JP2015503128A5 - - Google Patents

Download PDF

Info

Publication number
JP2015503128A5
JP2015503128A5 JP2014548737A JP2014548737A JP2015503128A5 JP 2015503128 A5 JP2015503128 A5 JP 2015503128A5 JP 2014548737 A JP2014548737 A JP 2014548737A JP 2014548737 A JP2014548737 A JP 2014548737A JP 2015503128 A5 JP2015503128 A5 JP 2015503128A5
Authority
JP
Japan
Prior art keywords
light beam
diffracted
optical element
diffracted light
relative phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014548737A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015503128A (ja
JP6208681B2 (ja
Filing date
Publication date
Priority claimed from US13/335,748 external-priority patent/US8693000B2/en
Application filed filed Critical
Publication of JP2015503128A publication Critical patent/JP2015503128A/ja
Publication of JP2015503128A5 publication Critical patent/JP2015503128A5/ja
Application granted granted Critical
Publication of JP6208681B2 publication Critical patent/JP6208681B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2014548737A 2011-12-22 2012-12-20 ラベルを使用しない高コントラストの細胞イメージングのための定量位相顕微鏡法 Active JP6208681B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/335,748 2011-12-22
US13/335,748 US8693000B2 (en) 2011-12-22 2011-12-22 Quantitative phase microscopy for label-free high-contrast cell imaging
PCT/SE2012/051445 WO2013095282A2 (en) 2011-12-22 2012-12-20 Quantitative phase microscopy for label-free high-contrast cell imaging

Publications (3)

Publication Number Publication Date
JP2015503128A JP2015503128A (ja) 2015-01-29
JP2015503128A5 true JP2015503128A5 (enExample) 2016-01-21
JP6208681B2 JP6208681B2 (ja) 2017-10-04

Family

ID=48654234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014548737A Active JP6208681B2 (ja) 2011-12-22 2012-12-20 ラベルを使用しない高コントラストの細胞イメージングのための定量位相顕微鏡法

Country Status (5)

