JP2018190949A5 - - Google Patents

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Publication number
JP2018190949A5
JP2018190949A5 JP2017171722A JP2017171722A JP2018190949A5 JP 2018190949 A5 JP2018190949 A5 JP 2018190949A5 JP 2017171722 A JP2017171722 A JP 2017171722A JP 2017171722 A JP2017171722 A JP 2017171722A JP 2018190949 A5 JP2018190949 A5 JP 2018190949A5
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JP
Japan
Prior art keywords
metal oxide
transistor
insulating film
oxide film
gate electrode
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JP2017171722A
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English (en)
Japanese (ja)
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JP7113602B2 (ja
JP2018190949A (ja
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Publication of JP2018190949A5 publication Critical patent/JP2018190949A5/ja
Priority to JP2022118918A priority Critical patent/JP7560512B2/ja
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Publication of JP7113602B2 publication Critical patent/JP7113602B2/ja
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JP2017171722A 2016-09-12 2017-09-07 表示装置及び電子機器 Active JP7113602B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022118918A JP7560512B2 (ja) 2016-09-12 2022-07-26 半導体装置

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP2016178106 2016-09-12
JP2016178106 2016-09-12
JP2016183322 2016-09-20
JP2016183322 2016-09-20
JP2016233577 2016-11-30
JP2016233577 2016-11-30
JP2017099483 2017-05-19
JP2017099483 2017-05-19

Related Child Applications (1)

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JP2022118918A Division JP7560512B2 (ja) 2016-09-12 2022-07-26 半導体装置

Publications (3)

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JP2018190949A JP2018190949A (ja) 2018-11-29
JP2018190949A5 true JP2018190949A5 (https=) 2020-10-08
JP7113602B2 JP7113602B2 (ja) 2022-08-05

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JP2017171722A Active JP7113602B2 (ja) 2016-09-12 2017-09-07 表示装置及び電子機器
JP2022118918A Active JP7560512B2 (ja) 2016-09-12 2022-07-26 半導体装置

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JP2022118918A Active JP7560512B2 (ja) 2016-09-12 2022-07-26 半導体装置

Country Status (7)

