JP2015526932A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2015526932A5 JP2015526932A5 JP2015516022A JP2015516022A JP2015526932A5 JP 2015526932 A5 JP2015526932 A5 JP 2015526932A5 JP 2015516022 A JP2015516022 A JP 2015516022A JP 2015516022 A JP2015516022 A JP 2015516022A JP 2015526932 A5 JP2015526932 A5 JP 2015526932A5
- Authority
- JP
- Japan
- Prior art keywords
- gate
- power switch
- junction
- comparison
- thermal resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 6
- 238000012544 monitoring process Methods 0.000 claims 6
- 238000005259 measurement Methods 0.000 claims 3
- 230000003862 health status Effects 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/492,947 US8957723B2 (en) | 2012-06-11 | 2012-06-11 | Apparatus and method for power switch health monitoring |
| US13/492,947 | 2012-06-11 | ||
| PCT/US2013/040273 WO2013188023A1 (en) | 2012-06-11 | 2013-05-09 | Apparatus and method for power switch health monitoring |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015526932A JP2015526932A (ja) | 2015-09-10 |
| JP2015526932A5 true JP2015526932A5 (enExample) | 2016-06-23 |
| JP6405303B2 JP6405303B2 (ja) | 2018-10-17 |
Family
ID=48577218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015516022A Active JP6405303B2 (ja) | 2012-06-11 | 2013-05-09 | 電力スイッチ正常性モニタリングのための装置および方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8957723B2 (enExample) |
| JP (1) | JP6405303B2 (enExample) |
| CN (1) | CN104365021B (enExample) |
| AU (1) | AU2013274854B2 (enExample) |
| CL (1) | CL2014003143A1 (enExample) |
| DE (1) | DE112013002881T5 (enExample) |
| WO (1) | WO2013188023A1 (enExample) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9815193B2 (en) * | 2011-06-27 | 2017-11-14 | Delaware Capital Formation, Inc. | Electric motor based holding control systems and methods |
| DE102012219240B4 (de) * | 2012-10-22 | 2015-02-05 | Conti Temic Microelectronic Gmbh | Verfahren und Schaltungsanordnung zum Ansteuern eines Halbleiterschalters |
| US8954210B2 (en) | 2012-11-30 | 2015-02-10 | Electro-Motive Diesel, Inc. | Distributed control system for a locomotive |
| US9026282B2 (en) | 2012-11-30 | 2015-05-05 | Electro-Motive Diesel, Inc. | Two-tiered hierarchically distributed locomotive control system |
| US8935020B2 (en) | 2012-11-30 | 2015-01-13 | Electro-Motive Diesel, Inc. | Back-up and redundancy of modules in locomotive distributed control systems |
| US8868267B2 (en) | 2012-11-30 | 2014-10-21 | Electro-Motive Diesel, Inc. | Remote update in locomotive distributed control systems |
| JP5907199B2 (ja) * | 2014-03-12 | 2016-04-26 | トヨタ自動車株式会社 | 半導体装置及び半導体装置の制御方法 |
| CN104284149A (zh) * | 2014-08-25 | 2015-01-14 | 国家电网公司 | 输配电线路危险源点大型车辆形体变化侦测视频识别方法 |
| EP3118638B1 (en) | 2015-06-25 | 2019-08-07 | ABB Schweiz AG | Temperature estimation in power semiconductor device in electric drive system |
| EP3109649B1 (en) | 2015-06-25 | 2019-08-07 | ABB Schweiz AG | Aging determination of power semiconductor device in electric drive system |
