JP2018533254A5 - - Google Patents
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- JP2018533254A5 JP2018533254A5 JP2018511372A JP2018511372A JP2018533254A5 JP 2018533254 A5 JP2018533254 A5 JP 2018533254A5 JP 2018511372 A JP2018511372 A JP 2018511372A JP 2018511372 A JP2018511372 A JP 2018511372A JP 2018533254 A5 JP2018533254 A5 JP 2018533254A5
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- JP
- Japan
- Prior art keywords
- output
- error
- decoder
- double
- vector signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 208000011580 syndromic disease Diseases 0.000 claims 8
- 238000001514 detection method Methods 0.000 claims 7
- 230000004807 localization Effects 0.000 claims 4
- 239000011159 matrix material Substances 0.000 claims 3
- 230000001960 triggered effect Effects 0.000 claims 2
- 238000000034 method Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/852,988 US9800271B2 (en) | 2015-09-14 | 2015-09-14 | Error correction and decoding |
| US14/852,988 | 2015-09-14 | ||
| PCT/US2016/048604 WO2017048474A1 (en) | 2015-09-14 | 2016-08-25 | Low-power double error correcting-triple error detecting (deb-ted) decoder |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018533254A JP2018533254A (ja) | 2018-11-08 |
| JP2018533254A5 true JP2018533254A5 (enExample) | 2019-09-19 |
| JP6884138B2 JP6884138B2 (ja) | 2021-06-09 |
Family
ID=56896776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018511372A Expired - Fee Related JP6884138B2 (ja) | 2015-09-14 | 2016-08-25 | 低電力ダブルエラー訂正−トリプルエラー検出(dec−ted)デコーダ |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US9800271B2 (enExample) |
| EP (1) | EP3350930B1 (enExample) |
| JP (1) | JP6884138B2 (enExample) |
| KR (1) | KR102599033B1 (enExample) |
| CN (1) | CN108055876B (enExample) |
| TW (2) | TWI662796B (enExample) |
| WO (1) | WO2017048474A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9800271B2 (en) | 2015-09-14 | 2017-10-24 | Qualcomm Incorporated | Error correction and decoding |
| US10268539B2 (en) * | 2015-12-28 | 2019-04-23 | Intel Corporation | Apparatus and method for multi-bit error detection and correction |
| KR102453437B1 (ko) | 2018-01-25 | 2022-10-12 | 삼성전자주식회사 | 반도체 메모리 장치, 이를 포함하는 메모리 시스템 및 반도체 메모리 장치의 동작 방법 |
| KR102583797B1 (ko) * | 2018-04-09 | 2023-10-05 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 메모리 시스템의 동작 방법 |
| KR102105428B1 (ko) * | 2018-08-29 | 2020-04-28 | 남서울대학교 산학협력단 | Sec부호에서 멀티오류정정을 위한 복호기 및 그 복호 방법 |
| KR102045437B1 (ko) * | 2018-09-07 | 2019-12-02 | 고려대학교 산학협력단 | 저복잡도 신드롬 기반 복호 장치 및 그 방법 |
| RU2704499C1 (ru) * | 2018-11-22 | 2019-10-29 | Федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский государственный университет аэрокосмического приборостроения" | Декодер кода Боуза-Чоудхури-Хоквингема с каноническим декодером Хэмминга |
| US11016843B2 (en) * | 2018-12-06 | 2021-05-25 | Micron Technology, Inc. | Direct-input redundancy scheme with adaptive syndrome decoder |
| KR102758952B1 (ko) * | 2018-12-17 | 2025-01-23 | 삼성전자주식회사 | 에러 정정 코드 회로, 반도체 메모리 장치 및 메모리 시스템 |
| CN111835320A (zh) * | 2019-04-22 | 2020-10-27 | 珠海格力电器股份有限公司 | 一种信号的边沿检测装置 |
| KR102705065B1 (ko) * | 2019-07-29 | 2024-09-09 | 에스케이하이닉스 주식회사 | 낮은 레이턴시를 갖는 에러정정코드 디코더 |
