KR101712028B1 - 기구 교환 어셈블리 및 방법 - Google Patents

기구 교환 어셈블리 및 방법 Download PDF

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Publication number
KR101712028B1
KR101712028B1 KR1020167005442A KR20167005442A KR101712028B1 KR 101712028 B1 KR101712028 B1 KR 101712028B1 KR 1020167005442 A KR1020167005442 A KR 1020167005442A KR 20167005442 A KR20167005442 A KR 20167005442A KR 101712028 B1 KR101712028 B1 KR 101712028B1
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KR
South Korea
Prior art keywords
probe
assembly
instrument
exchange tool
tool
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KR1020167005442A
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English (en)
Korean (ko)
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KR20160030335A (ko
Inventor
라지브 다마
스베틀라나 지겔만
Original Assignee
하이지트론, 인코포레이티드
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Publication of KR20160030335A publication Critical patent/KR20160030335A/ko
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
    • B23P19/00—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes
    • B23P19/04—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes for assembling or disassembling parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/36—DC mode
    • G01Q60/366—Nanoindenters, i.e. wherein the indenting force is measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
    • B23P19/00—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes
    • B23P19/10—Aligning parts to be fitted together
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0076—Hardness, compressibility or resistance to crushing
    • G01N2203/0078—Hardness, compressibility or resistance to crushing using indentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/0206—Means for supplying or positioning specimens or exchangeable parts of the machine such as indenters...
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nanotechnology (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measuring Leads Or Probes (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020167005442A 2013-08-01 2014-08-01 기구 교환 어셈블리 및 방법 Active KR101712028B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361861306P 2013-08-01 2013-08-01
US61/861,306 2013-08-01
PCT/US2014/049379 WO2015017765A2 (en) 2013-08-01 2014-08-01 Instrument changing assembly and methods for the same

Publications (2)

Publication Number Publication Date
KR20160030335A KR20160030335A (ko) 2016-03-16
KR101712028B1 true KR101712028B1 (ko) 2017-03-03

Family

ID=52432589

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167005442A Active KR101712028B1 (ko) 2013-08-01 2014-08-01 기구 교환 어셈블리 및 방법

Country Status (6)

Country Link
US (1) US9902027B2 (enExample)
EP (1) EP3027365B1 (enExample)
JP (1) JP6379197B2 (enExample)
KR (1) KR101712028B1 (enExample)
SG (1) SG11201600737TA (enExample)
WO (1) WO2015017765A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9902027B2 (en) 2013-08-01 2018-02-27 Hysitron, Inc. Instrument changing assembly and methods

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10883908B2 (en) * 2017-03-13 2021-01-05 King Fahd University Of Petroleum And Minerals Stage for high temperature indentation test
EP3680736A1 (en) * 2019-01-14 2020-07-15 JOT Automation Oy Apparatus and method for testing electronic device
US12270792B2 (en) * 2021-06-12 2025-04-08 University of the District of Columbia Scratch tester for adhesion testing of coatings on surfaces
KR102765238B1 (ko) 2024-03-11 2025-02-07 주식회사 바질바이오텍 과학수사를 위하여 gc-ms와 lc-ms를 이용한 기체 다성분 동시분석 기법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005521066A (ja) 2002-03-22 2005-07-14 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 試験プローブ整列装置
JP2005523453A (ja) 2002-04-16 2005-08-04 テラダイン・インコーポレーテッド 簡単に交換できるインターフェースユニットを備えた半導体試験システム
JP2014041141A (ja) 2011-02-10 2014-03-06 Hysitron Inc ナノメカニカルテストシステム
JP2016176923A (ja) 2015-01-23 2016-10-06 エロワ アーゲーＥｒｏｗａ Ａｇ ワークピースを測定するための測定機

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595707A (en) * 1990-03-02 1997-01-21 Ventana Medical Systems, Inc. Automated biological reaction apparatus
US5327657A (en) * 1991-07-11 1994-07-12 Renishaw Metrology Ltd. Touch probe
JP3266457B2 (ja) * 1995-05-25 2002-03-18 住友金属工業株式会社 自動ロックウェル硬さ試験機
JP3547143B2 (ja) 1997-07-22 2004-07-28 株式会社日立製作所 試料作製方法
JP3425383B2 (ja) * 1998-12-03 2003-07-14 株式会社島津製作所 走査型プローブ顕微鏡及びプローブホルダ
JP2004085387A (ja) * 2002-08-27 2004-03-18 Mitsutoyo Corp 測定装置
WO2008042009A1 (en) 2006-03-13 2008-04-10 Asylum Research Corporation Nanoindenter
EP2237052A1 (en) * 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
GB201005252D0 (enExample) * 2010-03-29 2010-05-12 Infinitesima Ltd
EP3027365B1 (en) 2013-08-01 2018-05-23 Hysitron, Inc. Instrument changing assembly and methods for the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005521066A (ja) 2002-03-22 2005-07-14 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 試験プローブ整列装置
JP2005523453A (ja) 2002-04-16 2005-08-04 テラダイン・インコーポレーテッド 簡単に交換できるインターフェースユニットを備えた半導体試験システム
JP2014041141A (ja) 2011-02-10 2014-03-06 Hysitron Inc ナノメカニカルテストシステム
JP2016176923A (ja) 2015-01-23 2016-10-06 エロワ アーゲーＥｒｏｗａ Ａｇ ワークピースを測定するための測定機

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9902027B2 (en) 2013-08-01 2018-02-27 Hysitron, Inc. Instrument changing assembly and methods

Also Published As

Publication number Publication date
US9902027B2 (en) 2018-02-27
WO2015017765A3 (en) 2015-10-15
EP3027365A2 (en) 2016-06-08
US20160169718A1 (en) 2016-06-16
EP3027365A4 (en) 2017-02-15
SG11201600737TA (en) 2016-02-26
KR20160030335A (ko) 2016-03-16
JP6379197B2 (ja) 2018-08-22
WO2015017765A2 (en) 2015-02-05
EP3027365B1 (en) 2018-05-23
JP2016527517A (ja) 2016-09-08

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