JP2018535104A5 - - Google Patents

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Publication number
JP2018535104A5
JP2018535104A5 JP2018517739A JP2018517739A JP2018535104A5 JP 2018535104 A5 JP2018535104 A5 JP 2018535104A5 JP 2018517739 A JP2018517739 A JP 2018517739A JP 2018517739 A JP2018517739 A JP 2018517739A JP 2018535104 A5 JP2018535104 A5 JP 2018535104A5
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JP
Japan
Prior art keywords
polishing
substrate
polishing pad
polymer
preparing
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JP2018517739A
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English (en)
Japanese (ja)
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JP6949833B2 (ja
JP2018535104A (ja
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Priority claimed from PCT/US2016/055908 external-priority patent/WO2017062719A1/en
Publication of JP2018535104A publication Critical patent/JP2018535104A/ja
Publication of JP2018535104A5 publication Critical patent/JP2018535104A5/ja
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Publication of JP6949833B2 publication Critical patent/JP6949833B2/ja
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JP2018517739A 2015-10-07 2016-10-07 研磨パッド及びシステム、並びにその製造方法及び使用方法 Active JP6949833B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201562238668P 2015-10-07 2015-10-07
US62/238,668 2015-10-07
US201562266963P 2015-12-14 2015-12-14
US62/266,963 2015-12-14
PCT/US2016/055908 WO2017062719A1 (en) 2015-10-07 2016-10-07 Polishing pads and systems and methods of making and using the same

Publications (3)

Publication Number Publication Date
JP2018535104A JP2018535104A (ja) 2018-11-29
JP2018535104A5 true JP2018535104A5 (enExample) 2019-11-14
JP6949833B2 JP6949833B2 (ja) 2021-10-13

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Family Applications (1)

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JP2018517739A Active JP6949833B2 (ja) 2015-10-07 2016-10-07 研磨パッド及びシステム、並びにその製造方法及び使用方法

Country Status (7)

Country Link
US (1) US11154959B2 (enExample)
EP (1) EP3359335B1 (enExample)
JP (1) JP6949833B2 (enExample)
KR (1) KR102615968B1 (enExample)
CN (1) CN108136564B (enExample)
TW (1) TWI769988B (enExample)
WO (1) WO2017062719A1 (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017073556A1 (ja) * 2015-10-27 2017-05-04 富士紡ホールディングス株式会社 ラッピング材及びその製造方法、並びに、研磨物の製造方法
TWI626117B (zh) * 2017-01-19 2018-06-11 智勝科技股份有限公司 研磨墊及研磨方法
KR102608124B1 (ko) * 2017-08-04 2023-11-29 쓰리엠 이노베이티브 프로퍼티즈 컴파니 향상된 동일 평면성을 갖는 미세복제된 폴리싱 표면
TWI650202B (zh) * 2017-08-22 2019-02-11 智勝科技股份有限公司 研磨墊、研磨墊的製造方法及研磨方法
CN111032285B (zh) * 2017-08-25 2022-07-19 3M创新有限公司 表面突起抛光垫
US11685013B2 (en) * 2018-01-24 2023-06-27 Taiwan Semiconductor Manufacturing Company, Ltd. Polishing pad for chemical mechanical planarization
TWI658585B (zh) * 2018-03-30 2019-05-01 世界先進積體電路股份有限公司 半導體結構及其製造方法
CN108972381A (zh) * 2018-07-26 2018-12-11 成都时代立夫科技有限公司 一种cmp抛光垫封边工艺
US11158533B2 (en) 2018-11-07 2021-10-26 Vanguard International Semiconductor Corporation Semiconductor structures and fabrication method thereof
US11331767B2 (en) 2019-02-01 2022-05-17 Micron Technology, Inc. Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods
TWI850338B (zh) 2019-02-28 2024-08-01 美商應用材料股份有限公司 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法
WO2020255744A1 (ja) * 2019-06-19 2020-12-24 株式会社クラレ 研磨パッド、研磨パッドの製造方法及び研磨方法
DE102019218560A1 (de) * 2019-11-29 2021-06-02 Robert Bosch Gmbh Schaumschleifmittel und Verfahren zur Herstellung
US11448391B2 (en) 2019-12-27 2022-09-20 Creeley Patent Llc Illuminating drywall sponge device
TWI717183B (zh) * 2020-01-03 2021-01-21 銓科光電材料股份有限公司 晶圓拋光墊
KR20230028318A (ko) * 2020-06-25 2023-02-28 쓰리엠 이노베이티브 프로퍼티즈 컴파니 폴리싱 패드 및 이를 사용하는 시스템 및 방법
DE102020209519A1 (de) * 2020-07-29 2022-02-03 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel
KR102538440B1 (ko) * 2021-05-26 2023-05-30 에스케이엔펄스 주식회사 연마 시스템, 연마 패드 및 반도체 소자의 제조방법
US12162118B2 (en) 2021-07-01 2024-12-10 Creeley Patent Llc Flexible density sanding system
JP7441916B2 (ja) * 2021-10-12 2024-03-01 エスケー エンパルス カンパニー リミテッド 研磨パッドおよびこれを用いた半導体素子の製造方法
CN117794686A (zh) * 2021-11-12 2024-03-29 韩商Kpx化学股份有限公司 包括与碳纳米管结合的高耐磨薄膜涂层的复合抛光垫和生产该复合抛光垫的方法
US20240253178A1 (en) * 2021-11-12 2024-08-01 Kpx Chemical Co., Ltd. Composite polishing pad including carbon nanotubes, and method for producing same
US20250033162A1 (en) * 2021-12-31 2025-01-30 3M Innovative Properties Company Microreplicated polishing pad including fluorinated polymer window
TWI841907B (zh) * 2022-01-17 2024-05-11 貝達先進材料股份有限公司 研磨墊、製造研磨墊之方法及研磨裝置

