JP2014007377A - シリコンウェハ剥離方法、およびシリコンウェハ剥離装置 - Google Patents
シリコンウェハ剥離方法、およびシリコンウェハ剥離装置 Download PDFInfo
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- JP2014007377A JP2014007377A JP2013024209A JP2013024209A JP2014007377A JP 2014007377 A JP2014007377 A JP 2014007377A JP 2013024209 A JP2013024209 A JP 2013024209A JP 2013024209 A JP2013024209 A JP 2013024209A JP 2014007377 A JP2014007377 A JP 2014007377A
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 182
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 182
- 239000010703 silicon Substances 0.000 title claims abstract description 182
- 238000000034 method Methods 0.000 title claims abstract description 37
- 235000012431 wafers Nutrition 0.000 claims abstract description 155
- 238000010438 heat treatment Methods 0.000 claims abstract description 60
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 43
- 230000006698 induction Effects 0.000 claims abstract description 36
- 239000000853 adhesive Substances 0.000 claims abstract description 35
- 230000001070 adhesive effect Effects 0.000 claims abstract description 34
- 239000007788 liquid Substances 0.000 claims abstract description 11
- 230000002093 peripheral effect Effects 0.000 claims description 6
- 239000011810 insulating material Substances 0.000 abstract description 20
- 238000007664 blowing Methods 0.000 abstract 1
- 238000002791 soaking Methods 0.000 abstract 1
- 238000005406 washing Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 description 65
- 239000003822 epoxy resin Substances 0.000 description 10
- 229920000647 polyepoxide Polymers 0.000 description 10
- 239000010802 sludge Substances 0.000 description 8
- 238000004140 cleaning Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 229920001187 thermosetting polymer Polymers 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000012459 cleaning agent Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 235000014655 lactic acid Nutrition 0.000 description 2
- 239000004310 lactic acid Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 229920001342 Bakelite® Polymers 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000004637 bakelite Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000004093 laser heating Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000006247 magnetic powder Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000003094 microcapsule Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B38/00—Ancillary operations in connection with laminating processes
- B32B38/10—Removing layers, or parts of layers, mechanically or chemically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/918—Delaminating processes adapted for specified product, e.g. delaminating medical specimen slide
- Y10S156/93—Semiconductive product delaminating, e.g. delaminating emiconductive wafer from underlayer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10S156/934—Apparatus having delaminating means adapted for delaminating a specified article
- Y10S156/941—Means for delaminating semiconductive product
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1111—Using solvent during delaminating [e.g., water dissolving adhesive at bonding face during delamination, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1153—Temperature change for delamination [e.g., heating during delaminating, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/11—Methods of delaminating, per se; i.e., separating at bonding face
- Y10T156/1153—Temperature change for delamination [e.g., heating during delaminating, etc.]
- Y10T156/1158—Electromagnetic radiation applied to work for delamination [e.g., microwave, uv, ir, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1911—Heating or cooling delaminating means [e.g., melting means, freezing means, etc.]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1911—Heating or cooling delaminating means [e.g., melting means, freezing means, etc.]
