JP2014150264A5 - - Google Patents
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- JP2014150264A5 JP2014150264A5 JP2014045897A JP2014045897A JP2014150264A5 JP 2014150264 A5 JP2014150264 A5 JP 2014150264A5 JP 2014045897 A JP2014045897 A JP 2014045897A JP 2014045897 A JP2014045897 A JP 2014045897A JP 2014150264 A5 JP2014150264 A5 JP 2014150264A5
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- 238000000034 method Methods 0.000 claims 35
- 238000005259 measurement Methods 0.000 claims 21
- 230000003287 optical effect Effects 0.000 claims 10
- 238000001514 detection method Methods 0.000 claims 8
- 238000005286 illumination Methods 0.000 claims 6
- 238000005192 partition Methods 0.000 claims 6
- 238000004519 manufacturing process Methods 0.000 claims 4
- 230000001133 acceleration Effects 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 2
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US23670109P | 2009-08-25 | 2009-08-25 | |
| US61/236,701 | 2009-08-25 | ||
| US12/859,983 US8493547B2 (en) | 2009-08-25 | 2010-08-20 | Exposure apparatus, exposure method, and device manufacturing method |
| US12/859,983 | 2010-08-20 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010187025A Division JP5637495B2 (ja) | 2009-08-25 | 2010-08-24 | 露光装置及び露光方法、並びにデバイス製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015002607A Division JP6035691B2 (ja) | 2009-08-25 | 2015-01-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014150264A JP2014150264A (ja) | 2014-08-21 |
| JP2014150264A5 true JP2014150264A5 (enExample) | 2015-02-26 |
| JP6035686B2 JP6035686B2 (ja) | 2016-11-30 |
Family
ID=43625431
Family Applications (9)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010187025A Active JP5637495B2 (ja) | 2009-08-25 | 2010-08-24 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2014045897A Active JP6035686B2 (ja) | 2009-08-25 | 2014-03-10 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2015002607A Active JP6035691B2 (ja) | 2009-08-25 | 2015-01-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2015121609A Active JP6035694B2 (ja) | 2009-08-25 | 2015-06-17 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016004156A Active JP6107980B2 (ja) | 2009-08-25 | 2016-01-13 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016218369A Active JP6292547B2 (ja) | 2009-08-25 | 2016-11-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2018016060A Active JP6566389B2 (ja) | 2009-08-25 | 2018-02-01 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2019138896A Active JP6788812B2 (ja) | 2009-08-25 | 2019-07-29 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2020171916A Active JP6948581B2 (ja) | 2009-08-25 | 2020-10-12 | 露光装置及び露光方法、並びにデバイス製造方法 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010187025A Active JP5637495B2 (ja) | 2009-08-25 | 2010-08-24 | 露光装置及び露光方法、並びにデバイス製造方法 |
Family Applications After (7)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015002607A Active JP6035691B2 (ja) | 2009-08-25 | 2015-01-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2015121609A Active JP6035694B2 (ja) | 2009-08-25 | 2015-06-17 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016004156A Active JP6107980B2 (ja) | 2009-08-25 | 2016-01-13 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016218369A Active JP6292547B2 (ja) | 2009-08-25 | 2016-11-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2018016060A Active JP6566389B2 (ja) | 2009-08-25 | 2018-02-01 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2019138896A Active JP6788812B2 (ja) | 2009-08-25 | 2019-07-29 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2020171916A Active JP6948581B2 (ja) | 2009-08-25 | 2020-10-12 | 露光装置及び露光方法、並びにデバイス製造方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (11) | US8493547B2 (enExample) |
