JP2014169984A - 部品観察装置 - Google Patents
部品観察装置 Download PDFInfo
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- JP2014169984A JP2014169984A JP2013043390A JP2013043390A JP2014169984A JP 2014169984 A JP2014169984 A JP 2014169984A JP 2013043390 A JP2013043390 A JP 2013043390A JP 2013043390 A JP2013043390 A JP 2013043390A JP 2014169984 A JP2014169984 A JP 2014169984A
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- component
- light
- phosphor
- light source
- visible light
- Prior art date
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- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims abstract description 43
- 230000003287 optical effect Effects 0.000 claims abstract description 8
- 230000001681 protective effect Effects 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 4
- 239000012780 transparent material Substances 0.000 claims description 2
- 239000012466 permeate Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 238000005286 illumination Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 230000003373 anti-fouling effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
- G01N2201/0621—Supply
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Theoretical Computer Science (AREA)
- Accessories Of Cameras (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Blocking Light For Cameras (AREA)
- Stroboscope Apparatuses (AREA)
- Studio Devices (AREA)
Abstract
【解決手段】波長400nm以上の可視光を部品Pの正面側に向けて照射する第1の光源1と、波長400nm未満のUV光を部品Pの正面側に向けて照射する第2の光源2と、部品Pの背面側に配置され、前記UV光が入射したときは可視域の蛍光を放射し、前記可視光が入射したときは蛍光を放射することなく前記可視光を透過する蛍光体3と、蛍光体3が放射する蛍光及び部品Pで反射された前記可視光が入射するカメラ8と、カメラ8への入射光路の途中に配置され、前記可視光及び前記蛍光は透過するが前記UV光は透過しないフィルタ6と、蛍光体3の背面側に配置され、蛍光体3を透過した前記可視光を吸収する背面体5とを有する部品観察装置。
【選択図】図1
Description
2 第2の光源
3 蛍光体
3a 孔
4 保護膜
5 背面体
6 フィルタ
7 レンズ
8 カメラ
9 部品保持具
10 照明制御部
11 反射板
12 カメラ制御部
13 補助蛍光体
Claims (4)
- 部品保持具の先端に保持された部品を観察する部品観察装置であって、
波長400nm以上の可視光を前記部品の正面側に向けて照射する第1の光源と、
波長400nm未満のUV光を前記部品の正面側に向けて照射する第2の光源と、
前記部品の背面側に配置され、前記UV光が入射したときは可視域の蛍光を放射し、前記可視光が入射したときは蛍光を放射することなく前記可視光を透過する蛍光体と、
前記蛍光体が放射する蛍光及び前記部品で反射された前記可視光が入射するカメラと、
前記カメラへの入射光路の途中に配置され、前記可視光及び前記蛍光は透過するが前記UV光は透過しないフィルタと、
前記蛍光体の背面側に配置され、前記蛍光体を透過した前記可視光を吸収又は前記カメラへの入射光路外に反射する背面体とを有する部品観察装置。 - 前記第1の光源が、波長400nm以上の白色光を放射する白色LEDである請求項1に記載の部品観察装置。
- 前記部品保持具の先端部分は先細り状の形状を有し、前記蛍光体は、前記先細り状の先端部分より基端側において前記部品保持具の外周を取り囲むように配置され、前記先細り状の先端部分の外周面を覆うように、前記蛍光体と同じ特性を有する補助蛍光体が配置されている請求項1又は2に記載の部品観察装置。
- 前記蛍光体の正面が保護膜で覆われており、前記保護膜は、前記蛍光及び前記可視光を透過する透明材料からなる請求項1から請求項3のいずれかに記載の部品観察装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013043390A JP6159104B2 (ja) | 2013-03-05 | 2013-03-05 | 部品観察装置 |
KR1020130040549A KR101828537B1 (ko) | 2013-03-05 | 2013-04-12 | 부품 촬영 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013043390A JP6159104B2 (ja) | 2013-03-05 | 2013-03-05 | 部品観察装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2014169984A true JP2014169984A (ja) | 2014-09-18 |
JP6159104B2 JP6159104B2 (ja) | 2017-07-05 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013043390A Active JP6159104B2 (ja) | 2013-03-05 | 2013-03-05 | 部品観察装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP6159104B2 (ja) |
KR (1) | KR101828537B1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108563084A (zh) * | 2018-05-25 | 2018-09-21 | 深圳新亮智能技术有限公司 | 多结构光图案三维传感系统 |
JP2021021592A (ja) * | 2019-07-25 | 2021-02-18 | Towa株式会社 | 検査システム、検査方法、切断装置、及び樹脂成形装置 |
WO2023176463A1 (ja) * | 2022-03-17 | 2023-09-21 | パナソニックIpマネジメント株式会社 | 部品位置検出装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02224951A (ja) * | 1989-02-27 | 1990-09-06 | Fuji Mach Mfg Co Ltd | 電子部品の保持位置検出装置 |
US5214841A (en) * | 1992-09-23 | 1993-06-01 | Emhart Inc. | Machine for placing surface mount components |
JPH1197900A (ja) * | 1997-09-25 | 1999-04-09 | Matsushita Electric Ind Co Ltd | 電子部品実装装置および電子部品実装方法 |
JP2001015993A (ja) * | 1999-06-28 | 2001-01-19 | Yamaha Motor Co Ltd | 表面実装部品装着機およびその方法 |
JP2003124700A (ja) * | 2001-10-15 | 2003-04-25 | Nidec Copal Corp | 撮像装置 |
JP2003168897A (ja) * | 2001-11-30 | 2003-06-13 | Matsushita Electric Ind Co Ltd | 電子部品姿勢認識装置 |
-
2013
- 2013-03-05 JP JP2013043390A patent/JP6159104B2/ja active Active
- 2013-04-12 KR KR1020130040549A patent/KR101828537B1/ko active IP Right Grant
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02224951A (ja) * | 1989-02-27 | 1990-09-06 | Fuji Mach Mfg Co Ltd | 電子部品の保持位置検出装置 |
US5214841A (en) * | 1992-09-23 | 1993-06-01 | Emhart Inc. | Machine for placing surface mount components |
JPH1197900A (ja) * | 1997-09-25 | 1999-04-09 | Matsushita Electric Ind Co Ltd | 電子部品実装装置および電子部品実装方法 |
JP2001015993A (ja) * | 1999-06-28 | 2001-01-19 | Yamaha Motor Co Ltd | 表面実装部品装着機およびその方法 |
JP2003124700A (ja) * | 2001-10-15 | 2003-04-25 | Nidec Copal Corp | 撮像装置 |
JP2003168897A (ja) * | 2001-11-30 | 2003-06-13 | Matsushita Electric Ind Co Ltd | 電子部品姿勢認識装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108563084A (zh) * | 2018-05-25 | 2018-09-21 | 深圳新亮智能技术有限公司 | 多结构光图案三维传感系统 |
CN108563084B (zh) * | 2018-05-25 | 2020-10-23 | 深圳新亮智能技术有限公司 | 多结构光图案三维传感系统 |
JP2021021592A (ja) * | 2019-07-25 | 2021-02-18 | Towa株式会社 | 検査システム、検査方法、切断装置、及び樹脂成形装置 |
WO2023176463A1 (ja) * | 2022-03-17 | 2023-09-21 | パナソニックIpマネジメント株式会社 | 部品位置検出装置 |
Also Published As
Publication number | Publication date |
---|---|
JP6159104B2 (ja) | 2017-07-05 |
KR101828537B1 (ko) | 2018-02-12 |
KR20140109207A (ko) | 2014-09-15 |
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