JP2014220492A5 - - Google Patents

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Publication number
JP2014220492A5
JP2014220492A5 JP2014079306A JP2014079306A JP2014220492A5 JP 2014220492 A5 JP2014220492 A5 JP 2014220492A5 JP 2014079306 A JP2014079306 A JP 2014079306A JP 2014079306 A JP2014079306 A JP 2014079306A JP 2014220492 A5 JP2014220492 A5 JP 2014220492A5
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JP
Japan
Prior art keywords
oxide semiconductor
semiconductor layer
electrode
gate
gate insulating
Prior art date
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Withdrawn
Application number
JP2014079306A
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English (en)
Japanese (ja)
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JP2014220492A (ja
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Publication date
Application filed filed Critical
Priority to JP2014079306A priority Critical patent/JP2014220492A/ja
Priority claimed from JP2014079306A external-priority patent/JP2014220492A/ja
Publication of JP2014220492A publication Critical patent/JP2014220492A/ja
Publication of JP2014220492A5 publication Critical patent/JP2014220492A5/ja
Withdrawn legal-status Critical Current

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JP2014079306A 2013-04-10 2014-04-08 半導体装置 Withdrawn JP2014220492A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014079306A JP2014220492A (ja) 2013-04-10 2014-04-08 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013081882 2013-04-10
JP2013081882 2013-04-10
JP2014079306A JP2014220492A (ja) 2013-04-10 2014-04-08 半導体装置

Publications (2)

Publication Number Publication Date
JP2014220492A JP2014220492A (ja) 2014-11-20
JP2014220492A5 true JP2014220492A5 (enExample) 2017-05-18

Family

ID=51686184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014079306A Withdrawn JP2014220492A (ja) 2013-04-10 2014-04-08 半導体装置

Country Status (2)

Country Link
US (1) US20140306219A1 (enExample)
JP (1) JP2014220492A (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9153650B2 (en) 2013-03-19 2015-10-06 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor
TWI652822B (zh) * 2013-06-19 2019-03-01 日商半導體能源研究所股份有限公司 氧化物半導體膜及其形成方法
JP6400961B2 (ja) 2013-07-12 2018-10-03 株式会社半導体エネルギー研究所 表示装置
TWI608523B (zh) 2013-07-19 2017-12-11 半導體能源研究所股份有限公司 Oxide semiconductor film, method of manufacturing oxide semiconductor film, and semiconductor device
KR102244553B1 (ko) 2013-08-23 2021-04-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 용량 소자 및 반도체 장치
JP2015179247A (ja) 2013-10-22 2015-10-08 株式会社半導体エネルギー研究所 表示装置
KR102317297B1 (ko) 2014-02-19 2021-10-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물, 반도체 장치, 모듈, 및 전자 장치
KR101562932B1 (ko) * 2014-11-28 2015-10-26 연세대학교 산학협력단 산화물 반도체 소자 및 이의 제조 방법
US10192957B2 (en) 2014-12-16 2019-01-29 Lg Display Co., Ltd. Thin-film transistor array substrate
KR102342694B1 (ko) * 2015-02-17 2021-12-23 삼성디스플레이 주식회사 액정 표시 장치
KR102334360B1 (ko) * 2015-04-09 2021-12-01 삼성디스플레이 주식회사 액정 표시 장치
KR102354972B1 (ko) * 2015-06-01 2022-01-25 삼성디스플레이 주식회사 액정 표시 장치
US9852926B2 (en) 2015-10-20 2017-12-26 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method for semiconductor device
US10333004B2 (en) 2016-03-18 2019-06-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, semiconductor wafer, module and electronic device
CN109661701A (zh) 2016-09-01 2019-04-19 夏普株式会社 有源矩阵基板和显示装置
CN110268529A (zh) 2017-02-16 2019-09-20 三菱电机株式会社 薄膜晶体管、薄膜晶体管基板、液晶显示装置以及薄膜晶体管基板的制造方法
KR102447148B1 (ko) 2017-03-13 2022-09-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
KR102315554B1 (ko) 2019-04-09 2021-10-21 한양대학교 산학협력단 수소 확산 방지막을 포함하는 표시 장치 및 그 제조 방법
GB2610886B (en) * 2019-08-21 2023-09-13 Pragmatic Printing Ltd Resistor geometry
GB2587793B (en) * 2019-08-21 2023-03-22 Pragmatic Printing Ltd Electronic circuit comprising transistor and resistor
EP4160697A4 (en) * 2020-12-01 2023-10-11 BOE Technology Group Co., Ltd. Oxide thin film transistor and preparation method therefor, and display device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8174053B2 (en) * 2006-09-08 2012-05-08 Sharp Kabushiki Kaisha Semiconductor device, production method thereof, and electronic device
US8106400B2 (en) * 2008-10-24 2012-01-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
EP2202802B1 (en) * 2008-12-24 2012-09-26 Semiconductor Energy Laboratory Co., Ltd. Driver circuit and semiconductor device
KR101082174B1 (ko) * 2009-11-27 2011-11-09 삼성모바일디스플레이주식회사 유기전계발광 표시 장치 및 그의 제조 방법
KR20190100462A (ko) * 2009-11-28 2019-08-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
TWI635613B (zh) * 2013-04-03 2018-09-11 半導體能源研究所股份有限公司 半導體裝置

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