W is loaded into the second cassette 332. A robot 330 having a function is disposed.

ロボット330の可動域には、加工前の被加工物Wを所定の位置に位置合わせする位置合わせ手段333及び研削済みの被加工物Wを洗浄する洗浄手段334が配設されている。洗浄手段334は、例えば、枚葉式のスピンナー洗浄装置であり、研削済みの被加工物Wを吸引保持するスピンナーテーブルを備えている。   In the movable area of the robot 330, alignment means 333 for aligning the workpiece W before processing to a predetermined position and cleaning means 334 for cleaning the ground workpiece W are disposed. The cleaning means 334 is, for example, a sheet-fed spinner cleaning device, and includes a spinner table that sucks and holds the ground workpiece W.

位置合わせ手段333の近傍には第一の搬送手段335が配設され、洗浄手段334の近傍には第二の搬送手段336が配設されている。第一の搬送手段335は、位置合わせ手段333に載置された研削前の被加工物Wを図1に示すいずれかのチャックテーブル30に搬送する機能を有し、第二の搬送手段336は、いずれかのチャックテーブル30に保持された研削済みの被加工物Wを洗浄手段334に搬送する機能を有する。   A first transport means 335 is disposed in the vicinity of the alignment means 333, and a second transport means 336 is disposed in the vicinity of the cleaning means 334. The first transfer means 335 has a function of transferring the workpiece W before grinding placed on the alignment means 333 to any one of the chuck tables 30 shown in FIG. It has a function of conveying the ground workpiece W held on any one of the chuck tables 30 to the cleaning means 334.

ベース3A上の第一の搬送手段335の後方側(+Y方向側)には、ターンテーブル34が配設されており、ターンテーブル34の上面には、例えば3つのチャックテーブル30が周方向に等間隔を空けて配設されている。ターンテーブル34の中心には、ターンテーブル34を自転させるための図示しない回転軸が配設されており、回転軸を中心としてターンテーブル34をベース3A上で自転させることができる。そして、ターンテーブル34の回転によって、いずれかのチャックテーブル30が第一の搬送手段335及び第二の搬送手段336の近傍に位置付けされる構成となっている。   The turntable 34 is disposed on the rear side (+ Y direction side) of the first conveying means 335 on the base 3A, and for example, three chuck tables 30 are circumferentially arranged on the upper surface of the turntable 34. It is arranged at intervals. A rotating shaft (not shown) for rotating the turntable 34 is disposed at the center of the turntable 34. The turntable 34 can rotate on the base 3A about the rotating shaft. The chuck table 30 is configured to be positioned in the vicinity of the first conveying means 335 and the second conveying means 336 by the rotation of the turntable 34.

チャックテーブル30は、ターンテーブル34によって公転可能に支持されている。また、チャックテーブル30の底面側には軸方向が鉛直方向(Z軸方向)である回転軸30bが接続されており、該回転軸30bがモータ等からなる図示しない回転手段により回転されることで、チャックテーブル30はターンテーブル34上で鉛直方向の回転軸周りに回転可能となっている。チャックテーブル30は、例えば、その外形が円形状となっており、ポーラス部材等からなり被加工物Wを吸着保持する吸着部300と、吸着部300を支持する枠体301とを備える。吸着部300は図示しない吸引源に連通し、吸引源が吸引することで生み出された吸引力が、吸着部300の露出面である保持面300aに伝達されることで、チャックテーブル30は保持面300a上で被加工物Wを吸引保持する。   The chuck table 30 is rotatably supported by the turntable 34. Further, a rotary shaft 30b whose axial direction is the vertical direction (Z-axis direction) is connected to the bottom surface side of the chuck table 30, and the rotary shaft 30b is rotated by a rotating means (not shown) such as a motor. The chuck table 30 is rotatable on the turntable 34 about a vertical rotation axis. The chuck table 30 has, for example, a suction portion 300 which has a circular outer shape and is made of a porous member or the like and holds the workpiece W by suction, and a frame 301 which supports the suction portion 300. The suction unit 300 is in communication with a suction source (not shown), and the suction force generated by suction by the suction source is transmitted to the holding surface 300 a which is the exposed surface of the suction unit 300, whereby the chuck table 30 holds the holding surface. The workpiece W is held by suction on 300 a.

ベース3A上の後方側には、コラム3B及びコラム3Cが並べて立設されており、コラム3Bの−Y方向側の側面には、粗研削手段31をチャックテーブル30によって保持された被加工物Wに対して研削送りする第一の研削送り手段35が配設されており、コラム3Cの−Y方向側の側面には、仕上げ研削手段32をチャックテーブル30によって保持された被加工物Wに対して研削送りする第二の研削送り手段36が配設されている。   A column 3B and a column 3C are erected side by side on the rear side on the base 3A, and the workpiece W whose rough grinding means 31 is held by the chuck table 30 is provided on the side surface on the -Y direction side of the column 3B. The first grinding feed means 35 for grinding feed is provided for the workpiece W held by the chuck table 30 on the side of the column 3C on the -Y direction side with respect to the workpiece W held by the chuck table 30. A second grinding feed means 36 for grinding feed is provided.

第一の研削送り手段35は、鉛直方向の軸心を有するボールネジ350と、ボールネジ350と平行に配設された一対のガイドレール351と、ボールネジ350に連結されボールネジ350を回動させるモータ352と、内部のナットがボールネジ350に螺合すると共に側部がガイドレール351に摺接する昇降部353とから構成され、モータ352がボールネジ350を回転させることに伴い昇降部353がガイドレール351にガイドされて昇降する構成となっている。昇降部353は粗研削手段31を支持しており、昇降部353の昇降によって粗研削手段31も昇降する。   The first grinding and feeding means 35 includes a ball screw 350 having a vertical axial center, a pair of guide rails 351 disposed parallel to the ball screw 350, and a motor 352 connected to the ball screw 350 to rotate the ball screw 350. The elevating part 353 is guided by the guide rail 351 as the motor 352 rotates the ball screw 350. Is configured to move up and down. The elevating part 353 supports the rough grinding means 31, and the rough grinding means 31 is also raised and lowered by the elevation of the elevating part 353.

第二の研削送り手段36は、鉛直方向の軸心を有するボールネジ360と、ボールネジ360と平行に配設された一対のガイドレール361と、ボールネジ360に連結されボールネジ360を回動させるモータ362と、内部のナットがボールネジ360に螺合すると共に側部がガイドレール361に摺接する昇降部363とから構成され、モータ362がボールネジ360を回転させることに伴い昇降部363がガイドレール361にガイドされて昇降する構成となっている。昇降部363は仕上げ研削手段32を支持しており、昇降部363の昇降によって仕上げ研削手段32も昇降する。   The second grinding feed means 36 includes a ball screw 360 having an axis in the vertical direction, a pair of guide rails 361 disposed parallel to the ball screw 360, and a motor 362 coupled to the ball screw 360 and rotating the ball screw 360. The elevating part 363 is guided by the guide rail 361 as the motor 362 rotates the ball screw 360. Is configured to move up and down. The elevation unit 363 supports the finish grinding unit 32, and the finish grinding unit 32 is also elevated by the elevation of the elevation unit 363.

粗研削手段31は、軸方向がチャックテーブル30の保持面300aに直交する鉛直方向(Z軸方向)である回転軸310と、回転軸310を回転可能に支持するハウジング311と、回転軸310を回転駆動するモータ312と、回転軸310の下端に取り付けられたマウント314と、マウント314に着脱可能に接続された研削ホイール313とを備える。研削ホイール313の底面には、略直方体形状の複数の粗研削砥石313aが環状に配設されている。粗研削砥石313aは、例えば、ビトリファイドボンド等でダイヤモンド砥粒等が固着されて成形されている。なお、粗研削砥石313aの形状は、環状に一体に形成されているものでもよい。粗研削砥石313aは、例えば、粗研削に用いられる砥石であり、砥石中に含まれる砥粒が比較的大きな砥石である。   The rough grinding means 31 has a rotating shaft 310 whose axial direction is a vertical direction (Z-axis direction) perpendicular to the holding surface 300 a of the chuck table 30, a housing 311 rotatably supporting the rotating shaft 310, and a rotating shaft 310. The motor includes a motor 312 which is driven to rotate, a mount 314 attached to the lower end of the rotary shaft 310, and a grinding wheel 313 detachably connected to the mount 314. On the bottom surface of the grinding wheel 313, a plurality of rough grinding stones 313a having a substantially rectangular parallelepiped shape are annularly disposed. The rough grinding stone 313a is formed, for example, by fixing diamond abrasive grains or the like by vitrified bonding or the like. In addition, the shape of the rough grinding stone 313a may be integrally formed in an annular shape. The rough grinding wheel 313a is, for example, a grinding wheel used for rough grinding, and is a grinding wheel in which the abrasive grains contained in the grinding wheel are relatively large.

