JP2014518379A5 - - Google Patents
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- Publication number
- JP2014518379A5 JP2014518379A5 JP2014515284A JP2014515284A JP2014518379A5 JP 2014518379 A5 JP2014518379 A5 JP 2014518379A5 JP 2014515284 A JP2014515284 A JP 2014515284A JP 2014515284 A JP2014515284 A JP 2014515284A JP 2014518379 A5 JP2014518379 A5 JP 2014518379A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electrodes
- detector
- sample holder
- tracer particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims 21
- 238000000034 method Methods 0.000 claims 17
- 239000002245 particle Substances 0.000 claims 13
- 239000000700 radioactive tracer Substances 0.000 claims 12
- 238000006073 displacement reaction Methods 0.000 claims 7
- 239000003792 electrolyte Substances 0.000 claims 7
- 239000011244 liquid electrolyte Substances 0.000 claims 4
- 230000005684 electric field Effects 0.000 claims 3
- 239000008151 electrolyte solution Substances 0.000 claims 3
- 238000000733 zeta-potential measurement Methods 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 2
- 238000004458 analytical method Methods 0.000 claims 1
- 239000012620 biological material Substances 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 238000001485 positron annihilation lifetime spectroscopy Methods 0.000 claims 1
- 239000007787 solid Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161497385P | 2011-06-15 | 2011-06-15 | |
| US61/497,385 | 2011-06-15 | ||
| PCT/GB2012/051336 WO2012172330A1 (en) | 2011-06-15 | 2012-06-13 | Surface charge measurement |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014518379A JP2014518379A (ja) | 2014-07-28 |
| JP2014518379A5 true JP2014518379A5 (OSRAM) | 2015-06-25 |
| JP6023184B2 JP6023184B2 (ja) | 2016-11-09 |
Family
ID=46582723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014515284A Active JP6023184B2 (ja) | 2011-06-15 | 2012-06-13 | 表面電荷測定 |
Country Status (6)
| Country | Link |
|---|---|
| US (4) | US9829525B2 (OSRAM) |
| EP (1) | EP2721399B1 (OSRAM) |
| JP (1) | JP6023184B2 (OSRAM) |
| CN (2) | CN105891304B (OSRAM) |
| DK (1) | DK2721399T3 (OSRAM) |
| WO (1) | WO2012172330A1 (OSRAM) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103954850B (zh) * | 2014-04-22 | 2017-01-04 | 重庆大学 | 一种运动控制机构外置的表面电荷测量系统和测量方法 |
| JP6936229B2 (ja) | 2015-09-23 | 2021-09-15 | マルバーン パナリティカル リミテッド | 粒子特性評価 |
| US11002655B2 (en) | 2015-09-23 | 2021-05-11 | Malvern Panalytical Limited | Cuvette carrier |
| CN105628685B (zh) * | 2015-12-30 | 2019-04-23 | 宁德时代新能源科技股份有限公司 | 一种锂离子电池芯中电解液分布的测定方法 |
| GB201604460D0 (en) * | 2016-03-16 | 2016-04-27 | Malvern Instr Ltd | Dynamic light scattering |
| US10365198B2 (en) | 2016-04-21 | 2019-07-30 | Malvern Panalytical Limited | Particle characterization |
| US11130686B2 (en) | 2017-01-10 | 2021-09-28 | Vermeer Manufacturing Company | Systems and methods for dosing slurries to remove suspended solids |
| EP3379232A1 (en) | 2017-03-23 | 2018-09-26 | Malvern Panalytical Limited | Particle characterisation |
| CN106950438B (zh) * | 2017-04-28 | 2023-06-02 | 中国科学院地球化学研究所 | 非接触式空间粒子带电检测装置及方法 |
| CN109358239A (zh) * | 2018-10-17 | 2019-02-19 | 国网天津市电力公司电力科学研究院 | 一种用于交流电缆空间电荷测试的相位匹配电路 |
