JP2018528586A - 行間適応電磁x線走査を用いた後方散乱特性評価 - Google Patents
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- 230000003044 adaptive effect Effects 0.000 title 1
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- 210000004894 snout Anatomy 0.000 claims abstract description 80
- 238000010894 electron beam technology Methods 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 claims abstract description 18
- 238000010408 sweeping Methods 0.000 claims abstract description 5
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- 238000001914 filtration Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims description 2
- 230000015572 biosynthetic process Effects 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 description 63
- 229910000831 Steel Inorganic materials 0.000 description 10
- 230000002146 bilateral effect Effects 0.000 description 10
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- 239000010959 steel Substances 0.000 description 10
- 239000004033 plastic Substances 0.000 description 9
- 229920003023 plastic Polymers 0.000 description 9
- 230000006870 function Effects 0.000 description 8
- 230000005855 radiation Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 230000004888 barrier function Effects 0.000 description 4
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- 230000003595 spectral effect Effects 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 241000357293 Leptobrama muelleri Species 0.000 description 1
- 241000143973 Libytheinae Species 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 229920001903 high density polyethylene Polymers 0.000 description 1
- 239000004700 high-density polyethylene Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 210000004258 portal system Anatomy 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
電子ビームが衝突するアノードに対する電子ビームの方向を変える工程と、
スナウトの長さによって特徴づけられる前記スナウトの頂点に配置された開口を介して前記アノードで生成されたX線を結合させることによって、時間の関数として、走査される方向によって特徴付けられるX線ビームを生成する工程と、
前記被検査体の寸法に基づいて前記スナウトの長さを調整する工程と
を含む。
108 検査車両
501 電子ビーム
505 ビームコントローラ
507、508 アノード
515 スナウト
517 開口
518 スイープコントローラ
519 頂点
525 ビーム
607 スナウト長
703 アクチュエータ
704 プロセッサ
707 真空バリア
715 可変長スナウト
720 スナウト
750 フィルタ
802 透過検出器
805 スナウト
900 両側性走査システム
903、905 走査ビーム
910、912 スナウト
1025、1026 走査パターン
1081、1082 検査対象
1200 車両スキャナ
1250 ディスプレイ
1301、1302 検査車両
Claims (22)
- 電子ビームを放出するカソードと、
アノードに対する前記電子ビームの方向を変えるビームコントローラと、
X線を透過しないスナウトであって、スナウトの頂点に配置された第1開口によって特徴付けられ、且つ可変スナウト長によって特徴付けられるスナウトと、
アノード上の所定パスにおいて電子ビームを走査するように、前記ビームコントローラに信号を印加するスイープコントローラと
を備え、
X線ビームを、時間の関数として変化する方向に、前記開口から放出させることを特徴とするX線源。 - 前記開口は、ロンメル開口であることを特徴とする請求項1に記載のX線源。
- 前記ロンメル開口は、可変ロンメル開口であることを特徴とする請求項2に記載のX線源。
- 前記第1開口は、前記アノードに対する位置が変化するように構成されていることを特徴とする請求項1に記載のX線源。
- 前記ビームコントローラは、ステアリングコイルを含むことを特徴とする請求項1に記載のX線源。
- さらに、スナウト長コントローラを含むことを特徴とする請求項1に記載のX線源。
- さらに、X線ビームを放出する第2開口を備え、
X線は、前記アノード上の電子ビームの配置に基づいて、前記第1開口または前記第2開口から放射されるように構成されていることを特徴とする請求項1に記載のX線源。 - さらに、前記アノードと前記第2開口との間に配置されたチャネル内に配置されたフィルタを備えることを特徴とする請求項6に記載のX線源。
- X線ビームを被検査体を横切るようにスイープする方法であって、
a.電子ビームが衝突するアノードに対する電子ビームの方向を変える工程と、
b.スナウトの長さによって特徴づけられる前記スナウトの頂点に配置された開口を介して前記アノードで生成されたX線を結合させることによって、時間の関数として、走査される方向によって特徴付けられるX線ビームを生成する工程と、
c.前記被検査体の寸法に基づいて前記スナウトの長さを調整する工程と
