JP2015233065A - Transport device - Google Patents

Transport device Download PDF

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Publication number
JP2015233065A
JP2015233065A JP2014118982A JP2014118982A JP2015233065A JP 2015233065 A JP2015233065 A JP 2015233065A JP 2014118982 A JP2014118982 A JP 2014118982A JP 2014118982 A JP2014118982 A JP 2014118982A JP 2015233065 A JP2015233065 A JP 2015233065A
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Prior art keywords
annular frame
suction
transport
diameter
support member
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JP2014118982A
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Japanese (ja)
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鈴木 稔
Minoru Suzuki
稔 鈴木
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Disco Corp
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Disco Abrasive Systems Ltd
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Application filed by Disco Abrasive Systems Ltd filed Critical Disco Abrasive Systems Ltd
Priority to JP2014118982A priority Critical patent/JP2015233065A/en
Priority to TW104113056A priority patent/TW201606916A/en
Priority to KR1020150073868A priority patent/KR20150141134A/en
Priority to CN201510299753.1A priority patent/CN105280539A/en
Publication of JP2015233065A publication Critical patent/JP2015233065A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67766Mechanical parts of transfer devices

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Dicing (AREA)
  • Manipulator (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a transport device capable of improving workability.SOLUTION: A transport device that transports a workpiece mounted on an annular frame through a tape stuck to a rear surface of the annular frame includes: a transport arm; a transport head mounted on the transport arm; and moving means that causes the transport head to be moved. The transport head includes: a support member attached to the transport arm; at least a pair of first suction pads that each have a first suction-holding surface for suction-holding a first annular frame mounted on the support member separated by a distance corresponding to a first diameter of the first annular frame having the first diameter; and at least a pair of second suction pads that each have a second suction-holding surface for suction-holding a second annular frame mounted on the support member separated by a distance corresponding to a second diameter of the second annular frame having the second diameter larger than the first diameter, in which the first suction-holding surface is positioned above the second suction-holding surface.

Description

本発明は、テープを介して環状フレームに装着された被加工物を搬送する搬送装置に関する。   The present invention relates to a conveying device that conveys a workpiece mounted on an annular frame via a tape.

切削装置、レーザー加工装置等の加工装置では、目的の加工を完全に実施するため或いはハンドリングを容易にするために、ウェーハの裏面を外周部が環状フレームに貼着された粘着テープであるダイシングテープに貼着してフレームユニットを形成し、フレームユニットの形態でカセットに対してフレームユニットを搬出入したり、加工装置内での搬送を行っている。   In a processing device such as a cutting device or a laser processing device, a dicing tape which is an adhesive tape whose outer peripheral portion is bonded to an annular frame on the back surface of a wafer in order to completely perform a desired processing or facilitate handling. The frame unit is formed by sticking to the cassette, and the frame unit is carried in and out of the cassette in the form of the frame unit, or is carried in the processing apparatus.

従来の切削装置では、搬送装置の搬送ヘッドは、φ6インチ用、φ8インチ用等の環状フレームのサイズに応じて、環状フレームを吸着保持する吸着パッドの位置を変更できるように支持部材に取り付けられている。   In the conventional cutting apparatus, the transport head of the transport apparatus is attached to the support member so that the position of the suction pad for sucking and holding the annular frame can be changed according to the size of the annular frame for φ6 inch, φ8 inch, or the like. ing.

特開2003−086543号公報Japanese Patent Laid-Open No. 2003-086543

従来の切削装置、レーザー加工装置等の加工装置に搭載された搬送装置では、環状フレームのサイズに応じて吸着パッドの取り付け位置を変更できるように工夫されている。しかし、フレームユニットの環状フレームのサイズに応じてその都度吸着パッドの取り付け位置を変更するのは非常に手間であるという問題がある。   In a transfer device mounted on a processing device such as a conventional cutting device or a laser processing device, the suction pad mounting position can be changed according to the size of the annular frame. However, there is a problem that it is very troublesome to change the attachment position of the suction pad each time according to the size of the annular frame of the frame unit.

本発明はこのような点に鑑みてなされたものであり、その目的とするところは、作業性を向上し得る搬送装置を提供することである。   The present invention has been made in view of the above points, and an object of the present invention is to provide a transport apparatus capable of improving workability.