例えば、回転軸310の内部には、研削水供給源に連通し研削水の通り道となる図示しない流路が、回転軸310の軸方向(Z軸方向)に貫通して形成されており、流路は研削ホイール313の底面において粗研削砥石313aに向かって研削水を噴出できるように開口している。   For example, a flow passage (not shown) communicating with the grinding water supply source and passing through the grinding water is formed in the rotation shaft 310 in the axial direction (Z-axis direction) of the rotation shaft 310. The passage is opened at the bottom surface of the grinding wheel 313 so that the grinding water can be jetted toward the rough grinding wheel 313a.

仕上げ研削手段32は、粗研削によって仕上げ厚み程度まで薄化された被加工物Wに対して、平坦性を高める仕上げ研削を行うことができる。すなわち、仕上げ研削手段32は、仕上げ研削砥石323aを備え回転可能に装着した研削ホイール313で、粗研削手段31が研削した被加工物Wの裏面Wbをさらに研削する。仕上げ研削砥石323a中に含まれる砥粒は、粗研削手段31の粗研削砥石313aに含まれる砥粒よりも粒径の小さい砥粒である。仕上げ研削手段32の仕上げ研削砥石323a以外の構成については、粗研削手段31の構成と同様となっている。   The finish grinding unit 32 can perform finish grinding for enhancing flatness on the workpiece W thinned to a finish thickness or so by rough grinding. That is, the finish grinding means 32 further grinds the back surface Wb of the workpiece W ground by the rough grinding means 31 with the grinding wheel 313 having the finish grinding wheel 323a and rotatably mounted. The abrasive grains contained in the finish grinding wheel 323 a are abrasive grains having a smaller particle size than the abrasive grains contained in the rough grinding stone 313 a of the rough grinding means 31. The configuration other than the finish grinding wheel 323 a of the finish grinding unit 32 is the same as the configuration of the rough grinding unit 31.

研削位置まで降下した状態の粗研削手段31及び仕上げ研削手段32にそれぞれ隣接する位置には、例えば、被加工物Wの厚みを接触式にて測定する第1の厚み測定手段38Aと第2の厚み測定手段38Bとがそれぞれ配設されている。第1の厚み測定手段38Aと第2の厚み測定手段38Bとは、同一の構造を備えているため、以下に、第1の厚み測定手段38Aについてのみ説明する。第1の厚み測定手段38Aは、例えば、一対の厚み測定器(ハイトゲージ)、即ち、チャックテーブル30の保持面300aの高さ位置測定用の第1の厚み測定器381と、被加工物Wのチャックテーブル30で保持された面と反対側の面(被研削面)の高さ位置測定用の第2の厚み測定器382とを備えている。   At positions adjacent to the rough grinding means 31 and the finish grinding means 32 in the state of being lowered to the grinding position, for example, a first thickness measuring means 38A and a second thickness measuring means for measuring the thickness of the workpiece W by contact. Thickness measuring means 38B are respectively provided. Since the first thickness measuring means 38A and the second thickness measuring means 38B have the same structure, only the first thickness measuring means 38A will be described below. The first thickness measuring means 38A is, for example, a pair of thickness measuring devices (height gauges), that is, a first thickness measuring device 381 for measuring the height position of the holding surface 300a of the chuck table 30; A second thickness measuring device 382 for measuring the height position of the surface (surface to be ground) opposite to the surface held by the chuck table 30 is provided.

第1の厚み測定器381及び第2の厚み測定器382は、その各先端に、上下方向に昇降し各測定面に接触するコンタクトを備えており、該コンタクトは、例えば、下方に向かって漸次縮径する鋭頭状に形成されている。第1の厚み測定器381(第2の厚み測定器382)は、その根元側が第1の支持部383(第2の支持部384)によって支持されている。第1の支持部383(第2の支持部384)は、第1の厚み測定器381(第2の厚み測定器382)を上下動可能に支持していると共に、例えば内部に内蔵したスプリングが生み出す押圧力によって、第1の厚み測定器381(第2の厚み測定器382)を各測定面に対して適宜の力で押し付けることができる。
第1の厚み測定手段38Aは、第1の厚み測定器381により、基準面となる枠体301の上面の高さ位置を検出し、第2の厚み測定器382により、研削される被加工物Wの被研削面、即ち、被加工物Wのチャックテーブル30で保持された面と反対側の面の高さ位置を検出し、両者の検出値の差を算出することで、被加工物Wの厚みを研削前又は研削中に随時測定することができる。
The first thickness measuring device 381 and the second thickness measuring device 382 have contacts at their respective ends, which are vertically moved up and down to make contact with the respective measurement surfaces, and the contacts are, for example, gradually going downward. It is formed in the shape of a sharpened tip. The root side of the first thickness measuring device 381 (second thickness measuring device 382) is supported by a first support 383 (second support 384). The first support portion 383 (the second support portion 384) supports the first thickness measuring instrument 381 (the second thickness measuring instrument 382) so as to move up and down, and for example, a spring incorporated therein. By the generated pressure, the first thickness measuring device 381 (second thickness measuring device 382) can be pressed with an appropriate force against each measurement surface.
The first thickness measuring means 38A detects the height position of the upper surface of the frame body 301 serving as the reference surface by the first thickness measuring device 381, and the workpiece to be ground by the second thickness measuring device 382 The workpiece W is detected by detecting the height position of the surface to be ground of W, that is, the surface opposite to the surface held by the chuck table 30 of the workpiece W and calculating the difference between the detected values of the two. The thickness can be measured at any time before or during grinding.

研削装置3は、例えば、装置全体の制御を行う制御手段9を備えている。制御手段9は、制御プログラムに従って演算処理するCPU、制御プログラム等を格納するROM、及び演算結果やその他の情報等を格納するRAM等を含んでおり、図示しない配線によって、第一の研削送り手段35やチャックテーブル30を回転させる図示しない回転手段等に接続されている。そして、制御手段9の制御の下で、図示しない回転手段によるチャックテーブル30の回転動作や第一の研削送り手段35による粗研削手段31のZ軸方向における研削送り動作等の研削装置3の各構成の動作が制御される。   The grinding device 3 includes, for example, control means 9 for controlling the entire device. The control means 9 includes a CPU for performing arithmetic processing according to a control program, a ROM for storing control programs and the like, and a RAM for storing arithmetic results and other information and the like. 35 and a rotating means (not shown) for rotating the chuck table 30. Then, under the control of the control means 9, each of the grinding devices 3 such as the rotation operation of the chuck table 30 by the rotation means (not shown) and the grinding feed operation in the Z axis direction of the rough grinding means 31 by the first grinding feed means 35 The operation of the configuration is controlled.

以下に、本発明に係る研削装置3を用いて図1に示す被加工物Wを研削する場合の各ステップについて説明する。   Below, each step in the case of grinding the to-be-processed object W shown in FIG. 1 using the grinding apparatus 3 which concerns on this invention is demonstrated.

(1)表面保護ステップ
まず、被加工物Wの表面Waには、例えば、被加工物Wと略同径の円形の表面保護部材Tが貼着されて、表面Waは表面保護部材Tで覆われ保護された状態になる。表面保護部材Tは、例えば、ある程度の柔軟性を有した樹脂等からなる基材層と粘着層とを備える粘着テープであるが、これに限定されるものではなく、表面Waに液体の樹脂を塗布してから該樹脂に熱を加える又は紫外線を照射する等して、該樹脂を硬化させて、ある程度の柔軟性を備え被加工物Wの表面Waを覆う保護部材を形成してもよい。
(1) Surface Protection Step First, for example, a circular surface protection member T having substantially the same diameter as the workpiece W is attached to the surface Wa of the workpiece W, and the surface Wa is covered with the surface protection member T. Become protected. The surface protection member T is, for example, a pressure-sensitive adhesive tape including a base material layer made of a resin or the like having a certain degree of flexibility and an adhesive layer, but is not limited thereto. After the application, the resin may be cured by applying heat or irradiating ultraviolet light to form a protective member which has a certain degree of flexibility and covers the surface Wa of the workpiece W.