を含むことを特徴とする方法。 - さらに、前記スナウトの2つの開口を通って放出されるX線を区別してフィルタ処理する工程をさらに含むことを特徴とする請求項9に記載の方法。
- 前記被検査体の第1部分を走査する工程と、
その後に前記被検査体の第2部分を走査する工程とをさらに含むことを特徴とする請求項9に記載の方法。 - 前記被検査体の前記第2部分は、前記第1部分と少なくとも部分的に重なることを特徴とする請求項11に記載の方法。
- その後に前記被検査体の前記第2部分を走査する工程は、前記第1部分が走査された第1サンプリングレートとは異なる第2サンプリングレートで走査する工程を含むことを特徴とする請求項11に記載の方法。
- 前記第2サンプリングレートは、走査のコースで得られる測定値に、少なくとも部分的に基づいていることを特徴とする請求項13に記載の方法。
- a.電子ビームを放出するカソードと、
b.第1アノード及び第2アノードに対する電子ビームの方向を変えるビームコントローラと、
c.X線を透過しない第1スナウトであって、前記第1スナウトの1つの頂点に配置された第1開口によって特徴付けられる第1スナウトと、
d.X線を透過しない第2スナウトであって、前記第2スナウトの1つの頂点に配置された第2開口によって特徴付けられる第2スナウトと、
e.前記第1および第2アノード上の所定パス内で電子ビームを走査するように、信号をビームコントローラに印加するスイープコントローラと
を備え、
第1X線ビームを、時間の第1関数として変化する方向に前記第1開口から放出させると共に、第2X線ビームを、時間の第2関数として変化する方向に前記第2開口から放出させることを特徴とするX線源。 - 前記第1開口は、ロンメル開口であることを特徴とする請求項15に記載のX線源。
- 前記第1開口は、可変ロンメル開口であることを特徴とする請求項15に記載のX線源。
- 前記第2開口は、ロンメル開口であることを特徴とする請求項16に記載のX線源。
- 前記第1開口および前記第2開口は、別々の開口を有することを特徴とする請求項18に記載のX線源。
- 前記第1スナウトの長さを制御するスナウト長コントローラをさらに備えることを特徴とする請求項15に記載のX線源。
- 複数の車両を同時に検査するシステムであって、
a.複数の開口を備え、各開口が複数の車両のうちの1台の車両を収容するポータルと、
b.前記複数の開口のうちの2つの開口の間の垂直部材内に配置され、前記複数の開口のうちの第1開口に向けられる第1X線ビームと、前記複数の開口のうちの第2開口に向けられる第2X線ビームとを生成する少なくとも1つの電磁スキャナと、
c.前記複数の車両のうちの第1車両によって前記第1X線ビームから散乱されたX線を検出し、第1散乱信号を生成する第1検出器と、
d.前記複数の車両のうちの第2車両によって前記第2X線ビームから散乱されたX線を検出し、第2散乱信号を生成する第2検出器と、
e.前記第1および第2散乱信号の画像を表示するためのディスプレイと
を含むことを特徴とするシステム。 - 車両と貨物とを同時に検査する移動システムであって、
a.搬送パスの内部に配置されて、前記搬送パスの外側の走査パス内で第1X線ビームを掃引し、前記搬送パスの内部の平面内の第2走査パス内で第2X線ビームを掃引する両側性走査システムと、
b.貨物を前記第2走査パスの前記平面を通過するように移動させるコンベアと、
c.前記第1X線ビームから前記車両によって散乱されたX線を検出する第1検出器と、
d.前記貨物と相互作用するX線を検出する第2検出器と
を含むことを特徴とする移動システム。
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- 2016-09-07 CN CN201680065601.8A patent/CN108450030B/zh not_active Expired - Fee Related
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- 2016-09-07 KR KR1020187009696A patent/KR20180041763A/ko not_active Application Discontinuation
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2019
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2020
- 2020-11-26 AU AU2020277194A patent/AU2020277194A1/en not_active Abandoned
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JP7440671B2 (ja) | 2016-09-14 | 2024-02-28 | ザ・ボーイング・カンパニー | 部品の検査のための後方散乱x線 |
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Publication number | Publication date |
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AU2020277194A1 (en) | 2020-12-24 |
JP6746691B2 (ja) | 2020-08-26 |
AU2019213301A1 (en) | 2019-08-22 |
GB201805702D0 (en) | 2018-05-23 |
HK1257878A1 (zh) | 2019-11-01 |
GB2559500B (en) | 2022-02-23 |
EP3347705A4 (en) | 2019-09-11 |
BR112018004768A2 (ja) | 2018-10-02 |
KR20180041763A (ko) | 2018-04-24 |
GB2559500A (en) | 2018-08-08 |
WO2017044441A1 (en) | 2017-03-16 |
US10656304B2 (en) | 2020-05-19 |
AU2019210665B2 (en) | 2021-01-07 |
AU2019213301B2 (en) | 2021-04-01 |
EP3347705A1 (en) | 2018-07-18 |
MX2018003016A (es) | 2018-08-01 |
CN108450030A (zh) | 2018-08-24 |
CN110824573A (zh) | 2020-02-21 |
AU2019210665A1 (en) | 2019-08-22 |
US20180252841A1 (en) | 2018-09-06 |
CN108450030B (zh) | 2021-02-26 |
BR112018004768B1 (pt) | 2022-03-03 |
AU2016321158A1 (en) | 2018-04-12 |
CA2998364A1 (en) | 2017-03-16 |
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