本発明によると、裏面に貼着されたテープを介して環状フレームに装着された被加工物を搬送する搬送装置であって、搬送アームと、該搬送アームに装着された搬送ヘッドと、該搬送ヘッドを移動させる移動手段と、を備え、該搬送ヘッドは、該搬送アームに取り付けられた支持部材と、第一の直径を有する第一環状フレームの該第一の直径に対応する距離離間して該支持部材に取り付けられた、該第一環状フレームを吸着保持する第一吸着保持面を有する少なくとも一対の第一吸着パッドと、第一の直径より大きい第二の直径を有する第二環状フレームの該第二の直径に対応する距離離間して該支持部材に取り付けられた、該第二環状フレームを吸着保持する第二吸着保持面を有する少なくとも一対の第二吸着パッドと、を具備し、該第一吸着保持面は該第二吸着保持面より上方に位置することを特徴とする搬送装置が提供される。   According to the present invention, there is provided a transport device for transporting a workpiece mounted on an annular frame via a tape attached to the back surface, the transport arm, a transport head mounted on the transport arm, and the transport Moving means for moving the head, the transport head being spaced apart from a support member attached to the transport arm by a distance corresponding to the first diameter of the first annular frame having a first diameter. At least a pair of first suction pads attached to the support member and having a first suction holding surface for sucking and holding the first annular frame; and a second annular frame having a second diameter larger than the first diameter. And at least a pair of second suction pads, which are attached to the support member at a distance corresponding to the second diameter and have a second suction holding surface for sucking and holding the second annular frame, first Wear holding surface transport apparatus is provided, characterized in that located above said second suction holding surface.

本発明の搬送装置によると、フレームユニットのフレームサイズに応じてその都度吸着パッドの位置を変更する作業が不要となるため、作業性を向上することができる。   According to the transfer device of the present invention, work to change the position of the suction pad each time according to the frame size of the frame unit is not required, so that workability can be improved.

本発明の搬送装置を備えた切削装置の斜視図である。It is a perspective view of the cutting device provided with the conveyance device of the present invention. 半導体ウェーハの表面側斜視図である。It is a surface side perspective view of a semiconductor wafer. ダイシングテープを介してウェーハを環状フレームで支持したフレームユニットの斜視図である。It is a perspective view of the frame unit which supported the wafer with the annular frame via the dicing tape. 本発明実施形態に係る搬送装置の斜視図である。It is a perspective view of the conveyance apparatus which concerns on this invention embodiment. 搬送装置の一部断面側面図である。It is a partial cross section side view of a conveying apparatus. 図6(A)はφ6インチ用フレーム搬送時の一部断面側面図、図6(B)はφ8インチ用フレーム搬送時の一部断面側面図である。6A is a partial cross-sectional side view during conveyance of a φ6 inch frame, and FIG. 6B is a partial cross-sectional side view during conveyance of a φ8 inch frame.

以下、本発明の実施形態を図面を参照して詳細に説明する。図1を参照すると、本発明実施形態に係る搬送装置を備えた切削装置の斜視図が示されている。切削装置2の前面側には、オペレータが加工条件等の装置に対する指示を入力するための操作パネル4が設けられている。装置上部には、オペレータに対する案内画面や後述する撮像ユニットによって撮像された画像が表示されるCRT等の表示モニタ6が設けられている。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Referring to FIG. 1, a perspective view of a cutting device provided with a transport device according to an embodiment of the present invention is shown. On the front side of the cutting apparatus 2, an operation panel 4 is provided for an operator to input instructions to the apparatus such as machining conditions. In the upper part of the apparatus, a display monitor 6 such as a CRT on which a guidance screen for an operator and an image captured by an imaging unit described later are displayed is provided.

切削装置2の切削対象である半導体ウェーハ(以下、単にウェーハと略称することがある)11は、図2に示すように、例えば厚さが700μmのシリコンウェーハからなっており、表面11aに複数のストリート(分割予定ライン)13が格子状に形成されているとともに、複数のストリート13によって区画された各領域にIC、LSI等のデバイス15が形成されている。   As shown in FIG. 2, a semiconductor wafer 11 (hereinafter sometimes simply referred to as a wafer) 11 to be cut by the cutting apparatus 2 is made of, for example, a silicon wafer having a thickness of 700 μm, and has a plurality of surfaces 11a. Streets (scheduled division lines) 13 are formed in a lattice pattern, and devices 15 such as ICs and LSIs are formed in each region partitioned by a plurality of streets 13.

