JP6949833B2 - 研磨パッド及びシステム、並びにその製造方法及び使用方法 - Google Patents
研磨パッド及びシステム、並びにその製造方法及び使用方法 Download PDFInfo
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- JP6949833B2 JP6949833B2 JP2018517739A JP2018517739A JP6949833B2 JP 6949833 B2 JP6949833 B2 JP 6949833B2 JP 2018517739 A JP2018517739 A JP 2018517739A JP 2018517739 A JP2018517739 A JP 2018517739A JP 6949833 B2 JP6949833 B2 JP 6949833B2
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (5)
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| US201562238668P | 2015-10-07 | 2015-10-07 | |
| US62/238,668 | 2015-10-07 | ||
| US201562266963P | 2015-12-14 | 2015-12-14 | |
| US62/266,963 | 2015-12-14 | ||
| PCT/US2016/055908 WO2017062719A1 (en) | 2015-10-07 | 2016-10-07 | Polishing pads and systems and methods of making and using the same |
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| JP2018535104A5 JP2018535104A5 (enExample) | 2019-11-14 |
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| TWI626117B (zh) * | 2017-01-19 | 2018-06-11 | 智勝科技股份有限公司 | 研磨墊及研磨方法 |
| KR102608124B1 (ko) * | 2017-08-04 | 2023-11-29 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 향상된 동일 평면성을 갖는 미세복제된 폴리싱 표면 |
| TWI650202B (zh) * | 2017-08-22 | 2019-02-11 | 智勝科技股份有限公司 | 研磨墊、研磨墊的製造方法及研磨方法 |
| CN111032285B (zh) * | 2017-08-25 | 2022-07-19 | 3M创新有限公司 | 表面突起抛光垫 |
| US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
| TWI658585B (zh) * | 2018-03-30 | 2019-05-01 | 世界先進積體電路股份有限公司 | 半導體結構及其製造方法 |
| CN108972381A (zh) * | 2018-07-26 | 2018-12-11 | 成都时代立夫科技有限公司 | 一种cmp抛光垫封边工艺 |
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| WO2020255744A1 (ja) * | 2019-06-19 | 2020-12-24 | 株式会社クラレ | 研磨パッド、研磨パッドの製造方法及び研磨方法 |
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| DE102020209519A1 (de) * | 2020-07-29 | 2022-02-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel |
| KR102538440B1 (ko) * | 2021-05-26 | 2023-05-30 | 에스케이엔펄스 주식회사 | 연마 시스템, 연마 패드 및 반도체 소자의 제조방법 |
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| JP7441916B2 (ja) * | 2021-10-12 | 2024-03-01 | エスケー エンパルス カンパニー リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
| CN117794686A (zh) * | 2021-11-12 | 2024-03-29 | 韩商Kpx化学股份有限公司 | 包括与碳纳米管结合的高耐磨薄膜涂层的复合抛光垫和生产该复合抛光垫的方法 |
| US20240253178A1 (en) * | 2021-11-12 | 2024-08-01 | Kpx Chemical Co., Ltd. | Composite polishing pad including carbon nanotubes, and method for producing same |
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| TWI841907B (zh) * | 2022-01-17 | 2024-05-11 | 貝達先進材料股份有限公司 | 研磨墊、製造研磨墊之方法及研磨裝置 |
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| US5958794A (en) | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
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| KR100344528B1 (ko) * | 1999-06-16 | 2002-07-24 | 동성에이앤티 주식회사 | 세포조직 구조의 미세 중공 폴리머 다발을 갖는 폴리싱 패드 및 그 제조방법 |
| US6406363B1 (en) * | 1999-08-31 | 2002-06-18 | Lam Research Corporation | Unsupported chemical mechanical polishing belt |
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| US6949128B2 (en) * | 2001-12-28 | 2005-09-27 | 3M Innovative Properties Company | Method of making an abrasive product |
| US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
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| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| US8398462B2 (en) * | 2008-02-21 | 2013-03-19 | Chien-Min Sung | CMP pads and method of creating voids in-situ therein |
| US20100188751A1 (en) | 2009-01-29 | 2010-07-29 | 3M Innovative Properties Company | Optical films with internally conformable layers and method of making the films |
| SG181890A1 (en) * | 2009-12-22 | 2012-07-30 | 3M Innovative Properties Co | Polishing pad and method of making the same |
| US9162340B2 (en) * | 2009-12-30 | 2015-10-20 | 3M Innovative Properties Company | Polishing pads including phase-separated polymer blend and method of making and using the same |
| WO2011139593A1 (en) | 2010-05-03 | 2011-11-10 | 3M Innovative Properties Company | Method of making a nanostructure |
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| JP6505693B2 (ja) | 2013-07-26 | 2019-04-24 | スリーエム イノベイティブ プロパティズ カンパニー | ナノ構造及びナノ構造化物品の作製方法 |
| US20150056895A1 (en) * | 2013-08-22 | 2015-02-26 | Cabot Microelectronics Corporation | Ultra high void volume polishing pad with closed pore structure |
| CN106163740B (zh) | 2014-04-03 | 2019-07-09 | 3M创新有限公司 | 抛光垫和系统以及制造和使用该抛光垫和系统的方法 |
| CN104149023A (zh) * | 2014-07-17 | 2014-11-19 | 湖北鼎龙化学股份有限公司 | 化学机械抛光垫 |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
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2016
- 2016-10-06 TW TW105132463A patent/TWI769988B/zh active
- 2016-10-07 WO PCT/US2016/055908 patent/WO2017062719A1/en not_active Ceased
- 2016-10-07 KR KR1020187012529A patent/KR102615968B1/ko active Active
- 2016-10-07 EP EP16784672.4A patent/EP3359335B1/en active Active
- 2016-10-07 JP JP2018517739A patent/JP6949833B2/ja active Active
- 2016-10-07 US US15/766,643 patent/US11154959B2/en active Active
- 2016-10-07 CN CN201680058703.7A patent/CN108136564B/zh active Active
Also Published As
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|---|---|
| EP3359335B1 (en) | 2023-07-05 |
| WO2017062719A1 (en) | 2017-04-13 |
| KR102615968B1 (ko) | 2023-12-19 |
| EP3359335A1 (en) | 2018-08-15 |
| TWI769988B (zh) | 2022-07-11 |
| KR20180066126A (ko) | 2018-06-18 |
| CN108136564B (zh) | 2021-06-22 |
| JP2018535104A (ja) | 2018-11-29 |
| TW201726316A (zh) | 2017-08-01 |
| US11154959B2 (en) | 2021-10-26 |
| US20180281148A1 (en) | 2018-10-04 |
| CN108136564A (zh) | 2018-06-08 |
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