JP2015503746A5 - - Google Patents

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Publication number
JP2015503746A5
JP2015503746A5 JP2014549552A JP2014549552A JP2015503746A5 JP 2015503746 A5 JP2015503746 A5 JP 2015503746A5 JP 2014549552 A JP2014549552 A JP 2014549552A JP 2014549552 A JP2014549552 A JP 2014549552A JP 2015503746 A5 JP2015503746 A5 JP 2015503746A5
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JP
Japan
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mass
xic
time interval
time intervals
fragment ions
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JP2014549552A
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English (en)
Japanese (ja)
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JP2015503746A (ja
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Priority claimed from PCT/IB2012/002723 external-priority patent/WO2013098618A1/en
Publication of JP2015503746A publication Critical patent/JP2015503746A/ja
Publication of JP2015503746A5 publication Critical patent/JP2015503746A5/ja
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JP2014549552A 2011-12-29 2012-12-15 滞留時間の決定または確認のための窓処理質量分析データの使用 Pending JP2015503746A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161581423P 2011-12-29 2011-12-29
US61/581,423 2011-12-29
PCT/IB2012/002723 WO2013098618A1 (en) 2011-12-29 2012-12-15 Use of windowed mass spectrometry data for retention time determination or confirmation

Related Child Applications (1)

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JP2016227513A Division JP6494588B2 (ja) 2011-12-29 2016-11-24 滞留時間の決定または確認のための窓処理質量分析データの使用

Publications (2)

Publication Number Publication Date
JP2015503746A JP2015503746A (ja) 2015-02-02
JP2015503746A5 true JP2015503746A5 (cg-RX-API-DMAC7.html) 2016-01-21

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JP2014549552A Pending JP2015503746A (ja) 2011-12-29 2012-12-15 滞留時間の決定または確認のための窓処理質量分析データの使用
JP2016227513A Active JP6494588B2 (ja) 2011-12-29 2016-11-24 滞留時間の決定または確認のための窓処理質量分析データの使用

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JP2016227513A Active JP6494588B2 (ja) 2011-12-29 2016-11-24 滞留時間の決定または確認のための窓処理質量分析データの使用

Country Status (7)

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US (2) US9343276B2 (cg-RX-API-DMAC7.html)
EP (1) EP2798664B1 (cg-RX-API-DMAC7.html)
JP (2) JP2015503746A (cg-RX-API-DMAC7.html)
KR (1) KR102044211B1 (cg-RX-API-DMAC7.html)
CN (2) CN104025249B (cg-RX-API-DMAC7.html)
CA (1) CA2862255A1 (cg-RX-API-DMAC7.html)
WO (1) WO2013098618A1 (cg-RX-API-DMAC7.html)

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US11474087B2 (en) * 2016-12-20 2022-10-18 Dh Technologies Development Pte. Ltd. Automated expected retention time and optimal expected retention time window detection
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US12180581B2 (en) 2017-09-18 2024-12-31 Waters Technologies Corporation Use of vapor deposition coated flow paths for improved chromatography of metal interacting analytes
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US12181452B2 (en) 2017-09-18 2024-12-31 Waters Technologies Corporation Use of vapor deposition coated flow paths for improved chromatography of metal interacting analytes
US11709156B2 (en) 2017-09-18 2023-07-25 Waters Technologies Corporation Use of vapor deposition coated flow paths for improved analytical analysis
EP3740964A4 (en) * 2018-01-17 2021-10-06 DH Technologies Development Pte. Ltd. DM SWATH COLLECTION TO IMPROVE MSMS CONFIDENCE
CN112534267A (zh) 2018-08-31 2021-03-19 Dh科技发展私人贸易有限公司 复杂样本中相关化合物的识别和评分
EP3942593A4 (en) * 2019-03-22 2023-01-11 DH Technologies Development Pte. Ltd. DETERMINING THE ELUTION OF AGNOSTIC COMPOUNDS
US12148604B2 (en) * 2019-04-22 2024-11-19 Amit, Inc. Method for generating data set for training a prediction model and apparatus comprising the prediciton model
CN113631920B (zh) 2019-05-31 2024-04-26 Dh科技发展私人贸易有限公司 用于前体推理的扫描带数据和概率框架的实时编码的方法
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