JP2017107103A5 - - Google Patents

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Publication number
JP2017107103A5
JP2017107103A5 JP2015241640A JP2015241640A JP2017107103A5 JP 2017107103 A5 JP2017107103 A5 JP 2017107103A5 JP 2015241640 A JP2015241640 A JP 2015241640A JP 2015241640 A JP2015241640 A JP 2015241640A JP 2017107103 A5 JP2017107103 A5 JP 2017107103A5
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JP
Japan
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acquisition unit
scale
sensor
lift pins
initial position
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JP2015241640A
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English (en)
Japanese (ja)
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JP6643071B2 (ja
JP2017107103A (ja
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Priority to JP2015241640A priority Critical patent/JP6643071B2/ja
Priority claimed from JP2015241640A external-priority patent/JP6643071B2/ja
Priority to PCT/JP2016/086322 priority patent/WO2017099107A2/en
Priority to US15/780,405 priority patent/US11009693B2/en
Priority to EP16815978.8A priority patent/EP3387478B1/en
Publication of JP2017107103A publication Critical patent/JP2017107103A/ja
Publication of JP2017107103A5 publication Critical patent/JP2017107103A5/ja
Application granted granted Critical
Publication of JP6643071B2 publication Critical patent/JP6643071B2/ja
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JP2015241640A 2015-12-10 2015-12-10 顕微鏡システム Active JP6643071B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015241640A JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム
PCT/JP2016/086322 WO2017099107A2 (en) 2015-12-10 2016-12-07 Microscope system
US15/780,405 US11009693B2 (en) 2015-12-10 2016-12-07 Microscope system
EP16815978.8A EP3387478B1 (en) 2015-12-10 2016-12-07 Microscope system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015241640A JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム

Publications (3)

Publication Number Publication Date
JP2017107103A JP2017107103A (ja) 2017-06-15
JP2017107103A5 true JP2017107103A5 (https=) 2019-01-31
JP6643071B2 JP6643071B2 (ja) 2020-02-12

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ID=57589109

Family Applications (1)

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JP2015241640A Active JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム

Country Status (4)

Country Link
US (1) US11009693B2 (https=)
EP (1) EP3387478B1 (https=)
JP (1) JP6643071B2 (https=)
WO (1) WO2017099107A2 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3467563A1 (de) * 2017-10-06 2019-04-10 Siemens Healthcare GmbH Mikroskopiervorrichtung
JP6995098B2 (ja) 2019-09-30 2022-01-14 日本電子株式会社 試料チップ作業台及びリテーナ
CN111220510A (zh) * 2020-01-15 2020-06-02 深圳市生强科技有限公司 全自动血细胞形态学扫描系统
CN116635814A (zh) * 2020-12-23 2023-08-22 徕卡生物系统成像股份有限公司 具有可旋转控制旋钮的输入设备
WO2022244355A1 (ja) * 2021-05-19 2022-11-24 パナソニックＩｐマネジメント株式会社 タッチセンサ
CN113670880A (zh) * 2021-08-27 2021-11-19 南京大学 一种荧光显微成像装置及成像方法
JP7621559B2 (ja) 2021-09-27 2025-01-24 ベックマン コールター， インコーポレイテッド 調整可能搭載装置
TWI866373B (zh) * 2022-08-04 2024-12-11 林大欽 顯微操作裝置
CN116753837B (zh) * 2023-06-25 2025-09-23 天津大学 一种用于波导器件测试的芯片空间映射定位方法
CN119395846B (zh) * 2024-11-15 2026-04-21 南京东利来光电实业有限责任公司 一种同轴对准装置和同轴对准方法

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US1876176A (en) * 1930-12-16 1932-09-06 Charles F Sulzner Location finder for microscopes
DE2521618B1 (de) * 1975-05-15 1976-03-11 Zeiss Carl Fa Vorrichtung zum Messen oder Einstellen von zweidimensionalen Lagekoordinaten
JPH09203865A (ja) * 1996-01-25 1997-08-05 Nikon Corp 指標ガラス及びそれを用いた蛍光光学機器
JPH09218932A (ja) * 1996-02-13 1997-08-19 Olympus Optical Co Ltd スライドガラス情報記録媒体
JPH09304703A (ja) * 1996-05-16 1997-11-28 Olympus Optical Co Ltd フォーカシング装置
EP0841594A3 (en) * 1996-11-07 1999-08-25 Nikon Corporation Mark for position detection, mark detecting method and apparatus, and exposure system
US6381013B1 (en) 1997-06-25 2002-04-30 Northern Edge Associates Test slide for microscopes and method for the production of such a slide
JP3736278B2 (ja) 2000-04-12 2006-01-18 松下電器産業株式会社 生化学物質の観察方法
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JP6659133B2 (ja) * 2015-12-10 2020-03-04 キヤノン株式会社 スライドおよびスライドとカバーガラスのセット、並びに顕微鏡システム

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