JP2016200537A5 - - Google Patents

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Publication number
JP2016200537A5
JP2016200537A5 JP2015081884A JP2015081884A JP2016200537A5 JP 2016200537 A5 JP2016200537 A5 JP 2016200537A5 JP 2015081884 A JP2015081884 A JP 2015081884A JP 2015081884 A JP2015081884 A JP 2015081884A JP 2016200537 A5 JP2016200537 A5 JP 2016200537A5
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JP
Japan
Prior art keywords
ray
measurement substrate
angle
stored
control device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015081884A
Other languages
English (en)
Japanese (ja)
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JP6481168B2 (ja
JP2016200537A (ja
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Publication date
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Priority to JP2015081884A priority Critical patent/JP6481168B2/ja
Priority claimed from JP2015081884A external-priority patent/JP6481168B2/ja
Priority to US15/094,142 priority patent/US9989484B2/en
Publication of JP2016200537A publication Critical patent/JP2016200537A/ja
Publication of JP2016200537A5 publication Critical patent/JP2016200537A5/ja
Application granted granted Critical
Publication of JP6481168B2 publication Critical patent/JP6481168B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2015081884A 2015-04-13 2015-04-13 蛍光ｘ線分析システム Active JP6481168B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015081884A JP6481168B2 (ja) 2015-04-13 2015-04-13 蛍光ｘ線分析システム
US15/094,142 US9989484B2 (en) 2015-04-13 2016-04-08 X-ray fluorescence analyzing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015081884A JP6481168B2 (ja) 2015-04-13 2015-04-13 蛍光ｘ線分析システム

Publications (3)

Publication Number Publication Date
JP2016200537A JP2016200537A (ja) 2016-12-01
JP2016200537A5 true JP2016200537A5 (enExample) 2018-05-10
JP6481168B2 JP6481168B2 (ja) 2019-03-13

Family

ID=57111711

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015081884A Active JP6481168B2 (ja) 2015-04-13 2015-04-13 蛍光ｘ線分析システム

Country Status (2)

Country Link
US (1) US9989484B2 (enExample)
JP (1) JP6481168B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101921726B1 (ko) 2017-03-07 2019-02-13 가부시키가이샤 리가쿠 시료 회수 장치, 시료 회수 방법 및 이들을 이용한 형광 x선 분석 장치
JP7302504B2 (ja) * 2020-02-27 2023-07-04 株式会社島津製作所 蛍光ｘ線分析装置
CN113960091A (zh) * 2021-10-28 2022-01-21 马鞍山钢铁股份有限公司 一种有色金属自动检测系统及自动检测方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2630249B2 (ja) * 1994-02-16 1997-07-16 日本電気株式会社 全反射蛍光ｘ線分析装置
JP2001343339A (ja) * 2000-06-02 2001-12-14 Rigaku Industrial Co 分析位置設定手段を備えた蛍光ｘ線分析方法およびその装置
JP3603278B2 (ja) * 2001-09-06 2004-12-22 理学電機工業株式会社 蛍光ｘ線分析システムおよびそれに用いるプログラム
JP3584262B2 (ja) * 2001-09-18 2004-11-04 理学電機工業株式会社 蛍光ｘ線分析用試料前処理システムおよびそれを備えた蛍光ｘ線分析システム
JP2003149181A (ja) 2001-11-12 2003-05-21 Rigaku Industrial Co 蛍光ｘ線分析方法および装置
JP4377755B2 (ja) * 2004-06-15 2009-12-02 株式会社東芝 全反射蛍光ｘ線分析方法
JP5092052B1 (ja) 2011-11-14 2012-12-05 株式会社リガク Ｘ線分析装置および方法

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