TWI769988B - 拋光墊與系統及其製造與使用方法 - Google Patents
拋光墊與系統及其製造與使用方法 Download PDFInfo
- Publication number
- TWI769988B TWI769988B TW105132463A TW105132463A TWI769988B TW I769988 B TWI769988 B TW I769988B TW 105132463 A TW105132463 A TW 105132463A TW 105132463 A TW105132463 A TW 105132463A TW I769988 B TWI769988 B TW I769988B
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing
- layer
- polishing pad
- less
- microns
- Prior art date
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/02—Backings, e.g. foils, webs, mesh fabrics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
- B24D18/0009—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for using moulds or presses
-
- H10P52/00—
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562238668P | 2015-10-07 | 2015-10-07 | |
| US62/238,668 | 2015-10-07 | ||
| US201562266963P | 2015-12-14 | 2015-12-14 | |
| US62/266,963 | 2015-12-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201726316A TW201726316A (zh) | 2017-08-01 |
| TWI769988B true TWI769988B (zh) | 2022-07-11 |
Family
ID=57178518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105132463A TWI769988B (zh) | 2015-10-07 | 2016-10-06 | 拋光墊與系統及其製造與使用方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11154959B2 (enExample) |
| EP (1) | EP3359335B1 (enExample) |
| JP (1) | JP6949833B2 (enExample) |
| KR (1) | KR102615968B1 (enExample) |
| CN (1) | CN108136564B (enExample) |
| TW (1) | TWI769988B (enExample) |
| WO (1) | WO2017062719A1 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6944374B2 (ja) * | 2015-10-27 | 2021-10-06 | 富士紡ホールディングス株式会社 | ラッピング材及びその製造方法、並びに、研磨物の製造方法 |
| TWI626117B (zh) * | 2017-01-19 | 2018-06-11 | 智勝科技股份有限公司 | 研磨墊及研磨方法 |
| WO2019026021A1 (en) * | 2017-08-04 | 2019-02-07 | 3M Innovative Properties Company | MICRO-REPLICATED POLISHING SURFACE WITH IMPROVED COPLANARITY |
| TWI650202B (zh) * | 2017-08-22 | 2019-02-11 | 智勝科技股份有限公司 | 研磨墊、研磨墊的製造方法及研磨方法 |
| JP7273796B2 (ja) * | 2017-08-25 | 2023-05-15 | スリーエム イノベイティブ プロパティズ カンパニー | 表面突起研磨パッド |
| US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
| TWI658585B (zh) * | 2018-03-30 | 2019-05-01 | 世界先進積體電路股份有限公司 | 半導體結構及其製造方法 |
| CN108972381A (zh) * | 2018-07-26 | 2018-12-11 | 成都时代立夫科技有限公司 | 一种cmp抛光垫封边工艺 |
| US11158533B2 (en) | 2018-11-07 | 2021-10-26 | Vanguard International Semiconductor Corporation | Semiconductor structures and fabrication method thereof |
| US11331767B2 (en) | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| TWI850338B (zh) | 2019-02-28 | 2024-08-01 | 美商應用材料股份有限公司 | 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法 |
| WO2020255744A1 (ja) * | 2019-06-19 | 2020-12-24 | 株式会社クラレ | 研磨パッド、研磨パッドの製造方法及び研磨方法 |
| DE102019218560A1 (de) * | 2019-11-29 | 2021-06-02 | Robert Bosch Gmbh | Schaumschleifmittel und Verfahren zur Herstellung |
| US11448391B2 (en) | 2019-12-27 | 2022-09-20 | Creeley Patent Llc | Illuminating drywall sponge device |
| TWI717183B (zh) * | 2020-01-03 | 2021-01-21 | 銓科光電材料股份有限公司 | 晶圓拋光墊 |
| US20230211455A1 (en) * | 2020-06-25 | 2023-07-06 | 3M Innovative Properties Company | Polishing pads and systems for and methods of using same |
| DE102020209519A1 (de) * | 2020-07-29 | 2022-02-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel |
| KR102538440B1 (ko) * | 2021-05-26 | 2023-05-30 | 에스케이엔펄스 주식회사 | 연마 시스템, 연마 패드 및 반도체 소자의 제조방법 |
| US12162118B2 (en) | 2021-07-01 | 2024-12-10 | Creeley Patent Llc | Flexible density sanding system |
| KR102594068B1 (ko) * | 2021-10-12 | 2023-10-24 | 에스케이엔펄스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| JP7441916B2 (ja) * | 2021-10-12 | 2024-03-01 | エスケー エンパルス カンパニー リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
| US20240253178A1 (en) * | 2021-11-12 | 2024-08-01 | Kpx Chemical Co., Ltd. | Composite polishing pad including carbon nanotubes, and method for producing same |
| WO2023085470A1 (ko) * | 2021-11-12 | 2023-05-19 | 케이피엑스케미칼 주식회사 | 탄소나노튜브로 결속된 고내마모성 박막 코팅을 포함하는 복합 연마패드 및 이의 제조방법 |
| US20250033162A1 (en) * | 2021-12-31 | 2025-01-30 | 3M Innovative Properties Company | Microreplicated polishing pad including fluorinated polymer window |
| TWI841907B (zh) * | 2022-01-17 | 2024-05-11 | 貝達先進材料股份有限公司 | 研磨墊、製造研磨墊之方法及研磨裝置 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001512057A (ja) * | 1997-07-30 | 2001-08-21 | スキャッパ、グループ、ピー・エル・シー | 半導体ウエハーの研磨 |
| US20020031984A1 (en) * | 1997-12-30 | 2002-03-14 | Moore Scott E. | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates |
| TW200406287A (en) * | 2002-06-07 | 2004-05-01 | Praxair Technology Inc | Subpad having robust, sealed edges |
| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| TW201505758A (zh) * | 2013-03-07 | 2015-02-16 | 羅門哈斯電子材料Cmp控股公司 | 具有寬譜終點偵測窗之多層化學機械硏磨墊 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
| US5435816A (en) | 1993-01-14 | 1995-07-25 | Minnesota Mining And Manufacturing Company | Method of making an abrasive article |
| US5489233A (en) | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| KR19990007929A (ko) | 1995-04-26 | 1999-01-25 | 데이빗로스클리블랜드 | 다면 반복 노광 방법 및 장치 |
| US5958794A (en) | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
| JPH11111656A (ja) | 1997-09-30 | 1999-04-23 | Nec Corp | 半導体装置の製造方法 |
| US6372323B1 (en) | 1998-10-05 | 2002-04-16 | 3M Innovative Properties Company | Slip control article for wet and dry applications |
| US6261168B1 (en) * | 1999-05-21 | 2001-07-17 | Lam Research Corporation | Chemical mechanical planarization or polishing pad with sections having varied groove patterns |
| US6234875B1 (en) | 1999-06-09 | 2001-05-22 | 3M Innovative Properties Company | Method of modifying a surface |
| KR100344528B1 (ko) * | 1999-06-16 | 2002-07-24 | 동성에이앤티 주식회사 | 세포조직 구조의 미세 중공 폴리머 다발을 갖는 폴리싱 패드 및 그 제조방법 |
| US6406363B1 (en) * | 1999-08-31 | 2002-06-18 | Lam Research Corporation | Unsupported chemical mechanical polishing belt |
| US6852766B1 (en) | 2000-06-15 | 2005-02-08 | 3M Innovative Properties Company | Multiphoton photosensitization system |
| US6949128B2 (en) | 2001-12-28 | 2005-09-27 | 3M Innovative Properties Company | Method of making an abrasive product |
| US6852020B2 (en) * | 2003-01-22 | 2005-02-08 | Raytech Innovative Solutions, Inc. | Polishing pad for use in chemical—mechanical planarization of semiconductor wafers and method of making same |
| US9278424B2 (en) * | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US8398462B2 (en) * | 2008-02-21 | 2013-03-19 | Chien-Min Sung | CMP pads and method of creating voids in-situ therein |
| US20100188751A1 (en) | 2009-01-29 | 2010-07-29 | 3M Innovative Properties Company | Optical films with internally conformable layers and method of making the films |
| US20130012108A1 (en) * | 2009-12-22 | 2013-01-10 | Naichao Li | Polishing pad and method of making the same |
| SG181678A1 (en) * | 2009-12-30 | 2012-07-30 | 3M Innovative Properties Co | Polishing pads including phase-separated polymer blend and method of making and using the same |
| EP2566681B1 (en) | 2010-05-03 | 2018-09-26 | 3M Innovative Properties Company | Method of making a nanostructure |
| CN105431376B (zh) | 2013-07-26 | 2018-08-31 | 3M创新有限公司 | 制备纳米结构和纳米结构化制品的方法 |
| US20150056895A1 (en) * | 2013-08-22 | 2015-02-26 | Cabot Microelectronics Corporation | Ultra high void volume polishing pad with closed pore structure |
| JP6640106B2 (ja) | 2014-04-03 | 2020-02-05 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨パッド及びシステム、並びにその作製方法及び使用方法 |
| CN104149023A (zh) * | 2014-07-17 | 2014-11-19 | 湖北鼎龙化学股份有限公司 | 化学机械抛光垫 |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
-
2016
- 2016-10-06 TW TW105132463A patent/TWI769988B/zh active
- 2016-10-07 CN CN201680058703.7A patent/CN108136564B/zh active Active
- 2016-10-07 KR KR1020187012529A patent/KR102615968B1/ko active Active
- 2016-10-07 EP EP16784672.4A patent/EP3359335B1/en active Active
- 2016-10-07 WO PCT/US2016/055908 patent/WO2017062719A1/en not_active Ceased
- 2016-10-07 US US15/766,643 patent/US11154959B2/en active Active
- 2016-10-07 JP JP2018517739A patent/JP6949833B2/ja active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001512057A (ja) * | 1997-07-30 | 2001-08-21 | スキャッパ、グループ、ピー・エル・シー | 半導体ウエハーの研磨 |
| US20020031984A1 (en) * | 1997-12-30 | 2002-03-14 | Moore Scott E. | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates |
| TW200406287A (en) * | 2002-06-07 | 2004-05-01 | Praxair Technology Inc | Subpad having robust, sealed edges |
| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| TW201505758A (zh) * | 2013-03-07 | 2015-02-16 | 羅門哈斯電子材料Cmp控股公司 | 具有寬譜終點偵測窗之多層化學機械硏磨墊 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20180066126A (ko) | 2018-06-18 |
| US11154959B2 (en) | 2021-10-26 |
| US20180281148A1 (en) | 2018-10-04 |
| JP6949833B2 (ja) | 2021-10-13 |
| EP3359335A1 (en) | 2018-08-15 |
| EP3359335B1 (en) | 2023-07-05 |
| TW201726316A (zh) | 2017-08-01 |
| KR102615968B1 (ko) | 2023-12-19 |
| CN108136564A (zh) | 2018-06-08 |
| WO2017062719A1 (en) | 2017-04-13 |
| JP2018535104A (ja) | 2018-11-29 |
| CN108136564B (zh) | 2021-06-22 |
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