| EP (5) | EP2470962B1 (enExample) |
| JP (9) | JP5637495B2 (enExample) |
| KR (8) | KR101977007B1 (enExample) |
| CN (4) | CN102549501B (enExample) |
| HK (2) | HK1250795A1 (enExample) |
| TW (7) | TWI599857B (enExample) |
| WO (1) | WO2011024985A1 (enExample) |
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| US8493547B2 (en) | 2009-08-25 | 2013-07-23 | Nikon Corporation | Exposure apparatus, exposure method, and device manufacturing method |
| NL2006699A (en) * | 2010-06-03 | 2011-12-06 | Asml Netherlands Bv | Stage apparatus and lithographic apparatus comprising such stage apparatus. |
| JP5756267B2 (ja) * | 2010-09-03 | 2015-07-29 | オリンパス株式会社 | エンコーダ用信号処理回路 |
| NL2007818A (en) | 2010-12-20 | 2012-06-21 | Asml Netherlands Bv | Method of updating calibration data and a device manufacturing method. |
| US9778579B2 (en) | 2011-11-10 | 2017-10-03 | Nikon Corporation | System and method for controlling a temperature of a reaction assembly |
| US9207549B2 (en) | 2011-12-29 | 2015-12-08 | Nikon Corporation | Exposure apparatus and exposure method, and device manufacturing method with encoder of higher reliability for position measurement |
| CN103246172B (zh) * | 2012-02-10 | 2016-12-28 | 约翰内斯﹒海德汉博士有限公司 | 具有位置测量装置的多个扫描单元的装置 |
| DE102012210309A1 (de) * | 2012-06-19 | 2013-12-19 | Dr. Johannes Heidenhain Gmbh | Positionsmesseinrichtung |
| JP6075657B2 (ja) | 2012-10-02 | 2017-02-08 | 株式会社ニコン | 露光装置及び露光方法、並びにデバイス製造方法 |
| EP3611572B1 (en) | 2013-06-28 | 2023-04-05 | Nikon Corporation | Mobile body apparatus, exposure apparatus, and device manufacturing method |
| JP6223091B2 (ja) * | 2013-09-25 | 2017-11-01 | 株式会社Ｓｃｒｅｅｎホールディングス | 位置計測装置、アライメント装置、パターン描画装置および位置計測方法 |
| CN104865798B (zh) * | 2014-02-21 | 2017-07-11 | 无锡华润上华科技有限公司 | 光刻工艺中的曝光场的尺寸选择方法 |
| JP6488073B2 (ja) * | 2014-02-28 | 2019-03-20 | 株式会社日立ハイテクノロジーズ | ステージ装置およびそれを用いた荷電粒子線装置 |
| JP6400827B2 (ja) * | 2014-07-16 | 2018-10-03 | エーエスエムエル ネザーランズ ビー．ブイ． | リソグラフィ装置およびデバイス製造方法 |
| KR102022785B1 (ko) | 2014-12-24 | 2019-09-18 | 가부시키가이샤 니콘 | 계측 장치 및 계측 방법, 노광 장치 및 노광 방법, 그리고 디바이스 제조 방법 |
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| CN111176084B (zh) | 2015-02-23 | 2023-07-28 | 株式会社尼康 | 测量装置、曝光装置、光刻系统、测量方法及曝光方法 |
| WO2016199738A1 (ja) | 2015-06-08 | 2016-12-15 | 株式会社ニコン | 荷電粒子ビーム露光装置及びデバイス製造方法 |
| CN108139685B (zh) * | 2015-09-30 | 2020-12-04 | 株式会社尼康 | 曝光装置、平面显示器的制造方法、组件制造方法、及曝光方法 |
| WO2017057560A1 (ja) * | 2015-09-30 | 2017-04-06 | 株式会社ニコン | 露光装置及び露光方法、並びにフラットパネルディスプレイ製造方法 |
| CN108139689B (zh) * | 2015-09-30 | 2021-06-15 | 株式会社尼康 | 曝光装置及曝光方法、以及平面显示器制造方法 |
| KR20180058734A (ko) | 2015-09-30 | 2018-06-01 | 가부시키가이샤 니콘 | 노광 장치, 플랫 패널 디스플레이의 제조 방법, 디바이스 제조 방법, 및 노광 방법 |
| WO2017057539A1 (ja) * | 2015-09-30 | 2017-04-06 | 株式会社ニコン | 露光装置及び露光方法、並びにフラットパネルディスプレイ製造方法 |
| JP6925783B2 (ja) * | 2016-05-26 | 2021-08-25 | 株式会社アドテックエンジニアリング | パターン描画装置及びパターン描画方法 |
| KR102840662B1 (ko) | 2016-08-24 | 2025-07-30 | 가부시키가이샤 니콘 | 계측 시스템 및 기판 처리 시스템, 그리고 디바이스 제조 방법 |
| JP6787404B2 (ja) * | 2016-09-30 | 2020-11-18 | 株式会社ニコン | 移動体装置、移動方法、露光装置、露光方法、フラットパネルディスプレイの製造方法、並びにデバイス製造方法 |
| KR102307527B1 (ko) * | 2016-09-30 | 2021-10-01 | 가부시키가이샤 니콘 | 이동체 장치, 이동 방법, 노광 장치, 노광 방법, 플랫 패널 디스플레이의 제조 방법, 그리고 디바이스 제조 방법 |
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| CN111989761B (zh) | 2018-04-20 | 2024-10-15 | Asml荷兰有限公司 | 用于大型活动区域的高速检测器的像素形状和分区形状选择 |
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