JP2014147427A5 - - Google Patents

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Publication number
JP2014147427A5
JP2014147427A5 JP2013016315A JP2013016315A JP2014147427A5 JP 2014147427 A5 JP2014147427 A5 JP 2014147427A5 JP 2013016315 A JP2013016315 A JP 2013016315A JP 2013016315 A JP2013016315 A JP 2013016315A JP 2014147427 A5 JP2014147427 A5 JP 2014147427A5
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JP
Japan
Prior art keywords
measurement mode
eye
mode
measurement
visual
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Application number
JP2013016315A
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English (en)
Japanese (ja)
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JP6471403B2 (ja
JP2014147427A (ja
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Priority to JP2013016315A priority Critical patent/JP6471403B2/ja
Priority claimed from JP2013016315A external-priority patent/JP6471403B2/ja
Priority to KR1020140009732A priority patent/KR102245596B1/ko
Priority to US14/170,013 priority patent/US9462940B2/en
Publication of JP2014147427A publication Critical patent/JP2014147427A/ja
Publication of JP2014147427A5 publication Critical patent/JP2014147427A5/ja
Application granted granted Critical
Publication of JP6471403B2 publication Critical patent/JP6471403B2/ja
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JP2013016315A 2013-01-31 2013-01-31 検眼装置 Active JP6471403B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2013016315A JP6471403B2 (ja) 2013-01-31 2013-01-31 検眼装置
KR1020140009732A KR102245596B1 (ko) 2013-01-31 2014-01-27 검안 장치
US14/170,013 US9462940B2 (en) 2013-01-31 2014-01-31 Optometric apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013016315A JP6471403B2 (ja) 2013-01-31 2013-01-31 検眼装置

Publications (3)

Publication Number Publication Date
JP2014147427A JP2014147427A (ja) 2014-08-21
JP2014147427A5 true JP2014147427A5 (enExample) 2016-03-17
JP6471403B2 JP6471403B2 (ja) 2019-02-20

Family

ID=51222576

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013016315A Active JP6471403B2 (ja) 2013-01-31 2013-01-31 検眼装置

Country Status (3)

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US (1) US9462940B2 (enExample)
JP (1) JP6471403B2 (enExample)
KR (1) KR102245596B1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6391979B2 (ja) * 2014-05-01 2018-09-19 株式会社トプコン 視機能検査装置
JP6466112B2 (ja) * 2014-09-10 2019-02-06 国立大学法人千葉大学 眼中散乱光分布測定方法及び眼中散乱光分布測定装置
EP3313263B1 (en) * 2015-06-23 2021-12-01 Essilor International Optometry measuring scale
US10016128B2 (en) * 2016-09-27 2018-07-10 David Evans Method and apparatus for vision acuity testing
JP6798287B2 (ja) * 2016-12-01 2020-12-09 株式会社ニデック 自覚式検眼装置
WO2019089600A1 (en) * 2017-10-31 2019-05-09 Welch Allyn, Inc. Visual acuity examination
CN110338748B (zh) * 2019-06-13 2022-03-08 宁波明星科技发展有限公司 快速定位视力值的方法、存储介质、终端及视力检测仪
WO2023042869A1 (ja) * 2021-09-14 2023-03-23 株式会社ナックイメージテクノロジー コントラスト感度検査装置、光学素子評価装置、コントラスト感度検査方法、光学素子評価方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4155632A (en) * 1976-02-26 1979-05-22 Acadia Associates Method and apparatus for testing vision
JP2612263B2 (ja) * 1986-12-25 1997-05-21 株式会社トプコン 検眼装置
JP3308373B2 (ja) * 1994-01-11 2002-07-29 株式会社トーメー 視力計
JP3547217B2 (ja) * 1995-05-31 2004-07-28 株式会社ニデック 検眼装置
US5844661A (en) * 1997-08-15 1998-12-01 Kabushiki Kaisha, Topcon Ophthalmic apparatus
US5844660A (en) * 1997-08-15 1998-12-01 Kabushiki Kaisha, Topcon Objectives refraction measuring apparatus
JP3580996B2 (ja) * 1997-10-31 2004-10-27 株式会社ニデック 検眼装置
JP3679258B2 (ja) * 1999-01-12 2005-08-03 株式会社ニデック 動体視力検査装置
JP2000350698A (ja) * 1999-06-10 2000-12-19 Kowa Co 視力計
JP3655129B2 (ja) * 1999-07-09 2005-06-02 株式会社ニデック 視力検査装置
JP3850254B2 (ja) * 2000-10-20 2006-11-29 株式会社ニデック 省スペース型視機能検査装置
JP3842975B2 (ja) * 2001-01-09 2006-11-08 株式会社ニデック 検眼装置
JP4406258B2 (ja) * 2002-10-30 2010-01-27 株式会社ニデック 視力検査装置
JP4494075B2 (ja) 2004-04-16 2010-06-30 株式会社トプコン 検眼装置
JP2010259492A (ja) * 2009-04-30 2010-11-18 Topcon Corp 眼底観察装置
JP5643078B2 (ja) * 2010-12-27 2014-12-17 株式会社ニデック 眼屈折力測定装置
JP5766961B2 (ja) * 2011-01-24 2015-08-19 株式会社ニデック 自動視力計

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