JP2016018971A5 - - Google Patents

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Publication number
JP2016018971A5
JP2016018971A5 JP2014142912A JP2014142912A JP2016018971A5 JP 2016018971 A5 JP2016018971 A5 JP 2016018971A5 JP 2014142912 A JP2014142912 A JP 2014142912A JP 2014142912 A JP2014142912 A JP 2014142912A JP 2016018971 A5 JP2016018971 A5 JP 2016018971A5
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JP
Japan
Prior art keywords
emitting laser
surface emitting
semiconductor
light
resonator
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JP2014142912A
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English (en)
Japanese (ja)
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JP6548365B2 (ja
JP2016018971A (ja
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Priority to JP2014142912A priority Critical patent/JP6548365B2/ja
Priority claimed from JP2014142912A external-priority patent/JP6548365B2/ja
Priority to US14/790,118 priority patent/US9379520B2/en
Priority to CN201510393621.5A priority patent/CN105305228B/zh
Priority to EP15176035.2A priority patent/EP2966738A1/en
Publication of JP2016018971A publication Critical patent/JP2016018971A/ja
Publication of JP2016018971A5 publication Critical patent/JP2016018971A5/ja
Application granted granted Critical
Publication of JP6548365B2 publication Critical patent/JP6548365B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014142912A 2014-07-11 2014-07-11 面発光レーザ及び光干渉断層計 Expired - Fee Related JP6548365B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2014142912A JP6548365B2 (ja) 2014-07-11 2014-07-11 面発光レーザ及び光干渉断層計
US14/790,118 US9379520B2 (en) 2014-07-11 2015-07-02 Surface emitting laser and optical coherence tomography apparatus
CN201510393621.5A CN105305228B (zh) 2014-07-11 2015-07-07 表面发射激光器和光学干涉层析成像装置
EP15176035.2A EP2966738A1 (en) 2014-07-11 2015-07-09 Surface emitting laser and optical coherence tomography apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014142912A JP6548365B2 (ja) 2014-07-11 2014-07-11 面発光レーザ及び光干渉断層計

Publications (3)

Publication Number Publication Date
JP2016018971A JP2016018971A (ja) 2016-02-01
JP2016018971A5 true JP2016018971A5 (enExample) 2017-08-24
JP6548365B2 JP6548365B2 (ja) 2019-07-24

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ID=53525133

Family Applications (1)

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JP2014142912A Expired - Fee Related JP6548365B2 (ja) 2014-07-11 2014-07-11 面発光レーザ及び光干渉断層計

Country Status (4)

Country Link
US (1) US9379520B2 (enExample)
EP (1) EP2966738A1 (enExample)
JP (1) JP6548365B2 (enExample)
CN (1) CN105305228B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10082383B2 (en) * 2015-03-05 2018-09-25 Harbin Institute Of Technology Method and equipment for dimensional measurement of a micro part based on fiber laser with multi-core FBG probe
US20180172583A1 (en) * 2015-09-09 2018-06-21 Dalian Tiandao Marine Technology Co., Ltd. The Calculation Method of Wave Reflective Index on Interface
KR102384230B1 (ko) 2017-10-12 2022-04-07 삼성전자주식회사 가변 레이저 소자
TWI733579B (zh) * 2019-09-09 2021-07-11 全新光電科技股份有限公司 垂直共振腔表面放射雷射二極體（vcsel）的量測方法及磊晶片測試治具
CN113013727B (zh) * 2021-03-01 2022-08-23 中国计量大学 一种基于可调谐振腔的量子点单光子源

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5771253A (en) * 1995-10-13 1998-06-23 The Board Of Trustees Of The Leland Stanford Junior University High performance micromechanical tunable verticle cavity surface emitting laser
FR2805902B1 (fr) * 2000-03-03 2002-05-10 Centre Nat Rech Scient Dispositif optoelectronique semiconducteur a fonction de transfert modulable electriquement
US6549687B1 (en) 2001-10-26 2003-04-15 Lake Shore Cryotronics, Inc. System and method for measuring physical, chemical and biological stimuli using vertical cavity surface emitting lasers with integrated tuner
US7457033B2 (en) * 2005-05-27 2008-11-25 The Regents Of The University Of California MEMS tunable vertical-cavity semiconductor optical amplifier
JP4898263B2 (ja) * 2006-04-07 2012-03-14 サンテック株式会社 光干渉断層画像表示システム
US7701588B2 (en) * 2006-04-11 2010-04-20 Santec Corporation Swept source type optical coherent tomography system
JP4968959B2 (ja) 2008-03-06 2012-07-04 キヤノン株式会社 フォトニック結晶および該フォトニック結晶を用いた面発光レーザ
US8309929B2 (en) * 2008-03-18 2012-11-13 Lawrence Livermore National Security, Llc. Tunable photonic cavities for in-situ spectroscopic trace gas detection
JP5388666B2 (ja) 2008-04-21 2014-01-15 キヤノン株式会社 面発光レーザ
JP5984693B2 (ja) * 2012-01-31 2016-09-06 キヤノン株式会社 光干渉断層撮像装置及び光干渉断層撮像方法
JP2014060384A (ja) * 2012-08-23 2014-04-03 Canon Inc 面発光レーザー、光源装置、光源装置の駆動方法及び光干渉断層撮像装置
US20140176958A1 (en) * 2012-12-21 2014-06-26 Axsun Technologies, Inc. OCT System with Bonded MEMS Tunable Mirror VCSEL Swept Source

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