Country Link
US (1) US8693000B2 (enExample)
EP (1) EP2795389A4 (enExample)
JP (1) JP6208681B2 (enExample)
CN (1) CN103998969A (enExample)
WO (1) WO2013095282A2 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2627727B2 (ja) * 1994-08-03 1997-07-09 株式会社中国医食研究所 骨髄品の製法
US8934103B2 (en) 2011-12-22 2015-01-13 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
WO2014070082A1 (en) * 2012-10-29 2014-05-08 General Electric Company Quantitative phase microscopy for label-free high-contrast cell imaging
JP6182005B2 (ja) * 2013-07-22 2017-08-16 アストロデザイン株式会社 光学的分解能向上装置
JP6195373B2 (ja) * 2013-12-19 2017-09-13 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置および撮像方法
DE112015006081T5 (de) 2015-01-30 2017-11-02 Hamamatsu Photonics K.K. Interferenz-optikvorrichtung, interferenz-beobachtungsvorrichtung und interferenz-beobachtungsverfahren
WO2016121248A1 (ja) * 2015-01-30 2016-08-04 浜松ホトニクス株式会社 干渉観察装置
CN107850530B (zh) 2015-05-04 2020-11-06 港大科桥有限公司 用于对样本进行光学成像的装置和方法
EP3115766A1 (en) 2015-07-10 2017-01-11 3Scan Inc. Spatial multiplexing of histological stains
JP2018139532A (ja) * 2017-02-28 2018-09-13 株式会社島津製作所 細胞観察装置
JPWO2018158946A1 (ja) * 2017-03-03 2019-11-21 株式会社島津製作所 細胞観察装置
WO2018224852A2 (en) * 2017-06-09 2018-12-13 77 Elektronika Műszeripari Kft. Combined bright-field and phase-contrast microscopy system and image processing apparatus equipped therewith
JP7158220B2 (ja) * 2018-09-11 2022-10-21 浜松ホトニクス株式会社 測定装置および測定方法
CN110376867A (zh) * 2019-06-25 2019-10-25 北京理工大学 一种高时空分辨率的离轴数字全息显微成像系统及方法
CN110907403B (zh) * 2019-11-18 2021-07-09 中国科学技术大学 单次直接定量相位成像的实现装置
CN113804625A (zh) * 2021-09-30 2021-12-17 常州北邮新一代信息技术研究院有限公司 自动跟踪细胞成像方法及系统
CN114324245B (zh) * 2021-11-15 2024-01-30 西安电子科技大学 基于部分相干结构光照明的定量相位显微装置和方法
CN116908217B (zh) * 2023-09-11 2023-11-17 中北大学 一种深孔测量与三维重建系统及其使用方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL68411A6 (enExample) 1969-05-26 1973-02-28
US5241364A (en) 1990-10-19 1993-08-31 Fuji Photo Film Co., Ltd. Confocal scanning type of phase contrast microscope and scanning microscope
JPH0527177A (ja) 1991-07-25 1993-02-05 Fuji Photo Film Co Ltd 走査型顕微鏡
JP3209645B2 (ja) * 1993-10-12 2001-09-17 三菱電機株式会社 位相シフトマスクの検査方法およびその方法に用いる検査装置
US5751475A (en) * 1993-12-17 1998-05-12 Olympus Optical Co., Ltd. Phase contrast microscope
ATE341012T1 (de) 2000-11-06 2006-10-15 Vincent Lauer Mikroskop für beugungsobjekte
US7151632B2 (en) * 2001-01-12 2006-12-19 University Of Rochester Apparatus for production of an inhomogeneously polarized optical beam for use in illumination and a method thereof
US7365858B2 (en) 2001-12-18 2008-04-29 Massachusetts Institute Of Technology Systems and methods for phase measurements
EP1631788B1 (en) * 2003-05-16 2007-03-14 Universite Libre De Bruxelles Digital holographic microscope for 3d imaging and process using it
US7564622B2 (en) * 2003-12-12 2009-07-21 Olympus Corporation Methods for implement microscopy and microscopic measurement as well as microscope and apparatus for implementing them
WO2006003867A2 (ja) * 2004-06-30 2006-01-12 Nikon Corporation 顕微鏡観察方法、顕微鏡装置、微分干渉顕微鏡装置、位相差顕微鏡装置、干渉顕微鏡装置、画像処理方法、及び画像処理装置
JP4512822B2 (ja) * 2004-10-20 2010-07-28 国立大学法人 筑波大学 線集光型フーリエドメイン干渉形状計測装置
JP2006250849A (ja) * 2005-03-14 2006-09-21 Naohiro Tanno 光コヒーレンストモグラフィー装置を用いた光画像計測方法及びその装置
EP1924877A2 (en) * 2005-08-18 2008-05-28 TAT Investments II, C.V. System and method for improved holographic imaging
JP4025878B2 (ja) * 2005-09-05 2007-12-26 国立大学法人 和歌山大学 物体の再生像を得る装置、位相シフトデジタルホログラフィ変位分布計測装置及びパラメータを同定する方法
US7812959B1 (en) 2007-03-22 2010-10-12 University Of South Florida Total internal reflection holographic microscope
US7633631B2 (en) * 2007-04-04 2009-12-15 Nikon Corporation Three-dimensional microscope and method for obtaining three-dimensional image
US8184298B2 (en) 2008-05-21 2012-05-22 The Board Of Trustees Of The University Of Illinois Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization
CN102576209B (zh) * 2009-10-08 2016-08-10 布鲁塞尔大学 离轴数字全息显微镜

Similar Documents

Publication Publication Date Title
JP2015503128A5 (enExample)
US9810896B2 (en) Microscope device and microscope system
US11187883B2 (en) Structured illuminating microscopy apparatus
JP5357329B2 (ja) 観察装置
Zhou et al. Advances in 3D single particle localization microscopy
JP6304792B2 (ja) 受け取った電磁放射からホログラムを生成するために複屈折レンズを使用するためのシステム、装置及び方法
JP2015506471A5 (enExample)
US9360611B2 (en) System, method and apparatus for contrast enhanced multiplexing of images
JP2016538584A5 (enExample)
JP5981443B2 (ja) 観察装置
US11285483B2 (en) Cell observation system and cell observation method
JP5039583B2 (ja) 観察装置
JP2011133580A (ja) ホログラム像投影方法およびホログラム像投影装置
JP6116142B2 (ja) 走査型共焦点レーザ顕微鏡
JP6385779B2 (ja) 光学的距離計測装置
US9163934B2 (en) Gap measurement device
Watanabe et al. Portable digital holographic microscope using spherical reference beam
JP6467160B2 (ja) 結像光学系、照明装置および観察装置
Zhou et al. Three-dimensional optical techniques using Dammann gratings
JP2012220611A (ja) 顕微鏡装置
CN207502929U (zh) 一种层叠衍射成像装置
CN106768342A (zh) 基于偏振复用实现不等间隔多平面成像的装置及方法
JP5823810B2 (ja) 観察装置
KR20210016969A (ko) Fpm에서 켈리브레이션 그레이팅을 이용한 회절격자 위상 측정시스템 및 측정방법
JP2017223981A (ja) 顕微鏡のための直交光ビーム分割