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US (1) US10276594B2 (https=)
JP (2) JP7113602B2 (https=)
KR (1) KR102403389B1 (https=)
CN (2) CN115857237A (https=)
DE (1) DE112017004584T5 (https=)
TW (1) TWI743187B (https=)
WO (1) WO2018047067A1 (https=)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12150755B1 (en) * 2012-09-25 2024-11-26 Micro Mobio Corporation Integrated display with antenna system and method
WO2018130954A1 (ja) * 2017-01-16 2018-07-19 株式会社半導体エネルギー研究所 半導体装置
US10460822B2 (en) * 2017-08-23 2019-10-29 Arm Limited Memory with a controllable I/O functional unit
CN108376695B (zh) * 2018-02-05 2021-01-08 惠科股份有限公司 一种显示面板和显示装置
US11552111B2 (en) 2018-04-20 2023-01-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2019226958A1 (en) 2018-05-24 2019-11-28 The Research Foundation For The State University Of New York Capacitive sensor
JP2020092222A (ja) * 2018-12-07 2020-06-11 日新電機株式会社 薄膜トランジスタ及びその製造方法
KR102557031B1 (ko) 2018-12-28 2023-07-19 삼성전자주식회사 금속 베젤을 이용하는 안테나 모듈 및 그것을 포함하는 전자 장치
JP7201508B2 (ja) * 2019-03-28 2023-01-10 株式会社ジャパンディスプレイ 半導体装置
US12463322B1 (en) 2019-04-03 2025-11-04 Micro Mobio Corporation Antenna in display
US11036322B2 (en) * 2019-06-24 2021-06-15 Wuhan China Star Optoelectronics Technology Co., Ltd Array substrate and method of manufacturing same
JP2021002633A (ja) * 2019-06-25 2021-01-07 日新電機株式会社 酸化物半導体の加工法方法及び薄膜トランジスタの製造方法
KR102727034B1 (ko) 2019-09-03 2024-11-07 삼성디스플레이 주식회사 표시 장치 및 제조 방법
CN115136323B (zh) * 2020-02-20 2025-10-21 株式会社尼康 晶体管、电子装置及晶体管之制造方法
CN111243540A (zh) * 2020-02-21 2020-06-05 合肥鑫晟光电科技有限公司 一种显示面板的驱动方法、其驱动电路及显示装置
JP7454971B2 (ja) * 2020-03-17 2024-03-25 東京エレクトロン株式会社 検出方法及びプラズマ処理装置
KR102765756B1 (ko) * 2020-11-17 2025-02-13 삼성디스플레이 주식회사 표시 장치
CN116997957A (zh) * 2021-04-12 2023-11-03 谷歌有限责任公司 重新校准伽玛曲线以用于多显示刷新速率中的无缝转变
US12382700B2 (en) 2021-12-09 2025-08-05 AUO Corporation Semiconductor device and manufacturing method thereof
CN116343685A (zh) * 2021-12-24 2023-06-27 川奇光电科技(扬州)有限公司 电子纸显示装置及电子纸显示面板
KR102923662B1 (ko) * 2022-05-04 2026-02-05 경희대학교 산학협력단 강유전성 박막 트랜지스터를 이용한 디스플레이 화소 회로 및 그 구동 방법
CN115148152B (zh) * 2022-06-28 2025-06-27 昆山国显光电有限公司 显示面板及其温度侦测方法、显示装置
TWI825888B (zh) * 2022-08-02 2023-12-11 元太科技工業股份有限公司 觸控顯示裝置及其製作方法
JP2024137422A (ja) * 2023-03-24 2024-10-07 キオクシア株式会社 半導体装置及び半導体記憶装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050017244A1 (en) 2003-07-25 2005-01-27 Randy Hoffman Semiconductor device
US9306078B2 (en) * 2008-09-08 2016-04-05 Cbrite Inc. Stable amorphous metal oxide semiconductor
KR101739154B1 (ko) 2009-07-17 2017-05-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
TWI559501B (zh) 2009-08-07 2016-11-21 半導體能源研究所股份有限公司 半導體裝置和其製造方法
KR101460869B1 (ko) 2009-09-04 2014-11-11 가부시끼가이샤 도시바 박막 트랜지스터 및 그 제조 방법
CN102484139B (zh) * 2009-10-08 2016-07-06 株式会社半导体能源研究所 氧化物半导体层及半导体装置
KR101865546B1 (ko) 2009-10-16 2018-06-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 액정 표시 장치를 포함한 전자 기기
MY166003A (en) 2009-10-21 2018-05-21 Semiconductor Energy Lab Display device and electronic device including display device
TWI562379B (en) 2010-11-30 2016-12-11 Semiconductor Energy Lab Co Ltd Semiconductor device and method for manufacturing semiconductor device
KR102932705B1 (ko) 2012-04-13 2026-02-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN107591316B (zh) 2012-05-31 2021-06-08 株式会社半导体能源研究所 半导体装置
TWI709244B (zh) 2012-09-24 2020-11-01 日商半導體能源研究所股份有限公司 半導體裝置
US9166021B2 (en) 2012-10-17 2015-10-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9704894B2 (en) 2013-05-10 2017-07-11 Semiconductor Energy Laboratory Co., Ltd. Display device including pixel electrode including oxide
DE112014004839T5 (de) 2013-10-22 2016-07-07 Semiconductor Energy Laboratory Co., Ltd. Anzeigevorrichtung
JP6625796B2 (ja) * 2013-10-25 2019-12-25 株式会社半導体エネルギー研究所 表示装置
JP6486660B2 (ja) 2013-11-27 2019-03-20 株式会社半導体エネルギー研究所 表示装置
CN110265482B (zh) 2013-12-02 2023-08-08 株式会社半导体能源研究所 显示装置
JP6506545B2 (ja) * 2013-12-27 2019-04-24 株式会社半導体エネルギー研究所 半導体装置
US9929279B2 (en) * 2014-02-05 2018-03-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TWI702187B (zh) 2014-02-21 2020-08-21 日商半導體能源研究所股份有限公司 半導體膜、電晶體、半導體裝置、顯示裝置以及電子裝置
WO2015132697A1 (en) * 2014-03-07 2015-09-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US10043913B2 (en) 2014-04-30 2018-08-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor film, semiconductor device, display device, module, and electronic device
US20150318171A1 (en) * 2014-05-02 2015-11-05 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing oxide
KR20150126272A (ko) * 2014-05-02 2015-11-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물의 제작 방법
KR102333604B1 (ko) 2014-05-15 2021-11-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 이 반도체 장치를 포함하는 표시 장치
JP6587497B2 (ja) * 2014-10-31 2019-10-09 株式会社半導体エネルギー研究所 半導体装置
JP6758844B2 (ja) 2015-02-13 2020-09-23 株式会社半導体エネルギー研究所 表示装置
DE112016001033T5 (de) 2015-03-03 2017-12-21 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung, Verfahren zum Herstellen derselben oder Anzeigevorrichtung mit derselben
JP2016183322A (ja) 2015-03-25 2016-10-20 日本ポリプロ株式会社 電気電子機器部品搬送ケース用プロピレン系樹脂組成物及び電気電子機器部品搬送ケース
WO2017149413A1 (en) 2016-03-04 2017-09-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR102721654B1 (ko) 2016-03-11 2024-10-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 복합체 및 트랜지스터
US9905579B2 (en) 2016-03-18 2018-02-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and display device including the semiconductor device
US10388738B2 (en) 2016-04-01 2019-08-20 Semiconductor Energy Laboratory Co., Ltd. Composite oxide semiconductor and method for manufacturing the same
WO2017199130A1 (en) 2016-05-19 2017-11-23 Semiconductor Energy Laboratory Co., Ltd. Composite oxide semiconductor and transistor

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