KR102615968B1 - 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법 - Google Patents
폴리싱 패드 및 시스템과 이의 제조 및 사용 방법 Download PDFInfo
- Publication number
- KR102615968B1 KR102615968B1 KR1020187012529A KR20187012529A KR102615968B1 KR 102615968 B1 KR102615968 B1 KR 102615968B1 KR 1020187012529 A KR1020187012529 A KR 1020187012529A KR 20187012529 A KR20187012529 A KR 20187012529A KR 102615968 B1 KR102615968 B1 KR 102615968B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- less
- layer
- micrometers
- polishing pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
- B24D18/0009—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for using moulds or presses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562238668P | 2015-10-07 | 2015-10-07 | |
| US62/238,668 | 2015-10-07 | ||
| US201562266963P | 2015-12-14 | 2015-12-14 | |
| US62/266,963 | 2015-12-14 | ||
| PCT/US2016/055908 WO2017062719A1 (en) | 2015-10-07 | 2016-10-07 | Polishing pads and systems and methods of making and using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20180066126A KR20180066126A (ko) | 2018-06-18 |
| KR102615968B1 true KR102615968B1 (ko) | 2023-12-19 |
Family
ID=57178518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187012529A Active KR102615968B1 (ko) | 2015-10-07 | 2016-10-07 | 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11154959B2 (enExample) |
| EP (1) | EP3359335B1 (enExample) |
| JP (1) | JP6949833B2 (enExample) |
| KR (1) | KR102615968B1 (enExample) |
| CN (1) | CN108136564B (enExample) |
| TW (1) | TWI769988B (enExample) |
| WO (1) | WO2017062719A1 (enExample) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6944374B2 (ja) * | 2015-10-27 | 2021-10-06 | 富士紡ホールディングス株式会社 | ラッピング材及びその製造方法、並びに、研磨物の製造方法 |
| TWI626117B (zh) * | 2017-01-19 | 2018-06-11 | 智勝科技股份有限公司 | 研磨墊及研磨方法 |
| JP7165719B2 (ja) * | 2017-08-04 | 2022-11-04 | スリーエム イノベイティブ プロパティズ カンパニー | 平坦性が向上された微細複製研磨表面 |
| TWI650202B (zh) * | 2017-08-22 | 2019-02-11 | 智勝科技股份有限公司 | 研磨墊、研磨墊的製造方法及研磨方法 |
| WO2019038675A1 (en) | 2017-08-25 | 2019-02-28 | 3M Innovative Properties Company | SURFACE SURFACE SURFACE POLISHING PAD |
| US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
| TWI658585B (zh) * | 2018-03-30 | 2019-05-01 | 世界先進積體電路股份有限公司 | 半導體結構及其製造方法 |
| CN108972381A (zh) * | 2018-07-26 | 2018-12-11 | 成都时代立夫科技有限公司 | 一种cmp抛光垫封边工艺 |
| US11158533B2 (en) | 2018-11-07 | 2021-10-26 | Vanguard International Semiconductor Corporation | Semiconductor structures and fabrication method thereof |
| US11331767B2 (en) | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| TWI850338B (zh) * | 2019-02-28 | 2024-08-01 | 美商應用材料股份有限公司 | 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法 |
| JP7514234B2 (ja) * | 2019-06-19 | 2024-07-10 | 株式会社クラレ | 研磨パッド、研磨パッドの製造方法及び研磨方法 |
| DE102019218560A1 (de) * | 2019-11-29 | 2021-06-02 | Robert Bosch Gmbh | Schaumschleifmittel und Verfahren zur Herstellung |
| US11448391B2 (en) | 2019-12-27 | 2022-09-20 | Creeley Patent Llc | Illuminating drywall sponge device |
| TWI717183B (zh) * | 2020-01-03 | 2021-01-21 | 銓科光電材料股份有限公司 | 晶圓拋光墊 |
| WO2021260629A1 (en) * | 2020-06-25 | 2021-12-30 | 3M Innovative Properties Company | Polishing pads and systems for and methods of using same |
| DE102020209519A1 (de) * | 2020-07-29 | 2022-02-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel |
| IT202100007232A1 (it) * | 2021-03-25 | 2022-09-25 | Surfaces Tech Abrasives S P A | Modulo abrasivo e relativa cinghia modulare |
| KR102538440B1 (ko) * | 2021-05-26 | 2023-05-30 | 에스케이엔펄스 주식회사 | 연마 시스템, 연마 패드 및 반도체 소자의 제조방법 |
| US12162118B2 (en) | 2021-07-01 | 2024-12-10 | Creeley Patent Llc | Flexible density sanding system |
| KR102594068B1 (ko) * | 2021-10-12 | 2023-10-24 | 에스케이엔펄스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| JP7441916B2 (ja) * | 2021-10-12 | 2024-03-01 | エスケー エンパルス カンパニー リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
| WO2023085470A1 (ko) * | 2021-11-12 | 2023-05-19 | 케이피엑스케미칼 주식회사 | 탄소나노튜브로 결속된 고내마모성 박막 코팅을 포함하는 복합 연마패드 및 이의 제조방법 |
| US20240253178A1 (en) * | 2021-11-12 | 2024-08-01 | Kpx Chemical Co., Ltd. | Composite polishing pad including carbon nanotubes, and method for producing same |
| CN118613348A (zh) * | 2021-12-31 | 2024-09-06 | 3M创新有限公司 | 包括氟化聚合物窗口的微复制型抛光垫 |
| TWI841907B (zh) * | 2022-01-17 | 2024-05-11 | 貝達先進材料股份有限公司 | 研磨墊、製造研磨墊之方法及研磨裝置 |
| KR20230166405A (ko) | 2022-05-30 | 2023-12-07 | 삼성전자주식회사 | 연마 패드 및 이를 포함하는 기판 처리 장치 |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
| US5435816A (en) | 1993-01-14 | 1995-07-25 | Minnesota Mining And Manufacturing Company | Method of making an abrasive article |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| CA2217018C (en) | 1995-04-26 | 2006-10-17 | Minnesota Mining And Manufacturing Company | Method and apparatus for step and repeat exposures |