ウェーハ11は、図3に示すように、外周部が環状フレームFに貼着された粘着テープであるダイシングテープTに裏面が貼着されてフレームユニット17の形態とされた後、フレームユニット17が図1に示したウェーハカセット8中に複数枚収容される。ウェーハカセット8は上下動可能なカセットエレベータ9上に載置される。   As shown in FIG. 3, the wafer 11 is formed in the form of a frame unit 17 by attaching the back surface to a dicing tape T, which is an adhesive tape having an outer peripheral part attached to an annular frame F. A plurality of wafers are accommodated in the wafer cassette 8 shown in FIG. The wafer cassette 8 is placed on a cassette elevator 9 that can move up and down.

カセットエレベータ9上に載置されたウェーハカセット8の後方には、ウェーハカセット8から切削前のフレームユニット17を搬出するとともに、切削後のフレームユニット17をウェーハカセット8に搬入する搬出入ユニット10が配設されている。   Behind the wafer cassette 8 placed on the cassette elevator 9 is a loading / unloading unit 10 for unloading the frame unit 17 before cutting from the wafer cassette 8 and loading the frame unit 17 after cutting into the wafer cassette 8. It is arranged.

ウェーハカセット8と搬出入ユニット10との間には、搬出入対象のフレームユニット17が一時的に載置される領域である仮置き領域12が設けられており、仮置き領域12には、フレームユニット17を一定の位置に位置合わせする位置合わせ機構14が配設されている。   Between the wafer cassette 8 and the carry-in / out unit 10, a temporary placement area 12 that is an area on which the frame unit 17 to be carried in / out is temporarily placed is provided. An alignment mechanism 14 for aligning the unit 17 at a certain position is provided.

仮置き領域12の近傍には、フレームユニット17を吸着して搬送する旋回式の搬送装置16が配設されており、仮置き領域12に搬出されて位置合わせされたフレームユニット17は、搬送装置16により吸着されてホームポジションに位置付けられたチャックテーブル18上に搬送され、チャックテーブル18により吸引保持される。   In the vicinity of the temporary placement area 12, a swivel type transport device 16 that sucks and transports the frame unit 17 is disposed, and the frame unit 17 that is unloaded and aligned in the temporary placement area 12 has a transport device. 16, and is sucked and held on the chuck table 18 positioned at the home position.

チャックテーブル18は、回転可能且つ図示しない加工送り機構によりX軸方向に往復動可能に構成されており、チャックテーブル18のX軸方向の移動経路の上方には、ウェーハ11の切削すべき領域を検出するアライメントユニット22が配設されている。20は、フレームユニット17の環状フレームFをクランプするクランプである。   The chuck table 18 is configured to be rotatable and reciprocally movable in the X-axis direction by a machining feed mechanism (not shown). A region to be cut of the wafer 11 is located above the movement path of the chuck table 18 in the X-axis direction. An alignment unit 22 for detection is provided. Reference numeral 20 denotes a clamp that clamps the annular frame F of the frame unit 17.

アライメントユニット22は、ウェーハ11の表面を撮像する撮像ユニット24を備えており、撮像により取得した画像に基づき、パターンマッチング等の画像処理によって切削すべき領域を検出することができる。撮像ユニット24によって取得された画像は、表示モニタ6上に表示される。   The alignment unit 22 includes an imaging unit 24 that images the surface of the wafer 11, and can detect a region to be cut by image processing such as pattern matching based on an image acquired by imaging. The image acquired by the imaging unit 24 is displayed on the display monitor 6.

アライメントユニット22の左側には、チャックテーブル18に保持されたウェーハ11に対して切削加工を施す切削ユニット26が配設されている。切削ユニット26はアライメントユニット22と一体的に構成されており、両者が連動してY軸方向及びZ軸方向方向に移動する。   On the left side of the alignment unit 22, a cutting unit 26 for cutting the wafer 11 held on the chuck table 18 is disposed. The cutting unit 26 is configured integrally with the alignment unit 22, and both move together in the Y-axis direction and the Z-axis direction.

