JP2014132717A5 - - Google Patents
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- Publication number
- JP2014132717A5 JP2014132717A5 JP2013000359A JP2013000359A JP2014132717A5 JP 2014132717 A5 JP2014132717 A5 JP 2014132717A5 JP 2013000359 A JP2013000359 A JP 2013000359A JP 2013000359 A JP2013000359 A JP 2013000359A JP 2014132717 A5 JP2014132717 A5 JP 2014132717A5
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply line
- electrostatic discharge
- protection circuit
- discharge protection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003990 capacitor Substances 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013000359A JP2014132717A (ja) | 2013-01-07 | 2013-01-07 | 静電気放電保護回路及び半導体回路装置 |
| US14/134,239 US9124088B2 (en) | 2013-01-07 | 2013-12-19 | Electrostatic discharge protection circuit and semiconductor circuit device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013000359A JP2014132717A (ja) | 2013-01-07 | 2013-01-07 | 静電気放電保護回路及び半導体回路装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2014132717A JP2014132717A (ja) | 2014-07-17 |
| JP2014132717A5 true JP2014132717A5 (enExample) | 2016-01-21 |
Family
ID=51060770
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013000359A Pending JP2014132717A (ja) | 2013-01-07 | 2013-01-07 | 静電気放電保護回路及び半導体回路装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9124088B2 (enExample) |
| JP (1) | JP2014132717A (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9269705B2 (en) * | 2012-05-04 | 2016-02-23 | Polar Semiconductor, Llc | Anti-snapback circuitry for metal oxide semiconductor (MOS) transistor |
| JP6237183B2 (ja) | 2013-12-09 | 2017-11-29 | セイコーエプソン株式会社 | 静電気保護回路及び半導体集積回路装置 |
| JP6375618B2 (ja) | 2013-12-09 | 2018-08-22 | セイコーエプソン株式会社 | 静電気保護回路及び半導体集積回路装置 |
| JP2015204126A (ja) | 2014-04-16 | 2015-11-16 | 株式会社東芝 | 半導体記憶装置 |
| JP6398649B2 (ja) | 2014-11-25 | 2018-10-03 | セイコーエプソン株式会社 | 静電気保護回路及び半導体集積回路装置 |
| FR3038131B1 (fr) * | 2015-06-26 | 2018-03-23 | Stmicroelectronics Sa | Dispositif de protection ameliore contre les decharges electrostatiques. |
| JP6627333B2 (ja) | 2015-09-01 | 2020-01-08 | セイコーエプソン株式会社 | 静電気保護回路、半導体集積回路装置、及び、電子機器 |
| JP2017112478A (ja) | 2015-12-16 | 2017-06-22 | セイコーエプソン株式会社 | 静電気保護回路、半導体集積回路装置、及び、電子機器 |
| JP6714824B2 (ja) | 2016-02-23 | 2020-07-01 | セイコーエプソン株式会社 | 静電気保護回路、半導体集積回路装置、及び、電子機器 |
| JP6714825B2 (ja) | 2016-02-23 | 2020-07-01 | セイコーエプソン株式会社 | 静電気保護回路、半導体集積回路装置、及び、電子機器 |
| CN107465180B (zh) * | 2017-09-21 | 2019-03-26 | 珠海亿智电子科技有限公司 | 一种具有交流检测和直流检测的钳位电路 |
| US11095286B2 (en) * | 2019-06-12 | 2021-08-17 | Skyworks Solutions, Inc. | Electrostatic discharge clamp topology |
| CN113394762A (zh) * | 2020-03-12 | 2021-09-14 | 长鑫存储技术有限公司 | 静电保护电路、集成电路及静电泄放方法 |
| CN114172137B (zh) * | 2020-11-03 | 2024-06-28 | 台湾积体电路制造股份有限公司 | 用于静电放电保护的电路和方法 |
| US12132308B2 (en) * | 2022-04-11 | 2024-10-29 | Changxin Memory Technologies, Inc. | Electrostatic protection circuit |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5781388A (en) | 1996-09-03 | 1998-07-14 | Motorola, Inc. | Non-breakdown triggered electrostatic discharge protection circuit for an integrated circuit and method therefor |
| US7209332B2 (en) * | 2002-12-10 | 2007-04-24 | Freescale Semiconductor, Inc. | Transient detection circuit |
| JP2005116695A (ja) * | 2003-10-06 | 2005-04-28 | Toshiba Corp | 半導体装置 |
| JP4450631B2 (ja) | 2004-01-06 | 2010-04-14 | 旭化成エレクトロニクス株式会社 | Esd保護機能付き信号出力回路 |
| US7085113B2 (en) | 2004-08-20 | 2006-08-01 | International Business Machines Corporation | ESD protection power clamp for suppressing ESD events occurring on power supply terminals |
| JP4504850B2 (ja) | 2005-03-17 | 2010-07-14 | パナソニック株式会社 | 半導体集積回路装置 |
| JP2009021332A (ja) | 2007-07-11 | 2009-01-29 | Kawasaki Microelectronics Kk | 静電気放電保護回路 |
| JP5165356B2 (ja) | 2007-12-13 | 2013-03-21 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
| JP5214263B2 (ja) | 2008-01-30 | 2013-06-19 | 川崎マイクロエレクトロニクス株式会社 | 静電気放電保護回路 |
| TWI379398B (en) * | 2009-05-20 | 2012-12-11 | Ind Tech Res Inst | Electrostatic discharge clamp circuit |
-
2013
- 2013-01-07 JP JP2013000359A patent/JP2014132717A/ja active Pending
- 2013-12-19 US US14/134,239 patent/US9124088B2/en active Active
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