(2)保持ステップ
図1に示すターンテーブル34が、+Z軸方向から見て時計回り方向に自転し、あるチャックテーブル30が第一の搬送手段335の近傍まで移動する。ロボット330が第一のカセット331から表面保護部材Tが貼着された一枚の被加工物Wを引き出し、被加工物Wを位置合わせ手段333に移動させる。位置合わせ手段333において被加工物Wが所定の位置に位置決めされた後、第一の搬送手段335が、位置合わせ手段333上の被加工物Wをチャックテーブル30の保持面300a上に搬送する。そして、図示しない吸引源により生み出された吸引力が保持面300aに伝達されることで、チャックテーブル30が被加工物Wを吸引保持する。
ここで、被加工物Wが正しくチャックテーブル30に搬送され吸引保持されれば、被加工物Wのチャックテーブル30で保持された面は表面保護部材Tで覆われている表面Waとなり、チャックテーブル30で保持された面と反対側の裏面Wbは上方に向かって露出した状態になる。
その一方、被加工物Wがチャックテーブル30に誤った状態で搬送され吸引保持されてしまう場合も発生し得る。即ち、被加工物Wのチャックテーブル30で保持された面が裏面Wbとなってしまっており、チャックテーブル30で保持された面と反対側の面となる表面保護部材Tで覆われている表面Waが上方に向いてしまっている状態も発生し得る。
(2) Holding Step The turntable 34 shown in FIG. 1 rotates in the clockwise direction as viewed from the + Z-axis direction, and a certain chuck table 30 moves to the vicinity of the first conveying means 335. The robot 330 pulls out a single workpiece W with the surface protection member T attached thereto from the first cassette 331, and moves the workpiece W to the alignment unit 333. After the workpiece W is positioned at a predetermined position by the alignment unit 333, the first transport unit 335 transports the workpiece W on the alignment unit 333 onto the holding surface 300 a of the chuck table 30. Then, the suction force generated by a suction source (not shown) is transmitted to the holding surface 300 a, whereby the chuck table 30 sucks and holds the workpiece W.
Here, if the workpiece W is correctly conveyed to the chuck table 30 and suction-held, the surface of the workpiece W held by the chuck table 30 becomes the surface Wa covered by the surface protection member T, and the chuck table The back surface Wb opposite to the surface held at 30 is exposed upward.
On the other hand, the workpiece W may be transported to the chuck table 30 in an incorrect state and be held by suction. That is, the surface of the workpiece W held by the chuck table 30 is the back surface Wb, and the surface covered by the surface protection member T which is the surface opposite to the surface held by the chuck table 30 It may also occur that Wa is facing upward.

(3)厚み測定ステップ
上記のような被加工物Wがチャックテーブル30により誤った状態で吸引保持されてしまった場合に、そのまま研削が開始されてしまい研削不良が発生してしまうことを防ぐために、本発明に係る研削装置1は、下記に説明する厚み測定ステップを実施する。
図1に示すように、+Z軸方向から見て時計回り方向にターンテーブル34が回転することで、被加工物Wを保持したチャックテーブル30が第1の厚み測定手段38Aの下まで移動する。そして、例えば、チャックテーブル30が回転軸30b周りに所定の回転速度で回転し、第1の厚み測定手段38Aによって被加工物Wの厚み測定が開始される。なお、チャックテーブル30が回転していない状態で被加工物Wの厚み測定が開始されてもよい。
(3) Thickness Measurement Step When the workpiece W as described above is sucked and held in an incorrect state by the chuck table 30, grinding is started as it is to prevent generation of grinding defects. The grinding apparatus 1 according to the present invention carries out the thickness measurement step described below.
As shown in FIG. 1, as the turntable 34 rotates in the clockwise direction as viewed from the + Z-axis direction, the chuck table 30 holding the workpiece W moves below the first thickness measuring means 38A. Then, for example, the chuck table 30 is rotated around the rotation axis 30b at a predetermined rotation speed, and the thickness measurement of the workpiece W is started by the first thickness measurement means 38A. The thickness measurement of the workpiece W may be started while the chuck table 30 is not rotating.

図3は被加工物Wが正しい状態でチャックテーブル30により吸引保持されている場合を示している。したがって、回転するチャックテーブル30の基準面となる枠体301の上面に第1の厚み測定器381が所定の押圧力で押し付けられ、また、被加工物Wのチャックテーブル30で保持された面である表面Waと反対側の面の裏面Wbに第2の厚み測定器382が所定の押圧力で押し付けられる。
その一方、図4においては、被加工物Wがチャックテーブル30により誤った状態で吸引保持されている場合を示している。したがって、回転するチャックテーブル30の基準面となる枠体301の上面に第1の厚み測定器381が所定の押圧力で押し付けられ、また、被加工物Wのチャックテーブル30で保持された面である裏面Wbと反対側の面の表面Waに貼着されている表面保護部材Tに第2の厚み測定器382が所定の押圧力で押し付けられる。
FIG. 3 shows a case where the workpiece W is suctioned and held by the chuck table 30 in a correct state. Therefore, the first thickness measuring device 381 is pressed against the upper surface of the frame 301 serving as the reference surface of the rotating chuck table 30 with a predetermined pressing force, and the surface of the workpiece W held by the chuck table 30 The second thickness measuring device 382 is pressed with a predetermined pressing force against the back surface Wb of the surface opposite to a certain surface Wa.
On the other hand, FIG. 4 shows the case where the workpiece W is sucked and held by the chuck table 30 in an incorrect state. Therefore, the first thickness measuring device 381 is pressed against the upper surface of the frame 301 serving as the reference surface of the rotating chuck table 30 with a predetermined pressing force, and the surface of the workpiece W held by the chuck table 30 The second thickness measuring device 382 is pressed with a predetermined pressing force on the surface protection member T attached to the front surface Wa of the surface opposite to the back surface Wb.

図3に示す場合においては、第1の厚み測定器381により枠体301の上面の高さ位置が測定され、第2の厚み測定器382により被加工物Wの裏面Wbの高さ位置が測定され、両者の測定値の差が被加工物Wの厚みとして算出される。そして、算出された被加工物Wの厚みについての情報は、例えば、制御手段9に送信されてRAMに記憶されていく。
図5に示すグラフG1は、図3に示す第1の厚み測定手段38Aによる被加工物Wの厚み測定開始時から任意の時間t1が経過した時点までの被加工物Wの厚みの推移を示すグラフの一例である。図5において縦軸は被加工物Wの厚みを示し、横軸は経過時間を示す。
In the case shown in FIG. 3, the height position of the upper surface of the frame 301 is measured by the first thickness measuring device 381, and the height position of the back surface Wb of the workpiece W is measured by the second thickness measuring device 382. The difference between the two measured values is calculated as the thickness of the workpiece W. Then, information on the calculated thickness of the workpiece W is, for example, transmitted to the control unit 9 and stored in the RAM.
The graph G1 shown in FIG. 5 shows the transition of the thickness of the workpiece W from the start of the thickness measurement of the workpiece W by the first thickness measuring means 38A shown in FIG. 3 to the time when an arbitrary time t1 has elapsed. It is an example of a graph. In FIG. 5, the vertical axis indicates the thickness of the workpiece W, and the horizontal axis indicates the elapsed time.

一方、図4に示す場合においては、第1の厚み測定器381により枠体301の上面の高さ位置が測定され、第2の厚み測定器382により被加工物Wの表面Waに貼着された表面保護部材Tの高さ位置が測定され、両者の測定値の差が被加工物Wの厚みとして算出される。そして、算出された被加工物Wの厚みについての情報は、例えば、制御手段9に送信されてRAMに記憶されていく。
図5に示すグラフG2は、図4に示す第1の厚み測定手段38Aによる被加工物Wの厚み測定開始時から任意の時間t1が経過した時点までの被加工物Wの厚みの推移を示すグラフの一例である。
On the other hand, in the case shown in FIG. 4, the first thickness measuring device 381 measures the height position of the upper surface of the frame 301, and the second thickness measuring device 382 attaches it to the surface Wa of the workpiece W. The height position of the surface protection member T is measured, and the difference between the two measured values is calculated as the thickness of the workpiece W. Then, information on the calculated thickness of the workpiece W is, for example, transmitted to the control unit 9 and stored in the RAM.
The graph G2 shown in FIG. 5 shows the transition of the thickness of the workpiece W from the start of the thickness measurement of the workpiece W by the first thickness measuring means 38A shown in FIG. 4 to the time when an arbitrary time t1 has elapsed. It is an example of a graph.

