JP6643071B2 - 顕微鏡システム - Google Patents

顕微鏡システム Download PDF

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Publication number
JP6643071B2
JP6643071B2 JP2015241640A JP2015241640A JP6643071B2 JP 6643071 B2 JP6643071 B2 JP 6643071B2 JP 2015241640 A JP2015241640 A JP 2015241640A JP 2015241640 A JP2015241640 A JP 2015241640A JP 6643071 B2 JP6643071 B2 JP 6643071B2
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JP
Japan
Prior art keywords
stage
axis
mark
slide
origin
Prior art date
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Active
Application number
JP2015241640A
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English (en)
Japanese (ja)
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JP2017107103A5 (https=
JP2017107103A (ja
Inventor
亨宇 坂元
亨宇 坂元
明典 橋口
明典 橋口
しのぶ 増田
しのぶ 増田
継英 坂田
継英 坂田
島田　勉
島田　　勉
安藤　浩武
浩武 安藤
昭弘 酒井
昭弘 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2015241640A priority Critical patent/JP6643071B2/ja
Priority to PCT/JP2016/086322 priority patent/WO2017099107A2/en
Priority to US15/780,405 priority patent/US11009693B2/en
Priority to EP16815978.8A priority patent/EP3387478B1/en
Publication of JP2017107103A publication Critical patent/JP2017107103A/ja
Publication of JP2017107103A5 publication Critical patent/JP2017107103A5/ja
Application granted granted Critical
Publication of JP6643071B2 publication Critical patent/JP6643071B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
JP2015241640A 2015-12-10 2015-12-10 顕微鏡システム Active JP6643071B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015241640A JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム
PCT/JP2016/086322 WO2017099107A2 (en) 2015-12-10 2016-12-07 Microscope system
US15/780,405 US11009693B2 (en) 2015-12-10 2016-12-07 Microscope system
EP16815978.8A EP3387478B1 (en) 2015-12-10 2016-12-07 Microscope system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015241640A JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム

Publications (3)

Publication Number Publication Date
JP2017107103A JP2017107103A (ja) 2017-06-15
JP2017107103A5 JP2017107103A5 (https=) 2019-01-31
JP6643071B2 true JP6643071B2 (ja) 2020-02-12

Family

ID=57589109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015241640A Active JP6643071B2 (ja) 2015-12-10 2015-12-10 顕微鏡システム

Country Status (4)

Country Link
US (1) US11009693B2 (https=)
EP (1) EP3387478B1 (https=)
JP (1) JP6643071B2 (https=)
WO (1) WO2017099107A2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3467563A1 (de) * 2017-10-06 2019-04-10 Siemens Healthcare GmbH Mikroskopiervorrichtung
JP6995098B2 (ja) 2019-09-30 2022-01-14 日本電子株式会社 試料チップ作業台及びリテーナ
CN111220510A (zh) * 2020-01-15 2020-06-02 深圳市生强科技有限公司 全自动血细胞形态学扫描系统
CN116635814A (zh) * 2020-12-23 2023-08-22 徕卡生物系统成像股份有限公司 具有可旋转控制旋钮的输入设备
WO2022244355A1 (ja) * 2021-05-19 2022-11-24 パナソニックＩｐマネジメント株式会社 タッチセンサ
CN113670880A (zh) * 2021-08-27 2021-11-19 南京大学 一种荧光显微成像装置及成像方法
JP7621559B2 (ja) 2021-09-27 2025-01-24 ベックマン コールター， インコーポレイテッド 調整可能搭載装置
TWI866373B (zh) * 2022-08-04 2024-12-11 林大欽 顯微操作裝置
CN116753837B (zh) * 2023-06-25 2025-09-23 天津大学 一种用于波导器件测试的芯片空间映射定位方法
CN119395846B (zh) * 2024-11-15 2026-04-21 南京东利来光电实业有限责任公司 一种同轴对准装置和同轴对准方法

