TWI769988B - 拋光墊與系統及其製造與使用方法 - Google Patents
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- TWI769988B TWI769988B TW105132463A TW105132463A TWI769988B TW I769988 B TWI769988 B TW I769988B TW 105132463 A TW105132463 A TW 105132463A TW 105132463 A TW105132463 A TW 105132463A TW I769988 B TWI769988 B TW I769988B
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Images
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562238668P | 2015-10-07 | 2015-10-07 | |
| US62/238,668 | 2015-10-07 | ||
| US201562266963P | 2015-12-14 | 2015-12-14 | |
| US62/266,963 | 2015-12-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201726316A TW201726316A (zh) | 2017-08-01 |
| TWI769988B true TWI769988B (zh) | 2022-07-11 |
Family
ID=57178518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW105132463A TWI769988B (zh) | 2015-10-07 | 2016-10-06 | 拋光墊與系統及其製造與使用方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US11154959B2 (enExample) |
| EP (1) | EP3359335B1 (enExample) |
| JP (1) | JP6949833B2 (enExample) |
| KR (1) | KR102615968B1 (enExample) |
| CN (1) | CN108136564B (enExample) |
| TW (1) | TWI769988B (enExample) |
| WO (1) | WO2017062719A1 (enExample) |
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| EP3354406B1 (en) * | 2015-10-27 | 2023-11-22 | Fujibo Holdings, Inc. | Wrapping material and method for manufacturing same, and method for manufacturing abrasive |
| TWI626117B (zh) * | 2017-01-19 | 2018-06-11 | 智勝科技股份有限公司 | 研磨墊及研磨方法 |
| WO2019026021A1 (en) * | 2017-08-04 | 2019-02-07 | 3M Innovative Properties Company | MICRO-REPLICATED POLISHING SURFACE WITH IMPROVED COPLANARITY |
| TWI650202B (zh) * | 2017-08-22 | 2019-02-11 | 智勝科技股份有限公司 | 研磨墊、研磨墊的製造方法及研磨方法 |
| JP7273796B2 (ja) * | 2017-08-25 | 2023-05-15 | スリーエム イノベイティブ プロパティズ カンパニー | 表面突起研磨パッド |
| US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
| TWI658585B (zh) * | 2018-03-30 | 2019-05-01 | 世界先進積體電路股份有限公司 | 半導體結構及其製造方法 |
| CN108972381A (zh) * | 2018-07-26 | 2018-12-11 | 成都时代立夫科技有限公司 | 一种cmp抛光垫封边工艺 |
| US11158533B2 (en) | 2018-11-07 | 2021-10-26 | Vanguard International Semiconductor Corporation | Semiconductor structures and fabrication method thereof |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| TWI850338B (zh) | 2019-02-28 | 2024-08-01 | 美商應用材料股份有限公司 | 拋光墊、化學機械拋光系統、及控制拋光墊的背襯層的剛度的方法 |
| KR102674356B1 (ko) * | 2019-06-19 | 2024-06-11 | 주식회사 쿠라레 | 연마 패드, 연마 패드의 제조 방법 및 연마 방법 |
| DE102019218560A1 (de) * | 2019-11-29 | 2021-06-02 | Robert Bosch Gmbh | Schaumschleifmittel und Verfahren zur Herstellung |
| US11448391B2 (en) | 2019-12-27 | 2022-09-20 | Creeley Patent Llc | Illuminating drywall sponge device |
| TWI717183B (zh) * | 2020-01-03 | 2021-01-21 | 銓科光電材料股份有限公司 | 晶圓拋光墊 |
| WO2021260629A1 (en) * | 2020-06-25 | 2021-12-30 | 3M Innovative Properties Company | Polishing pads and systems for and methods of using same |
| DE102020209519A1 (de) * | 2020-07-29 | 2022-02-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel |
| KR102538440B1 (ko) * | 2021-05-26 | 2023-05-30 | 에스케이엔펄스 주식회사 | 연마 시스템, 연마 패드 및 반도체 소자의 제조방법 |
| US12162118B2 (en) | 2021-07-01 | 2024-12-10 | Creeley Patent Llc | Flexible density sanding system |
| JP7441916B2 (ja) * | 2021-10-12 | 2024-03-01 | エスケー エンパルス カンパニー リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
| EP4431235A4 (en) * | 2021-11-12 | 2025-09-10 | Kpx Chemical Co Ltd | COMPOSITE POLISHING PAD HAVING A HIGHLY ABRASION-RESISTANT THIN FILM COATING BONDED WITH CARBON NANOTUBES, AND PROCESS FOR PRODUCING THE SAME |
