JP2018180296A - 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ - Google Patents

顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ Download PDF

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Publication number
JP2018180296A
JP2018180296A JP2017079985A JP2017079985A JP2018180296A JP 2018180296 A JP2018180296 A JP 2018180296A JP 2017079985 A JP2017079985 A JP 2017079985A JP 2017079985 A JP2017079985 A JP 2017079985A JP 2018180296 A JP2018180296 A JP 2018180296A
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Japan
Prior art keywords
imaging
microscope
optical
image
distance
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Pending
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JP2017079985A
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English (en)
Japanese (ja)
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JP2018180296A5 (enExample
Inventor
山宮　広之
Hiroyuki Yamamiya
広之 山宮
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Yokogawa Electric Corp
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Yokogawa Electric Corp
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Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP2017079985A priority Critical patent/JP2018180296A/ja
Priority to PCT/JP2018/012893 priority patent/WO2018190132A1/ja
Priority to US16/604,150 priority patent/US20200116990A1/en
Priority to CN201880023673.5A priority patent/CN110494787A/zh
Priority to EP18783910.5A priority patent/EP3611551A1/en
Publication of JP2018180296A publication Critical patent/JP2018180296A/ja
Publication of JP2018180296A5 publication Critical patent/JP2018180296A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
JP2017079985A 2017-04-13 2017-04-13 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ Pending JP2018180296A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2017079985A JP2018180296A (ja) 2017-04-13 2017-04-13 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ
PCT/JP2018/012893 WO2018190132A1 (ja) 2017-04-13 2018-03-28 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ
US16/604,150 US20200116990A1 (en) 2017-04-13 2018-03-28 Microscope system, microscope, processing device, and camera for microscope
CN201880023673.5A CN110494787A (zh) 2017-04-13 2018-03-28 显微镜系统、显微镜、处理装置以及显微镜用照相机
EP18783910.5A EP3611551A1 (en) 2017-04-13 2018-03-28 Microscope system, microscope, processing device, and camera for microscopes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017079985A JP2018180296A (ja) 2017-04-13 2017-04-13 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ

Publications (2)

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JP2018180296A true JP2018180296A (ja) 2018-11-15
JP2018180296A5 JP2018180296A5 (enExample) 2019-07-18

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JP2017079985A Pending JP2018180296A (ja) 2017-04-13 2017-04-13 顕微鏡システム、顕微鏡、処理装置、及び顕微鏡用カメラ

Country Status (5)

Country Link
US (1) US20200116990A1 (enExample)
EP (1) EP3611551A1 (enExample)
JP (1) JP2018180296A (enExample)
CN (1) CN110494787A (enExample)
WO (1) WO2018190132A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020154167A (ja) * 2019-03-20 2020-09-24 株式会社日立ハイテクサイエンス 三次元形状測定方法および三次元形状測定装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11857151B2 (en) * 2018-09-12 2024-01-02 Steris Instrument Management Services, Inc. Systems and methods for standalone endoscopic objective image analysis

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH075370A (ja) * 1993-06-14 1995-01-10 Nikon Corp 多数面同時測定顕微鏡装置
JPH07333511A (ja) * 1994-06-08 1995-12-22 Nikon Corp 顕微鏡
US20020044346A1 (en) * 2000-01-21 2002-04-18 Nguyen Lam K. Multiparallel three dimensional optical microscopy system
US6433325B1 (en) * 1999-08-07 2002-08-13 Institute Of Microelectronics Apparatus and method for image enhancement
JP2002529689A (ja) * 1998-11-02 2002-09-10 ザ ユニバーシティ オブ メルボルン 放射波動場の位相決定
JP2008102294A (ja) * 2006-10-18 2008-05-01 Olympus Corp 位相物体の可視化方法とその顕微鏡システム
WO2008069220A1 (ja) * 2006-11-30 2008-06-12 Nikon Corporation 結像装置及び顕微鏡
JP2011007872A (ja) * 2009-06-23 2011-01-13 Olympus Corp 観察装置、及び倍率補正方法
JP2013084152A (ja) * 2011-10-11 2013-05-09 Acutelogic Corp 全焦点画像生成方法、全焦点画像生成装置、全焦点画像生成プログラム、被写体高さ情報取得方法、被写体高さ情報取得装置及び被写体高さ情報取得プログラム
JP2016180675A (ja) * 2015-03-24 2016-10-13 オリンパス株式会社 光検出機構、アライメント機構、観測システム、及び観測方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0829668A (ja) 1994-07-18 1996-02-02 Olympus Optical Co Ltd 光学素子移動装置
JP4226235B2 (ja) 2001-09-04 2009-02-18 日本放送協会 撮像装置
CN102981261B (zh) * 2012-11-30 2015-03-11 山东大学 一种激光相干衍射显微成像装置及应用
JP6010450B2 (ja) * 2012-12-20 2016-10-19 浜松ホトニクス株式会社 光観察装置及び光観察方法
JP5376076B1 (ja) * 2013-01-22 2013-12-25 株式会社高岳製作所 共焦点スキャナおよびそれを用いた光学的計測装置
CN104089573B (zh) * 2014-07-03 2017-03-15 佛山市南海区欧谱曼迪科技有限责任公司 基于正交偏振光的多通道白光共路干涉显微层析系统

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH075370A (ja) * 1993-06-14 1995-01-10 Nikon Corp 多数面同時測定顕微鏡装置
JPH07333511A (ja) * 1994-06-08 1995-12-22 Nikon Corp 顕微鏡
JP2002529689A (ja) * 1998-11-02 2002-09-10 ザ ユニバーシティ オブ メルボルン 放射波動場の位相決定
US6433325B1 (en) * 1999-08-07 2002-08-13 Institute Of Microelectronics Apparatus and method for image enhancement
US20020044346A1 (en) * 2000-01-21 2002-04-18 Nguyen Lam K. Multiparallel three dimensional optical microscopy system
JP2008102294A (ja) * 2006-10-18 2008-05-01 Olympus Corp 位相物体の可視化方法とその顕微鏡システム
WO2008069220A1 (ja) * 2006-11-30 2008-06-12 Nikon Corporation 結像装置及び顕微鏡
JP2011007872A (ja) * 2009-06-23 2011-01-13 Olympus Corp 観察装置、及び倍率補正方法
JP2013084152A (ja) * 2011-10-11 2013-05-09 Acutelogic Corp 全焦点画像生成方法、全焦点画像生成装置、全焦点画像生成プログラム、被写体高さ情報取得方法、被写体高さ情報取得装置及び被写体高さ情報取得プログラム
JP2016180675A (ja) * 2015-03-24 2016-10-13 オリンパス株式会社 光検出機構、アライメント機構、観測システム、及び観測方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020154167A (ja) * 2019-03-20 2020-09-24 株式会社日立ハイテクサイエンス 三次元形状測定方法および三次元形状測定装置
CN111721195A (zh) * 2019-03-20 2020-09-29 日本株式会社日立高新技术科学 三维形状计测方法和三维形状计测装置
JP7227604B2 (ja) 2019-03-20 2023-02-22 株式会社日立ハイテクサイエンス 三次元形状測定方法および三次元形状測定装置
TWI855035B (zh) * 2019-03-20 2024-09-11 日商日立高新技術科學股份有限公司 三維形狀計測方法和三維形狀計測裝置

Also Published As

Publication number Publication date
CN110494787A (zh) 2019-11-22
EP3611551A1 (en) 2020-02-19
WO2018190132A1 (ja) 2018-10-18
US20200116990A1 (en) 2020-04-16

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