- Y10T156/1917—Electromagnetic radiation delaminating means [e.g., microwave, uv, ir, etc.]
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
【解決手段】 複数のシリコンウェハが接着剤を介して接着されたビーム材2を支える断熱材3と、ビーム材2を加熱するための誘導加熱コイル5と、水平方向に、断熱材3を誘導加熱コイル5に対して相対的に送る送り機構4と、シリコンウェハを一枚ずつ剥離する吸着パッド6と、シリコンウェハ、ビーム材2および断熱材3を液体中に浸漬させるための水槽7と、を備えたことを特徴とする、シリコンウェハ剥離装置である。
【選択図】 図1
Description
前記シリコンウェハの外周部の一部の平面と、前記板状部材の表面と、が接着剤を介して接着されていることを特徴とする、第1の本発明のシリコンウェハ剥離方法である。
前記板状部材を加熱するための加熱手段と、
水平方向に、前記支持部材を前記加熱手段に対して相対的に送る送り機構と、
前記シリコンウェハを一枚ずつ剥離する剥離機構と、
前記シリコンウェハ、前記板状部材および前記支持部材を液体中に浸漬させるための水槽と、を備えたことを特徴とする、シリコンウェハ剥離装置である。
2 ビーム材
3 断熱材
4 送り機構
5 誘導加熱コイル
6 吸着パッド
7 水槽
Claims (8)
- 板状部材に接着剤を介して接着された複数のシリコンウェハを、液体中で前記板状部材の加熱により前記板状部材から剥離することを特徴とする、シリコンウェハ剥離方法。
- 前記シリコンウェハの外周部の一部が平面であり、
前記シリコンウェハの外周部の一部の平面と、前記板状部材の表面と、が接着剤を介して接着されていることを特徴とする、請求項1に記載のシリコンウェハ剥離方法。 - 前記板状部材の鉛直上側に前記シリコンウェハを配置した状態で、前記シリコンウェハの剥離を行うことを特徴とする、請求項2に記載のシリコンウェハ剥離方法。
- 前記板状部材を、前記加熱を行うための加熱手段に対して相対的に移動させながら、前記シリコンウェハの剥離を繰り返し行うことを特徴とする、請求項3に記載のシリコンウェハ剥離方法。
- 前記板状部材は導電性であり、前記液体中での前記板状部材の加熱は誘導加熱により行うことを特徴とする、請求項1から4の何れかに記載のシリコンウェハ剥離方法。
- 前記シリコンウェハの剥離を行う際、前記板状部材の外周部の温度が前記板状部材の中心部の温度よりも高いことを特徴とする、請求項5に記載のシリコンウェハ剥離方法。
- 複数のシリコンウェハが接着剤を介して接着された板状部材を支える支持部材と、
前記板状部材を加熱するための加熱手段と、
水平方向に、前記支持部材を前記加熱手段に対して相対的に送る送り機構と、
前記シリコンウェハを一枚ずつ剥離する剥離機構と、
前記シリコンウェハ、前記板状部材および前記支持部材を液体中に浸漬させるための水槽と、を備えたことを特徴とする、シリコンウェハ剥離装置。 - 前記板状部材は導電性であり、前記加熱手段は誘導加熱コイルであることを特徴とする、請求項7に記載のシリコンウェハ剥離装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013024209A JP5995089B2 (ja) | 2012-05-31 | 2013-02-12 | シリコンウェハ剥離方法、およびシリコンウェハ剥離装置 |
US13/900,615 US8992726B2 (en) | 2012-05-31 | 2013-05-23 | Method and device for peeling off silicon wafers |
KR1020130059001A KR20130135088A (ko) | 2012-05-31 | 2013-05-24 | 실리콘 웨이퍼 박리방법 및 실리콘 웨이퍼 박리장치 |
CN201310207714.5A CN103456668B (zh) | 2012-05-31 | 2013-05-29 | 硅晶圆剥离方法以及硅晶圆剥离装置 |
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JP2012124438 | 2012-05-31 | ||
JP2012124438 | 2012-05-31 | ||
JP2013024209A JP5995089B2 (ja) | 2012-05-31 | 2013-02-12 | シリコンウェハ剥離方法、およびシリコンウェハ剥離装置 |
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JP2014007377A true JP2014007377A (ja) | 2014-01-16 |
JP5995089B2 JP5995089B2 (ja) | 2016-09-21 |
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US (1) | US8992726B2 (ja) |
JP (1) | JP5995089B2 (ja) |
KR (1) | KR20130135088A (ja) |
CN (1) | CN103456668B (ja) |
Cited By (1)
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JP2014009354A (ja) * | 2012-07-03 | 2014-01-20 | Panasonic Corp | シリコンインゴット固定用熱硬化性接着剤、それを用いたシリコンインゴット固定方法およびシリコンウエハの製造方法 |
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JP5632897B2 (ja) * | 2012-11-09 | 2014-11-26 | パナソニック株式会社 | ウエハ剥離装置およびウエハ剥離方法 |
JP5982650B2 (ja) * | 2013-12-06 | 2016-08-31 | パナソニックIpマネジメント株式会社 | ウエハ剥離装置 |
SG10201603100XA (en) * | 2016-04-19 | 2017-11-29 | Singapore Polytechnic | Method and apparatus for separating a component from a thermoset polymer adhered to the component |
KR102200652B1 (ko) | 2018-10-11 | 2021-01-11 | 주식회사 쿠온솔루션 | 웨이퍼 박리 시스템에 사용되는 테이프 분리 장치 및 방법 |
KR102111211B1 (ko) | 2018-10-11 | 2020-05-14 | 주식회사 쿠온솔루션 | 웨이퍼 박리 시스템에 사용되는 캐리어 분리 장치 및 방법 |
KR102122129B1 (ko) | 2018-10-11 | 2020-06-11 | 주식회사 쿠온솔루션 | 웨이퍼 박리 시스템에 사용되는 이송 장치 및 방법 |
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JP2014009354A (ja) * | 2012-07-03 | 2014-01-20 | Panasonic Corp | シリコンインゴット固定用熱硬化性接着剤、それを用いたシリコンインゴット固定方法およびシリコンウエハの製造方法 |
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CN103456668A (zh) | 2013-12-18 |
JP5995089B2 (ja) | 2016-09-21 |
CN103456668B (zh) | 2016-06-29 |
US20130319619A1 (en) | 2013-12-05 |
KR20130135088A (ko) | 2013-12-10 |
US8992726B2 (en) | 2015-03-31 |
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