JP2018535104A5 - - Google Patents
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- Publication number
- JP2018535104A5 JP2018535104A5 JP2018517739A JP2018517739A JP2018535104A5 JP 2018535104 A5 JP2018535104 A5 JP 2018535104A5 JP 2018517739 A JP2018517739 A JP 2018517739A JP 2018517739 A JP2018517739 A JP 2018517739A JP 2018535104 A5 JP2018535104 A5 JP 2018535104A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- substrate
- polishing pad
- polymer
- preparing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims 23
- 239000000758 substrate Substances 0.000 claims 10
- 229920000642 polymer Polymers 0.000 claims 6
- 238000004049 embossing Methods 0.000 claims 2
- 239000011148 porous material Substances 0.000 claims 2
Claims (6)
- 作業面及び前記作業面とは反対側を向いた第2の表面を有する研磨層であって、前記作業面は、ランド領域と、複数の正確に成形された細孔及び複数の正確に成形された突起のうちの少なくとも一方とを含み、前記ランド領域の厚さが約5mm未満であり、前記研磨層はポリマーを含む、研磨層と、
第1主面、反対側を向いた第2主面、及び複数の中空部を有する多孔質基材と、
前記研磨層の前記ポリマーの一部が、前記多孔質基材の前記複数の中空部の少なくとも一部に埋め込まれている、境界面領域と
を含む研磨パッド。 - 前記研磨層が、少なくとも1つのマクロチャネルを更に含む、請求項1に記載の研磨パッド。
- 前記境界面領域は、前記研磨パッドの厚さを介して、前記少なくとも1つのマクロチャネルと位置が整合している、請求項2に記載の研磨パッド。
- 請求項1に記載の研磨パッド、及び研磨溶液を含む、研磨システム。
- 基材を研磨する方法であって、
請求項1に記載の研磨パッドを準備することと、
基材を準備することと、
前記研磨パッドの前記作業面を前記基材の表面に接触させることと、
前記研磨パッドの前記作業面と前記基材の表面との間の接触を維持しながら、前記研磨パッドと前記基材とを互いに対して移動させることと
を含み、
研磨は研磨溶液の存在下で実行される、基材を研磨する方法。 - ポリマーを準備することと、
複数の中空部を有し、前記ポリマーに隣接する多孔質基材を準備することと、
前記ポリマーの表面をエンボス加工して、作業面を有する研磨層を形成することであって、前記作業面が、ランド領域と、複数の正確に成形された細孔及び複数の正確に成形された突起のうちの少なくとも一方とを含み、前記エンボス加工は、前記研磨層の前記ポリマーの一部が前記多孔質基材の前記複数の中空部の前記少なくとも一部に埋め込まれている境界面領域を形成する、ことと
を含む、研磨パッドの製造方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562238668P | 2015-10-07 | 2015-10-07 | |
US62/238,668 | 2015-10-07 | ||
US201562266963P | 2015-12-14 | 2015-12-14 | |
US62/266,963 | 2015-12-14 | ||
PCT/US2016/055908 WO2017062719A1 (en) | 2015-10-07 | 2016-10-07 | Polishing pads and systems and methods of making and using the same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2018535104A JP2018535104A (ja) | 2018-11-29 |
JP2018535104A5 true JP2018535104A5 (ja) | 2019-11-14 |
JP6949833B2 JP6949833B2 (ja) | 2021-10-13 |
Family
ID=57178518
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018517739A Active JP6949833B2 (ja) | 2015-10-07 | 2016-10-07 | 研磨パッド及びシステム、並びにその製造方法及び使用方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US11154959B2 (ja) |
EP (1) | EP3359335B1 (ja) |
JP (1) | JP6949833B2 (ja) |
KR (1) | KR102615968B1 (ja) |
CN (1) | CN108136564B (ja) |
TW (1) | TWI769988B (ja) |
WO (1) | WO2017062719A1 (ja) |
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CN111032285B (zh) * | 2017-08-25 | 2022-07-19 | 3M创新有限公司 | 表面突起抛光垫 |
US11685013B2 (en) * | 2018-01-24 | 2023-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Polishing pad for chemical mechanical planarization |
TWI658585B (zh) * | 2018-03-30 | 2019-05-01 | 世界先進積體電路股份有限公司 | 半導體結構及其製造方法 |
CN108972381A (zh) * | 2018-07-26 | 2018-12-11 | 成都时代立夫科技有限公司 | 一种cmp抛光垫封边工艺 |
US11158533B2 (en) | 2018-11-07 | 2021-10-26 | Vanguard International Semiconductor Corporation | Semiconductor structures and fabrication method thereof |
US11331767B2 (en) | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
DE102019218560A1 (de) * | 2019-11-29 | 2021-06-02 | Robert Bosch Gmbh | Schaumschleifmittel und Verfahren zur Herstellung |
TWI717183B (zh) * | 2020-01-03 | 2021-01-21 | 銓科光電材料股份有限公司 | 晶圓拋光墊 |
DE102020209519A1 (de) * | 2020-07-29 | 2022-02-03 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zur Herstellung eines Schaumschleifmittels und Schaumschleifmittel |
KR102538440B1 (ko) * | 2021-05-26 | 2023-05-30 | 에스케이엔펄스 주식회사 | 연마 시스템, 연마 패드 및 반도체 소자의 제조방법 |
JP7441916B2 (ja) | 2021-10-12 | 2024-03-01 | エスケー エンパルス カンパニー リミテッド | 研磨パッドおよびこれを用いた半導体素子の製造方法 |
CN117545591A (zh) * | 2021-11-12 | 2024-02-09 | 韩商Kpx化学股份有限公司 | 包括碳纳米管的复合抛光垫及其生产方法 |
CN117794686A (zh) * | 2021-11-12 | 2024-03-29 | 韩商Kpx化学股份有限公司 | 包括与碳纳米管结合的高耐磨薄膜涂层的复合抛光垫和生产该复合抛光垫的方法 |
WO2023126854A1 (en) * | 2021-12-31 | 2023-07-06 | 3M Innovative Properties Company | Microreplicated polishing pad including fluorinated polymer window |
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-
2016
- 2016-10-06 TW TW105132463A patent/TWI769988B/zh active
- 2016-10-07 WO PCT/US2016/055908 patent/WO2017062719A1/en active Application Filing
- 2016-10-07 CN CN201680058703.7A patent/CN108136564B/zh active Active
- 2016-10-07 JP JP2018517739A patent/JP6949833B2/ja active Active
- 2016-10-07 KR KR1020187012529A patent/KR102615968B1/ko active IP Right Grant
- 2016-10-07 US US15/766,643 patent/US11154959B2/en active Active
- 2016-10-07 EP EP16784672.4A patent/EP3359335B1/en active Active
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