CN105891304B - 表面电荷测量 - Google Patents

表面电荷测量 Download PDF

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Publication number
CN105891304B
CN105891304B CN201610324224.7A CN201610324224A CN105891304B CN 105891304 B CN105891304 B CN 105891304B CN 201610324224 A CN201610324224 A CN 201610324224A CN 105891304 B CN105891304 B CN 105891304B
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sample
electrode
flat surface
sample holder
measurement
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Chinese (zh)
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CN105891304A (zh
Inventor
杰森·科比特
弗雷泽·麦克尼尔·沃森
罗伯特·杰克
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Malvern Panalytical Ltd
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Malvern Instruments Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis
    • G01N27/44704—Details; Accessories
    • G01N27/44717—Arrangements for investigating the separated zones, e.g. localising zones
    • G01N27/44721—Arrangements for investigating the separated zones, e.g. localising zones by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
    • G01N2021/513—Cuvettes for scattering measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • G01N27/416—Systems
    • G01N27/447—Systems using electrophoresis

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  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
CN201610324224.7A 2011-06-15 2012-06-13 表面电荷测量 Active CN105891304B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161497385P 2011-06-15 2011-06-15
US61/497,385 2011-06-15
CN201280027695.1A CN103608671B (zh) 2011-06-15 2012-06-13 表面电荷测量

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201280027695.1A Division CN103608671B (zh) 2011-06-15 2012-06-13 表面电荷测量

Publications (2)

Publication Number Publication Date
CN105891304A CN105891304A (zh) 2016-08-24
CN105891304B true CN105891304B (zh) 2018-10-23

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CN201610324224.7A Active CN105891304B (zh) 2011-06-15 2012-06-13 表面电荷测量
CN201280027695.1A Active CN103608671B (zh) 2011-06-15 2012-06-13 表面电荷测量

Family Applications After (1)

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CN201280027695.1A Active CN103608671B (zh) 2011-06-15 2012-06-13 表面电荷测量

Country Status (6)

Country Link
US (4) US9829525B2 (OSRAM)
EP (1) EP2721399B1 (OSRAM)
JP (1) JP6023184B2 (OSRAM)
CN (2) CN105891304B (OSRAM)
DK (1) DK2721399T3 (OSRAM)
WO (1) WO2012172330A1 (OSRAM)

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Publication number Priority date Publication date Assignee Title
CN103954850B (zh) * 2014-04-22 2017-01-04 重庆大学 一种运动控制机构外置的表面电荷测量系统和测量方法
JP6936229B2 (ja) 2015-09-23 2021-09-15 マルバーン パナリティカル リミテッド 粒子特性評価
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
CN105628685B (zh) * 2015-12-30 2019-04-23 宁德时代新能源科技股份有限公司 一种锂离子电池芯中电解液分布的测定方法
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
US10365198B2 (en) 2016-04-21 2019-07-30 Malvern Panalytical Limited Particle characterization
US11130686B2 (en) 2017-01-10 2021-09-28 Vermeer Manufacturing Company Systems and methods for dosing slurries to remove suspended solids
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN106950438B (zh) * 2017-04-28 2023-06-02 中国科学院地球化学研究所 非接触式空间粒子带电检测装置及方法
CN109358239A (zh) * 2018-10-17 2019-02-19 国网天津市电力公司电力科学研究院 一种用于交流电缆空间电荷测试的相位匹配电路
CN109557388A (zh) * 2018-11-23 2019-04-02 国网天津市电力公司电力科学研究院 基于lipp法的高分辨率空间电荷测试系统
CN110346657B (zh) * 2019-06-28 2021-09-03 同济大学 一种自适应调整电极夹具装置
CN110456171B (zh) * 2019-08-05 2020-11-06 清华大学 电晕放电导体表面电场强度的测量方法及装置
JP7440331B2 (ja) * 2020-04-16 2024-02-28 大塚電子株式会社 ゼータ電位測定用治具
JP7813177B2 (ja) * 2022-04-13 2026-02-12 大塚電子株式会社 ゼータ電位測定用治具セット

Citations (4)

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US5214342A (en) * 1991-10-21 1993-05-25 Yang Kei Wean C Two-dimensional walker assembly for a scanning tunneling microscope
US7211797B2 (en) * 2004-04-05 2007-05-01 Hitachi High-Technologies Corporation Inspection method and inspection system using charged particle beam
US7217921B2 (en) * 2004-01-22 2007-05-15 Thermo Finnigan Llc Method and apparatus for FAIMS for in-line analysis of multiple samples
US7698090B2 (en) * 2004-05-25 2010-04-13 Lima Jose Augusto Pedro System for the measure of thermal properties of fluids

