JP2014130058A - Ｘ線検査装置及び品質判定方法 - Google Patents

Ｘ線検査装置及び品質判定方法 Download PDF

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Publication number
JP2014130058A
JP2014130058A JP2012287552A JP2012287552A JP2014130058A JP 2014130058 A JP2014130058 A JP 2014130058A JP 2012287552 A JP2012287552 A JP 2012287552A JP 2012287552 A JP2012287552 A JP 2012287552A JP 2014130058 A JP2014130058 A JP 2014130058A
Authority
JP
Japan
Prior art keywords
ray
quality
inspection apparatus
quality determination
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012287552A
Other languages
English (en)
Japanese (ja)
Inventor
Masami Yamamoto
正美 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Advance Technology Corp
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Priority to JP2012287552A priority Critical patent/JP2014130058A/ja
Priority to KR1020130157815A priority patent/KR20140086841A/ko
Priority to TW102146839A priority patent/TWI476401B/zh
Publication of JP2014130058A publication Critical patent/JP2014130058A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/08—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measuring Leads Or Probes (AREA)
JP2012287552A 2012-12-28 2012-12-28 Ｘ線検査装置及び品質判定方法 Pending JP2014130058A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012287552A JP2014130058A (ja) 2012-12-28 2012-12-28 Ｘ線検査装置及び品質判定方法
KR1020130157815A KR20140086841A (ko) 2012-12-28 2013-12-18 X선 검사 장치 및 품질 판정 방법
TW102146839A TWI476401B (zh) 2012-12-28 2013-12-18 X射線檢查裝置及品質判斷方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012287552A JP2014130058A (ja) 2012-12-28 2012-12-28 Ｘ線検査装置及び品質判定方法

Publications (1)

Publication Number Publication Date
JP2014130058A true JP2014130058A (ja) 2014-07-10

Family

ID=51408565

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012287552A Pending JP2014130058A (ja) 2012-12-28 2012-12-28 Ｘ線検査装置及び品質判定方法

Country Status (3)

Country Link
JP (1) JP2014130058A (ko)
KR (1) KR20140086841A (ko)
TW (1) TWI476401B (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016166783A (ja) * 2015-03-09 2016-09-15 日本電子材料株式会社 プローブ及びその製造方法
JP2021025901A (ja) * 2019-08-06 2021-02-22 日本製鉄株式会社 周溶接部の検査方法及び検査装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11271242A (ja) * 1998-03-19 1999-10-05 Tokai Rubber Ind Ltd 中空弾性体の内部形状観察方法および変形試験方法
JP2000180678A (ja) * 1998-12-11 2000-06-30 Sumitomo Electric Ind Ltd 光ケーブル用溝付スペーサの溝形態異常検出方法および検出装置
CN2692665Y (zh) * 2003-05-21 2005-04-13 中国科学院上海硅酸盐研究所 一种用于检测细长型棒材内部缺陷的无损检测的机械装置
CN1906480B (zh) * 2004-06-24 2012-08-08 株式会社石田 X射线检查装置和x射线检查装置的图像处理顺序的生成方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016166783A (ja) * 2015-03-09 2016-09-15 日本電子材料株式会社 プローブ及びその製造方法
JP2021025901A (ja) * 2019-08-06 2021-02-22 日本製鉄株式会社 周溶接部の検査方法及び検査装置
JP7226179B2 (ja) 2019-08-06 2023-02-21 日本製鉄株式会社 周溶接部の検査方法及び検査装置

Also Published As

Publication number Publication date
TWI476401B (zh) 2015-03-11
KR20140086841A (ko) 2014-07-08
TW201425920A (zh) 2014-07-01

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