被加工物Wの裏面Wbはある程度の硬度を備えるシリコンであるため、図3における第1の厚み測定手段38Aによる被加工物Wの厚み測定において、第2の厚み測定器382の被加工物Wの裏面Wbに対する沈み込みは僅かなものとなる。その結果、第1の厚み測定器381の測定値と第2の厚み測定器382の測定値との差で示される被加工物Wの厚みは、図5に示すグラフG1のようにあまり変化せず、測定開始時における被加工物Wの厚みM1と被加工物Wの厚み測定開始時から任意の時間t1が経過した時点における被加工物Wの厚みM2とにはあまり差が生じない。
一方で、表面保護部材Tは樹脂等からなりある程度の柔軟性を備える粘着テープであるため、図4における第1の厚み測定手段38Aによる被加工物Wの厚み測定において、第2の厚み測定器382の表面保護部材Tに対する沈み込みは大きいものとなる。その結果、第1の厚み測定器381の測定値と第2の厚み測定器382の測定値との差で示される被加工物Wの厚みは、図5に示すグラフG2のようにグラフG1と比べて大きく変化していき、グラフG2に示す測定開始時における被加工物Wの厚みM1と被加工物Wの厚み測定開始時から任意の時間t1が経過した時点における被加工物Wの厚みM3とにはある程度の差が生じる。
Since the back surface Wb of the workpiece W is silicon having a certain degree of hardness, in the thickness measurement of the workpiece W by the first thickness measuring means 38A in FIG. Sinking to the back surface Wb of the As a result, the thickness of the workpiece W indicated by the difference between the measurement value of the first thickness measurement device 381 and the measurement value of the second thickness measurement device 382 changes so much as the graph G1 shown in FIG. Therefore, there is not much difference between the thickness M1 of the workpiece W at the start of the measurement and the thickness M2 of the workpiece W at the time when an arbitrary time t1 has elapsed from the start of the thickness measurement of the workpiece W.
On the other hand, since the surface protection member T is an adhesive tape made of resin or the like and provided with a certain degree of flexibility, in the thickness measurement of the workpiece W by the first thickness measurement means 38A in FIG. The depression of the surface protection member T at 382 is large. As a result, the thickness of the workpiece W indicated by the difference between the measured value of the first thickness measuring device 381 and the measured value of the second thickness measuring device 382 is a graph G1 and a graph G2 shown in FIG. Compared with the above, the thickness M1 of the workpiece W at the start of the measurement shown in graph G2 and the thickness M3 of the workpiece W at the time when an arbitrary time t1 has elapsed from the start of the thickness measurement of the workpiece W There is some difference between them.

制御手段9は、例えば、図1に示す算出手段90を含んでいる。算出手段90は、第1の厚み測定手段38Aにより測定された第1の厚みデータと第1の厚みデータが測定された時点から任意の時間経過後に測定された第2の厚みデータとからその変化量を算出する。本実施形態における図3に示す場合の厚み測定ステップにおいては、第1の厚みデータとは、例えば、図5のグラフG1に示す測定開始時における被加工物Wの厚みM1であり、第2の厚みデータとは、グラフG1に示す被加工物Wの厚み測定開始時から任意の時間t1が経過した時点における被加工物Wの厚みM2である。そして、算出手段90は、例えば、被加工物Wの厚みM1と被加工物Wの厚みM2との差である(M1−M2)を被加工物Wの厚みの変化量(差分量)として算出する。
本実施形態における図4に示す場合の厚み測定ステップにおいては、第1の厚みデータとは、例えば、グラフG2に示す測定開始時における被加工物Wの厚みM1であり、第2の厚みデータとは、グラフG2に示す被加工物Wの厚み測定開始時から任意の時間t1が経過した時点における被加工物Wの厚みM3である。そして、算出手段90は、例えば、被加工物Wの厚みM1と被加工物Wの厚みM3との差である(M1−M3)を被加工物Wの厚みの変化量(差分量)として算出する。
The control means 9 includes, for example, the calculation means 90 shown in FIG. The calculating means 90 changes the first thickness data measured by the first thickness measuring means 38A and the second thickness data measured after an elapse of an arbitrary time from the time when the first thickness data is measured. Calculate the quantity. In the thickness measurement step shown in FIG. 3 in the present embodiment, the first thickness data is, for example, the thickness M1 of the workpiece W at the start of measurement shown in the graph G1 of FIG. The thickness data is the thickness M2 of the workpiece W when an arbitrary time t1 has elapsed from the start of the thickness measurement of the workpiece W shown in the graph G1. Then, the calculating means 90 calculates, for example, (M1-M2), which is the difference between the thickness M1 of the workpiece W and the thickness M2 of the workpiece W, as the change amount (difference amount) of the thickness of the workpiece W Do.
In the thickness measurement step in the case shown in FIG. 4 in the present embodiment, the first thickness data is, for example, the thickness M1 of the workpiece W at the start of the measurement shown in the graph G2, and the second thickness data Is a thickness M3 of the workpiece W at the time when an arbitrary time t1 has elapsed from the start of thickness measurement of the workpiece W shown in the graph G2. The calculating means 90 calculates, for example, (M1-M3), which is the difference between the thickness M1 of the workpiece W and the thickness M3 of the workpiece W, as the amount of change (difference amount) in the thickness of the workpiece W. Do.

例えば、制御手段9のROMには、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生し難い被加工物Wの裏面Wbであるか否か、換言すれば、被加工物Wのチャックテーブル30で保持された面と反対側の面が、被研削面である裏面Wbとなっているかを判断するためのしきい値Mcが登録されている。そして、制御手段9は、算出手段90が算出した被加工物Wの厚みの変化量(本実施形態においては差分量)が、しきい値Mcを超えているか、又は、しきい値Mc以下であるかを判断する。なお、被加工物Wの種類及び表面保護部材Tの種類によって、第2の厚み測定器382が被加工物Wの裏面Wb又は表面保護部材Tへ沈み込む量は異なってくるため、予め登録されたしきい値Mcは、被加工物Wの裏面Wb及び表面保護部材Tの種類に対応して実験的、経験的、又は理論的に選択された値となる。   For example, in the ROM of the control means 9, the surface of the workpiece W in contact with the second thickness measurement device 382 is the back surface Wb of the workpiece W in which the second thickness measurement device 382 is unlikely to sink. In other words, the threshold Mc is registered to determine whether the surface of the workpiece W opposite to the surface held by the chuck table 30 is the back surface Wb, which is the surface to be ground. It is done. Then, the control means 9 determines that the change amount (the difference amount in the present embodiment) of the thickness of the workpiece W calculated by the calculation means 90 exceeds the threshold value Mc or is equal to or less than the threshold value Mc. Determine if there is. The amount of sinking of the second thickness measuring instrument 382 into the back surface Wb of the workpiece W or the surface protective member T differs depending on the type of the workpiece W and the type of the surface protection member T, so The threshold Mc is a value selected experimentally, empirically or theoretically corresponding to the type of the back surface Wb of the workpiece W and the surface protection member T.

図3に示す場合においては、図5のグラフG1に示すように、変化量(M1−M)はしきい値Mcよりも小さい値となるため、制御手段9は、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生し難い被加工物Wの裏面Wbである、即ち、被加工物Wが正しい状態でチャックテーブル30により吸引保持されており研削をそのまま開始させてもよいと判断する。
図4に示す場合においては、図5のグラフG2に示すように、変化量(M1−M3)はしきい値Mcを超える値となるため、制御手段9は、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生する表面保護部材Tである、即ち、被加工物Wが間違った状態でチャックテーブル30により吸引保持されておりこのまま研削を開始させてはならないと判断する。
In the case shown in FIG. 3, as shown in the graph G1 of FIG. 5, the change amount (M1-M) becomes a value smaller than the threshold value Mc. Is the back surface Wb of the workpiece W in which the second thickness measuring device 382 is unlikely to sink, that is, the workpiece W is held by suction with the chuck table 30 in a correct state It is determined that grinding may be started as it is.
In the case shown in FIG. 4, as shown in the graph G2 of FIG. 5, the change amount (M1-M3) becomes a value exceeding the threshold value Mc. The surface of the workpiece W in contact is the surface protection member T on which the second thickness measuring device 382 sinks, that is, the workpiece W is sucked and held by the chuck table 30 in the wrong state and remains as it is Judged that grinding should not be started.