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JP2924815B2 (ja) 1996-09-27 1999-07-26 日本電気株式会社 ゼータ電位測定装置
EP0990888B1 (en) * 1998-09-29 2008-07-02 Horiba, Ltd. Apparatus and method for measuring a particle size distribution
JP2001264282A (ja) 2000-03-16 2001-09-26 Kobe Steel Ltd 金属材表面のゼータ電位測定方法およびゼータ電位測定装置、金属材の表面特性の評価方法
GB2361772B (en) * 2000-04-29 2004-05-19 Malvern Instr Ltd Mobility and effects arising from surface charge
JP4456301B2 (ja) * 2001-07-18 2010-04-28 株式会社堀場製作所 粒子径分布測定装置
KR100486730B1 (ko) * 2003-01-21 2005-05-03 삼성전자주식회사 교류 전압과 t 채널을 이용하여 제타 포텐셜을 측정하는방법
JP4334899B2 (ja) 2003-02-25 2009-09-30 大塚電子株式会社 電気泳動速度測定装置
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JP4944859B2 (ja) * 2008-09-26 2012-06-06 株式会社堀場製作所 粒子物性測定装置
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Patent Citations (4)

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US5214342A (en) * 1991-10-21 1993-05-25 Yang Kei Wean C Two-dimensional walker assembly for a scanning tunneling microscope
US7217921B2 (en) * 2004-01-22 2007-05-15 Thermo Finnigan Llc Method and apparatus for FAIMS for in-line analysis of multiple samples
US7211797B2 (en) * 2004-04-05 2007-05-01 Hitachi High-Technologies Corporation Inspection method and inspection system using charged particle beam
US7698090B2 (en) * 2004-05-25 2010-04-13 Lima Jose Augusto Pedro System for the measure of thermal properties of fluids

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Title
Effects of Zeta Potential and Electrolyte on Particle Interactions on an Electrode under ac Polarization;Kim, Anderson et al.;《Langmuir》;20020613;第18卷(第14期);摘要、引文、实验,第5387、5388页 *
Ferrari, Fariñas et al..Determination and Control of Metallic Impurities in Alumina Deposits Obtained by Aqueous Electrophoretic Deposition.《Journal of the American Ceramic Society》.2001,第84卷(第4期),733–739. *
High-concentration zeta potential measurements using light-scattering techniques;Kaszuba, Corbett et al.;《Philosophical transactions. Series A, Mathematical, physical, and engineering sciences》;20100928;第368卷(第1927期);引文、实验,第4440-4442页,图1、2、4 *
Kätzel.Dynamic Light Scattering for the Characterization of Polydisperse Fractal Systems by the Example of Pyrogenic Silica.《德累斯顿技术大学学位论文》.2007, *
Measurement of the zeta potential of planar solid surfaces by means of a rotating disk;Sides, Hoggard;《Langmuir》;20041124;第20卷(第26期);第11493–11498页 *
Progress in nanoparticles characterization: Sizing and zeta potential measurement;Xu;《Particuology》;20080319;第6卷(第2期);第113-114页 *
Streaming potential and streaming current measurements at planar solid/liquid interfaces for simultaneous determination of zeta potential and surface conductivity;Werner, Zimmermann et al.;《Colloids and Surfaces A: Physicochemical and Engineering Aspects》;20010825;第192卷(第1-3期);第206-207页,图1 *
Zeta potential of microfluidic substrates: 1. Theory, experimental techniques, and effects on separations;Kirby, Hasselbrink;《Electrophoresis》;20040119;第25卷(第2期);第三部分3.1和3.2节,第192-193页 *

Also Published As

Publication number Publication date
US10274528B2 (en) 2019-04-30
US11079420B2 (en) 2021-08-03
US20200072888A1 (en) 2020-03-05
JP6023184B2 (ja) 2016-11-09
US20150022212A1 (en) 2015-01-22
DK2721399T3 (en) 2017-07-10
US20180059160A1 (en) 2018-03-01
US20170356943A1 (en) 2017-12-14
JP2014518379A (ja) 2014-07-28
EP2721399A1 (en) 2014-04-23
WO2012172330A1 (en) 2012-12-20
EP2721399B1 (en) 2017-04-19
CN105891304A (zh) 2016-08-24
CN103608671B (zh) 2016-05-18
CN103608671A (zh) 2014-02-26
US9829525B2 (en) 2017-11-28

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