JP2017218334A - Ga2O3系結晶膜の成長方法及び結晶積層構造体 - Google Patents
Ga2O3系結晶膜の成長方法及び結晶積層構造体 Download PDFInfo
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- 239000013078 crystal Substances 0.000 title claims abstract description 231
- 238000000034 method Methods 0.000 title claims abstract description 54
- QZQVBEXLDFYHSR-UHFFFAOYSA-N gallium(III) oxide Inorganic materials O=[Ga]O[Ga]=O QZQVBEXLDFYHSR-UHFFFAOYSA-N 0.000 title 1
- 239000000758 substrate Substances 0.000 claims abstract description 48
- 238000010438 heat treatment Methods 0.000 claims abstract description 17
- 150000001875 compounds Chemical class 0.000 claims abstract description 16
- 229910005191 Ga 2 O 3 Inorganic materials 0.000 claims description 172
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 18
- 229910052710 silicon Inorganic materials 0.000 claims description 11
- 239000000203 mixture Substances 0.000 claims description 3
- 239000002019 doping agent Substances 0.000 abstract description 33
- 238000009826 distribution Methods 0.000 abstract description 10
- 230000002708 enhancing effect Effects 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 9
- 239000002994 raw material Substances 0.000 description 9
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 5
- 229910052733 gallium Inorganic materials 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 229910006404 SnO 2 Inorganic materials 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000004549 pulsed laser deposition Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 238000005231 Edge Defined Film Fed Growth Methods 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000003887 surface segregation Methods 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
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Abstract
Description
(Ga2O3系結晶膜)
図1は、第1の実施の形態に係るGa2O3系結晶基板及びGa2O3系結晶膜の垂直断面図である。
図2は、Ga2O3系結晶膜の成長に用いられるMBE装置の構成の一例を示す。このMBE装置3は、真空槽10と、この真空槽10内に支持され、Ga2O3系結晶基板2を保持する基板ホルダ11と、基板ホルダ11に保持されたGa2O3系結晶基板2を加熱するための加熱装置12と、Ga2O3系結晶膜1を構成する原子の原料が充填された複数のセル13(13a、13b、13c)と、セル13を加熱するためのヒータ14(14a、14b、14c)と、真空槽10内に酸素系ガスを供給するガス供給パイプ15と、真空槽10内の空気を排出するための真空ポンプ16とを備えている。基板ホルダ11は、シャフト110を介して図示しないモータにより回転可能に構成されている。
第2の実施の形態は、Si含有蒸気を発生させる方法において、第1の実施の形態と異なる。その他の点については第1の実施の形態と同様であるため、説明を省略又は簡略化する。
第3の実施の形態は、第1、2の実施の形態に係るGa2O3系結晶膜の成長方法を用いて形成される結晶積層構造体についての形態である。
上記第1及び第2の実施の形態によれば、ドーパントの濃度を高い精度で制御し、かつドーパントの濃度分布の均一性を高めることができる、MBE法によるGa2O3系結晶膜の成長方法を提供することができる。また、上記第3の実施の形態によれば、第1及び第2の実施の形態に係るGa2O3系結晶膜の成長方法を用いることにより、Siが添加された薄いGa2O3系結晶膜が2枚のアンドープGa2O3系結晶膜に挟まれた積層構造を含む結晶積層構造体を提供することができる。
Claims (5)
- MBE法により、導電性を有するGa2O3系結晶膜を成長させるGa2O3系結晶膜の成長方法であって、
Ga蒸気及びSi含有蒸気を発生させ、分子線としてGa2O3系結晶基板の表面に供給して、Siを含むGa2O3系単結晶膜を成長させる工程を含み、
Si又はSi化合物とGaとを接触させた状態で加熱することにより、前記Si含有蒸気を発生させる、
Ga2O3系結晶膜の成長方法。 - 前記Si化合物が、SiO2からなるMBE装置のセルであり、
前記セル中に前記Gaを収容し、前記セルと前記Gaとを接触させた状態で加熱することにより、前記Si含有蒸気を発生させる、
請求項1に記載のGa2O3系結晶膜の成長方法。 - MBE装置のセル中に前記Si又は前記Si化合物と前記Gaを収容し、前記Si又は前記Si化合物と前記Gaとを接触させた状態で加熱することにより、前記Si含有蒸気を発生させる、
請求項1に記載のGa2O3系結晶膜の成長方法。 - 前記Si化合物が、SiO、SiO2、又はこれらの混合物である、
請求項3に記載のGa2O3系結晶膜の成長方法。 - Ga2O3系結晶基板と、
前記Ga2O3系結晶基板上に形成されたアンドープGa2O3系結晶膜と、
前記アンドープGa2O3系結晶膜上に直接形成された第1のアンドープ(AlGa)2O3結晶膜と、
前記アンドープ(AlGa)2O3結晶膜上に直接形成され、10nm以下の厚さを有し、3.0×1017/cm3以上かつ3.5×1019/cm3以下の濃度のSiを含む(AlGa)2O3結晶膜と、
前記(AlGa)2O3結晶膜上に直接形成された第2のアンドープ(AlGa)2O3結晶膜と、
を有する、結晶積層構造体。
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US15/611,952 US10358742B2 (en) | 2016-06-03 | 2017-06-02 | Ga2O3-based crystal film, and crystal multilayer structure |
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KR20200142482A (ko) * | 2020-08-13 | 2020-12-22 | 한국세라믹기술원 | 도펀트 활성화 기술을 이용한 전력반도체용 갈륨옥사이드 박막 제조 방법 |
CN114059173A (zh) * | 2022-01-17 | 2022-02-18 | 浙江大学杭州国际科创中心 | 一种制备氧化镓料棒的装置及方法 |
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JP7008293B2 (ja) * | 2017-04-27 | 2022-01-25 | 国立研究開発法人情報通信研究機構 | Ga2O3系半導体素子 |
WO2019155444A1 (en) * | 2018-02-12 | 2019-08-15 | King Abdullah University Of Science And Technology | Semiconductor devices with two iii‑oxide layers having different phases and method of production |
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