| US20170108538A1 (en) * | 2015-10-20 | 2017-04-20 | General Electric Company | Isolated probe and method for power device monitoring |
| JP6010204B1 (ja) * | 2015-10-26 | 2016-10-19 | ファナック株式会社 | パワー素子の予測寿命を学習する機械学習装置及び方法並びに該機械学習装置を備えた寿命予測装置及びモータ駆動装置 |
| JP6616699B2 (ja) * | 2016-01-28 | 2019-12-04 | 株式会社日立製作所 | 電力変換装置およびパワーモジュールの熱抵抗計測方法 |
| EP3208586B1 (en) * | 2016-02-18 | 2019-08-28 | Mitsubishi Electric R&D Centre Europe B.V. | Method and device for determining the junction temperature of at least one die of a semiconductor power module |
| GB2549086B (en) * | 2016-03-30 | 2022-09-07 | Advanced Electric Machines Group Ltd | Electrical sub-assembly |
| GB201609907D0 (en) * | 2016-06-07 | 2016-07-20 | Rolls Royce Plc | Method for estimating power system health |
| US10393795B2 (en) | 2017-07-25 | 2019-08-27 | Abb Schweiz Ag | Semiconductor failure prognostication |
| JP6853147B2 (ja) * | 2017-09-06 | 2021-03-31 | 株式会社日立製作所 | 電力変換装置、電動機制御システム、および電力変換装置の診断方法 |
| US10737575B2 (en) * | 2017-11-22 | 2020-08-11 | Ford Global Technologies, Llc | Power device parameter adjustment |
| US10955297B2 (en) * | 2018-06-07 | 2021-03-23 | General Electric Company | Systems and methods for monitoring junction temperature of a semiconductor switch |
| FR3083385B1 (fr) * | 2018-06-27 | 2022-01-21 | Valeo Equip Electr Moteur | Machine electrique tournante munie d'un capteur de courant et d'un module de diagnostic |
| JP7279413B2 (ja) * | 2019-02-27 | 2023-05-23 | 株式会社デンソー | 故障予知システム |
| US11397209B2 (en) * | 2019-06-18 | 2022-07-26 | Board Of Regents, The University Of Texas System | Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products |
| US11849344B2 (en) * | 2020-05-15 | 2023-12-19 | Cisco Technology, Inc. | Dynamic media access control addresses in a wireless network |
| CN111781482B (zh) * | 2020-06-10 | 2022-10-25 | 徐州中矿大传动与自动化有限公司 | 一种大功率sic mosfet模块键合线健康状态检测方法及装置 |
| US11211928B1 (en) * | 2021-02-01 | 2021-12-28 | Infineon Technologies Ag | Apparatus and method for power switch status check |
| DE112021007405T5 (de) * | 2021-03-29 | 2024-01-18 | Mitsubishi Electric Corporation | Halbleitereinheit, verfahren zur herstellung einer halbleitereinheit und verfahren zum ersetzen einer halbleitereinheit |
| US11716014B2 (en) * | 2021-12-27 | 2023-08-01 | GM Global Technology Operations LLC | Method for detecting early degradation within the inverter module |
| GB202311386D0 (en) * | 2023-07-25 | 2023-09-06 | Rolls Royce Plc | Power electronics converter |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5039941A (en) * | 1990-07-27 | 1991-08-13 | Intel Corporation | Voltage threshold measuring circuit |
| US6405154B1 (en) * | 1999-12-29 | 2002-06-11 | General Electric Company | Method and apparatus for power electronics health monitoring |
| JP3668708B2 (ja) * | 2001-10-22 | 2005-07-06 | 株式会社日立製作所 | 故障検知システム |
| JP3933627B2 (ja) * | 2003-12-19 | 2007-06-20 | 株式会社日立製作所 | インバータ装置およびこれを用いた車両 |
| US20060267621A1 (en) * | 2005-05-27 | 2006-11-30 | Harris Edward B | On-chip apparatus and method for determining integrated circuit stress conditions |
