JP2018525834A5 - - Google Patents
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- Publication number
- JP2018525834A5 JP2018525834A5 JP2018507627A JP2018507627A JP2018525834A5 JP 2018525834 A5 JP2018525834 A5 JP 2018525834A5 JP 2018507627 A JP2018507627 A JP 2018507627A JP 2018507627 A JP2018507627 A JP 2018507627A JP 2018525834 A5 JP2018525834 A5 JP 2018525834A5
- Authority
- JP
- Japan
- Prior art keywords
- support surface
- processing tool
- applied pressure
- chuck
- machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562205643P | 2015-08-14 | 2015-08-14 | |
| US62/205,643 | 2015-08-14 | ||
| PCT/US2016/046335 WO2017030867A2 (en) | 2015-08-14 | 2016-08-10 | Method for deterministic finishing of a chuck surface |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018525834A JP2018525834A (ja) | 2018-09-06 |
| JP2018525834A5 true JP2018525834A5 (cg-RX-API-DMAC7.html) | 2019-09-19 |
| JP7032307B2 JP7032307B2 (ja) | 2022-03-08 |
Family
ID=58050895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018507627A Active JP7032307B2 (ja) | 2015-08-14 | 2016-08-10 | チャック表面の決定論的な仕上げのための方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10953513B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP3334564B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP7032307B2 (cg-RX-API-DMAC7.html) |
| WO (1) | WO2017030867A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3334560B1 (en) * | 2015-08-14 | 2023-09-13 | M Cubed Technologies Inc. | Method for removing contamination from a chuck surface |
| WO2019154630A1 (en) * | 2018-02-06 | 2019-08-15 | Asml Netherlands B.V. | System, device and method for reconditioning a substrate support |
| NL2023396A (en) * | 2018-07-27 | 2020-01-31 | Asml Netherlands Bv | Tool for modifying a support surface |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06252113A (ja) | 1993-02-26 | 1994-09-09 | Matsushita Electric Ind Co Ltd | 半導体基板の平坦化方法 |
| JPH07171747A (ja) | 1993-12-21 | 1995-07-11 | Ricoh Co Ltd | 研削研磨装置 |
| JPH0936070A (ja) | 1995-07-21 | 1997-02-07 | Nippon Steel Corp | 半導体ウエハの研磨装置 |
| JP3664188B2 (ja) * | 1995-12-08 | 2005-06-22 | 株式会社東京精密 | 表面加工方法及びその装置 |
| JP3850924B2 (ja) * | 1996-02-15 | 2006-11-29 | 財団法人国際科学振興財団 | 化学機械研磨装置及び化学機械研磨方法 |
| US6179695B1 (en) | 1996-05-10 | 2001-01-30 | Canon Kabushiki Kaisha | Chemical mechanical polishing apparatus and method |
| JPH1071562A (ja) | 1996-05-10 | 1998-03-17 | Canon Inc | 化学機械研磨装置および方法 |
| US6162112A (en) * | 1996-06-28 | 2000-12-19 | Canon Kabushiki Kaisha | Chemical-mechanical polishing apparatus and method |
| JPH11138426A (ja) * | 1997-11-11 | 1999-05-25 | Tokyo Electron Ltd | 研磨装置 |
| JP2968784B1 (ja) * | 1998-06-19 | 1999-11-02 | 日本電気株式会社 | 研磨方法およびそれに用いる装置 |
| US6439986B1 (en) | 1999-10-12 | 2002-08-27 | Hunatech Co., Ltd. | Conditioner for polishing pad and method for manufacturing the same |
| JP3859937B2 (ja) | 2000-06-02 | 2006-12-20 | 住友大阪セメント株式会社 | 静電チャック |
