JP6405303B2 - 電力スイッチ正常性モニタリングのための装置および方法 - Google Patents

電力スイッチ正常性モニタリングのための装置および方法 Download PDF

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JP6405303B2
JP6405303B2 JP2015516022A JP2015516022A JP6405303B2 JP 6405303 B2 JP6405303 B2 JP 6405303B2 JP 2015516022 A JP2015516022 A JP 2015516022A JP 2015516022 A JP2015516022 A JP 2015516022A JP 6405303 B2 JP6405303 B2 JP 6405303B2
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power switch
power
gate
junction
case
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Japanese (ja)
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JP2015526932A (ja
JP2015526932A5 (enExample
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ゾエルズ,トーマス・アロイス
カルベロ,アルヴァロ・ジョージ・マリ
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General Electric Co
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General Electric Co
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/18Modifications for indicating state of switch

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  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
  • Inverter Devices (AREA)
  • Electric Propulsion And Braking For Vehicles (AREA)
JP2015516022A 2012-06-11 2013-05-09 電力スイッチ正常性モニタリングのための装置および方法 Active JP6405303B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/492,947 US8957723B2 (en) 2012-06-11 2012-06-11 Apparatus and method for power switch health monitoring
US13/492,947 2012-06-11
PCT/US2013/040273 WO2013188023A1 (en) 2012-06-11 2013-05-09 Apparatus and method for power switch health monitoring

Publications (3)

Publication Number Publication Date
JP2015526932A JP2015526932A (ja) 2015-09-10
JP2015526932A5 JP2015526932A5 (enExample) 2016-06-23
JP6405303B2 true JP6405303B2 (ja) 2018-10-17

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JP2015516022A Active JP6405303B2 (ja) 2012-06-11 2013-05-09 電力スイッチ正常性モニタリングのための装置および方法

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US (1) US8957723B2 (enExample)
JP (1) JP6405303B2 (enExample)
CN (1) CN104365021B (enExample)
AU (1) AU2013274854B2 (enExample)
CL (1) CL2014003143A1 (enExample)
DE (1) DE112013002881T5 (enExample)
WO (1) WO2013188023A1 (enExample)

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JP6616699B2 (ja) * 2016-01-28 2019-12-04 株式会社日立製作所 電力変換装置およびパワーモジュールの熱抵抗計測方法
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US10737575B2 (en) * 2017-11-22 2020-08-11 Ford Global Technologies, Llc Power device parameter adjustment
US10955297B2 (en) * 2018-06-07 2021-03-23 General Electric Company Systems and methods for monitoring junction temperature of a semiconductor switch
FR3083385B1 (fr) * 2018-06-27 2022-01-21 Valeo Equip Electr Moteur Machine electrique tournante munie d'un capteur de courant et d'un module de diagnostic
JP7279413B2 (ja) * 2019-02-27 2023-05-23 株式会社デンソー 故障予知システム
US11397209B2 (en) * 2019-06-18 2022-07-26 Board Of Regents, The University Of Texas System Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products
US11849344B2 (en) * 2020-05-15 2023-12-19 Cisco Technology, Inc. Dynamic media access control addresses in a wireless network
CN111781482B (zh) * 2020-06-10 2022-10-25 徐州中矿大传动与自动化有限公司 一种大功率sic mosfet模块键合线健康状态检测方法及装置
US11211928B1 (en) * 2021-02-01 2021-12-28 Infineon Technologies Ag Apparatus and method for power switch status check
DE112021007405T5 (de) * 2021-03-29 2024-01-18 Mitsubishi Electric Corporation Halbleitereinheit, verfahren zur herstellung einer halbleitereinheit und verfahren zum ersetzen einer halbleitereinheit
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Also Published As

Publication number Publication date
US20130328596A1 (en) 2013-12-12
AU2013274854B2 (en) 2017-01-19
JP2015526932A (ja) 2015-09-10
DE112013002881T5 (de) 2015-03-19
CN104365021B (zh) 2018-02-16
US8957723B2 (en) 2015-02-17
WO2013188023A1 (en) 2013-12-19
CN104365021A (zh) 2015-02-18
AU2013274854A1 (en) 2014-12-18
CL2014003143A1 (es) 2015-03-27

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