切削ユニット26は、モータにより回転駆動されるスピンドル28の先端部に外周に切り刃を有する切削ブレード30が装着されて構成され、Y軸方向及びZ軸方向に移動可能となっている。切削ブレード30は撮像ユニット24のX軸方向の延長線上に一致している。切削ユニット26のY軸方向の移動は、図示しない割り出し送り機構により達成される。   The cutting unit 26 is configured by mounting a cutting blade 30 having a cutting blade on the outer periphery at the tip of a spindle 28 that is rotationally driven by a motor, and is movable in the Y-axis direction and the Z-axis direction. The cutting blade 30 coincides with an extended line of the imaging unit 24 in the X-axis direction. The movement of the cutting unit 26 in the Y-axis direction is achieved by an index feed mechanism (not shown).

34は切削加工の終了したウェーハ11を洗浄するスピンナ洗浄ユニットであり、ウェーハ11の切削加工が終了するとチャックテーブル18がホームポジションに戻され、チャックテーブル18の吸引保持及びクランプ20が解除された後、フレームユニット17は搬送装置32によりスピンナ洗浄ユニット34まで搬送され、スピンナ洗浄ユニット34でスピン洗浄及びスピン乾燥される。   Reference numeral 34 denotes a spinner cleaning unit for cleaning the wafer 11 that has been subjected to the cutting process. After the cutting process of the wafer 11 is completed, the chuck table 18 is returned to the home position, and the chuck table 18 is held by suction and the clamp 20 is released. The frame unit 17 is transported to the spinner cleaning unit 34 by the transport device 32, and is subjected to spin cleaning and spin drying by the spinner cleaning unit 34.

次に、図4乃至図6を参照して、本発明実施形態に係る搬送装置32について詳細に説明する。図4を参照すると、搬送装置32の斜視図が示されている。搬送装置32の搬送アーム36は移動手段60によりY軸方向に移動される。   Next, with reference to FIG. 4 thru | or FIG. 6, the conveying apparatus 32 which concerns on embodiment of this invention is demonstrated in detail. Referring to FIG. 4, a perspective view of the transport device 32 is shown. The transfer arm 36 of the transfer device 32 is moved in the Y-axis direction by the moving means 60.

搬送アーム36の先端部には搬送ヘッド38が上下方向に移動可能に取り付けられている。即ち、図5に最も良く示されるように、搬送アーム36の先端部の下面にはエアシリンダ40が取り付けられており、エアシリンダ40のピストンロッド41の先端が搬送ヘッド38のY軸方向に伸長する支持部材44に固定されたブロック42に連結されている。エアシリンダ40を作動すると、ピストンロッド41が伸長又は収縮し、これに応じて支持部材44が上下方向に移動される。   A transport head 38 is attached to the front end of the transport arm 36 so as to be movable in the vertical direction. That is, as best shown in FIG. 5, the air cylinder 40 is attached to the lower surface of the tip of the transport arm 36, and the tip of the piston rod 41 of the air cylinder 40 extends in the Y-axis direction of the transport head 38. The support member 44 is connected to a block 42 fixed to the support member 44. When the air cylinder 40 is operated, the piston rod 41 extends or contracts, and the support member 44 is moved in the vertical direction accordingly.

支持部材44には、φ6インチ用の環状フレームF1の直径(第一の直径)に対応した距離離間した一対の支持アーム46が一体的に連結されており、更に、φ8インチ用の環状フレームF2の直径(第一の直径より大きい第二の直径)に対応した距離離間した一対の支持アーム48が一体的に連結されている。ここで、環状フレームFの直径とは、環状フレームFの幅方向中央部分の直径をいうものとする。   A pair of support arms 46 spaced apart from each other corresponding to the diameter (first diameter) of the annular frame F1 for φ6 inches are integrally connected to the support member 44, and further, the annular frame F2 for φ8 inches is further connected. A pair of support arms 48 that are spaced apart by a distance corresponding to the diameter (second diameter larger than the first diameter) are integrally connected. Here, the diameter of the annular frame F refers to the diameter of the central portion in the width direction of the annular frame F.

各支持アーム46の両端部には第一吸着保持面50aを有する第一吸着パッド50が取り付けられており、各支持アーム48の両端部には第二吸着保持面52aを有する第二吸着パッド52が取り付けられている。   A first suction pad 50 having a first suction holding surface 50a is attached to both ends of each support arm 46, and a second suction pad 52 having a second suction holding surface 52a is attached to both ends of each support arm 48. Is attached.