| CN117545591A (zh) * | 2021-11-12 | 2024-02-09 | 韩商Kpx化学股份有限公司 | 包括碳纳米管的复合抛光垫及其生产方法 |
| KR20240132321A (ko) * | 2021-12-31 | 2024-09-03 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 플루오르화 중합체 윈도우를 포함하는 미세복제된 폴리싱 패드 |
| TWI841907B (zh) * | 2022-01-17 | 2024-05-11 | 貝達先進材料股份有限公司 | 研磨墊、製造研磨墊之方法及研磨裝置 |
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| TW200406287A (en) * | 2002-06-07 | 2004-05-01 | Praxair Technology Inc | Subpad having robust, sealed edges |
| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| TW201505758A (zh) * | 2013-03-07 | 2015-02-16 | 羅門哈斯電子材料Cmp控股公司 | 具有寬譜終點偵測窗之多層化學機械硏磨墊 |
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| US5152917B1 (en) | 1991-02-06 | 1998-01-13 | Minnesota Mining & Mfg | Structured abrasive article |
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| US6261168B1 (en) * | 1999-05-21 | 2001-07-17 | Lam Research Corporation | Chemical mechanical planarization or polishing pad with sections having varied groove patterns |
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| KR100344528B1 (ko) * | 1999-06-16 | 2002-07-24 | 동성에이앤티 주식회사 | 세포조직 구조의 미세 중공 폴리머 다발을 갖는 폴리싱 패드 및 그 제조방법 |
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| US9278424B2 (en) * | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US8398462B2 (en) * | 2008-02-21 | 2013-03-19 | Chien-Min Sung | CMP pads and method of creating voids in-situ therein |
| US20100188751A1 (en) | 2009-01-29 | 2010-07-29 | 3M Innovative Properties Company | Optical films with internally conformable layers and method of making the films |
| US20130012108A1 (en) * | 2009-12-22 | 2013-01-10 | Naichao Li | Polishing pad and method of making the same |
| CN102686362A (zh) * | 2009-12-30 | 2012-09-19 | 3M创新有限公司 | 包括分相共混聚合物的抛光垫及其制备和使用方法 |
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| KR102347711B1 (ko) * | 2014-04-03 | 2022-01-06 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 폴리싱 패드 및 시스템과 이의 제조 및 사용 방법 |
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-
2016
- 2016-10-06 TW TW105132463A patent/TWI769988B/zh active
- 2016-10-07 KR KR1020187012529A patent/KR102615968B1/ko active Active
- 2016-10-07 JP JP2018517739A patent/JP6949833B2/ja active Active
- 2016-10-07 US US15/766,643 patent/US11154959B2/en active Active
- 2016-10-07 EP EP16784672.4A patent/EP3359335B1/en active Active
- 2016-10-07 WO PCT/US2016/055908 patent/WO2017062719A1/en not_active Ceased
- 2016-10-07 CN CN201680058703.7A patent/CN108136564B/zh active Active
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| JP2001512057A (ja) * | 1997-07-30 | 2001-08-21 | スキャッパ、グループ、ピー・エル・シー | 半導体ウエハーの研磨 |
| US20020031984A1 (en) * | 1997-12-30 | 2002-03-14 | Moore Scott E. | Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates |
| TW200406287A (en) * | 2002-06-07 | 2004-05-01 | Praxair Technology Inc | Subpad having robust, sealed edges |
| US7226345B1 (en) * | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| TW201505758A (zh) * | 2013-03-07 | 2015-02-16 | 羅門哈斯電子材料Cmp控股公司 | 具有寬譜終點偵測窗之多層化學機械硏磨墊 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108136564A (zh) | 2018-06-08 |
| JP6949833B2 (ja) | 2021-10-13 |
| CN108136564B (zh) | 2021-06-22 |
| US11154959B2 (en) | 2021-10-26 |
| EP3359335B1 (en) | 2023-07-05 |
| JP2018535104A (ja) | 2018-11-29 |
| EP3359335A1 (en) | 2018-08-15 |
| KR20180066126A (ko) | 2018-06-18 |
| TW201726316A (zh) | 2017-08-01 |
| US20180281148A1 (en) | 2018-10-04 |
| WO2017062719A1 (en) | 2017-04-13 |
| KR102615968B1 (ko) | 2023-12-19 |
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