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5152917B1 (en) 1991-02-06 1998-01-13 Minnesota Mining & Mfg Structured abrasive article
US5435816A (en) 1993-01-14 1995-07-25 Minnesota Mining And Manufacturing Company Method of making an abrasive article
US5489233A (en) 1994-04-08 1996-02-06 Rodel, Inc. Polishing pads and methods for their use
CA2217018C (en) 1995-04-26 2006-10-17 Minnesota Mining And Manufacturing Company Method and apparatus for step and repeat exposures
US5958794A (en) 1995-09-22 1999-09-28 Minnesota Mining And Manufacturing Company Method of modifying an exposed surface of a semiconductor wafer
US6736714B2 (en) * 1997-07-30 2004-05-18 Praxair S.T. Technology, Inc. Polishing silicon wafers
JPH11111656A (ja) 1997-09-30 1999-04-23 Nec Corp 半導体装置の製造方法
US6139402A (en) * 1997-12-30 2000-10-31 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates
US6372323B1 (en) 1998-10-05 2002-04-16 3M Innovative Properties Company Slip control article for wet and dry applications
US6261168B1 (en) * 1999-05-21 2001-07-17 Lam Research Corporation Chemical mechanical planarization or polishing pad with sections having varied groove patterns
US6234875B1 (en) 1999-06-09 2001-05-22 3M Innovative Properties Company Method of modifying a surface
KR100344528B1 (ko) * 1999-06-16 2002-07-24 동성에이앤티 주식회사 세포조직 구조의 미세 중공 폴리머 다발을 갖는 폴리싱 패드 및 그 제조방법
US6406363B1 (en) * 1999-08-31 2002-06-18 Lam Research Corporation Unsupported chemical mechanical polishing belt
US6852766B1 (en) 2000-06-15 2005-02-08 3M Innovative Properties Company Multiphoton photosensitization system
US6949128B2 (en) * 2001-12-28 2005-09-27 3M Innovative Properties Company Method of making an abrasive product
US6852020B2 (en) * 2003-01-22 2005-02-08 Raytech Innovative Solutions, Inc. Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same
US7201647B2 (en) * 2002-06-07 2007-04-10 Praxair Technology, Inc. Subpad having robust, sealed edges
US9278424B2 (en) * 2003-03-25 2016-03-08 Nexplanar Corporation Customized polishing pads for CMP and methods of fabrication and use thereof
US7226345B1 (en) * 2005-12-09 2007-06-05 The Regents Of The University Of California CMP pad with designed surface features
US8398462B2 (en) * 2008-02-21 2013-03-19 Chien-Min Sung CMP pads and method of creating voids in-situ therein
US20100188751A1 (en) 2009-01-29 2010-07-29 3M Innovative Properties Company Optical films with internally conformable layers and method of making the films
SG181890A1 (en) * 2009-12-22 2012-07-30 3M Innovative Properties Co Polishing pad and method of making the same
US9162340B2 (en) * 2009-12-30 2015-10-20 3M Innovative Properties Company Polishing pads including phase-separated polymer blend and method of making and using the same
WO2011139593A1 (en) 2010-05-03 2011-11-10 3M Innovative Properties Company Method of making a nanostructure
US20140256231A1 (en) 2013-03-07 2014-09-11 Dow Global Technologies Llc Multilayer Chemical Mechanical Polishing Pad With Broad Spectrum, Endpoint Detection Window
JP6505693B2 (ja) 2013-07-26 2019-04-24 スリーエム イノベイティブ プロパティズ カンパニー ナノ構造及びナノ構造化物品の作製方法
US20150056895A1 (en) * 2013-08-22 2015-02-26 Cabot Microelectronics Corporation Ultra high void volume polishing pad with closed pore structure
CN106163740B (zh) 2014-04-03 2019-07-09 3M创新有限公司 抛光垫和系统以及制造和使用该抛光垫和系统的方法
CN104149023A (zh) * 2014-07-17 2014-11-19 湖北鼎龙化学股份有限公司 化学机械抛光垫
US11331767B2 (en) * 2019-02-01 2022-05-17 Micron Technology, Inc. Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods

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