| US11095313B2 (en) | 2019-10-21 | 2021-08-17 | International Business Machines Corporation | Employing single error correction and triple error detection to optimize bandwidth and resilience under multiple bit failures |
| KR20210092391A (ko) * | 2020-01-16 | 2021-07-26 | 삼성전자주식회사 | 반도체 메모리 장치의 에러 정정 회로 및 반도체 메모리 장치 |
| JP7631126B2 (ja) * | 2021-06-29 | 2025-02-18 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| EP4420004A4 (en) | 2021-10-18 | 2025-07-02 | Micron Technology Inc | OPTIMIZATION OF ECC ENERGY CONSUMPTION IN MEMORIES |
| US12250005B2 (en) | 2023-06-16 | 2025-03-11 | Microsoft Technology Licensing, Llc | Error correction systems and methods |
| DE102023119646A1 (de) * | 2023-07-25 | 2025-01-30 | Infineon Technologies Ag | Verarbeitung eines datenworts |
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| US3623155A (en) * | 1969-12-24 | 1971-11-23 | Ibm | Optimum apparatus and method for check bit generation and error detection, location and correction |
| US3650107A (en) * | 1970-08-12 | 1972-03-21 | Sperry Rand Corp | Power transmission |
| US4030067A (en) | 1975-12-29 | 1977-06-14 | Honeywell Information Systems, Inc. | Table lookup direct decoder for double-error correcting (DEC) BCH codes using a pair of syndromes |
| US4397022A (en) * | 1981-01-30 | 1983-08-02 | Weng Ming I | Weighted erasure codec for the (24, 12) extended Golay code |
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| US4979174A (en) * | 1988-12-29 | 1990-12-18 | At&T Bell Laboratories | Error correction and detection apparatus and method |
| US5323402A (en) * | 1991-02-14 | 1994-06-21 | The Mitre Corporation | Programmable systolic BCH decoder |
| KR950008789B1 (ko) * | 1992-07-30 | 1995-08-08 | 삼성전자주식회사 | 멀티-이씨씨(ecc)회로를 내장하는 반도체 메모리 장치 |
| EP0629051B1 (en) | 1993-06-10 | 1998-04-01 | BULL HN INFORMATION SYSTEMS ITALIA S.p.A. | Digital information error correcting apparatus for correcting single errors(sec),detecting double errors(ded)and single byte multiple errors(sbd),and the correction of an odd number of single byte errors(odd sbc). |
| JP2691973B2 (ja) * | 1994-10-20 | 1997-12-17 | 博一 岡野 | 単一誤り訂正および多重誤り検出bch符号の復号装置 |
| US5666371A (en) * | 1995-02-24 | 1997-09-09 | Unisys Corporation | Method and apparatus for detecting errors in a system that employs multi-bit wide memory elements |
| JP3258897B2 (ja) * | 1996-03-18 | 2002-02-18 | 富士通株式会社 | 軟判定誤り訂正復号装置 |
| TW432362B (en) * | 1997-04-02 | 2001-05-01 | Matsushita Electric Industrial Co Ltd | High speed data input-output device which fetches data into internal memory and performs operations on the data before outputting the data |
| US6662336B1 (en) * | 1999-07-06 | 2003-12-09 | Cirrus Logic, Inc. | Error correction method and apparatus |
| US6662333B1 (en) * | 2000-02-04 | 2003-12-09 | Hewlett-Packard Development Company, L.P. | Shared error correction for memory design |
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| DE602004026707D1 (de) * | 2004-06-30 | 2010-06-02 | St Microelectronics Srl | Verfahren und Vorrichtung für die Fehlerkorrektur in elektronischen Speichern |