制御手段9が研削を開始させてはならないという判断を下した場合には、制御手段9による制御の下で、研削装置3において後述する研削ステップへの移行が停止され、被加工物Wの研削加工が開始されないようになる。さらに、制御手段9は、スピーカーから警報音を鳴らす又はモニターにエラーを表示する等して作業者に該判断を通知する。例えば、該判断が通知された作業者の手作業によって、被加工物Wがチャックテーブル30の保持面300aで裏面Wbが上方に向かって露出した状態に直される、又は、被加工物Wがチャックテーブル30上から取り除かれる。   When it is determined that the control means 9 should not start grinding, the shift to the grinding step described later is stopped in the grinding device 3 under the control of the control means 9, and the workpiece W is ground It will not start processing. Further, the control means 9 notifies the operator of the judgment by, for example, emitting an alarm sound from a speaker or displaying an error on a monitor. For example, the workpiece W is corrected to a state in which the back surface Wb is exposed upward on the holding surface 300a of the chuck table 30 by the manual work of the operator notified of the determination, or the workpiece W is chucked It is removed from the table 30.

厚み測定ステップは上記実施形態に限定されるものではなく、例えば、以下に説明するように実施されてもよい(以下、厚み測定ステップの別実施形態とする)。厚み測定ステップの別実施形態において、図3に示す場合に算出手段90が算出する変化量は、測定時間内の任意の時点t2におけるグラフG1の接線L1の傾き(微分量)である。即ち、算出手段90は、厚み測定開始後に第1の厚み測定手段38Aにより測定された第1の厚みデータと第1の厚みが測定された時点から任意の時間経過後(僅かな時間経過後)に測定された第2の厚みデータとの差分を算出し、さらに算出した差分を微分することによって変化量(接線L1の傾き)を算出する。なお、変化量を接線L1の傾きとせずに、厚み測定時間内の任意の2時点(例えば、測定開始時とt1時間経過時又はt2時間経過時とt1時間経過時)におけるグラフG1の傾きとしてもよい。
同様に、図4に示す場合に算出手段90が算出する変化量は、測定時間内の任意の時点t2におけるグラフG2の接線L2の傾き(微分量)である。即ち、算出手段90は、厚み測定開始後に第1の厚み測定手段38Aにより測定された第1の厚みデータと第1の厚みが測定された時点から任意の時間経過後(僅かな時間経過後)に測定された第2の厚みデータとの差分を算出し、さらに算出した差分を微分することによって変化量(接線L2の傾き)を算出する。なお、変化量を接線L2の傾きとせずに、厚み測定時間内の任意の2時点(例えば、測定開始時とt1時間経過時又はt2時間経過時とt1時間経過時)におけるグラフG2の傾きとしてもよい。
The thickness measurement step is not limited to the above embodiment, and may be performed, for example, as described below (hereinafter referred to as another embodiment of the thickness measurement step). In another embodiment of the thickness measurement step, the amount of change calculated by the calculation means 90 in the case shown in FIG. 3 is the slope (differential amount) of the tangent L1 of the graph G1 at an arbitrary time point t2 within the measurement time. That is, after an arbitrary time has elapsed from the time when the first thickness data measured by the first thickness measurement means 38A and the first thickness are measured after the start of thickness measurement, the calculation means 90 (after a slight time) The difference with the second thickness data measured in (4) is calculated, and the amount of change (the slope of the tangent L1) is calculated by differentiating the calculated difference. As the slope of the graph G1 at any two time points within the thickness measurement time (for example, when the measurement starts and t1 time elapses or t2 time elapses and t1 time elapses) without using the change amount as the slope of the tangent L1. It is also good.
Similarly, the amount of change calculated by the calculation means 90 in the case shown in FIG. 4 is the slope (differential amount) of the tangent L2 of the graph G2 at an arbitrary time point t2 within the measurement time. That is, after an arbitrary time has elapsed from the time when the first thickness data measured by the first thickness measurement means 38A and the first thickness are measured after the start of thickness measurement, the calculation means 90 (after a slight time) The difference with the second thickness data measured in (2) is calculated, and the amount of change (the slope of the tangent L2) is calculated by differentiating the calculated difference. As the slope of the graph G2 at any two time points within the thickness measurement time (for example, when the measurement starts and t1 time elapses or t2 time elapses and t1 time elapses) without making the change amount the slope of the tangent L2. It is also good.

制御手段9のROMには、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生し難い被加工物Wの裏面Wbであるか否か、換言すれば、被加工物Wのチャックテーブル30で保持された面と反対側の面が、被研削面である裏面Wbとなっているかを判断するためのしきい値が登録されている。そして、制御手段9は、算出手段90算出した変化量(別実施形態においては微分量)が、しきい値を超えているか、又は、しきい値以下であるかを判断する。   In the ROM of the control means 9, it is determined whether or not the surface of the workpiece W in contact with the second thickness measuring device 382 is the back surface Wb of the workpiece W in which the second thickness measuring device 382 hardly sinks. Or, in other words, a threshold value is registered to determine whether the surface of the workpiece W opposite to the surface held by the chuck table 30 is the back surface Wb, which is the surface to be ground. . Then, the control means 9 determines whether the calculated change amount (the differential amount in another embodiment) calculated by the calculation means 90 exceeds the threshold or is equal to or less than the threshold.

図3に示す場合において、図5のグラフG1の接線L1の傾き(変化量)は例えば登録されているしきい値よりも小さくなり、制御手段9は、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生し難い被加工物Wの裏面Wbである、即ち、被加工物Wが正しい状態でチャックテーブル30により吸引保持されており研削を開始させてもよいと判断する。図4に示す場合においては、図5のグラフG2の接線L2の傾き(変化量)は例えば登録されているしきい値を超えており、制御手段9は、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生する表面保護部材Tである、即ち、被加工物Wが間違った状態でチャックテーブル30により吸引保持されており研削を開始させてはならないと判断する。   In the case shown in FIG. 3, the inclination (change amount) of the tangent L1 of the graph G1 in FIG. 5 is smaller than, for example, the registered threshold, and the control means 9 makes contact with the second thickness measuring device 382 The surface of the workpiece W is the back surface Wb of the workpiece W in which the second thickness measuring device 382 is unlikely to sink, that is, the workpiece W is sucked and held by the chuck table 30 in the correct state. It is determined that grinding may be started. In the case shown in FIG. 4, the slope (change amount) of the tangent L2 of the graph G2 of FIG. 5 exceeds, for example, the registered threshold, and the control means 9 is in contact with the second thickness measuring device 382 The surface of the processed workpiece W is the surface protection member T where the second thickness measuring device 382 sinks, that is, the workpiece W is held by suction with the chuck table 30 in the wrong state and grinding is performed. Decide that it should not be started.

(4)研削ステップ
上記のようにいずれかの厚み測定ステップが実施されて、その結果、制御手段9が被加工物Wの研削を開始させるという判断を下した場合、即ち、図3に示すように、被加工物Wが正しい状態でチャックテーブル30により吸引保持されていると判断された場合には、本研削ステップが実施される。
図1に示すように、+Z軸方向から見て時計回り方向にターンテーブル34が回転することで、被加工物Wを保持したチャックテーブル30が粗研削手段31の下まで移動して、研削ホイール313と被加工物Wとの位置合わせがなされる。位置合わせは、例えば、図6に示すように、研削ホイール313の回転中心が被加工物Wの回転中心に対して所定の距離だけ+X方向にずれ、粗研削砥石313aの回転軌道が被加工物Wの回転中心を通るように行われる。
(4) Grinding step When any thickness measurement step is performed as described above, as a result, when it is determined that the control means 9 starts grinding the workpiece W, as shown in FIG. If it is determined that the workpiece W is suctioned and held by the chuck table 30 in the correct state, the main grinding step is performed.
As shown in FIG. 1, as the turntable 34 rotates in the clockwise direction as viewed from the + Z-axis direction, the chuck table 30 holding the workpiece W moves under the rough grinding means 31, and the grinding wheel Position alignment of 313 and the to-be-processed object W is made. For alignment, for example, as shown in FIG. 6, the rotation center of the grinding wheel 313 is shifted in the + X direction by a predetermined distance with respect to the rotation center of the workpiece W, and the rotation trajectory of the rough grinding stone 313a is the workpiece It is performed so as to pass through the rotation center of W.