図5に示すように、第一吸着パッド50の吸着保持面50aの高さ位置50bが、第二吸着パッド52の吸着保持面52aの高さ位置52bより上方に位置するように、吸着パッド50,52が第一支持アーム46、第二支持アーム48にそれぞれ取り付けられている。   As shown in FIG. 5, the suction pad 50 is arranged such that the height position 50 b of the suction holding surface 50 a of the first suction pad 50 is located above the height position 52 b of the suction holding surface 52 a of the second suction pad 52. , 52 are attached to the first support arm 46 and the second support arm 48, respectively.

図4に示すように、4個の第一吸着パッド50は電磁切替弁54を介して吸引源56に接続されており、4個の第二吸着パッド52は電磁切替弁58を介して吸引源56に接続されている。   As shown in FIG. 4, the four first suction pads 50 are connected to the suction source 56 via the electromagnetic switching valve 54, and the four second suction pads 52 are connected to the suction source via the electromagnetic switching valve 58. 56.

次に、図6を参照して、搬送装置32の使用方法について説明する。φ6インチのウェーハ11を支持する第一環状フレームF1の搬送時には、図6(A)に示すように、電磁切替弁54を連通位置に切り替えて第一吸着パッド50を吸引源56に接続し、第一吸着パッド50で第一環状フレームF1を吸着保持し、搬送アーム36を移動手段60で移動することにより、ダイシングテープTを介して第一環状フレームF1に支持されたφ6インチウェーハ11を搬送する。   Next, with reference to FIG. 6, the usage method of the conveying apparatus 32 is demonstrated. When the first annular frame F1 supporting the φ6 inch wafer 11 is transported, as shown in FIG. 6A, the electromagnetic switching valve 54 is switched to the communication position to connect the first suction pad 50 to the suction source 56, The first annular frame F1 is sucked and held by the first suction pad 50, and the transfer arm 36 is moved by the moving means 60, whereby the φ6 inch wafer 11 supported by the first annular frame F1 is transferred via the dicing tape T. To do.

この時には、第一環状フレームF1の外径がY軸方向に離間した第二吸着パッド52と52との間の距離よりも小さいため、第二吸着パッド52が第一環状フレームF1に干渉することなく、第一環状フレームF1を第一吸着パッド50で吸着保持することができる。   At this time, since the outer diameter of the first annular frame F1 is smaller than the distance between the second suction pads 52 and 52 separated in the Y-axis direction, the second suction pad 52 interferes with the first annular frame F1. The first annular frame F1 can be sucked and held by the first suction pad 50.

一方、φ8インチのウェーハ11を支持する第二環状フレームF2の搬送時には、電磁切替弁54を遮断位置に切り替えるとともに、電磁切替弁58を連通位置に切り替えて、第二吸着パッド52を吸引源56に接続する。   On the other hand, when the second annular frame F2 supporting the φ8 inch wafer 11 is transported, the electromagnetic switching valve 54 is switched to the cutoff position, and the electromagnetic switching valve 58 is switched to the communication position, so that the second suction pad 52 is moved to the suction source 56. Connect to.

これにより、図6(B)に示すように、第二吸着パッド52でφ8インチのウェーハ11を支持する第二環状フレームF2を吸着保持して搬送することができる。この時、第一吸着パッド50の吸着保持面50aは第二吸着パッド52の吸着保持面52aよりも上方に位置するため、第二吸着パッド52で第二環状フレームF2を吸着保持する際第一吸着パッド50が干渉することはない。   As a result, as shown in FIG. 6B, the second annular frame F2 supporting the φ11 inch wafer 11 by the second suction pad 52 can be sucked and held and transported. At this time, since the suction holding surface 50a of the first suction pad 50 is positioned above the suction holding surface 52a of the second suction pad 52, when the second annular frame F2 is suctioned and held by the second suction pad 52, the first suction pad 50 is suctioned. The suction pad 50 does not interfere.