| US6991524B1 (en) * | 2000-07-07 | 2006-01-31 | Disc Go Technologies Inc. | Method and apparatus for reconditioning digital discs |
| US20030045208A1 (en) * | 2001-09-06 | 2003-03-06 | Neidrich Jason M. | System and method for chemical mechanical polishing using retractable polishing pads |
| US20040116058A1 (en) * | 2002-12-13 | 2004-06-17 | Eastman Kodak Company | Sub-aperture compliant toroidal polishing element |
| US7118446B2 (en) * | 2003-04-04 | 2006-10-10 | Strasbaugh, A California Corporation | Grinding apparatus and method |
| US7150677B2 (en) | 2004-09-22 | 2006-12-19 | Mitsubishi Materials Corporation | CMP conditioner |
| JP4756583B2 (ja) | 2005-08-30 | 2011-08-24 | 株式会社東京精密 | 研磨パッド、パッドドレッシング評価方法、及び研磨装置 |
| JP5099476B2 (ja) | 2006-12-28 | 2012-12-19 | 株式会社ニコン | 清掃装置及び清掃システム、パターン形成装置、清掃方法及び露光方法、並びにデバイス製造方法 |
| JP5018249B2 (ja) | 2007-06-04 | 2012-09-05 | 株式会社ニコン | クリーニング装置、クリーニング方法、露光装置、及びデバイス製造方法 |
| JP2009060035A (ja) | 2007-09-03 | 2009-03-19 | Shinko Electric Ind Co Ltd | 静電チャック部材、その製造方法及び静電チャック装置 |
| JP2009160700A (ja) | 2008-01-08 | 2009-07-23 | Disco Abrasive Syst Ltd | 研磨装置 |
| TWI475594B (zh) | 2008-05-19 | 2015-03-01 | Entegris Inc | 靜電夾頭 |
| KR20110039308A (ko) | 2008-07-01 | 2011-04-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 모듈형 기부 플레이트 반도체 연마기 구조체 |
| JP2010153407A (ja) | 2008-12-23 | 2010-07-08 | Nikon Corp | 清掃方法及び装置、並びに露光方法及び装置 |
| US8588956B2 (en) | 2009-01-29 | 2013-11-19 | Tayyab Ishaq Suratwala | Apparatus and method for deterministic control of surface figure during full aperture polishing |
| NL2004153A (en) | 2009-02-24 | 2010-08-25 | Asml Netherlands Bv | Lithographic apparatus, a method for removing material of one or more protrusions on a support surface, and an article support system. |
| US20100330890A1 (en) | 2009-06-30 | 2010-12-30 | Zine-Eddine Boutaghou | Polishing pad with array of fluidized gimballed abrasive members |
| JP2012028697A (ja) * | 2010-07-27 | 2012-02-09 | Toshiba Corp | 洗浄装置、方法 |
| US10035237B2 (en) * | 2011-11-02 | 2018-07-31 | The Boeing Company | Robotic end effector including multiple abrasion tools |
| WO2013113569A1 (en) | 2012-02-03 | 2013-08-08 | Asml Netherlands B.V. | Substrate holder and method of manufacturing a substrate holder |
| JP6085152B2 (ja) | 2012-11-22 | 2017-02-22 | 日本特殊陶業株式会社 | 真空チャック |
| CN105359258B (zh) * | 2013-07-02 | 2018-09-25 | 富士纺控股株式会社 | 研磨垫及其制造方法 |
| JP6109010B2 (ja) | 2013-08-14 | 2017-04-05 | 株式会社ディスコ | 研削装置 |
| JP2014128877A (ja) | 2014-03-03 | 2014-07-10 | Femutekku:Kk | 表面加工装置及び方法 |
| US10875153B2 (en) * | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| CN107206567B (zh) | 2014-11-23 | 2020-12-29 | M丘比德技术公司 | 晶片针钉卡盘制造和修理 |
-
2016
- 2016-08-10 JP JP2018507627A patent/JP7032307B2/ja active Active
- 2016-08-10 EP EP16837526.9A patent/EP3334564B1/en active Active
- 2016-08-10 US US15/568,424 patent/US10953513B2/en active Active
- 2016-08-10 WO PCT/US2016/046335 patent/WO2017030867A2/en not_active Ceased
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