回転軸310が回転駆動されるのに伴って研削ホイール313が回転する。また、粗研削手段31が図1に示す第一の研削送り手段35により−Z方向へと送られ、回転する研削ホイール313の粗研削砥石313aが被加工物Wの裏面Wbに当接することで粗研削加工が行われる。また、チャックテーブル30が回転することに伴い保持面300a上に保持された被加工物Wも回転するので、被加工物Wの裏面Wbの全面が研削される。また、研削水が、回転軸310内の図示しない流路を介して粗研削砥石313aと被加工物Wとの接触部位に対して供給され、接触部位が冷却・洗浄される。また、被加工物Wの粗研削中においては、第1の厚み測定手段38Aによって被加工物Wの厚みが測定され、被加工物Wが所望の厚み(例えば、仕上げ厚みの手前の厚み)となるように厚み制御がされる。   The grinding wheel 313 rotates as the rotation shaft 310 is rotationally driven. Further, the rough grinding means 313 is fed in the −Z direction by the first grinding feeding means 35 shown in FIG. 1 and the rough grinding stone 313 a of the rotating grinding wheel 313 abuts on the back surface Wb of the workpiece W Rough grinding is performed. Further, since the workpiece W held on the holding surface 300a is also rotated as the chuck table 30 is rotated, the entire back surface Wb of the workpiece W is ground. Further, grinding water is supplied to the contact portion between the rough grinding stone 313a and the workpiece W through a flow path (not shown) in the rotating shaft 310, and the contact portion is cooled and cleaned. In addition, during rough grinding of the workpiece W, the thickness of the workpiece W is measured by the first thickness measurement means 38A, and the workpiece W has a desired thickness (for example, the thickness before the finish thickness) Thickness control is performed as follows.

粗研削により仕上げ厚みの手前まで研削された被加工物Wは、次いで仕上げ厚みまで研削される。図1に示す粗研削手段31が被加工物Wから離間した後、ターンテーブル34が+Z方向から見て時計回り方向に回転することで、チャックテーブル30が仕上げ研削手段32の下方まで移動する。そして、仕上げ研削手段32に備える研削ホイール313と被加工物Wとの位置合わせが行われた後、仕上げ研削手段32が−Z方向へと送られ、回転する仕上げ研削砥石323aが被加工物Wの裏面Wbに当接し、また、チャックテーブル30が回転することに伴って保持面300a上に保持された被加工物Wが回転して、被加工物Wの裏面Wbの全面が仕上げ研削される。また、研削水が仕上げ研削砥石323aと被加工物Wとの接触部位に対して供給され、接触部位が冷却・洗浄される。また、被加工物Wの粗研削中においては、第2の厚み測定手段38Bによって被加工物Wの厚みが測定され、被加工物Wが所望の厚み(仕上げ厚み)となるように厚み制御がされる。   The workpiece W ground to the front of the finish thickness by rough grinding is then ground to the finish thickness. After the rough grinding means 31 shown in FIG. 1 is separated from the workpiece W, the chuck table 30 is moved to the lower side of the finish grinding means 32 by the turntable 34 rotating clockwise as viewed from the + Z direction. Then, after the alignment between the grinding wheel 313 provided in the finish grinding unit 32 and the workpiece W is performed, the finish grinding unit 32 is fed in the −Z direction, and the finish grinding wheel 323 a that rotates is the workpiece W The workpiece W held on the holding surface 300a is rotated with the rotation of the chuck table 30, and the entire surface of the back surface Wb of the workpiece W is finish ground. . Further, grinding water is supplied to the contact portion between the finish grinding wheel 323 a and the workpiece W, and the contact portion is cooled and cleaned. Further, during rough grinding of the workpiece W, the thickness of the workpiece W is measured by the second thickness measurement means 38B, and thickness control is performed so that the workpiece W has a desired thickness (finish thickness). Be done.

仕上げ厚みまで研削され裏面Wbの平坦性が高められた被加工物Wは、仕上げ研削手段32が被加工物Wから離間した後、ターンテーブル34が+Z方向から見て時計回り方向に自転することで、第二の搬送手段336の近傍まで移動する。そして、第二の搬送手段336が、チャックテーブル30上の被加工物Wを洗浄手段334に搬送する。そして、洗浄手段334において被加工物Wが洗浄された後、被加工物Wはロボット330によって第二のカセット332内に収容される。   After the finish grinding means 32 is separated from the work W, the work piece W ground to the finish thickness and the flatness of the back surface Wb is enhanced, the turntable 34 rotates in a clockwise direction as viewed from the + Z direction. , To the vicinity of the second transport means 336. Then, the second transport means 336 transports the workpiece W on the chuck table 30 to the cleaning means 334. Then, after the workpiece W is cleaned by the cleaning means 334, the workpiece W is accommodated in the second cassette 332 by the robot 330.

上記のように本発明に係る研削方法は、被加工物Wの表面Waを表面保護部材Tで覆う表面保護ステップと、表面保護ステップを実施した後、被加工物Wを軸方向が鉛直方向である回転軸30bで回転可能なチャックテーブル30の保持面300aで保持する保持ステップと、保持ステップを実施した後、被加工物Wのチャックテーブル30で保持された面と反対側の面に第2の厚み測定器382を接触させて被加工物Wの厚みを測定し、測定した第1の厚みデータと第1の厚みデータを測定した時点から任意の時間経過後に測定した第2の厚みデータとからその変化量を算出する厚み測定ステップと、厚み測定ステップを実施した後、保持面300aと直交する回転軸310で回転する粗研削砥石313aで研削水を供給しながら被加工物Wの裏面Wbを研削する研削ステップと、を備え、厚み測定ステップでは、算出した変化量が予め登録したしきい値以下であれば、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生し難い被加工物Wの裏面Wbであると判断し研削ステップを開始し、算出した変化量が予め登録したしきい値を越えていれば、第2の厚み測定器382が接触した被加工物Wの面が第2の厚み測定器382の沈み込みが発生しやすい表面保護部材Tであると判断し研削ステップを開始しないものとすることで、被加工物Wがチャックテーブル30により誤った状態で吸引保持されてしまった場合、即ち、被加工物Wの被研削面たる裏面Wbがチャックテーブル30によって吸着されてしまった場合に、そのまま研削ステップが実施されて表面保護部材Tが研削され研削不良を発生させてしまうということが無くなる。   As described above, in the grinding method according to the present invention, after performing the surface protection step of covering the surface Wa of the workpiece W with the surface protection member T and the surface protection step, the axial direction of the workpiece W is vertical. After carrying out the holding step of holding the holding surface 300a of the chuck table 30 rotatable with a certain rotation shaft 30b and the holding step, the second side is the second surface of the workpiece W opposite to the surface held by the chuck table 30. And the thickness of the workpiece W measured, and the first thickness data measured and the second thickness data measured after an arbitrary time has elapsed from the time of measuring the first thickness data, and After performing the thickness measurement step of calculating the amount of change from the above and the thickness measurement step, the workpiece is supplied while the grinding water is supplied by the rough grinding stone 313a rotating on the rotation axis 310 orthogonal to the holding surface 300a. And, in the thickness measuring step, the surface of the workpiece W with which the second thickness measuring device 382 is in contact if the calculated amount of change is equal to or less than the previously registered threshold value. Is determined to be the back surface Wb of the workpiece W in which the second thickness measuring device 382 hardly sinks, and the grinding step is started, and if the calculated amount of change exceeds the previously registered threshold value, By judging that the surface of the workpiece W with which the second thickness measuring device 382 is in contact is the surface protection member T in which the second thickness measuring device 382 tends to sink, the grinding step is not started. If the workpiece W is suctioned and held in the wrong state by the chuck table 30, that is, if the back surface Wb, which is the surface to be ground of the workpiece W, is adsorbed by the chuck table 30, grinding is performed as it is. Step is carried out the surface protective member T that is eliminated that would not be ground generating grinding defects.

