JP2016014657A5 - - Google Patents

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Publication number
JP2016014657A5
JP2016014657A5 JP2015113703A JP2015113703A JP2016014657A5 JP 2016014657 A5 JP2016014657 A5 JP 2016014657A5 JP 2015113703 A JP2015113703 A JP 2015113703A JP 2015113703 A JP2015113703 A JP 2015113703A JP 2016014657 A5 JP2016014657 A5 JP 2016014657A5
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JP
Japan
Prior art keywords
light beam
optical axis
inclination
tilting
measuring apparatus
Prior art date
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Application number
JP2015113703A
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English (en)
Japanese (ja)
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JP2016014657A (ja
JP6566416B2 (ja
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Priority to JP2015113703A priority Critical patent/JP6566416B2/ja
Priority claimed from JP2015113703A external-priority patent/JP6566416B2/ja
Publication of JP2016014657A publication Critical patent/JP2016014657A/ja
Publication of JP2016014657A5 publication Critical patent/JP2016014657A5/ja
Application granted granted Critical
Publication of JP6566416B2 publication Critical patent/JP6566416B2/ja
Active legal-status Critical Current
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JP2015113703A 2014-06-10 2015-06-04 光ビーム測定装置 Active JP6566416B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2015113703A JP6566416B2 (ja) 2014-06-10 2015-06-04 光ビーム測定装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014119392 2014-06-10
JP2014119392 2014-06-10
JP2015113703A JP6566416B2 (ja) 2014-06-10 2015-06-04 光ビーム測定装置

Publications (3)

Publication Number Publication Date
JP2016014657A JP2016014657A (ja) 2016-01-28
JP2016014657A5 true JP2016014657A5 (enExample) 2018-04-12
JP6566416B2 JP6566416B2 (ja) 2019-08-28

Family

ID=54769344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015113703A Active JP6566416B2 (ja) 2014-06-10 2015-06-04 光ビーム測定装置

Country Status (2)

Country Link
US (1) US9488519B2 (enExample)
JP (1) JP6566416B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6878866B2 (ja) * 2016-12-15 2021-06-02 株式会社サタケ 光学式選別機用光学ユニット

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61140887A (ja) * 1984-12-14 1986-06-27 富士通株式会社 2軸ゴニオステ−ジ
JP3529486B2 (ja) * 1995-04-18 2004-05-24 株式会社東芝 光ディスクドライブの組み立て方法
JP2000352505A (ja) * 1999-04-05 2000-12-19 Toshiba Corp 膜厚測定方法および装置、薄膜処理装置並びに半導体装置の製造方法
JP2003121572A (ja) * 2001-10-10 2003-04-23 Fuji Photo Optical Co Ltd 載物ステージ
JP2006330210A (ja) 2005-05-24 2006-12-07 Olympus Corp レンズの心出し方法及び装置
JP2009243920A (ja) * 2008-03-28 2009-10-22 Jfe Steel Corp 基準板、表面検査装置の光軸調整方法、及び表面検査装置
JP5134603B2 (ja) * 2009-09-09 2013-01-30 株式会社日立ハイテクノロジーズ 光ビーム調整方法及び光ビーム調整装置
US8325344B2 (en) * 2009-12-18 2012-12-04 Hewlett-Packard Development Company, L.P. Optical density determination methods and apparatus

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