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1876176A (en) * 1930-12-16 1932-09-06 Charles F Sulzner Location finder for microscopes
DE2521618B1 (de) * 1975-05-15 1976-03-11 Zeiss Carl Fa Vorrichtung zum Messen oder Einstellen von zweidimensionalen Lagekoordinaten
JPH09203865A (ja) * 1996-01-25 1997-08-05 Nikon Corp 指標ガラス及びそれを用いた蛍光光学機器
JPH09218932A (ja) * 1996-02-13 1997-08-19 Olympus Optical Co Ltd スライドガラス情報記録媒体
JPH09304703A (ja) * 1996-05-16 1997-11-28 Olympus Optical Co Ltd フォーカシング装置
EP0841594A3 (en) * 1996-11-07 1999-08-25 Nikon Corporation Mark for position detection, mark detecting method and apparatus, and exposure system
US6381013B1 (en) 1997-06-25 2002-04-30 Northern Edge Associates Test slide for microscopes and method for the production of such a slide
JP3736278B2 (ja) 2000-04-12 2006-01-18 松下電器産業株式会社 生化学物質の観察方法
US20020131167A1 (en) 2000-11-09 2002-09-19 Nguyen Francis T. Sample holder for an imaging system
US6673315B2 (en) 2001-06-29 2004-01-06 Biomachines, Inc. Method and apparatus for accessing a site on a biological substrate
US6924929B2 (en) * 2002-03-29 2005-08-02 National Institute Of Radiological Sciences Microscope apparatus
DE10336803A1 (de) 2003-08-11 2005-03-24 Leica Microsystems Wetzlar Gmbh Verfahren und System zur geräteunabhängigen Bestimmung von Koordinaten eines mittels eines Mikroskops abgebildeten Punktes
GB0403576D0 (en) 2004-02-18 2004-03-24 Prior Scient Instr Ltd Stage apparatus
US8094914B2 (en) 2004-09-22 2012-01-10 Nikon Corporation Microscope system and image processing method used for observation of a specimen
GB0428165D0 (en) 2004-12-23 2005-01-26 Renishaw Plc Position measurement
JP5064864B2 (ja) 2007-04-02 2012-10-31 キヤノン株式会社 光偏向装置、画像形成装置、及び光偏向装置の駆動方法
JP5581851B2 (ja) * 2009-12-25 2014-09-03 ソニー株式会社 ステージ制御装置、ステージ制御方法、ステージ制御プログラム及び顕微鏡
WO2011087894A1 (en) 2010-01-15 2011-07-21 Qbc Diagnostics, Inc. Fluorescent microscope slide
US8175452B1 (en) 2010-10-26 2012-05-08 Complete Genomics, Inc. Method and system for imaging high density biochemical arrays with sub-pixel alignment
DE102012005587A1 (de) 2012-03-20 2013-09-26 Metasystems Hard & Software Gmbh Automatische Kalibrierung eines Mikroskop-Scanningsystems
FR2993988B1 (fr) 2012-07-27 2015-06-26 Horiba Jobin Yvon Sas Dispositif et procede de caracterisation d'un echantillon par des mesures localisees
JP5684214B2 (ja) 2012-10-17 2015-03-11 京楽産業．株式会社 遊技機
CN103776831B (zh) * 2012-10-18 2016-12-21 苏州惠生电子科技有限公司 一种显微影像检测仪器及其自动调焦方法
JP6312505B2 (ja) 2014-04-08 2018-04-18 キヤノン株式会社 光学式エンコーダおよびこれを備えた装置
US10112194B2 (en) 2014-04-14 2018-10-30 Q-Linea Ab Detection of microscopic objects
JP6560490B2 (ja) * 2014-12-10 2019-08-14 キヤノン株式会社 顕微鏡システム
JP6659133B2 (ja) * 2015-12-10 2020-03-04 キヤノン株式会社 スライドおよびスライドとカバーガラスのセット、並びに顕微鏡システム

Also Published As

Publication number Publication date
EP3387478B1 (en) 2024-07-24
WO2017099107A3 (en) 2017-09-21
US11009693B2 (en) 2021-05-18
EP3387478A2 (en) 2018-10-17
JP2017107103A (ja) 2017-06-15
WO2017099107A2 (en) 2017-06-15
US20180348497A1 (en) 2018-12-06

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