JP2016527517A5 - - Google Patents

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Publication number
JP2016527517A5
JP2016527517A5 JP2016531930A JP2016531930A JP2016527517A5 JP 2016527517 A5 JP2016527517 A5 JP 2016527517A5 JP 2016531930 A JP2016531930 A JP 2016531930A JP 2016531930 A JP2016531930 A JP 2016531930A JP 2016527517 A5 JP2016527517 A5 JP 2016527517A5
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JP
Japan
Prior art keywords
probe
tool
assembly
socket
modification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016531930A
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English (en)
Japanese (ja)
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JP2016527517A (ja
JP6379197B2 (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/US2014/049379 external-priority patent/WO2015017765A2/en
Publication of JP2016527517A publication Critical patent/JP2016527517A/ja
Publication of JP2016527517A5 publication Critical patent/JP2016527517A5/ja
Application granted granted Critical
Publication of JP6379197B2 publication Critical patent/JP6379197B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2016531930A 2013-08-01 2014-08-01 アセンブリを変更する装置及びそのための方法 Active JP6379197B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361861306P 2013-08-01 2013-08-01
US61/861,306 2013-08-01
PCT/US2014/049379 WO2015017765A2 (en) 2013-08-01 2014-08-01 Instrument changing assembly and methods for the same

Publications (3)

Publication Number Publication Date
JP2016527517A JP2016527517A (ja) 2016-09-08
JP2016527517A5 true JP2016527517A5 (enExample) 2017-09-14
JP6379197B2 JP6379197B2 (ja) 2018-08-22

Family

ID=52432589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016531930A Active JP6379197B2 (ja) 2013-08-01 2014-08-01 アセンブリを変更する装置及びそのための方法

Country Status (6)

Country Link
US (1) US9902027B2 (enExample)
EP (1) EP3027365B1 (enExample)
JP (1) JP6379197B2 (enExample)
KR (1) KR101712028B1 (enExample)
SG (1) SG11201600737TA (enExample)
WO (1) WO2015017765A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101712028B1 (ko) 2013-08-01 2017-03-03 하이지트론, 인코포레이티드 기구 교환 어셈블리 및 방법
US10883908B2 (en) * 2017-03-13 2021-01-05 King Fahd University Of Petroleum And Minerals Stage for high temperature indentation test
EP3680736A1 (en) * 2019-01-14 2020-07-15 JOT Automation Oy Apparatus and method for testing electronic device
US12270792B2 (en) * 2021-06-12 2025-04-08 University of the District of Columbia Scratch tester for adhesion testing of coatings on surfaces
KR102765238B1 (ko) 2024-03-11 2025-02-07 주식회사 바질바이오텍 과학수사를 위하여 gc-ms와 lc-ms를 이용한 기체 다성분 동시분석 기법

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595707A (en) * 1990-03-02 1997-01-21 Ventana Medical Systems, Inc. Automated biological reaction apparatus
US5327657A (en) * 1991-07-11 1994-07-12 Renishaw Metrology Ltd. Touch probe
JP3266457B2 (ja) * 1995-05-25 2002-03-18 住友金属工業株式会社 自動ロックウェル硬さ試験機
WO1999005506A1 (fr) 1997-07-22 1999-02-04 Hitachi, Ltd. Procede et dispositif de preparation d'echantillons
JP3425383B2 (ja) * 1998-12-03 2003-07-14 株式会社島津製作所 走査型プローブ顕微鏡及びプローブホルダ
JP4803959B2 (ja) * 2002-03-22 2011-10-26 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 試験プローブ整列装置
US6756800B2 (en) * 2002-04-16 2004-06-29 Teradyne, Inc. Semiconductor test system with easily changed interface unit
JP2004085387A (ja) * 2002-08-27 2004-03-18 Mitsutoyo Corp 測定装置
JP5036802B2 (ja) 2006-03-13 2012-09-26 アサイラム リサーチ コーポレーション ナノ圧子
EP2237052A1 (en) * 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
GB201005252D0 (enExample) 2010-03-29 2010-05-12 Infinitesima Ltd
US8939041B2 (en) * 2011-02-10 2015-01-27 Hysitron, Inc. Nanomechanical testing system
KR101712028B1 (ko) 2013-08-01 2017-03-03 하이지트론, 인코포레이티드 기구 교환 어셈블리 및 방법
CH710648A1 (de) * 2015-01-23 2016-07-29 Erowa Ag Messmaschine zum Vermessen von Werkstücken.

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