| US5958794A (en) | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
| US6736714B2 (en) * | 1997-07-30 | 2004-05-18 | Praxair S.T. Technology, Inc. | Polishing silicon wafers |
| JPH11111656A (ja) | 1997-09-30 | 1999-04-23 | Nec Corp | 半導体装置の製造方法 |
| US6139402A (en) * | 1997-12-30 | 2000-10-31 | Micron Technology, Inc. | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates |
| US6372323B1 (en) | 1998-10-05 | 2002-04-16 | 3M Innovative Properties Company | Slip control article for wet and dry applications |
| US6261168B1 (en) * | 1999-05-21 | 2001-07-17 | Lam Research Corporation | Chemical mechanical planarization or polishing pad with sections having varied groove patterns |
| US6234875B1 (en) | 1999-06-09 | 2001-05-22 | 3M Innovative Properties Company | Method of modifying a surface |
| KR100344528B1 (ko) * | 1999-06-16 | 2002-07-24 | 동성에이앤티 주식회사 | 세포조직 구조의 미세 중공 폴리머 다발을 갖는 폴리싱 패드 및 그 제조방법 |
| US6406363B1 (en) * | 1999-08-31 | 2002-06-18 | Lam Research Corporation | Unsupported chemical mechanical polishing belt |
| US6852766B1 (en) | 2000-06-15 | 2005-02-08 | 3M Innovative Properties Company | Multiphoton photosensitization system |
| US6949128B2 (en) | 2001-12-28 | 2005-09-27 | 3M Innovative Properties Company | Method of making an abrasive product |
| US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
| US7201647B2 (en) * | 2002-06-07 | 2007-04-10 | Praxair Technology, Inc. | Subpad having robust, sealed edges |
| US9278424B2 (en) * | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| US8398462B2 (en) * | 2008-02-21 | 2013-03-19 | Chien-Min Sung | CMP pads and method of creating voids in-situ therein |
| US20100188751A1 (en) | 2009-01-29 | 2010-07-29 | 3M Innovative Properties Company | Optical films with internally conformable layers and method of making the films |
| SG181890A1 (en) * | 2009-12-22 | 2012-07-30 | 3M Innovative Properties Co | Polishing pad and method of making the same |
| CN102686362A (zh) * | 2009-12-30 | 2012-09-19 | 3M创新有限公司 | 包括分相共混聚合物的抛光垫及其制备和使用方法 |
| JP5438245B2 (ja) | 2010-05-03 | 2014-03-12 | スリーエム イノベイティブ プロパティズ カンパニー | ナノ構造の作製方法 |
| US20140256231A1 (en) | 2013-03-07 | 2014-09-11 | Dow Global Technologies Llc | Multilayer Chemical Mechanical Polishing Pad With Broad Spectrum, Endpoint Detection Window |
| EP3024777B1 (en) | 2013-07-26 | 2024-05-15 | 3M Innovative Properties Company | Method of making a nanostructure |
| US20150056895A1 (en) * | 2013-08-22 | 2015-02-26 | Cabot Microelectronics Corporation | Ultra high void volume polishing pad with closed pore structure |
| WO2015153601A1 (en) | 2014-04-03 | 2015-10-08 | 3M Innovative Properties Company | Polishing pads and systems and methods of making and using the same |
| CN104149023A (zh) * | 2014-07-17 | 2014-11-19 | 湖北鼎龙化学股份有限公司 | 化学机械抛光垫 |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
-
2016
- 2016-10-06 TW TW105132463A patent/TWI769988B/zh active
- 2016-10-07 KR KR1020187012529A patent/KR102615968B1/ko active Active
- 2016-10-07 WO PCT/US2016/055908 patent/WO2017062719A1/en not_active Ceased
- 2016-10-07 CN CN201680058703.7A patent/CN108136564B/zh active Active
- 2016-10-07 US US15/766,643 patent/US11154959B2/en active Active
- 2016-10-07 EP EP16784672.4A patent/EP3359335B1/en active Active
- 2016-10-07 JP JP2018517739A patent/JP6949833B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN108136564B (zh) | 2021-06-22 |
| WO2017062719A1 (en) | 2017-04-13 |
| JP2018535104A (ja) | 2018-11-29 |
| US11154959B2 (en) | 2021-10-26 |
| CN108136564A (zh) | 2018-06-08 |
| EP3359335B1 (en) | 2023-07-05 |
| US20180281148A1 (en) | 2018-10-04 |
| JP6949833B2 (ja) | 2021-10-13 |
| EP3359335A1 (en) | 2018-08-15 |
| TW201726316A (zh) | 2017-08-01 |
| TWI769988B (zh) | 2022-07-11 |
| KR20180066126A (ko) | 2018-06-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20180502 Patent event code: PA01051R01D Comment text: International Patent Application |
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| PG1501 | Laying open of application | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20211007 Comment text: Request for Examination of Application |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20230621 Patent event code: PE09021S01D |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20230918 |
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| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20231215 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20231215 End annual number: 3 Start annual number: 1 |
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| PG1601 | Publication of registration |