上記のように本発明に係る研削装置3は、第1の厚み測定手段38Aにより測定された第1の厚みデータと第1の厚みデータが測定された時点から任意の時間経過後に測定された第2の厚みデータとからその変化量を算出する算出手段90と、算出手段90が算出した変化量が予め登録されたしきい値以下であれば研削を開始させ、変化量が予め登録されたしきい値を超えている場合にはエラーを表示し研削を開始させない制御手段9と、を備えるものとすることで、被加工物Wがチャックテーブル30により誤った状態で吸引保持されてしまった場合、即ち、被加工物Wの被研削面たる裏面Wbがチャックテーブル30に吸着されてしまった場合に、そのまま粗研削手段31で表面保護部材Tを研削して研削不良を発生させてしまうということが無くなる。   As described above, in the grinding apparatus 3 according to the present invention, the first thickness data measured by the first thickness measuring means 38A and the first thickness data are measured after an arbitrary time has elapsed from the time when the first thickness data is measured. Calculation means 90 for calculating the amount of change from the thickness data of 2 and grinding is started if the amount of change calculated by calculation means 90 is equal to or less than a pre-registered threshold, and the amount of change is registered beforehand. When the workpiece W is suctioned and held in the wrong state by the chuck table 30 by providing the control means 9 that displays an error and does not start grinding when the threshold value is exceeded. That is, when the back surface Wb, which is the surface to be ground of the workpiece W, is adsorbed to the chuck table 30, the surface protection member T is ground by the rough grinding means 31 as it is to cause grinding defects. Bet is lost.

研削装置3の第1の厚み測定手段38Aが、研削開始前の被加工物Wの厚み測定に用いられると共に、研削開始後の被加工物Wの厚み制御にも用いられることで、研削装置3の小型化を図れ、また、研削装置3の製造コストの増加を防ぐことができる。   The first thickness measurement means 38A of the grinding device 3 is used to measure the thickness of the workpiece W before the start of grinding, and is also used to control the thickness of the workpiece W after the start of grinding, thereby the grinding device 3 In addition, it is possible to prevent an increase in the manufacturing cost of the grinding apparatus 3.

なお、本発明に係る研削方法は上記実施形態に限定されるものではなく、また、添付図面に図示されている研削装置3の構成等についても、これに限定されず、本発明の効果を発揮できる範囲内で適宜変更可能である。
例えば、研削装置3は、本実施形態のような研削手段が二軸の研削装置に限定されるものではなく、研削手段が一軸の研削装置であってもよい。
また、例えば、第1の厚み測定手段38Aは、本実施形態のような第1の厚み測定器381と第2の厚み測定器382とを備える構成に限定されず、例えば、第2の厚み測定器382と、第2の厚み測定器382を上下方向に移動可能に保持するキャリッジと、キャリッジの位置を検出する変位検出手段とを備える構成として、1つの厚み測定器で被加工物Wの厚みを測定できるようにしてもよい。
The grinding method according to the present invention is not limited to the above embodiment, and the configuration of the grinding apparatus 3 shown in the attached drawings is not limited to this, and the effects of the present invention are exhibited. It can change suitably within the limits which can be done.
For example, the grinding device 3 in the present embodiment is not limited to the two-axis grinding device, and the grinding device may be a single-axis grinding device.
Also, for example, the first thickness measurement means 38A is not limited to the configuration including the first thickness measurement device 381 and the second thickness measurement device 382 as in this embodiment, and for example, the second thickness measurement Thickness of the workpiece W by one thickness measuring device as a configuration including a device 382, a carriage for holding the second thickness measuring device 382 so as to be vertically movable, and displacement detection means for detecting the position of the carriage. May be measured.

W:被加工物 Wa:被加工物の表面 Wb:被加工物の裏面
T:表面保護部材
3:研削装置 3A:ベース 3B、3C:コラム
30:チャックテーブル 300:吸着部 300a:保持面 301:枠体
31:粗研削手段 310:回転軸 311:ハウジング 312:モータ
313:研削ホイール 313a:粗研削砥石
32:仕上げ研削手段 323a:仕上げ研削砥石
330:ロボット
331:第一のカセット 332:第二のカセット 333:位置合わせ手段 334:洗浄手段
335:第一の搬送手段 336:第二の搬送手段 34:ターンテーブル
35:第一の研削送り手段 350:ボールネジ 351:ガイドレール 352:モータ 353:昇降部
36:第二の研削送り手段 360:ボールネジ 361:ガイドレール 362:モータ 363:昇降部
38A:第1の厚み測定手段 381:第1の厚み測定器 382:第2の厚み測定器
38B:第2の厚み測定手段
9:制御手段 90:算出手段
W: Workpiece Wa: Surface of Workpiece Wb: Back surface of Workpiece
T: surface protection member 3: grinding device 3A: base 3B, 3C: column 30: chuck table 300: suction portion 300a: holding surface 301: frame 31: rough grinding means 310: rotating shaft 311: housing 312: motor 313: Grinding wheel 313a: rough grinding wheel 32: finish grinding means 323a: finish grinding wheel 330: robot 331: first cassette 332: second cassette 333: alignment means 334: cleaning means 335: first conveying means 336: Second conveying means 34: Turn table 35: First grinding feeding means 350: Ball screw 351: Guide rail 352: Motor 353: Lifting part 36: Second grinding feeding means 360: Ball screw 361: Guide rail 362: Motor 363 : Lifting part 38A: First thickness measuring means 381: First See meter 382: second thickness gauge 38B: second thickness measuring means 9: Control means 90: calculation means

Claims (4)

