JP2014513310A5 - - Google Patents

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JP2014513310A5
JP2014513310A5 JP2014510300A JP2014510300A JP2014513310A5 JP 2014513310 A5 JP2014513310 A5 JP 2014513310A5 JP 2014510300 A JP2014510300 A JP 2014510300A JP 2014510300 A JP2014510300 A JP 2014510300A JP 2014513310 A5 JP2014513310 A5 JP 2014513310A5
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probe
operative
temperature
measurement system
signal interface
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JP2014510300A
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JP2014513310A (ja
JP6038890B2 (ja
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JP2014510300A 2011-05-10 2012-03-01 ゼロ熱流束深部組織温度測定システム Active JP6038890B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161518766P 2011-05-10 2011-05-10
US61/518,766 2011-05-10
US13/373,529 2011-11-17
US13/373,529 US9354122B2 (en) 2011-05-10 2011-11-17 Zero-heat-flux, deep tissue temperature measurement system
PCT/US2012/000112 WO2012154212A2 (en) 2011-05-10 2012-03-01 A zero-heat-flux, deep tissue temperature measurement system

Publications (3)

Publication Number Publication Date
JP2014513310A JP2014513310A (ja) 2014-05-29
JP2014513310A5 true JP2014513310A5 (enExample) 2015-04-02
JP6038890B2 JP6038890B2 (ja) 2016-12-07

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JP2014510300A Active JP6038890B2 (ja) 2011-05-10 2012-03-01 ゼロ熱流束深部組織温度測定システム

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US (2) US9354122B2 (enExample)
EP (1) EP2707682B1 (enExample)
JP (1) JP6038890B2 (enExample)
CN (1) CN103582806A (enExample)
AU (2) AU2012254171A1 (enExample)
BR (1) BR112013028136A2 (enExample)
CA (1) CA2834717A1 (enExample)
MX (1) MX2013012705A (enExample)
WO (1) WO2012154212A2 (enExample)

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KR20230017981A (ko) 2021-07-29 2023-02-07 삼성전자주식회사 체온 추정 장치 및 방법
KR20230032212A (ko) 2021-08-30 2023-03-07 삼성전자주식회사 체온 추정 장치 및 방법
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CN114414099A (zh) * 2022-03-16 2022-04-29 广东恒翼能科技有限公司 一种针床设备温度探针校准、线序检测工装系统
KR20230150037A (ko) 2022-04-21 2023-10-30 삼성전자주식회사 전자 장치 및 그 전자 장치를 이용한 기온 측정 방법
CN119317391B (zh) 2022-05-27 2025-09-16 世美特株式会社 深部温度测量装置和深部温度测量方法
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