JP2018156879A5 - - Google Patents

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JP2018156879A5
JP2018156879A5 JP2017053970A JP2017053970A JP2018156879A5 JP 2018156879 A5 JP2018156879 A5 JP 2018156879A5 JP 2017053970 A JP2017053970 A JP 2017053970A JP 2017053970 A JP2017053970 A JP 2017053970A JP 2018156879 A5 JP2018156879 A5 JP 2018156879A5
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Japan
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chamber
vacuum
mass spectrometer
electrode
vacuum chamber
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JP2017053970A
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JP6870406B2 (ja
JP2018156879A (ja
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JP2017053970A 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法 Active JP6870406B2 (ja)

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JP2017053970A JP6870406B2 (ja) 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法

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JP2017053970A JP6870406B2 (ja) 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法

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JP2018156879A JP2018156879A (ja) 2018-10-04
JP2018156879A5 true JP2018156879A5 (https=) 2019-08-08
JP6870406B2 JP6870406B2 (ja) 2021-05-12

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JP2017053970A Active JP6870406B2 (ja) 2017-03-21 2017-03-21 タンデム四重極型質量分析装置および該装置の制御パラメータ最適化方法

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11942314B2 (en) 2019-06-06 2024-03-26 Shimadzu Corporation Mass spectrometer and mass spectrometry method
EP4292119A1 (en) * 2021-02-10 2023-12-20 DH Technologies Development Pte. Ltd. Method of performing ms/ms of high intensity ion beams using a bandpass filtering collision cell to enhance mass spectrometry robustness

Family Cites Families (5)

* Cited by examiner, † Cited by third party
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JP4822346B2 (ja) * 2006-10-31 2011-11-24 アジレント・テクノロジーズ・インク 誘導結合プラズマ質量分析装置のための診断及び較正システム
US8927927B2 (en) * 2011-11-04 2015-01-06 Shimadzu Corporation Mass spectrometer
WO2013140558A1 (ja) * 2012-03-22 2013-09-26 株式会社島津製作所 質量分析装置
JP6176049B2 (ja) * 2013-10-11 2017-08-09 株式会社島津製作所 タンデム四重極型質量分析装置
EP3090442A4 (en) * 2013-12-31 2017-09-27 DH Technologies Development PTE. Ltd. Method for removing trapped ions from a multipole device

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