| CN109557388A (zh) * | 2018-11-23 | 2019-04-02 | 国网天津市电力公司电力科学研究院 | 基于lipp法的高分辨率空间电荷测试系统 |
| CN110346657B (zh) * | 2019-06-28 | 2021-09-03 | 同济大学 | 一种自适应调整电极夹具装置 |
| CN110456171B (zh) * | 2019-08-05 | 2020-11-06 | 清华大学 | 电晕放电导体表面电场强度的测量方法及装置 |
| JP7440331B2 (ja) * | 2020-04-16 | 2024-02-28 | 大塚電子株式会社 | ゼータ電位測定用治具 |
| JP7813177B2 (ja) * | 2022-04-13 | 2026-02-12 | 大塚電子株式会社 | ゼータ電位測定用治具セット |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5214342A (en) * | 1991-10-21 | 1993-05-25 | Yang Kei Wean C | Two-dimensional walker assembly for a scanning tunneling microscope |
| JP2924815B2 (ja) | 1996-09-27 | 1999-07-26 | 日本電気株式会社 | ゼータ電位測定装置 |
| EP0990888B1 (en) * | 1998-09-29 | 2008-07-02 | Horiba, Ltd. | Apparatus and method for measuring a particle size distribution |
| JP2001264282A (ja) | 2000-03-16 | 2001-09-26 | Kobe Steel Ltd | 金属材表面のゼータ電位測定方法およびゼータ電位測定装置、金属材の表面特性の評価方法 |
| GB2361772B (en) * | 2000-04-29 | 2004-05-19 | Malvern Instr Ltd | Mobility and effects arising from surface charge |
| JP4456301B2 (ja) * | 2001-07-18 | 2010-04-28 | 株式会社堀場製作所 | 粒子径分布測定装置 |
| KR100486730B1 (ko) * | 2003-01-21 | 2005-05-03 | 삼성전자주식회사 | 교류 전압과 ｔ 채널을 이용하여 제타 포텐셜을 측정하는방법 |
| JP4334899B2 (ja) | 2003-02-25 | 2009-09-30 | 大塚電子株式会社 | 電気泳動速度測定装置 |
| CA2493691A1 (en) * | 2004-01-22 | 2005-07-22 | Ionalytics Corporation | Method and apparatus for faims with a laser-based ionization source |
| US20080208511A1 (en) * | 2005-03-07 | 2008-08-28 | Michael Trainer | Methods and apparatus for determining characteristics of particles |
| JP4528014B2 (ja) * | 2004-04-05 | 2010-08-18 | 株式会社日立ハイテクノロジーズ | 試料検査方法 |
| BRPI0402805A (pt) * | 2004-05-25 | 2006-01-17 | Jose Augusto Pedro Lima | Sistema para medição de propriedades térmicas de fluidos |
| US7295311B2 (en) * | 2004-12-01 | 2007-11-13 | Particle Sizing Systems, Inc. | Methods and apparatus for electrophoretic mobility determination using phase light scattering analysis |
| JP4944859B2 (ja) * | 2008-09-26 | 2012-06-06 | 株式会社堀場製作所 | 粒子物性測定装置 |
| US9341564B2 (en) * | 2008-10-09 | 2016-05-17 | Malvern Instruments, Ltd. | Apparatus for high-throughput suspension measurements |
| JP2010101705A (ja) | 2008-10-22 | 2010-05-06 | Horiba Ltd | 粒子物性測定装置 |
| US8441638B2 (en) | 2010-02-26 | 2013-05-14 | Wyatt Technology Corporation | Apparatus to measure particle mobility in solution with scattered and unscattered light |
| JP5411096B2 (ja) | 2010-08-31 | 2014-02-12 | 株式会社堀場製作所 | 粒子物性測定セル及び粒子物性測定装置 |
-
2012
- 2012-06-13 DK DK12740387.1T patent/DK2721399T3/en active
- 2012-06-13 WO PCT/GB2012/051336 patent/WO2012172330A1/en not_active Ceased
- 2012-06-13 CN CN201610324224.7A patent/CN105891304B/zh active Active
- 2012-06-13 JP JP2014515284A patent/JP6023184B2/ja active Active
- 2012-06-13 EP EP12740387.1A patent/EP2721399B1/en active Active
- 2012-06-13 CN CN201280027695.1A patent/CN103608671B/zh active Active
- 2012-06-13 US US14/126,673 patent/US9829525B2/en active Active
-
2017
- 2017-01-25 US US15/415,852 patent/US20170356943A1/en not_active Abandoned
- 2017-10-21 US US15/789,984 patent/US10274528B2/en active Active
-
2019
- 2019-04-29 US US16/397,925 patent/US11079420B2/en active Active
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