JP2015511258A5 - - Google Patents

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Publication number
JP2015511258A5
JP2015511258A5 JP2014556155A JP2014556155A JP2015511258A5 JP 2015511258 A5 JP2015511258 A5 JP 2015511258A5 JP 2014556155 A JP2014556155 A JP 2014556155A JP 2014556155 A JP2014556155 A JP 2014556155A JP 2015511258 A5 JP2015511258 A5 JP 2015511258A5
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JP
Japan
Prior art keywords
composition according
cmp composition
saccharide
monosaccharide
tetrasaccharide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2014556155A
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English (en)
Japanese (ja)
Other versions
JP6114312B2 (ja
JP2015511258A (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/IB2013/050647 external-priority patent/WO2013118015A1/en
Publication of JP2015511258A publication Critical patent/JP2015511258A/ja
Publication of JP2015511258A5 publication Critical patent/JP2015511258A5/ja
Application granted granted Critical
Publication of JP6114312B2 publication Critical patent/JP6114312B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2014556155A 2012-02-10 2013-01-25 タンパク質を含有する化学機械研磨(cmp)組成物 Expired - Fee Related JP6114312B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261597210P 2012-02-10 2012-02-10
US61/597,210 2012-02-10
PCT/IB2013/050647 WO2013118015A1 (en) 2012-02-10 2013-01-25 Chemical mechanical polishing (cmp) composition comprising a protein

Publications (3)

Publication Number Publication Date
JP2015511258A JP2015511258A (ja) 2015-04-16
JP2015511258A5 true JP2015511258A5 (enExample) 2016-03-10
JP6114312B2 JP6114312B2 (ja) 2017-04-12

Family

ID=48946960

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014556155A Expired - Fee Related JP6114312B2 (ja) 2012-02-10 2013-01-25 タンパク質を含有する化学機械研磨(cmp)組成物

Country Status (11)

Country Link
US (1) US9777192B2 (enExample)
EP (1) EP2812911B1 (enExample)
JP (1) JP6114312B2 (enExample)
KR (1) KR20140122271A (enExample)
CN (1) CN104081501B (enExample)
IL (1) IL233797A0 (enExample)
MY (1) MY171093A (enExample)
RU (1) RU2631875C2 (enExample)
SG (1) SG11201404747UA (enExample)
TW (1) TWI606102B (enExample)
WO (1) WO2013118015A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104169418B (zh) * 2012-02-13 2017-06-13 国立大学法人京都工艺纤维大学 具有对氮化硅(si3n4)的亲和性的肽及其用途
US9340706B2 (en) * 2013-10-10 2016-05-17 Cabot Microelectronics Corporation Mixed abrasive polishing compositions
US9551075B2 (en) * 2014-08-04 2017-01-24 Sinmat, Inc. Chemical mechanical polishing of alumina
KR102605140B1 (ko) * 2015-12-17 2023-11-24 솔브레인 주식회사 화학 기계적 연마 슬러리 조성물 및 이를 이용한 연마 방법
US11326076B2 (en) * 2019-01-25 2022-05-10 Versum Materials Us, Llc Shallow trench isolation (STI) chemical mechanical planarization (CMP) polishing with low abrasive concentration and a combination of chemical additives
US11608451B2 (en) 2019-01-30 2023-03-21 Versum Materials Us, Llc Shallow trench isolation (STI) chemical mechanical planarization (CMP) polishing with tunable silicon oxide and silicon nitride removal rates
KR20210076571A (ko) * 2019-12-16 2021-06-24 주식회사 케이씨텍 Sti 공정용 연마 슬러리 조성물
WO2021231090A1 (en) * 2020-05-11 2021-11-18 Versum Materials Us, Llc Novel pad-1 n-a-bottle (pib) technology for advanced chemical-mechanical planarization (cmp) slurries and processes
US12009339B2 (en) 2020-08-18 2024-06-11 Seoul National University R&Db Foundation Electronic device and method of transferring electronic element using stamping and magnetic field alignment
CN118240485B (zh) * 2024-05-27 2024-08-16 嘉兴市小辰光伏科技有限公司 一种具有云朵状塔基硅片碱抛添加剂及其使用方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE266071T1 (de) * 1998-02-24 2004-05-15 Showa Denko Kk Schleifmittelzusammensetzung zum polieren eines halbleiterbauteils und herstellung des halbleiterbauteils mit derselben
JP3560484B2 (ja) * 1998-08-05 2004-09-02 昭和電工株式会社 Lsiデバイス研磨用研磨材組成物及び研磨方法
US6679761B1 (en) 1999-11-04 2004-01-20 Seimi Chemical Co., Ltd. Polishing compound for semiconductor containing peptide
JP2002110596A (ja) * 2000-10-02 2002-04-12 Mitsubishi Electric Corp 半導体加工用研磨剤およびこれに用いる分散剤、並びに上記半導体加工用研磨剤を用いた半導体装置の製造方法
TWI281493B (en) * 2000-10-06 2007-05-21 Mitsui Mining & Smelting Co Polishing material
US20040175942A1 (en) 2003-01-03 2004-09-09 Chang Song Y. Composition and method used for chemical mechanical planarization of metals
US7241734B2 (en) * 2004-08-18 2007-07-10 E. I. Du Pont De Nemours And Company Thermophilic hydrophobin proteins and applications for surface modification
JP4027929B2 (ja) * 2004-11-30 2007-12-26 花王株式会社 半導体基板用研磨液組成物
US20060216935A1 (en) * 2005-03-28 2006-09-28 Ferro Corporation Composition for oxide CMP in CMOS device fabrication
EP1929512A2 (en) 2005-08-05 2008-06-11 Advanced Technology Materials, Inc. High throughput chemical mechanical polishing composition for metal film planarization
KR101395542B1 (ko) * 2006-05-02 2014-05-14 캐보트 마이크로일렉트로닉스 코포레이션 반도체 물질의 cmp를 위한 조성물 및 방법
EP2092031A1 (en) 2006-12-04 2009-08-26 Basf Se Planarization composition for metal surfaces comprising an alumina hydrate abrasive
JP4784614B2 (ja) * 2008-02-25 2011-10-05 Jsr株式会社 化学機械研磨用水系分散体
WO2010037730A1 (en) * 2008-10-03 2010-04-08 Basf Se Chemical mechanical polishing (cmp) polishing solution with enhanced performance
CA2752808A1 (en) * 2009-03-09 2010-09-16 Basf Se Use of a synergistic mixture of water-soluble polymers and hydrophobins for thickening aqueous phases
JP2012028747A (ja) * 2010-06-24 2012-02-09 Hitachi Chem Co Ltd Cmp研磨液及び基板の研磨方法

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