CN104365021B - 用于电源开关健康监测的设备和方法 - Google Patents

用于电源开关健康监测的设备和方法 Download PDF

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Publication number
CN104365021B
CN104365021B CN201380030660.8A CN201380030660A CN104365021B CN 104365021 B CN104365021 B CN 104365021B CN 201380030660 A CN201380030660 A CN 201380030660A CN 104365021 B CN104365021 B CN 104365021B
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China
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power switch
thermal resistance
health
gate
junction
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Chinese (zh)
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CN104365021A (zh
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T.A.策尔斯
A.J.M.库尔韦洛
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General Electric Co
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General Electric Co
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/18—Modifications for indicating state of switch

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  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
  • Electric Propulsion And Braking For Vehicles (AREA)
  • Inverter Devices (AREA)
CN201380030660.8A 2012-06-11 2013-05-09 用于电源开关健康监测的设备和方法 Active CN104365021B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/492947 2012-06-11
US13/492,947 US8957723B2 (en) 2012-06-11 2012-06-11 Apparatus and method for power switch health monitoring
PCT/US2013/040273 WO2013188023A1 (en) 2012-06-11 2013-05-09 Apparatus and method for power switch health monitoring

Publications (2)

Publication Number Publication Date
CN104365021A CN104365021A (zh) 2015-02-18
CN104365021B true CN104365021B (zh) 2018-02-16

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US (1) US8957723B2 (enExample)
JP (1) JP6405303B2 (enExample)
CN (1) CN104365021B (enExample)
AU (1) AU2013274854B2 (enExample)
CL (1) CL2014003143A1 (enExample)
DE (1) DE112013002881T5 (enExample)
WO (1) WO2013188023A1 (enExample)

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US20170108538A1 (en) * 2015-10-20 2017-04-20 General Electric Company Isolated probe and method for power device monitoring
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JP6616699B2 (ja) * 2016-01-28 2019-12-04 株式会社日立製作所 電力変換装置およびパワーモジュールの熱抵抗計測方法
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US10737575B2 (en) * 2017-11-22 2020-08-11 Ford Global Technologies, Llc Power device parameter adjustment
US10955297B2 (en) * 2018-06-07 2021-03-23 General Electric Company Systems and methods for monitoring junction temperature of a semiconductor switch
FR3083385B1 (fr) * 2018-06-27 2022-01-21 Valeo Equip Electr Moteur Machine electrique tournante munie d'un capteur de courant et d'un module de diagnostic
JP7279413B2 (ja) * 2019-02-27 2023-05-23 株式会社デンソー 故障予知システム
US11397209B2 (en) * 2019-06-18 2022-07-26 Board Of Regents, The University Of Texas System Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products
US11849344B2 (en) * 2020-05-15 2023-12-19 Cisco Technology, Inc. Dynamic media access control addresses in a wireless network
CN111781482B (zh) * 2020-06-10 2022-10-25 徐州中矿大传动与自动化有限公司 一种大功率sic mosfet模块键合线健康状态检测方法及装置
US11211928B1 (en) * 2021-02-01 2021-12-28 Infineon Technologies Ag Apparatus and method for power switch status check
DE112021007405T5 (de) * 2021-03-29 2024-01-18 Mitsubishi Electric Corporation Halbleitereinheit, verfahren zur herstellung einer halbleitereinheit und verfahren zum ersetzen einer halbleitereinheit
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US20080272658A1 (en) * 2007-05-03 2008-11-06 Hassan Ali Kojori Integrated gate drive for use in control and protection of power modules
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Also Published As

Publication number Publication date
CN104365021A (zh) 2015-02-18
AU2013274854A1 (en) 2014-12-18
JP2015526932A (ja) 2015-09-10
JP6405303B2 (ja) 2018-10-17
WO2013188023A1 (en) 2013-12-19
AU2013274854B2 (en) 2017-01-19
US8957723B2 (en) 2015-02-17
CL2014003143A1 (es) 2015-03-27
US20130328596A1 (en) 2013-12-12
DE112013002881T5 (de) 2015-03-19

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