JP2016191719A5 - - Google Patents

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Publication number
JP2016191719A5
JP2016191719A5 JP2016147718A JP2016147718A JP2016191719A5 JP 2016191719 A5 JP2016191719 A5 JP 2016191719A5 JP 2016147718 A JP2016147718 A JP 2016147718A JP 2016147718 A JP2016147718 A JP 2016147718A JP 2016191719 A5 JP2016191719 A5 JP 2016191719A5
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Japan
Prior art keywords
inspection tool
identified
pattern types
critical pattern
sampling
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JP2016147718A
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English (en)
Japanese (ja)
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JP6329209B2 (ja
JP2016191719A (ja
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Priority claimed from US13/399,805 external-priority patent/US8656323B2/en
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JP2016147718A 2011-02-22 2016-07-27 設計ベースデバイスリスク評価 Active JP6329209B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201161445164P 2011-02-22 2011-02-22
US61/445,164 2011-02-22
US13/399,805 US8656323B2 (en) 2011-02-22 2012-02-17 Based device risk assessment
US13/399,805 2012-02-17

Related Parent Applications (1)

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JP2013555475A Division JP5980237B2 (ja) 2011-02-22 2012-02-20 設計ベースデバイスリスク評価

Related Child Applications (1)

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JP2018080437A Division JP6498337B2 (ja) 2011-02-22 2018-04-19 デバイス処理監視方法及び装置

Publications (3)

Publication Number Publication Date
JP2016191719A JP2016191719A (ja) 2016-11-10
JP2016191719A5 true JP2016191719A5 (enExample) 2017-02-09
JP6329209B2 JP6329209B2 (ja) 2018-05-23

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JP2013555475A Active JP5980237B2 (ja) 2011-02-22 2012-02-20 設計ベースデバイスリスク評価
JP2016147718A Active JP6329209B2 (ja) 2011-02-22 2016-07-27 設計ベースデバイスリスク評価
JP2018080437A Active JP6498337B2 (ja) 2011-02-22 2018-04-19 デバイス処理監視方法及び装置

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JP2013555475A Active JP5980237B2 (ja) 2011-02-22 2012-02-20 設計ベースデバイスリスク評価

Family Applications After (1)

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JP2018080437A Active JP6498337B2 (ja) 2011-02-22 2018-04-19 デバイス処理監視方法及び装置

Country Status (8)

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US (2) US8656323B2 (enExample)
EP (1) EP2678880A4 (enExample)
JP (3) JP5980237B2 (enExample)
KR (4) KR102351672B1 (enExample)
IL (1) IL228063A (enExample)
SG (1) SG192891A1 (enExample)
TW (1) TWI468958B (enExample)
WO (1) WO2012115912A2 (enExample)

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