JP2014132717A - 静電気放電保護回路及び半導体回路装置 - Google Patents

静電気放電保護回路及び半導体回路装置 Download PDF

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Publication number
JP2014132717A
JP2014132717A JP2013000359A JP2013000359A JP2014132717A JP 2014132717 A JP2014132717 A JP 2014132717A JP 2013000359 A JP2013000359 A JP 2013000359A JP 2013000359 A JP2013000359 A JP 2013000359A JP 2014132717 A JP2014132717 A JP 2014132717A
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JP
Japan
Prior art keywords
electrostatic discharge
circuit
line
transistor
protection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013000359A
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English (en)
Japanese (ja)
Other versions
JP2014132717A5 (enExample
Inventor
Masuhide Ikeda
益英 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2013000359A priority Critical patent/JP2014132717A/ja
Priority to US14/134,239 priority patent/US9124088B2/en
Publication of JP2014132717A publication Critical patent/JP2014132717A/ja
Publication of JP2014132717A5 publication Critical patent/JP2014132717A5/ja
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H9/00—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection
    • H02H9/04—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage
    • H02H9/045—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere
    • H02H9/046—Emergency protective circuit arrangements for limiting excess current or voltage without disconnection responsive to excess voltage adapted to a particular application and not provided for elsewhere responsive to excess voltage appearing at terminals of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Electronic Switches (AREA)
JP2013000359A 2013-01-07 2013-01-07 静電気放電保護回路及び半導体回路装置 Pending JP2014132717A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013000359A JP2014132717A (ja) 2013-01-07 2013-01-07 静電気放電保護回路及び半導体回路装置
US14/134,239 US9124088B2 (en) 2013-01-07 2013-12-19 Electrostatic discharge protection circuit and semiconductor circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013000359A JP2014132717A (ja) 2013-01-07 2013-01-07 静電気放電保護回路及び半導体回路装置

Publications (2)

Publication Number Publication Date
JP2014132717A true JP2014132717A (ja) 2014-07-17
JP2014132717A5 JP2014132717A5 (enExample) 2016-01-21

Family

ID=51060770

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013000359A Pending JP2014132717A (ja) 2013-01-07 2013-01-07 静電気放電保護回路及び半導体回路装置

Country Status (2)

Country Link
US (1) US9124088B2 (enExample)
JP (1) JP2014132717A (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9520716B2 (en) 2013-12-09 2016-12-13 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US9716382B2 (en) 2013-12-09 2017-07-25 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US9935096B2 (en) 2015-12-16 2018-04-03 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device
US9991698B2 (en) 2014-11-25 2018-06-05 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US10348085B2 (en) 2015-09-01 2019-07-09 Seiko Epson Corporation Static electricity protection circuit, semiconductor integrated circuit device, and electronic apparatus
US10389111B2 (en) 2016-02-23 2019-08-20 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device
US10396551B2 (en) 2016-02-23 2019-08-27 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9269705B2 (en) * 2012-05-04 2016-02-23 Polar Semiconductor, Llc Anti-snapback circuitry for metal oxide semiconductor (MOS) transistor
JP2015204126A (ja) 2014-04-16 2015-11-16 株式会社東芝 半導体記憶装置
FR3038131B1 (fr) * 2015-06-26 2018-03-23 Stmicroelectronics Sa Dispositif de protection ameliore contre les decharges electrostatiques.
CN107465180B (zh) * 2017-09-21 2019-03-26 珠海亿智电子科技有限公司 一种具有交流检测和直流检测的钳位电路
US11095286B2 (en) * 2019-06-12 2021-08-17 Skyworks Solutions, Inc. Electrostatic discharge clamp topology
CN113394762A (zh) * 2020-03-12 2021-09-14 长鑫存储技术有限公司 静电保护电路、集成电路及静电泄放方法
CN114172137B (zh) * 2020-11-03 2024-06-28 台湾积体电路制造股份有限公司 用于静电放电保护的电路和方法
US12132308B2 (en) * 2022-04-11 2024-10-29 Changxin Memory Technologies, Inc. Electrostatic protection circuit

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040109270A1 (en) * 2002-12-10 2004-06-10 Michael Stockinger Transient detection circuit
US20050073009A1 (en) * 2003-10-06 2005-04-07 Kenji Kojima Semiconductor device
US20060209478A1 (en) * 2005-03-17 2006-09-21 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit device
US20100296212A1 (en) * 2009-05-20 2010-11-25 Industrial Technology Research Institute Electrostatic discharge clamp circuit

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5781388A (en) 1996-09-03 1998-07-14 Motorola, Inc. Non-breakdown triggered electrostatic discharge protection circuit for an integrated circuit and method therefor
JP4450631B2 (ja) 2004-01-06 2010-04-14 旭化成エレクトロニクス株式会社 Ｅｓｄ保護機能付き信号出力回路
US7085113B2 (en) 2004-08-20 2006-08-01 International Business Machines Corporation ESD protection power clamp for suppressing ESD events occurring on power supply terminals
JP2009021332A (ja) 2007-07-11 2009-01-29 Kawasaki Microelectronics Kk 静電気放電保護回路
JP5165356B2 (ja) 2007-12-13 2013-03-21 ルネサスエレクトロニクス株式会社 半導体集積回路装置
JP5214263B2 (ja) 2008-01-30 2013-06-19 川崎マイクロエレクトロニクス株式会社 静電気放電保護回路

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040109270A1 (en) * 2002-12-10 2004-06-10 Michael Stockinger Transient detection circuit
US20050073009A1 (en) * 2003-10-06 2005-04-07 Kenji Kojima Semiconductor device
JP2005116695A (ja) * 2003-10-06 2005-04-28 Toshiba Corp 半導体装置
US20060209478A1 (en) * 2005-03-17 2006-09-21 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit device
US20100296212A1 (en) * 2009-05-20 2010-11-25 Industrial Technology Research Institute Electrostatic discharge clamp circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9520716B2 (en) 2013-12-09 2016-12-13 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US9716382B2 (en) 2013-12-09 2017-07-25 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US9991698B2 (en) 2014-11-25 2018-06-05 Seiko Epson Corporation Electrostatic protection circuit and semiconductor integrated circuit apparatus
US10348085B2 (en) 2015-09-01 2019-07-09 Seiko Epson Corporation Static electricity protection circuit, semiconductor integrated circuit device, and electronic apparatus
US9935096B2 (en) 2015-12-16 2018-04-03 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device
US10389111B2 (en) 2016-02-23 2019-08-20 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device
US10396551B2 (en) 2016-02-23 2019-08-27 Seiko Epson Corporation Electrostatic protection circuit, semiconductor integrated circuit device, and electronic device

Also Published As

Publication number Publication date
US20140192445A1 (en) 2014-07-10
US9124088B2 (en) 2015-09-01

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