| DE102005045957A1 (de) | 2005-09-26 | 2006-11-16 | Siemens Ag | Verfahren und Vorrichtung zur Übertragung von Signalen |
| JP4720586B2 (ja) * | 2006-04-10 | 2011-07-13 | 富士電機システムズ株式会社 | 検査方法及び検査装置 |
| US8299767B1 (en) * | 2006-08-18 | 2012-10-30 | Picor Corporation | Dynamic safe operating area control |
| US7777370B2 (en) * | 2007-05-03 | 2010-08-17 | Honeywell International Inc. | Integrated gate drive for use in control and protection of power modules |
| JP4830993B2 (ja) * | 2007-07-11 | 2011-12-07 | 富士電機株式会社 | 半導体装置の劣化検出方法 |
| JP5233198B2 (ja) * | 2007-08-06 | 2013-07-10 | 富士電機株式会社 | 半導体装置 |
| EP2096506B1 (en) * | 2008-02-29 | 2013-04-24 | Rockwell Automation Limited | Method and apparatus for protecting digital output circuits |
| JP5196370B2 (ja) * | 2008-03-14 | 2013-05-15 | 東芝エレベータ株式会社 | 電力変換装置の寿命診断装置 |
| US8008953B1 (en) * | 2008-11-07 | 2011-08-30 | Silego Technology, Inc. | Gate control circuit |
| CN201794805U (zh) * | 2010-02-10 | 2011-04-13 | 浙江移动电气股份有限公司 | 一种带智能空气质量检测装置的换气扇 |
| JP5420461B2 (ja) * | 2010-03-25 | 2014-02-19 | 本田技研工業株式会社 | 温度センサ接合部検査装置、及び、温度センサ接合部検査方法 |
| JP5007754B2 (ja) * | 2010-05-14 | 2012-08-22 | 株式会社デンソー | 電力変換システムの放電制御装置 |
-
2012
- 2012-06-11 US US13/492,947 patent/US8957723B2/en active Active
-
2013
- 2013-05-09 WO PCT/US2013/040273 patent/WO2013188023A1/en not_active Ceased
- 2013-05-09 JP JP2015516022A patent/JP6405303B2/ja active Active
- 2013-05-09 DE DE112013002881.6T patent/DE112013002881T5/de active Pending
- 2013-05-09 CN CN201380030660.8A patent/CN104365021B/zh active Active
- 2013-05-09 AU AU2013274854A patent/AU2013274854B2/en active Active
-
2014
- 2014-11-19 CL CL2014003143A patent/CL2014003143A1/es unknown
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2015526932A5 (enExample) | ||
| US10620274B2 (en) | Method and apparatus for contact detection in battery packs | |
| CN109298306A (zh) | 半导体故障预测 | |
| JP2015526228A5 (enExample) | ||
| US10826138B2 (en) | Method and apparatus for contact detection in battery packs | |
| JP6188095B2 (ja) | 自動車の充電装置 | |
| JP2012044768A5 (ja) | 組電池システム、電圧監視システム、及び電圧監視装置 | |
| JP2015008618A5 (enExample) | ||
| CN204559607U (zh) | 一种物联网网关 | |
| JP2013530500A (ja) | スイッチ検知システム | |
| JP6476835B2 (ja) | 信号変換装置 | |
| US20150064513A1 (en) | Method for Activating a Plurality of Monitoring Units for a Battery, Battery and Motor Vehicle having said Battery | |
| CN115500081A (zh) | 电池监测装置及系统 | |
| JP2013196698A5 (enExample) | ||
| JP2016019417A5 (enExample) | ||
| CN103455061A (zh) | 干式变压器用温度控制装置及其操作方法 | |
| JP2014508357A5 (enExample) | ||
| CN103454545A (zh) | 热电偶焊接检测装置 | |
| CN105848393A (zh) | 故障检测设备及方法 | |
| EP1508842A3 (en) | Condition monitoring of an electrical machine | |
| JP5888499B2 (ja) | 温度伝送器 | |
| WO2014128437A3 (en) | Motor control circuit and method of monitoring a motor | |
| JPWO2016111128A1 (ja) | 故障検出装置 | |
| CN103124066A (zh) | 用于高电流脉冲电源的短路控制 | |
| JP2019111010A5 (ja) | パルスオキシメーター、モニタリングシステム及び生体情報測定装置 |