格子状に形成された複数の分割予定ラインにより区画された領域にデバイスが形成された表面を有する被加工物の裏面を研削砥石で研削する被加工物の研削方法であって、
被加工物の表面を表面保護部材で覆う表面保護ステップと、
該表面保護ステップを実施した後、該被加工物を軸方向が鉛直方向である回転軸で回転可能なチャックテーブルの保持面で保持する保持ステップと、
該保持ステップを実施した後、該被加工物のチャックテーブルで保持された面と反対側の面に厚み測定器を接触させて被加工物の厚みを測定し、測定した第1の厚みデータと該第1の厚みデータを測定した時点から任意の時間経過後に測定した第2の厚みデータとからその変化量を算出する厚み測定ステップと、
該厚み測定ステップを実施した後、該保持面と直交する回転軸で回転する研削砥石で研削水を供給しながら被加工物の裏面を研削する研削ステップと、を備え、
該厚み測定ステップでは、算出した該変化量が予め登録したしきい値以下であれば、該厚み測定器が接触した被加工物の該面が該厚み測定器の沈み込みが発生し難い被加工物の裏面であると判断し該研削ステップを開始し、算出した該変化量が該予め登録したしきい値を越えていれば、該厚み測定器が接触した被加工物の該面が該厚み測定器の沈み込みが発生しやすい該表面保護部材であると判断し該研削ステップを開始しない研削方法。
A method of grinding a workpiece, comprising grinding a back surface of a workpiece having a surface on which devices are formed in regions partitioned by a plurality of planned dividing lines formed in a grid shape with a grinding stone,
A surface protection step of covering the surface of the workpiece with a surface protection member;
After performing the surface protection step, a holding step of holding the workpiece on a holding surface of a chuck table that is rotatable about a rotation axis whose axial direction is the vertical direction;
After carrying out the holding step, the thickness measuring device is brought into contact with the surface opposite to the surface held by the chuck table of the workpiece to measure the thickness of the workpiece, and the first thickness data measured A thickness measurement step of calculating an amount of change from the second thickness data measured after an arbitrary time has elapsed from the time of measuring the first thickness data;
And a grinding step of grinding the back surface of the workpiece while supplying grinding water with a grinding wheel rotating on a rotation axis orthogonal to the holding surface after performing the thickness measurement step.
In the thickness measurement step, if the calculated amount of change is equal to or less than a pre-registered threshold value, the surface of the workpiece to which the thickness measurement device is in contact is a workpiece on which the thickness measurement device is unlikely to sink. If it is judged that it is the back side of the object, the grinding step is started, and the calculated change amount exceeds the pre-registered threshold value, the surface of the workpiece to which the thickness measuring device contacts is the thickness A grinding method that does not start the grinding step, judging that the surface protection member is apt to cause sinking of a measuring instrument.
前記表面保護部材は、粘着テープであることを特徴とする請求項1記載の研削方法。   The grinding method according to claim 1, wherein the surface protection member is an adhesive tape. 被加工物を保持するチャックテーブルと、該チャックテーブルに保持された被加工物の厚みを測定する厚み測定手段と、該チャックテーブルに保持された該被加工物を研削する研削手段と、を備えた研削装置であって、
該チャックテーブルは、鉛直方向を軸方向とする回転軸で回転可能であり保持面で表面保護部材が貼着された被加工物を保持し、
該厚み測定手段は、被加工物の研削開始前に被加工物の該チャックテーブルで保持された面と反対側の面に厚み測定器を接触させて厚み測定を行い、
該研削手段は、該チャックテーブルの保持面と直交する回転軸で回転する研削砥石で研削水を供給しながら被加工物の裏面を研削し、
該厚み測定手段により測定された第1の厚みデータと第1の厚みデータが測定された時点から任意の時間経過後に測定された第2の厚みデータとからその変化量を算出する算出手段と、該算出手段が算出した該変化量が予め登録されたしきい値以下であれば研削を開始させ、該変化量が該予め登録されたしきい値を超えている場合にはエラーを表示し研削を開始させない制御手段と、を備えたことを特徴とする研削装置。
A chuck table for holding a workpiece, thickness measuring means for measuring the thickness of the workpiece held by the chuck table, and grinding means for grinding the workpiece held by the chuck table Grinding machine, and
The chuck table is rotatable about an axis of rotation having the vertical direction as an axial direction, and holds a workpiece to which a surface protection member is attached by a holding surface,
The thickness measuring means measures the thickness by bringing a thickness measuring device into contact with the surface of the workpiece opposite to the surface held by the chuck table before the start of grinding of the workpiece.
The grinding means grinds the back surface of the workpiece while supplying grinding water with a grinding wheel rotating on a rotation axis orthogonal to the holding surface of the chuck table.
Calculating means for calculating the amount of change from the first thickness data measured by the thickness measuring means and the second thickness data measured after an elapse of an arbitrary time from the time when the first thickness data is measured; Grinding is started if the amount of change calculated by the calculation means is equal to or less than a pre-registered threshold, and an error is displayed if the amount of change exceeds the pre-registered threshold. And c) a control means which does not start.
前記厚み測定手段は、研削開始前の被加工物の厚み測定に用いられると共に、研削開始後の被加工物の厚み制御にも用いられることを特徴とする請求項3記載の研削装置。   4. The grinding apparatus according to claim 3, wherein the thickness measuring means is used not only to measure the thickness of the workpiece before the start of grinding but also to control the thickness of the workpiece after the start of grinding.
JP2017201728A 2017-10-18 2017-10-18 Grinding method and grinding equipment for workpieces Active JP7015139B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2017201728A JP7015139B2 (en) 2017-10-18 2017-10-18 Grinding method and grinding equipment for workpieces
TW107136178A TWI772535B (en) 2017-10-18 2018-10-15 Grinding method and grinding device of workpiece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017201728A JP7015139B2 (en) 2017-10-18 2017-10-18 Grinding method and grinding equipment for workpieces

Publications (2)

Publication Number Publication Date
JP2019075494A true JP2019075494A (en) 2019-05-16
JP7015139B2 JP7015139B2 (en) 2022-02-02

Family

ID=66544331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017201728A Active JP7015139B2 (en) 2017-10-18 2017-10-18 Grinding method and grinding equipment for workpieces

Country Status (2)

Country Link
JP (1) JP7015139B2 (en)
TW (1) TWI772535B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021008012A (en) * 2019-07-02 2021-01-28 株式会社ディスコ Grinding device
CN113043156A (en) * 2019-12-10 2021-06-29 株式会社迪思科 Grinding device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001028355A (en) * 1999-07-14 2001-01-30 Disco Abrasive Syst Ltd Polishing apparatus
JP2005150528A (en) * 2003-11-18 2005-06-09 Disco Abrasive Syst Ltd Grinding apparatus
JP2006021264A (en) * 2004-07-07 2006-01-26 Disco Abrasive Syst Ltd Grinding apparatus
JP2008098351A (en) * 2006-10-11 2008-04-24 Disco Abrasive Syst Ltd Grinding method of wafer
JP2009043931A (en) * 2007-08-08 2009-02-26 Disco Abrasive Syst Ltd Rear-surface grinding method for wafer
JP5025200B2 (en) * 2006-09-19 2012-09-12 株式会社ディスコ Thickness measurement method during grinding
JP2012193295A (en) * 2011-03-17 2012-10-11 Nitto Denko Corp Adhesive tape
JP2015056510A (en) * 2013-09-12 2015-03-23 株式会社ディスコ Processing method of device wafer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4913481B2 (en) * 2006-06-12 2012-04-11 株式会社ディスコ Wafer grinding equipment
JP5311858B2 (en) * 2008-03-27 2013-10-09 株式会社東京精密 Wafer grinding method and wafer grinding apparatus
JP6388545B2 (en) * 2015-01-16 2018-09-12 株式会社ディスコ Workpiece grinding method
JP6478801B2 (en) * 2015-05-19 2019-03-06 株式会社ディスコ Wafer processing method
TWI651163B (en) * 2015-08-26 2019-02-21 日商迪思科股份有限公司 Grinding method

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001028355A (en) * 1999-07-14 2001-01-30 Disco Abrasive Syst Ltd Polishing apparatus
JP2005150528A (en) * 2003-11-18 2005-06-09 Disco Abrasive Syst Ltd Grinding apparatus
JP2006021264A (en) * 2004-07-07 2006-01-26 Disco Abrasive Syst Ltd Grinding apparatus
JP5025200B2 (en) * 2006-09-19 2012-09-12 株式会社ディスコ Thickness measurement method during grinding
JP2008098351A (en) * 2006-10-11 2008-04-24 Disco Abrasive Syst Ltd Grinding method of wafer
JP2009043931A (en) * 2007-08-08 2009-02-26 Disco Abrasive Syst Ltd Rear-surface grinding method for wafer
JP2012193295A (en) * 2011-03-17 2012-10-11 Nitto Denko Corp Adhesive tape
JP2015056510A (en) * 2013-09-12 2015-03-23 株式会社ディスコ Processing method of device wafer

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021008012A (en) * 2019-07-02 2021-01-28 株式会社ディスコ Grinding device
CN113043156A (en) * 2019-12-10 2021-06-29 株式会社迪思科 Grinding device
CN113043156B (en) * 2019-12-10 2024-03-12 株式会社迪思科 Grinding device

Also Published As

Publication number Publication date
JP7015139B2 (en) 2022-02-02
TWI772535B (en) 2022-08-01
TW201916976A (en) 2019-05-01

Similar Documents

Publication Publication Date Title
JP5461104B2 (en) Holding table and grinding device
JP5917850B2 (en) Wafer processing method
JP6618822B2 (en) Method for detecting wear amount of grinding wheel
JP5963537B2 (en) Processing method of silicon wafer
JP2006203132A (en) Method of grinding wafer
TWI823988B (en) polishing pad
JP2005246491A (en) Grinding apparatus and method for grinding wafer
JP6192778B2 (en) Silicon wafer processing equipment
JP2013004726A (en) Processing method of plate-like object
JP5658586B2 (en) Grinding equipment
JP2018060873A (en) Processing method for wafer
JP2019075494A (en) Grinding method and grinding device of workpiece
JP2017056523A (en) Grinding device
JP2009061568A (en) Tray for processing tabular article and processing device
JP6424081B2 (en) Grinding method
JP7127994B2 (en) Dressing board and dressing method
JP2010137349A (en) Chuck table for wafer and wafer processing apparatus
JP5686570B2 (en) How to use wafer support plate
US20220088742A1 (en) Grinding method for workpiece and grinding apparatus
JP2016078132A (en) Processing device
US20230173638A1 (en) Method of grinding workpiece
JP5975839B2 (en) Grinding equipment
JP2019111634A (en) Method for grinding work-piece
TW202319181A (en) Grinding method and grinding apparatus for workpiece capable of suppressing occurrence of machining defects
KR20230065689A (en) Method and apparatus for grinding a workpiece

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20200814

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20210624

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210803

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20210922

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20211228

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20220121

R150 Certificate of patent or registration of utility model

Ref document number: 7015139

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150