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| KR100732628B1 (ko) * | 2005-07-28 | 2007-06-27 | 삼성전자주식회사 | 멀티-비트 데이터 및 싱글-비트 데이터를 저장하는 플래시메모리 장치 |
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| KR101433620B1 (ko) * | 2007-08-17 | 2014-08-25 | 삼성전자주식회사 | 처리량을 높이기 위하여 더블 버퍼링 구조와 파이프라이닝기법을 이용하는 디코더 및 그 디코딩 방법 |
| CN101493804B (zh) * | 2008-01-24 | 2011-07-20 | 国际商业机器公司 | 数据总线系统及其编解码器和编解码方法 |
| KR101437396B1 (ko) * | 2008-02-27 | 2014-09-05 | 삼성전자주식회사 | 레이턴시를 줄일 수 있는 에러 정정 블록을 포함하는메모리 시스템 및 그것의 에러 정정 방법 |
| US8261165B2 (en) | 2008-11-14 | 2012-09-04 | Silicon Laboratories Inc. | Multi-syndrome error correction circuit |
| TWI399042B (zh) * | 2009-06-06 | 2013-06-11 | Univ Ishou | To detect the wrong position of the detection device |
| US8381083B2 (en) * | 2009-10-22 | 2013-02-19 | Arm Limited | Error control coding for single error correction and double error detection |
| US20130086444A1 (en) | 2010-03-05 | 2013-04-04 | Bao Liu | Error detection code enhanced self-timed/asynchronous nanoelectronic circuits |
| US8984367B2 (en) * | 2011-02-25 | 2015-03-17 | Altera Corporation | Error detection and correction circuitry |
| US8612834B2 (en) * | 2011-03-08 | 2013-12-17 | Intel Corporation | Apparatus, system, and method for decoding linear block codes in a memory controller |
| GB201114831D0 (en) * | 2011-08-26 | 2011-10-12 | Univ Oxford Brookes | Circuit with error correction |
| US8762821B2 (en) * | 2012-03-30 | 2014-06-24 | Intel Corporation | Method of correcting adjacent errors by using BCH-based error correction coding |
| US8694862B2 (en) * | 2012-04-20 | 2014-04-08 | Arm Limited | Data processing apparatus using implicit data storage data storage and method of implicit data storage |
| US8745472B2 (en) | 2012-09-01 | 2014-06-03 | Texas Instruments Incorporated | Memory with segmented error correction codes |
| US8984368B2 (en) * | 2012-10-11 | 2015-03-17 | Advanced Micro Devices, Inc. | High reliability memory controller |
| US9246516B2 (en) * | 2012-12-20 | 2016-01-26 | Intel Corporation | Techniques for error correction of encoded data |
| US9054742B2 (en) * | 2013-03-14 | 2015-06-09 | Intel Corporation | Error and erasure decoding apparatus and method |
| US9417957B2 (en) * | 2013-10-04 | 2016-08-16 | Infineon Technologies Ag | Method of detecting bit errors, an electronic circuit for detecting bit errors, and a data storage device |
| US9800271B2 (en) | 2015-09-14 | 2017-10-24 | Qualcomm Incorporated | Error correction and decoding |
-
2015
- 2015-09-14 US US14/852,988 patent/US9800271B2/en not_active Expired - Fee Related
-
2016
- 2016-08-25 WO PCT/US2016/048604 patent/WO2017048474A1/en not_active Ceased
- 2016-08-25 KR KR1020187010280A patent/KR102599033B1/ko active Active
- 2016-08-25 CN CN201680052581.0A patent/CN108055876B/zh active Active
- 2016-08-25 EP EP16763625.7A patent/EP3350930B1/en active Active
- 2016-08-25 JP JP2018511372A patent/JP6884138B2/ja not_active Expired - Fee Related
- 2016-08-29 TW TW107106147A patent/TWI662796B/zh active
- 2016-08-29 TW TW105127673A patent/TWI625943B/zh active
-
2017
- 2017-09-26 US US15/716,451 patent/US10263645B2/en active Active
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