JP2017067591A5 - - Google Patents

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Publication number
JP2017067591A5
JP2017067591A5 JP2015192910A JP2015192910A JP2017067591A5 JP 2017067591 A5 JP2017067591 A5 JP 2017067591A5 JP 2015192910 A JP2015192910 A JP 2015192910A JP 2015192910 A JP2015192910 A JP 2015192910A JP 2017067591 A5 JP2017067591 A5 JP 2017067591A5
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JP
Japan
Prior art keywords
inspection
electronic component
unit
mounting member
transports
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2015192910A
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English (en)
Japanese (ja)
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JP2017067591A (ja
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Publication date
Application filed filed Critical
Priority to JP2015192910A priority Critical patent/JP2017067591A/ja
Priority claimed from JP2015192910A external-priority patent/JP2017067591A/ja
Priority to CN201610832319.XA priority patent/CN106829359A/zh
Priority to TW105131457A priority patent/TWI657253B/zh
Priority to TW107117026A priority patent/TWI657029B/zh
Publication of JP2017067591A publication Critical patent/JP2017067591A/ja
Publication of JP2017067591A5 publication Critical patent/JP2017067591A5/ja
Withdrawn legal-status Critical Current

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JP2015192910A 2015-09-30 2015-09-30 電子部品搬送装置および電子部品検査装置 Withdrawn JP2017067591A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2015192910A JP2017067591A (ja) 2015-09-30 2015-09-30 電子部品搬送装置および電子部品検査装置
CN201610832319.XA CN106829359A (zh) 2015-09-30 2016-09-19 电子部件输送装置以及电子部件检查装置
TW105131457A TWI657253B (zh) 2015-09-30 2016-09-29 電子零件搬送裝置及電子零件檢查裝置
TW107117026A TWI657029B (zh) 2015-09-30 2016-09-29 電子零件搬送裝置及電子零件檢查裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015192910A JP2017067591A (ja) 2015-09-30 2015-09-30 電子部品搬送装置および電子部品検査装置

Publications (2)

Publication Number Publication Date
JP2017067591A JP2017067591A (ja) 2017-04-06
JP2017067591A5 true JP2017067591A5 (cg-RX-API-DMAC7.html) 2018-10-11

Family

ID=58492249

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015192910A Withdrawn JP2017067591A (ja) 2015-09-30 2015-09-30 電子部品搬送装置および電子部品検査装置

Country Status (1)

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JP (1) JP2017067591A (cg-RX-API-DMAC7.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019064765A (ja) * 2017-09-29 2019-04-25 日本電産サンキョー株式会社 トレイ配置部および搬送システム
JP2019064763A (ja) * 2017-09-29 2019-04-25 日本電産サンキョー株式会社 搬送システム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5319353A (en) * 1992-10-14 1994-06-07 Advantest Corporation Alarm display system for automatic test handler
JPH07239365A (ja) * 1994-02-25 1995-09-12 Advantest Corp 半導体試験装置における自動再検査方法
JPH08262102A (ja) * 1995-03-23 1996-10-11 Advantest Corp Ｉｃテスタ用ハンドラにおけるデバイス再検査方法
JP3492793B2 (ja) * 1994-12-28 2004-02-03 株式会社アドバンテスト Ｉｃテスタ用ハンドラにおける再検査方法
JPH08262103A (ja) * 1995-03-24 1996-10-11 Ando Electric Co Ltd Ｉｃ搬送器が循環するオートハンドラの再選別方法
WO1997009629A1 (en) * 1995-09-04 1997-03-13 Advantest Corporation Semiconductor device transferring apparatus
JPH09318703A (ja) * 1996-05-31 1997-12-12 Toshiba Corp Ｉｃハンドラ
US6518745B2 (en) * 2000-10-10 2003-02-11 Mirae Corporation Device test handler and method for operating the same
US7919974B2 (en) * 2004-07-23 2011-04-05 Advantest Corporation Electronic device test apparatus and method of configuring electronic device test apparatus
KR100699866B1 (ko) * 2005-09-30 2007-03-28 삼성전자주식회사 로트 및 트레이 확인을 통한 반도체 소자의 연속검사 방법

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