上述した説明では搬送ヘッド38を搬送装置32に適用した例について説明したが、旋回式の搬送装置16も搬送ヘッド38と同様な機構を有しており、φ6インチウェーハ11を支持する第一環状フレームF1及びφ8インチウェーハ11を支持する第二環状フレームF2を選択的に吸着保持することができる。   In the above description, the example in which the transfer head 38 is applied to the transfer device 32 has been described. However, the swivel transfer device 16 also has the same mechanism as the transfer head 38 and supports the φ6 inch wafer 11. The second annular frame F2 supporting the frame F1 and the φ8 inch wafer 11 can be selectively sucked and held.

上述した実施形態の搬送装置では、φ6インチ用の環状フレームF1及びφ8インチ用の環状フレームF2を吸着保持する例について説明したが、本発明はφ6インチ用及びφ8インチ用ウェーハを支持する環状フレームに限定されるものではなく、直径が異なる二種類の環状フレームを選択的に吸着保持する場合に使用可能である。   In the transfer apparatus of the above-described embodiment, the example in which the annular frame F1 for φ6 inch and the annular frame F2 for φ8 inch are sucked and held has been described, but the present invention is an annular frame that supports the wafer for φ6 inch and φ8 inch The present invention is not limited to this, and can be used when two types of annular frames having different diameters are selectively held by suction.

更に、上述した実施形態では、本発明の搬送措置を切削装置に適用した例について説明したが、本発明はこれに限定されるものではなく、被加工物をダイシングテープを介して環状フレームで支持するレーザー加工装置等の他の加工装置にも同様に適用することができる。   Further, in the above-described embodiment, the example in which the conveyance device of the present invention is applied to the cutting apparatus has been described. However, the present invention is not limited to this, and the workpiece is supported by the annular frame via the dicing tape. The present invention can be similarly applied to other processing apparatuses such as a laser processing apparatus.

11 半導体ウェーハ
16 旋回式搬送装置
18 チャックテーブル
26 切削ユニット
30 切削ブレード
32 搬送装置
36 搬送アーム
38 搬送ヘッド
44 支持部材
46 第一支持アーム
48 第二支持アーム
50 第一吸着パッド
52 第二吸着パッド
54,58 電磁切替弁
56 吸引源
T ダイシングテープ
F 環状フレーム
F1 第一環状フレーム
F2 第二環状フレーム
11 Semiconductor wafer 16 Revolving transfer device 18 Chuck table 26 Cutting unit 30 Cutting blade 32 Transfer device 36 Transfer arm 38 Transfer head 44 Support member 46 First support arm 48 Second support arm 50 First suction pad 52 Second suction pad 54 , 58 Electromagnetic switching valve 56 Suction source T Dicing tape F Annular frame F1 First annular frame F2 Second annular frame

Claims (1)

裏面に貼着されたテープを介して環状フレームに装着された被加工物を搬送する搬送装置であって、
搬送アームと、
該搬送アームに装着された搬送ヘッドと、
該搬送ヘッドを移動させる移動手段と、を備え、
該搬送ヘッドは、該搬送アームに取り付けられた支持部材と、
第一の直径を有する第一環状フレームの該第一の直径に対応する距離離間して該支持部材に取り付けられた、該第一環状フレームを吸着保持する第一吸着保持面を有する少なくとも一対の第一吸着パッドと、
第一の直径より大きい第二の直径を有する第二環状フレームの該第二の直径に対応する距離離間して該支持部材に取り付けられた、該第二環状フレームを吸着保持する第二吸着保持面を有する少なくとも一対の第二吸着パッドと、を具備し、
該第一吸着保持面は該第二吸着保持面より上方に位置することを特徴とする搬送装置。
A transport device for transporting a workpiece mounted on an annular frame via a tape attached to the back surface,
A transfer arm;
A transport head mounted on the transport arm;
Moving means for moving the transport head,
The transport head includes a support member attached to the transport arm;
At least a pair of first adsorbing and holding surfaces for adsorbing and holding the first annular frame attached to the support member at a distance corresponding to the first diameter of the first annular frame having a first diameter. A first suction pad;
A second adsorbing holder for adsorbing and holding the second annular frame attached to the support member at a distance corresponding to the second diameter of a second annular frame having a second diameter larger than the first diameter. Comprising at least a pair of second suction pads having a surface,
The conveying device, wherein the first suction holding surface is located above the second suction holding surface.
JP2014118982A 2014-06-09 2014-06-09 Transport device Pending JP2015233065A (en)

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KR1020150073868A KR20150141134A (en) 2014-06-09 2015-05-27 Conveyance device
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